Membership
Tour
Register
Log in
Arrangements for measuring frequencies Arrangements for analysing frequency spectra
Follow
Industry
CPC
G01R23/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R23/00
Arrangements for measuring frequencies Arrangements for analysing frequency spectra
Sub Industries
G01R23/005
Circuits for comparing several input signals and for indicating the result of this comparison
G01R23/02
Arrangements for measuring frequency
G01R23/04
adapted for measuring in circuits having distributed constants
G01R23/06
by converting frequency into an amplitude of current or voltage
G01R23/07
using response of circuits tuned on resonance
G01R23/08
using response of circuits tuned off resonance
G01R23/09
using analogue integrators
G01R23/10
by converting frequency into a train of pulses, which are then counted
G01R23/12
by converting frequency into phase shift
G01R23/14
by heterodyning by beat-frequency comparison
G01R23/145
by heterodyning or by beat-frequency comparison with the harmonic of an oscillator
G01R23/15
Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)
G01R23/155
giving an indication of the number of times this occurs
G01R23/16
Spectrum analysis Fourier analysis
G01R23/163
adapted for measuring in circuits having distributed constants
G01R23/165
using filters
G01R23/167
with digital filters
G01R23/17
with optical or acoustical auxiliary devices
G01R23/173
Wobbulating devices similar to swept panoramic receivers
G01R23/175
by delay means
G01R23/177
Analysis of very low frequencies
G01R23/18
with provision for recording frequency spectrum
G01R23/20
Measurement of non-linear distortion
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Phase frequency detector-based high-precision feedback frequency me...
Patent number
11,965,919
Issue date
Apr 23, 2024
Zhejiang University
Xinglin Sun
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and measurement method
Patent number
11,965,921
Issue date
Apr 23, 2024
Anritsu Corporation
Hiroaki Iida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for enabling determination of a position of a rec...
Patent number
11,959,993
Issue date
Apr 16, 2024
TAKEMETUIT INC.
Nick Barker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Tool for electronics testing and diagnostics
Patent number
11,953,524
Issue date
Apr 9, 2024
Gentiam LLC
Omar Laldin
G01 - MEASURING TESTING
Information
Patent Grant
System frequency detector
Patent number
11,953,530
Issue date
Apr 9, 2024
Toshiba Mitsubishi-Electric Industrial Systems Corporation
Yasuaki Mitsugi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System, device, method, and program for analysis
Patent number
11,946,962
Issue date
Apr 2, 2024
Toyo Corporation
Congbing Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Signal processing device as well as method of applying a zone trigger
Patent number
11,933,819
Issue date
Mar 19, 2024
Rohde & Schwarz GmbH & Co. KG
Markus Breunig
G01 - MEASURING TESTING
Information
Patent Grant
System frequency detector
Patent number
11,933,825
Issue date
Mar 19, 2024
Toshiba Mitsubishi-Electric Industrial Systems Corporation
Yasuaki Mitsugi
G01 - MEASURING TESTING
Information
Patent Grant
Multiple analog-to-digital converter system to provide simultaneous...
Patent number
11,936,397
Issue date
Mar 19, 2024
Tektronix, Inc.
Alexander Krauska
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Analysis threshold determination device and analysis threshold dete...
Patent number
11,927,521
Issue date
Mar 12, 2024
JVCKENWOOD CORPORATION
Atsushi Saito
G01 - MEASURING TESTING
Information
Patent Grant
Minimization of drill string rotation rate effect on acoustic signa...
Patent number
11,920,467
Issue date
Mar 5, 2024
Saudi Arabian Oil Company
Yunlai Yang
E21 - EARTH DRILLING MINING
Information
Patent Grant
Exceptional points of degeneracy in linear time periodic systems an...
Patent number
11,921,136
Issue date
Mar 5, 2024
The Regents of the University of California
Filippo Capolino
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Fan-out buffer with skew control function, operating method thereof...
Patent number
11,921,158
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Byung-Sung Kim
G01 - MEASURING TESTING
Information
Patent Grant
Anomaly detection apparatus, method, and program
Patent number
11,921,137
Issue date
Mar 5, 2024
Kabushiki Kaisha Toshiba
Tenta Sasaya
G01 - MEASURING TESTING
Information
Patent Grant
Processing sinewave signals of variable frequency in a device with...
Patent number
11,906,557
Issue date
Feb 20, 2024
Schweitzer Engineering Laboratories, Inc.
Veselin Skendzic
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectrum analyzer and method of controlling the same
Patent number
11,906,558
Issue date
Feb 20, 2024
Innowireless Co., Ltd.
Young Su Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Wind turbine and method for detecting low-frequency oscillations in...
Patent number
11,899,050
Issue date
Feb 13, 2024
Wobben Properties GmbH
Aramis Schwanka Trevisan
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Motor bearing failure diagnosis device
Patent number
11,898,932
Issue date
Feb 13, 2024
ZHUZHOU CRRC TIMES ELECTRIC CO., LTD
Wenlong Zhu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Receiving device, mobile terminal test apparatus provided with rece...
Patent number
11,892,498
Issue date
Feb 6, 2024
Anritsu Corporation
Takasumi Ikebe
G01 - MEASURING TESTING
Information
Patent Grant
Frequency characteristic measurement apparatus
Patent number
11,892,534
Issue date
Feb 6, 2024
Rohm Co., Ltd.
Kenji Hamachi
G01 - MEASURING TESTING
Information
Patent Grant
Frequency debugging board, frequency debugging system, and method f...
Patent number
11,892,486
Issue date
Feb 6, 2024
BOE Technology Group Co., Ltd.
Xiangxiang Zou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for inspecting cooling holes of a turbine engine...
Patent number
11,885,688
Issue date
Jan 30, 2024
General Electric Company
Guanghua Wang
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Grant
Method and system for making time domain measurements of periodic r...
Patent number
11,885,839
Issue date
Jan 30, 2024
Keysight Technologies, Inc.
Andrew Michael Owen
G01 - MEASURING TESTING
Information
Patent Grant
Signal analyzer
Patent number
11,885,832
Issue date
Jan 30, 2024
Rohde & Schwarz GmbH & Co. KG
Thomas Guenther
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and electronic device for estimating frequencies of multiple...
Patent number
11,879,916
Issue date
Jan 23, 2024
INDIAN INSTITUTE OF TECHNOLOGY MADRAS (IIT MADRAS)
Vishnu Palakkal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
ASIC implementing real-time spectrum analysis
Patent number
11,874,308
Issue date
Jan 16, 2024
Keysight Technologies, Inc.
Connor P. McKay
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods of signal analysis and data transfer using spec...
Patent number
11,867,733
Issue date
Jan 9, 2024
Robert William Enouy
G01 - MEASURING TESTING
Information
Patent Grant
Fault arc signal detection method using convolutional neural network
Patent number
11,860,216
Issue date
Jan 2, 2024
QINGDAO TOPSCOMM COMMUNICATION CO., LTD
Zhen Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pulsed high frequency monitor
Patent number
11,852,665
Issue date
Dec 26, 2023
Kyosan Electric Mfg. Co., Ltd.
Hiroyuki Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for determining the ratio between two frequencies
Patent number
11,846,661
Issue date
Dec 19, 2023
SEMIBLOCKS B.V.
Michiel Van Elzakker
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING COOLING HOLES OF A TURBINE ENGINE...
Publication number
20240118140
Publication date
Apr 11, 2024
GENERAL ELECTRIC COMPANY
Guanghua Wang
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Application
SENSOR MODULE
Publication number
20240110960
Publication date
Apr 4, 2024
SEIKO EPSON CORPORATION
Kenta Sato
G01 - MEASURING TESTING
Information
Patent Application
Frequency Monitoring Circuitry with Voltage Conversion
Publication number
20240110959
Publication date
Apr 4, 2024
Apple Inc.
Arunvenkatesh Alagappan
G01 - MEASURING TESTING
Information
Patent Application
METHOD, SIGNAL PROCESSING DEVICE, AND MEASUREMENT APPLICATION DEVICE
Publication number
20240103056
Publication date
Mar 28, 2024
Rohde& Schwarz GmbH & Co. KG
Mahmud NASEEF
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, NON-TRANSITORY COMPUTER READABLE...
Publication number
20240103060
Publication date
Mar 28, 2024
FUJIFILM Business Innovation Corp.
Masahito KUBONO
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL RECONFIGURABLE APPARATUS FOR SPECTRUM ANALYSIS AND INTREFER...
Publication number
20240085570
Publication date
Mar 14, 2024
ANDREY V. VEITSEL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Tunable Coupler, Calibrating Method and Device for the Tunable Coup...
Publication number
20240077524
Publication date
Mar 7, 2024
Origin Quantum Computing Technology (Hefei) Co., Ltd.
Weicheng KONG
G01 - MEASURING TESTING
Information
Patent Application
Method for Harmonic Detection and Apparatus, Frequency Converter, a...
Publication number
20240069080
Publication date
Feb 29, 2024
HEFEI MIDEA HEATING & VENTILATING EQUIPMENT CO., LTD.
Junhua CHEN
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL ANALYSIS FOR COMPUTING A COMPLEMENTARY CUMULATIVE DISTRIBUTI...
Publication number
20240069081
Publication date
Feb 29, 2024
KEYSIGHT TECHNOLOGIES, INC.
Rishi Mohindra
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR CALIBRATING FREQUENCY OF SUPERCONDUCTING QUBI...
Publication number
20240069079
Publication date
Feb 29, 2024
Origin Quantum Computing Technology (Hefei) Co., Ltd.
HANQING SHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIBAND RESONANCE FREQUENCY TRACKING CIRCUIT AND METHOD APPLIED T...
Publication number
20240053390
Publication date
Feb 15, 2024
Hangzhou Dianzi University
Yaguang KONG
G01 - MEASURING TESTING
Information
Patent Application
CONTACTLESS ELEMENT DETECTION DEVICE
Publication number
20240053854
Publication date
Feb 15, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Pierre-Henri OREFICE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS FOR DETERMINING AND CALIBRATING NON-LINEARITY IN A PHASE IN...
Publication number
20240044978
Publication date
Feb 8, 2024
Samsung Electronics Co., Ltd.
Gunjan Mandal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ADJUSTING QUBIT FREQUENCY, ELECTRONIC DEVI...
Publication number
20240036089
Publication date
Feb 1, 2024
BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.
Li LI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FREQUENCY DETECTION DEVICE FOR CLOCK SIGNAL AND DETECTION METHOD TH...
Publication number
20240036090
Publication date
Feb 1, 2024
WINBOND ELECTRONICS CORP.
Hsing-Yu Liu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Discharge Detection Device
Publication number
20240036098
Publication date
Feb 1, 2024
NITTO KOGYO CORPORATION
Atsushi Miyamoto
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING AND CORRECTION OF CURRENT SENSING DEVICES
Publication number
20240027501
Publication date
Jan 25, 2024
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Muhammad Hussain Alvi
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR CIRCUIT, SIGNAL PROCESSING CIRCUIT, AND MEASUREMENT INSTRU...
Publication number
20240019470
Publication date
Jan 18, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Wolfgang WENDLER
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED SENSOR AND METHOD OF TIMING MONITORING IN AN INTEGRATED...
Publication number
20240019475
Publication date
Jan 18, 2024
STMicroelectronics S.r.l.
Matteo QUARTIROLI
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY ESTIMATION IN A POWER SYSTEM
Publication number
20240019467
Publication date
Jan 18, 2024
Amirkabir University of Technology
Seyed Soroush Karimi Madahi
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND ELECTRIC CIRCUIT ARRANGEMENT FOR DETERMINING A BRANCH IN...
Publication number
20240012042
Publication date
Jan 11, 2024
BENDER GMBH & CO. KG
Pascal Becker
G01 - MEASURING TESTING
Information
Patent Application
Spectrum Analyzer, System and Method for Outputting Data from a Spe...
Publication number
20240003946
Publication date
Jan 4, 2024
AARONIA AG
Thorsten Chmielus
G01 - MEASURING TESTING
Information
Patent Application
STRETCH DETECTION SYSTEM FOR POWER TRANSMISSION MECHANISM
Publication number
20230417809
Publication date
Dec 28, 2023
Hitachi, Ltd
Akihiro NAKAMURA
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Application
DETECTION OF PASSIVE INTERMODULATION DISTORTION IN OPEN RADIO ACCES...
Publication number
20230421276
Publication date
Dec 28, 2023
VIAVI SOLUTIONS INC.
Wei Chen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MULTI-CHANNEL SPECTRUM ANALYZER WITH MULTI-CHANNEL ANALOG-DIGITAL-C...
Publication number
20230417799
Publication date
Dec 28, 2023
VIAVI SOLUTIONS INC.
Chang-Hyun PARK
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR WIDE-BAND SPECTRAL ANALYSIS OF A SIGNAL OF INTEREST
Publication number
20230417810
Publication date
Dec 28, 2023
Centre National de la Recherche Scientifique
Hugues GUILLET DE CHATELLUS
G01 - MEASURING TESTING
Information
Patent Application
RADIO-FREQUENCY ELEMENT GROUP TESTING SYSTEM AND METHOD
Publication number
20230417822
Publication date
Dec 28, 2023
OHMPLUS TECHNOLOGY INC.
CHIH-YUAN CHU
G01 - MEASURING TESTING
Information
Patent Application
ULTRA-WIDEBAND COMMUNICATION SYSTEM
Publication number
20230408669
Publication date
Dec 21, 2023
DecaWave, Ltd
Michael McLaughlin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS, AN...
Publication number
20230400487
Publication date
Dec 14, 2023
YOKOGAWA ELECTRIC CORPORATION
Kazuma Koga
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSING SYSTEM AND SIGNAL PROCESSING METHOD
Publication number
20230400486
Publication date
Dec 14, 2023
Hitachi, Ltd
Shinji NAKAGAWA
G01 - MEASURING TESTING