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Analysing diffraction patterns
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G01N23/2055
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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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G01N23/2055
Analysing diffraction patterns
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last 30 patents
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Patent Grant
Sample inspection system comprising a beam former to project a poly...
Patent number
11,971,371
Issue date
Apr 30, 2024
The Nottingham Trent University
Paul Evans
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Crosslinked fluoropolymer resin and control method for same
Patent number
11,946,924
Issue date
Apr 2, 2024
PROTERIAL, LTD.
Kazufumi Suenaga
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
Patent number
11,933,747
Issue date
Mar 19, 2024
University of Maryland, College Park
Peter Zavalij
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
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Patent Grant
Orientation degree distribution calculation method, orientation deg...
Patent number
11,921,061
Issue date
Mar 5, 2024
National Institute of Advanced Industrial Science and Technology
Rikio Soda
G01 - MEASURING TESTING
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Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
Patent number
11,913,891
Issue date
Feb 27, 2024
Rigaku Corporation
Koichiro Ito
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
Patent number
11,841,334
Issue date
Dec 12, 2023
Rigaku Corporation
Hideo Toraya
G01 - MEASURING TESTING
Information
Patent Grant
Data-driven solutions for inverse elemental modeling
Patent number
11,821,857
Issue date
Nov 21, 2023
Baker Hughes Oilfield Operations LLC
Robert Krumm
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method for identifying molecular structure
Patent number
11,815,475
Issue date
Nov 14, 2023
The University of Tokyo
Makoto Fujita
C30 - CRYSTAL GROWTH
Information
Patent Grant
Method of acquiring sample for evaluation of SiC single crystal
Patent number
11,815,437
Issue date
Nov 14, 2023
Resonac Corporation
Shunsuke Noguchi
C30 - CRYSTAL GROWTH
Information
Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
Patent number
11,815,476
Issue date
Nov 14, 2023
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission X-ray critical dimension (T-XCD) characterization of s...
Patent number
11,761,913
Issue date
Sep 19, 2023
BRUKER TECHNOLOGIES LTD.
Adam Ginsburg
G01 - MEASURING TESTING
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Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
Patent number
11,703,465
Issue date
Jul 18, 2023
Kioxia Corporation
Nobuhito Kuge
G01 - MEASURING TESTING
Information
Patent Grant
X-ray based measurements in patterned structure
Patent number
11,692,953
Issue date
Jul 4, 2023
Nova Ltd.
Gilad Barak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electron microscopy analysis method
Patent number
11,686,693
Issue date
Jun 27, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Nicolas Bernier
G01 - MEASURING TESTING
Information
Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
Patent number
11,614,414
Issue date
Mar 28, 2023
COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
James Richard Tickner
G01 - MEASURING TESTING
Information
Patent Grant
Estimating wear for BHA components using borehole hardness
Patent number
11,579,329
Issue date
Feb 14, 2023
Halliburton Energy Services, Inc.
Ian David Campbell Mitchell
E21 - EARTH DRILLING MINING
Information
Patent Grant
Methods and systems for real time measurement control
Patent number
11,519,869
Issue date
Dec 6, 2022
KLA-Tencor Corporation
Antonio Arion Gellineau
G01 - MEASURING TESTING
Information
Patent Grant
Residual stress detection device and detection method thereof
Patent number
11,519,798
Issue date
Dec 6, 2022
Metal Industries Research & Development Centre
Zong-Rong Liu
G01 - MEASURING TESTING
Information
Patent Grant
Process for quantification of metal amino acid chelates in solution...
Patent number
11,499,952
Issue date
Nov 15, 2022
Premex, Inc.
Paula Leon Monsalve
G01 - MEASURING TESTING
Information
Patent Grant
Quantitative phase analysis device for analyzing non-crystalline ph...
Patent number
11,402,341
Issue date
Aug 2, 2022
Rigaku Corporation
Hideo Toraya
G01 - MEASURING TESTING
Information
Patent Grant
System and method for high-resolution high contrast x-ray ghost dif...
Patent number
11,402,342
Issue date
Aug 2, 2022
Bar Ilan University
Sharon Shwartz
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Measurement of crystallite size distribution in polycrystalline mat...
Patent number
11,397,154
Issue date
Jul 26, 2022
Bob Baoping He
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring fiber orientation degree, fiber orientation de...
Patent number
11,360,035
Issue date
Jun 14, 2022
NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
Atsuhiko Yamanaka
G01 - MEASURING TESTING
Information
Patent Grant
Method for rolling and/or heat treating a metal strip
Patent number
11,319,611
Issue date
May 3, 2022
SMS GROUP GMBH
Mostafa Biglari
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Full beam metrology for x-ray scatterometry systems
Patent number
11,313,816
Issue date
Apr 26, 2022
KLA Corporation
Antonio Arion Gellineau
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Opaline flux-calcined diatomite products
Patent number
11,243,177
Issue date
Feb 8, 2022
EP Minerals, LLC
Peter E. Lenz
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Detection of crystallographic properties in aerospace components
Patent number
11,181,491
Issue date
Nov 23, 2021
Raytheon Technologies Corporation
Iuliana Cernatescu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for computed laminography x-ray fluorescence imaging
Patent number
11,143,605
Issue date
Oct 12, 2021
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CRYSTAL STRUCTURE DATABASE-BASED MATERIAL ANALYSIS METHOD AND SYSTE...
Publication number
20240142394
Publication date
May 2, 2024
PEKING UNIVERSITY SHENZHEN GRADUATE SCHOOL
Feng PAN
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
Publication number
20240133829
Publication date
Apr 25, 2024
Rigaku Corporation
Takumi OTA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
Publication number
20240077436
Publication date
Mar 7, 2024
FEI Company
Stefano VESPUCCI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
Publication number
20240044819
Publication date
Feb 8, 2024
NOVA LTD
Gilad Barak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTROCHEMICAL APPARATUS AND ELECTRONIC APPARATUS
Publication number
20240038995
Publication date
Feb 1, 2024
Ningde Amperex Technology Limited
Xiaohu CAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON PTYCHOGRAPHY METHOD AND APPARATUS FOR AUTOMATICALLY CORREC...
Publication number
20230417690
Publication date
Dec 28, 2023
TSINGHUA UNIVERSITY
RONG YU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
Publication number
20230393083
Publication date
Dec 7, 2023
Oxford Instruments Nanotechnology Tools Limited
Patrick Trimby
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRODE FOR POWER STORAGE DEVICES AND LITHIUM-ION SECONDARY BATTERY
Publication number
20230361299
Publication date
Nov 9, 2023
TDK Corporation
Takuya AOKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND COMPOSITIONS FOR LOW SALINITY ENHANCED OIL RECOVERY
Publication number
20230358694
Publication date
Nov 9, 2023
BP CORPORATION NORTH AMERICA INC.
Huang Zeng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NONAQUEOUS ELECTROLYTE BATTERY AND BATTERY PACK
Publication number
20230352682
Publication date
Nov 2, 2023
Kabushiki Kaisha Toshiba
Natsuki OTANI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
Publication number
20230341325
Publication date
Oct 26, 2023
ASML NETHERLANDS B.V.
Lars LOETGERING
G01 - MEASURING TESTING
Information
Patent Application
CRYSTALLITE SIZE IN ROCK SAMPLES
Publication number
20230333078
Publication date
Oct 19, 2023
Chevron U.S.A. Inc.
Rebecca Stokes
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20230324316
Publication date
Oct 12, 2023
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
Hitomi ADACHI
G01 - MEASURING TESTING
Information
Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
Publication number
20230314348
Publication date
Oct 5, 2023
UNIVERSITY OF HOUSTON SYSTEM
Byron Freelon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...
Publication number
20230304948
Publication date
Sep 28, 2023
Rigaku Corporation
Ryouichi YOKOYAMA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS
Publication number
20230296538
Publication date
Sep 21, 2023
MALVERN PANALYTICAL B.V.
Roelof De Vries
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
Publication number
20230280290
Publication date
Sep 7, 2023
Rigaku Corporation
Hideo TORAYA
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
Publication number
20230273134
Publication date
Aug 31, 2023
PROTO PATENTS LTD.
Vedran Nicholas VUKOTIC
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETRIC COHERENT DIFFRACTION IMAGING
Publication number
20230258560
Publication date
Aug 17, 2023
Rensselaer Polytechnic Institute
Edwin Fohtung
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
Publication number
20230228695
Publication date
Jul 20, 2023
The Regents of the University of California
Tamir Gonen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MON...
Publication number
20230194445
Publication date
Jun 22, 2023
ADVANCED ANALYZER LABS, INC.
PETER ZAVALIJ
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL ELECTRON DENSITY MAP SPECIFYING APPARATUS, SYSTEM...
Publication number
20230187017
Publication date
Jun 15, 2023
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
Publication number
20230175991
Publication date
Jun 8, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Robert MASTERS
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS
Publication number
20230145297
Publication date
May 11, 2023
The Regents of the University of California
Tamir Gonen
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYSIS AND DETERMINATION OF HEAVY METAL OCCURRENCE KEY...
Publication number
20230117820
Publication date
Apr 20, 2023
Central South University
Zhang LIN
G01 - MEASURING TESTING
Information
Patent Application
PROCESS FOR QUANTIFICATION OF METAL AMINO ACID CHELATES IN SOLUTION...
Publication number
20230071747
Publication date
Mar 9, 2023
Premex, Inc.
Paula Leon MONSALVE
G01 - MEASURING TESTING
Information
Patent Application
Methods for determining crystal structure and apparatus for carryin...
Publication number
20230065841
Publication date
Mar 2, 2023
Fyzikální ústav AV CR, v.v.i.
Lukas Palatinus
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR STRUCTURALLY CHARACTERIZING COMPOUNDS
Publication number
20230057900
Publication date
Feb 23, 2023
The Regents of the University of California
Hosea M. Nelson
G01 - MEASURING TESTING
Information
Patent Application
ARTIFICIAL INTELLIGENCE BASED MATERIAL SCREENING FOR TARGET PROPERTIES
Publication number
20230043363
Publication date
Feb 9, 2023
International Business Machines Corporation
Rodrigo Neumann Barros Ferreira
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
Publication number
20230031147
Publication date
Feb 2, 2023
Merck Patent GmbH
Carolina VON ESSEN
G01 - MEASURING TESTING