Warren K. Harwood

Person

Vancouver, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 7,595,632
- Issue date Sep 29, 2009
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,589,518
- Issue date Sep 15, 2009
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,492,147
- Issue date Feb 17, 2009
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 7,348,787
- Issue date Mar 25, 2008
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,330,023
- Issue date Feb 12, 2008
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 7,009,383
- Issue date Mar 7, 2006
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,980,012
- Issue date Dec 27, 2005
- Cascase Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,801,047
- Issue date Oct 5, 2004
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,720,782
- Issue date Apr 13, 2004
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,636,059
- Issue date Oct 21, 2003
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,492,822
- Issue date Dec 10, 2002
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,486,687
- Issue date Nov 26, 2002
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,380,751
- Issue date Apr 30, 2002
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,335,628
- Issue date Jan 1, 2002
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,313,649
- Issue date Nov 6, 2001
- Cascade Microtech, Inc.
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,232,788
- Issue date May 15, 2001
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 5,663,653
- Issue date Sep 2, 1997
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 5,604,444
- Issue date Feb 18, 1997
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 5,532,609
- Issue date Jul 2, 1996
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having full guarding
- Patent number 5,457,398
- Issue date Oct 10, 1995
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having integrated guarding, Kelvin connection a...
- Patent number 5,434,512
- Issue date Jul 18, 1995
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having integrated guarding, Kelvin connection a...
- Patent number 5,345,170
- Issue date Sep 6, 1994
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station with integrated environment control enclosure
- Patent number 5,266,889
- Issue date Nov 30, 1993
- Cascade Microtech, Inc.
- Warren K. Harwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer probe station having auxiliary chucks
- Patent number 5,237,267
- Issue date Aug 17, 1993
- Cascade Microtech, Inc.
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for microstrip assemblies
- Patent number 4,961,050
- Issue date Oct 2, 1990
- Cascade Microtech, Inc.
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial transmission line to microstrip transmission line launcher
- Patent number 4,855,697
- Issue date Aug 8, 1989
- Cascade Microtech, Inc.
- Keith E. Jones
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20080106290
- Publication date May 8, 2008
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having a skirting component
- Publication number 20070290700
- Publication date Dec 20, 2007
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20060132157
- Publication date Jun 22, 2006
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having a skirting component
- Publication number 20050194983
- Publication date Sep 8, 2005
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having a skirting component
- Publication number 20050184744
- Publication date Aug 25, 2005
- CascadeMicrotech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20050017741
- Publication date Jan 27, 2005
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20040061514
- Publication date Apr 1, 2004
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20030205997
- Publication date Nov 6, 2003
- Cascade Microtech, Inc., an Oregon corporation
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20030057979
- Publication date Mar 27, 2003
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20030048110
- Publication date Mar 13, 2003
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20020093353
- Publication date Jul 18, 2002
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20020043981
- Publication date Apr 18, 2002
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20010040461
- Publication date Nov 15, 2001
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20010009377
- Publication date Jul 26, 2001
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION HAVING ENVIRONMENT CONTROL ENCLOSURE
- Publication number 20010001538
- Publication date May 24, 2001
- WARREN K. HARWOOD
- G01 - MEASURING TESTING

Warren K. Harwood

Person

Patents Grantslast 30 patents

Wafer probe station having environment control enclosure

Wafer probe station having a skirting component

Wafer probe station having a skirting component

Wafer probe station having environment control enclosure

Wafer probe station having a skirting component

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station having full guarding

Wafer probe station having integrated guarding, Kelvin connection a...

Wafer probe station having integrated guarding, Kelvin connection a...

Wafer probe station with integrated environment control enclosure

Wafer probe station having auxiliary chucks

Test fixture for microstrip assemblies

Coaxial transmission line to microstrip transmission line launcher

Patents Applicationslast 30 patents

Wafer probe station having environment control enclosure

Wafer probe station having a skirting component

Wafer probe station having environment control enclosure

Wafer probe station having a skirting component

Wafer probe station having a skirting component

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

Wafer probe station having environment control enclosure

Wafer probe station for low-current measurements

WAFER PROBE STATION HAVING ENVIRONMENT CONTROL ENCLOSURE