Automated test systems [ATE]; using microprocessors or computers

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CPC
G01R31/2834

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2834Automated test systems [ATE]; using microprocessors or computers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Lead guides having a recessed face
- Patent number 12,181,516
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Chi-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Onboard circuits and methods to predict the health of critical elem...
- Patent number 12,174,237
- Issue date Dec 24, 2024
- University of Houston System
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Grant
Device under test simulation equipment
- Patent number 12,174,244
- Issue date Dec 24, 2024
- Teradyne (Asia) Pte. Ltd.
- Min Nie
- G01 - MEASURING TESTING
Information Patent Grant
Ergonomic loading for a test interface board (TIB) / burn-in-board...
- Patent number 12,174,248
- Issue date Dec 24, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Testing an electronic circuit having a voltage monitor circuit
- Patent number 12,163,997
- Issue date Dec 10, 2024
- STMicroelectronics S.r.l.
- Nicola De Campo
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test system and automatic test method for integrated-circ...
- Patent number 12,158,494
- Issue date Dec 3, 2024
- Kingston Digital, Inc.
- Chao-Kun Lee
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Systems and methods for automatic time domain reflectometer measure...
- Patent number 12,117,491
- Issue date Oct 15, 2024
- Advantest Corporation
- Siegfried Podolski
- G01 - MEASURING TESTING
Information Patent Grant
Cost-saving scheme for scan testing of 3D stack die
- Patent number 12,099,091
- Issue date Sep 24, 2024
- Advanced Micro Devices, Inc.
- Songgan Zang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for testing semiconductor circuitry using m...
- Patent number 12,099,085
- Issue date Sep 24, 2024
- Analog Devices International Unlimited Company
- Padraig Fitzgerald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan tree construction
- Patent number 12,092,691
- Issue date Sep 17, 2024
- Tsinghua University
- Can Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for adjusting input-output impedance for I/O in...
- Patent number 12,085,605
- Issue date Sep 10, 2024
- Meta Platforms Technologies, LLC
- Sri Harsha Manjunath
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an electronic circuit and corresponding method a...
- Patent number 12,072,372
- Issue date Aug 27, 2024
- STMicroelectronics S.r.l.
- Matteo Brivio
- G01 - MEASURING TESTING
Information Patent Grant
Software directed firmware acceleration
- Patent number 12,055,581
- Issue date Aug 6, 2024
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decompression circuit, circuit generation method, and IC chip
- Patent number 12,050,248
- Issue date Jul 30, 2024
- Huawei Technologies Co., Ltd.
- Yu Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Scan chain designing and circuit testing method
- Patent number 12,044,721
- Issue date Jul 23, 2024
- Realtek Semiconductor Corporation
- Shiou Wen Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-core test processor, and integrated circuit test system and m...
- Patent number 12,044,720
- Issue date Jul 23, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G01 - MEASURING TESTING
Information Patent Grant
Flexible input/output (I/O) allocation for integrated circuit scan...
- Patent number 12,032,015
- Issue date Jul 9, 2024
- Amazon Technologies, Inc.
- Ilan Strulovici
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clock conversion device, test system having the same, and method of...
- Patent number 12,032,019
- Issue date Jul 9, 2024
- Samsung Electronics Co., Ltd.
- Yongjeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method for wiring relationship of electrical components
- Patent number 12,013,430
- Issue date Jun 18, 2024
- SiPing Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing an integrated circuit
- Patent number 12,007,438
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 11,982,597
- Issue date May 14, 2024
- Myung Ki Kim
- G01 - MEASURING TESTING
Information Patent Grant
Pull out-assisting linkage device for test load board of automatic...
- Patent number 11,977,111
- Issue date May 7, 2024
- Zhijie Bao
- G01 - MEASURING TESTING
Information Patent Grant
Mass-interconnect engaging device
- Patent number 11,971,430
- Issue date Apr 30, 2024
- Jeffery P. Stowers
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing functionality and performance of a...
- Patent number 11,953,544
- Issue date Apr 9, 2024
- THE ADT SECURITY CORPORATION
- Jeron E. Bornstein
- G01 - MEASURING TESTING
Information Patent Grant
Remote control device testing environment
- Patent number 11,953,554
- Issue date Apr 9, 2024
- CSC Holdings, LLC
- Heitor J. Almeida
- G08 - SIGNALLING
Information Patent Grant
Diagnosis of mobile devices using built-in actuators and sensors
- Patent number 11,946,968
- Issue date Apr 2, 2024
- BLANCCO TECHNOLOGY GROUP IP OY
- Timo Sairiala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Output voltage glitch reduction in ate systems
- Patent number 11,940,496
- Issue date Mar 26, 2024
- Analog Devices, Inc.
- Michael E. Harrell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit yield improvement
- Patent number 11,923,807
- Issue date Mar 5, 2024
- pSemi Corporation
- Parvez H. Daruwalla
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automated test equipment comprising a device under test loopback an...
- Patent number 11,913,987
- Issue date Feb 27, 2024
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ESTIMATING PERFORMANCE VALUES OF CHIPS, COMPUTING SYSTEM...
- Publication number 20250012851
- Publication date Jan 9, 2025
- Global Unichip Corporation
- Ting-Hao WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND MEASUREMENT APPLICATION SYSTEM CONFIGURATION SYSTEM
- Publication number 20250012850
- Publication date Jan 9, 2025
- Rohde& Schwarz GmbH & Co. KG
- Thomas BRAUNSTORFINGER
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION
- Publication number 20250004014
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING AND INFORMATION ABOUT CHARACTE...
- Publication number 20250004039
- Publication date Jan 2, 2025
- Advantest Corporation
- Jochen RIVOIR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A...
- Publication number 20240426896
- Publication date Dec 26, 2024
- The ADT Security Corporation
- Jeron E. BORNSTEIN
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ANALYSIS
- Publication number 20240426901
- Publication date Dec 26, 2024
- The Regents of the University of Michigan
- Al-Thaddeus Avestruz
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR TESTING SEMICONDUCTOR CIRCUITRY USING M...
- Publication number 20240402239
- Publication date Dec 5, 2024
- Analog Devices International Unlimited Company
- Padraig Fitzgerald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369615
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369616
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...
- Publication number 20240369617
- Publication date Nov 7, 2024
- Advantest Corporation
- Klaus-Dieter HILLIGES
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONDENSATION PREVENTION FOR 2-PHASE COOLIN...
- Publication number 20240361357
- Publication date Oct 31, 2024
- Advantest Corporation
- Peter Weixiang ZHENG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF OPTIMIZING CABLING OF AT LEAST ONE DEVICE UNDER TEST AND...
- Publication number 20240353482
- Publication date Oct 24, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Sebastian ENGEL
- G01 - MEASURING TESTING
Information Patent Application
Computer-Implemented Method for Determining a Quality State of a Wafer
- Publication number 20240353473
- Publication date Oct 24, 2024
- ROBERT BOSCH GmbH
- Jonas Bergdolt
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND TEST DEVICE FOR IDENTIFYING CRITICAL POINTS OF A CI...
- Publication number 20240345157
- Publication date Oct 17, 2024
- MEDIATEK INC.
- Harry Hai Chen
- G01 - MEASURING TESTING
Information Patent Application
Method and System of Developing and Executing Test Program for Veri...
- Publication number 20240337683
- Publication date Oct 10, 2024
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
SOURCE MEASUREMENT UNIT WITH RESISTOR-CAPACITOR CHARGING CIRCUIT
- Publication number 20240337682
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Rajavelu Thinakaran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STATE TRANSITION CONTROL FOR PARAMETRIC MEASUREMENT UNIT
- Publication number 20240319260
- Publication date Sep 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Tanmay Neema
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION FOR ROUTING RESISTANCE INDUCED ERROR
- Publication number 20240310432
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Gautam Salil NANDI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TUNABLE TRANSCONDUCTOR
- Publication number 20240297627
- Publication date Sep 5, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Hariharan SRINIVASAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS
- Publication number 20240288497
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Michael Richard Spica
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Adjusting Input-Output Impedance for I/O In...
- Publication number 20240288490
- Publication date Aug 29, 2024
- Meta Platforms Technologies, LLC
- Sri Harsha Manjunath
- G01 - MEASURING TESTING
Information Patent Application
CENTRALIZED CONTROL OF AN AUTOMATED TEST EQUIPMENT SYSTEM USING COM...
- Publication number 20240275499
- Publication date Aug 15, 2024
- Rakuten Symphony UK Ltd
- Hugh Roger McCalman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Integrated Circuit Yield Improvement
- Publication number 20240275336
- Publication date Aug 15, 2024
- pSemi Corporation
- Parvez H. Daruwalla
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MASS-INTERCONNECT ENGAGING DEVICE
- Publication number 20240255570
- Publication date Aug 1, 2024
- Leyo, LLC
- Jeffery P. Stowers
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS OF MOBILE DEVICES USING BUILT-IN ACTUATORS AND SENSORS
- Publication number 20240248130
- Publication date Jul 25, 2024
- Blancco Technology Group IP Oy
- Timo Sairiala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOW POWER ARCHITECTURE FOR CHIPLETS
- Publication number 20240248132
- Publication date Jul 25, 2024
- QUALCOMM Incorporated
- Praveen RAGHURAMAN
- G01 - MEASURING TESTING
Information Patent Application
Detection Method For Wiring Relationship Of Electrical Components
- Publication number 20240230750
- Publication date Jul 11, 2024
- Guangdong Yang Dili Electric Technology Co., Ltd.
- SiPing Zeng
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CORE TEST PROCESSOR, AND INTEGRATED CIRCUIT TEST SYSTEM AND M...
- Publication number 20240219451
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...
- Publication number 20240219452
- Publication date Jul 4, 2024
- Intel Corporation
- Prasoon JOSHI
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED SWITCHING OF STRESS VOLTAGES IN LATERAL DMOS STRUCTURES
- Publication number 20240210467
- Publication date Jun 27, 2024
- INFINEON TECHNOLOGIES AG
- Till Schloesser
- G01 - MEASURING TESTING

Automated test systems [ATE]; using microprocessors or computers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for performing multiple tests on a device under test

Lead guides having a recessed face

Onboard circuits and methods to predict the health of critical elem...

Device under test simulation equipment

Ergonomic loading for a test interface board (TIB) / burn-in-board...

Testing an electronic circuit having a voltage monitor circuit

Automatic test system and automatic test method for integrated-circ...

Systems and methods for automatic time domain reflectometer measure...

Cost-saving scheme for scan testing of 3D stack die

Apparatuses and methods for testing semiconductor circuitry using m...

Scan tree construction

Systems and methods for adjusting input-output impedance for I/O in...

System for testing an electronic circuit and corresponding method a...

Software directed firmware acceleration

Decompression circuit, circuit generation method, and IC chip

Scan chain designing and circuit testing method

Multi-core test processor, and integrated circuit test system and m...

Flexible input/output (I/O) allocation for integrated circuit scan...

Clock conversion device, test system having the same, and method of...

Detection method for wiring relationship of electrical components

Method and system for testing an integrated circuit

Automated functional testing systems and methods of making and usin...

Pull out-assisting linkage device for test load board of automatic...

Mass-interconnect engaging device

Systems and methods for testing functionality and performance of a...

Remote control device testing environment

Diagnosis of mobile devices using built-in actuators and sensors

Output voltage glitch reduction in ate systems

Integrated circuit yield improvement

Automated test equipment comprising a device under test loopback an...

Patents Applicationslast 30 patents

METHOD FOR ESTIMATING PERFORMANCE VALUES OF CHIPS, COMPUTING SYSTEM...

METHOD AND MEASUREMENT APPLICATION SYSTEM CONFIGURATION SYSTEM

MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION

METHOD AND APPARATUS FOR DETERMINING AND INFORMATION ABOUT CHARACTE...

SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A...

TEMPERATURE ANALYSIS

APPARATUSES AND METHODS FOR TESTING SEMICONDUCTOR CIRCUITRY USING M...

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USI...

APPARATUS AND METHOD FOR CONDENSATION PREVENTION FOR 2-PHASE COOLIN...

METHOD OF OPTIMIZING CABLING OF AT LEAST ONE DEVICE UNDER TEST AND...

Computer-Implemented Method for Determining a Quality State of a Wafer

TEST METHOD AND TEST DEVICE FOR IDENTIFYING CRITICAL POINTS OF A CI...

Method and System of Developing and Executing Test Program for Veri...

SOURCE MEASUREMENT UNIT WITH RESISTOR-CAPACITOR CHARGING CIRCUIT

STATE TRANSITION CONTROL FOR PARAMETRIC MEASUREMENT UNIT

CALIBRATION FOR ROUTING RESISTANCE INDUCED ERROR

TUNABLE TRANSCONDUCTOR

SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS

Systems and Methods for Adjusting Input-Output Impedance for I/O In...

CENTRALIZED CONTROL OF AN AUTOMATED TEST EQUIPMENT SYSTEM USING COM...

Integrated Circuit Yield Improvement

MASS-INTERCONNECT ENGAGING DEVICE

DIAGNOSIS OF MOBILE DEVICES USING BUILT-IN ACTUATORS AND SENSORS

LOW POWER ARCHITECTURE FOR CHIPLETS

Detection Method For Wiring Relationship Of Electrical Components

MULTI-CORE TEST PROCESSOR, AND INTEGRATED CIRCUIT TEST SYSTEM AND M...

METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...

CONTROLLED SWITCHING OF STRESS VOLTAGES IN LATERAL DMOS STRUCTURES