Timothy J. Koprowski

Person

Newburgh, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
String dataflow error detection
- Patent number 9,715,420
- Issue date Jul 25, 2017
- International Business Machines Corporation
- James R. Cuffney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
String dataflow error detection
- Patent number 9,588,838
- Issue date Mar 7, 2017
- International Business Machines Corporation
- James R. Cuffney
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
String dataflow error detection
- Patent number 9,389,955
- Issue date Jul 12, 2016
- International Business Machines Corporation
- James R. Cuffney
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Design-based weighting for logic built-in self-test
- Patent number 9,292,398
- Issue date Mar 22, 2016
- International Business Machines Corporation
- Gregory J. Cook
- G01 - MEASURING TESTING
Information Patent Grant
Design-Based weighting for logic built-in self-test
- Patent number 9,292,399
- Issue date Mar 22, 2016
- International Business Machines Corporation
- Gregory J. Cook
- G01 - MEASURING TESTING
Information Patent Grant
Pseudo random optimized built-in self-test
- Patent number 6,968,489
- Issue date Nov 22, 2005
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
VLSI chip test power reduction
- Patent number 6,816,990
- Issue date Nov 9, 2004
- International Business Machines Corporation
- Peilin Song
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic random LBIST
- Patent number 6,708,305
- Issue date Mar 16, 2004
- International Business Machines Corporation
- L. Owen Farnsworth
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for programmable LBIST channel weighting
- Patent number 6,671,838
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Timothy J. Koprowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for delaying ABIST start
- Patent number 6,629,280
- Issue date Sep 30, 2003
- International Business Machines Corporation
- Timothy J. Koprowski
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for at speed diagnostics and bit fail mapping
- Patent number 6,629,281
- Issue date Sep 30, 2003
- International Business Machines Corporation
- Timothy G. McNamara
- G11 - INFORMATION STORAGE
Information Patent Grant
Logic built-in self test selective signature generation
- Patent number 6,442,723
- Issue date Aug 27, 2002
- International Business Machines Corporation
- Timothy J. Koprowski
- G01 - MEASURING TESTING
Information Patent Grant
Technique to decrease the exposure time of infrared imaging of semi...
- Patent number 6,442,720
- Issue date Aug 27, 2002
- International Business Machines Corporation
- Timothy J. Koprowski
- G01 - MEASURING TESTING
Information Patent Grant
Logic built-in self test
- Patent number 6,327,685
- Issue date Dec 4, 2001
- International Business Machines Corporation
- Timothy J. Koprowski
- G01 - MEASURING TESTING
Information Patent Grant
Isolation/removal of faults during LBIST testing
- Patent number 6,125,465
- Issue date Sep 26, 2000
- International Business Machines Corporation
- Timothy G. McNamara
- G01 - MEASURING TESTING
Information Patent Grant
Limited latch linehold capability for LBIST testing
- Patent number 6,021,514
- Issue date Feb 1, 2000
- International Business Machines Corporation
- Timothy John Koprowski
- G01 - MEASURING TESTING
Information Patent Grant
Look ahead pattern generation and simulation including support for...
- Patent number 5,479,414
- Issue date Dec 26, 1995
- International Business Machines Corporation
- Paul N. Keller
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS

Patents Applicationslast 30 patents

Information Patent Application
STRING DATAFLOW ERROR DETECTION
- Publication number 20160266959
- Publication date Sep 15, 2016
- International Business Machines Corporation
- James R. Cuffney
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRING DATAFLOW ERROR DETECTION
- Publication number 20160210182
- Publication date Jul 21, 2016
- International Business Machines Corporation
- James R. Cuffney
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRING DATAFLOW ERROR DETECTION
- Publication number 20160211850
- Publication date Jul 21, 2016
- International Business Machines Corporation
- James R. Cuffney
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-BASED WEIGHTING FOR LOGIC BUILT-IN SELF-TEST
- Publication number 20150168489
- Publication date Jun 18, 2015
- International Business Machines Corporation
- Gregory J. Cook
- G01 - MEASURING TESTING
Information Patent Application
DESIGN-BASED WEIGHTING FOR LOGIC BUILT-IN SELF-TEST
- Publication number 20150169423
- Publication date Jun 18, 2015
- International Business Machines Corporation
- Gregory J. Cook
- G01 - MEASURING TESTING
Information Patent Application
Pseudo random LBIST controls
- Publication number 20040230882
- Publication date Nov 18, 2004
- International Business Machines Corporation
- William V. Huott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VLSI chip test power reduction
- Publication number 20030145263
- Publication date Jul 31, 2003
- International Business Machines Corporation
- Peilin Song
- G01 - MEASURING TESTING
Information Patent Application
Pseudo random optimized built-in self-test
- Publication number 20030140293
- Publication date Jul 24, 2003
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING

Timothy J. Koprowski

Person

Patents Grantslast 30 patents

String dataflow error detection

String dataflow error detection

String dataflow error detection

Design-based weighting for logic built-in self-test

Design-Based weighting for logic built-in self-test

Pseudo random optimized built-in self-test

VLSI chip test power reduction

Deterministic random LBIST

Method and apparatus for programmable LBIST channel weighting

Method and apparatus for delaying ABIST start

Method and system for at speed diagnostics and bit fail mapping

Logic built-in self test selective signature generation

Technique to decrease the exposure time of infrared imaging of semi...

Logic built-in self test

Isolation/removal of faults during LBIST testing

Limited latch linehold capability for LBIST testing

Look ahead pattern generation and simulation including support for...

Patents Applicationslast 30 patents

STRING DATAFLOW ERROR DETECTION

STRING DATAFLOW ERROR DETECTION

STRING DATAFLOW ERROR DETECTION

DESIGN-BASED WEIGHTING FOR LOGIC BUILT-IN SELF-TEST

DESIGN-BASED WEIGHTING FOR LOGIC BUILT-IN SELF-TEST

Pseudo random LBIST controls

VLSI chip test power reduction

Pseudo random optimized built-in self-test