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Automated test systems [ATE]; using microprocessors or computers
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CPC
G01R31/2834
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2834
Automated test systems [ATE]; using microprocessors or computers
Industries
Overview
Organizations
People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automated functional testing systems and methods of making and usin...
Patent number
11,982,597
Issue date
May 14, 2024
Myung Ki Kim
G01 - MEASURING TESTING
Information
Patent Grant
Pull out-assisting linkage device for test load board of automatic...
Patent number
11,977,111
Issue date
May 7, 2024
Zhijie Bao
G01 - MEASURING TESTING
Information
Patent Grant
Mass-interconnect engaging device
Patent number
11,971,430
Issue date
Apr 30, 2024
Jeffery P. Stowers
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for testing functionality and performance of a...
Patent number
11,953,544
Issue date
Apr 9, 2024
THE ADT SECURITY CORPORATION
Jeron E. Bornstein
G01 - MEASURING TESTING
Information
Patent Grant
Remote control device testing environment
Patent number
11,953,554
Issue date
Apr 9, 2024
CSC Holdings, LLC
Heitor J. Almeida
G08 - SIGNALLING
Information
Patent Grant
Diagnosis of mobile devices using built-in actuators and sensors
Patent number
11,946,968
Issue date
Apr 2, 2024
BLANCCO TECHNOLOGY GROUP IP OY
Timo Sairiala
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Output voltage glitch reduction in ate systems
Patent number
11,940,496
Issue date
Mar 26, 2024
Analog Devices, Inc.
Michael E. Harrell
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit yield improvement
Patent number
11,923,807
Issue date
Mar 5, 2024
pSemi Corporation
Parvez H. Daruwalla
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Automated test equipment comprising a device under test loopback an...
Patent number
11,913,987
Issue date
Feb 27, 2024
Advantest Corporation
Andreas Hantsch
G01 - MEASURING TESTING
Information
Patent Grant
Communicating using contactless coupling
Patent number
11,899,056
Issue date
Feb 13, 2024
Teradyne, Inc.
Tushar K. Gohel
G01 - MEASURING TESTING
Information
Patent Grant
Automated test equipment for testing one or more devices-under-test...
Patent number
11,899,059
Issue date
Feb 13, 2024
Advantest Corporation
Marc Mössinger
G01 - MEASURING TESTING
Information
Patent Grant
Automated test equipment for testing one or more devices-under-test...
Patent number
11,899,058
Issue date
Feb 13, 2024
Advantest Corporation
Marc Mössinger
G01 - MEASURING TESTING
Information
Patent Grant
Detection of an aged circuit
Patent number
11,879,932
Issue date
Jan 23, 2024
International Business Machines Corporation
Franco Stellari
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test method for control chip and related device
Patent number
11,867,758
Issue date
Jan 9, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Chuanqi Shi
G11 - INFORMATION STORAGE
Information
Patent Grant
Eye diagram capture test during production
Patent number
11,828,787
Issue date
Nov 28, 2023
Advantest Corporation
Justin Treon
G01 - MEASURING TESTING
Information
Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
Patent number
11,821,913
Issue date
Nov 21, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Bi-directional coupler with termination point for a test point
Patent number
11,802,903
Issue date
Oct 31, 2023
ARRIS Enterprises LLC
Zhijian Sun
G01 - MEASURING TESTING
Information
Patent Grant
Stacker of electronic component test handler, and electronic compon...
Patent number
11,802,907
Issue date
Oct 31, 2023
ATECO INC.
Taek Seon Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated functional testing systems and methods of making and usin...
Patent number
11,796,423
Issue date
Oct 24, 2023
Myung Ki Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Parameter space reduction for device testing
Patent number
11,789,074
Issue date
Oct 17, 2023
National Instruments Corporation
James C. Nagle
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test arrangement for testing high-frequency components, particularl...
Patent number
11,782,072
Issue date
Oct 10, 2023
Advantest Corporation
José Moreira
G01 - MEASURING TESTING
Information
Patent Grant
Method for assembling or repairing a connectorized electrical equip...
Patent number
11,776,422
Issue date
Oct 3, 2023
ZIOTA TECHNOLOGY INC.
Alain Lussier
G01 - MEASURING TESTING
Information
Patent Grant
Decoupled load generation architecture
Patent number
11,720,089
Issue date
Aug 8, 2023
Amazon Technologies, Inc.
Carlos A. Arguelles
G01 - MEASURING TESTING
Information
Patent Grant
Automated functional testing systems and methods of making and usin...
Patent number
11,709,114
Issue date
Jul 25, 2023
Myung Ki Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for ground fault detection
Patent number
11,703,549
Issue date
Jul 18, 2023
Northrop Grumman Systems Corporation
Sunny Bagga
G01 - MEASURING TESTING
Information
Patent Grant
Method and non-transitory computer-readable medium for performing m...
Patent number
11,686,761
Issue date
Jun 27, 2023
NANYA TECHNOLOGY CORPORATION
Chien-Hwa Su
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for circuit failure protection
Patent number
11,686,757
Issue date
Jun 27, 2023
Hamilton Sundstrand Corporation
Kamaraj Thangavelu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method of testing single DUT through multiple cores in p...
Patent number
11,686,768
Issue date
Jun 27, 2023
Test Research, Inc.
Ching-Chih Lin
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of testing electronic components
Patent number
11,656,270
Issue date
May 23, 2023
ASE TEST, INC.
Chun-Hung Sun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inductance control system
Patent number
11,651,910
Issue date
May 16, 2023
Teradyne, Inc.
Frank Parrish
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Scan Tree Construction
Publication number
20240151771
Publication date
May 9, 2024
TSINGHUA UNIVERSITY
Can Xiang
G01 - MEASURING TESTING
Information
Patent Application
RF TESTING METHOD AND TESTING SYSTEM
Publication number
20240125849
Publication date
Apr 18, 2024
MEDIATEK INC.
Jung-Yin CHIEN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DISTRIBUTED TEST PATTERN GENERATION AND SYNCHRONIZATION
Publication number
20240110973
Publication date
Apr 4, 2024
Synopsys, Inc.
Peter Wohl
G01 - MEASURING TESTING
Information
Patent Application
MASS-INTERCONNECT ENGAGING DEVICE
Publication number
20240077517
Publication date
Mar 7, 2024
Leyo, LLC
Jeffery P. Stowers
G01 - MEASURING TESTING
Information
Patent Application
TEST BOARD AND TEST METHOD FOR SEMICONDUCTOR DEVICE USING THE SAME
Publication number
20240077535
Publication date
Mar 7, 2024
Samsung Electronics Co., Ltd.
Soonil KWON
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...
Publication number
20240061034
Publication date
Feb 22, 2024
Advantest Corporation
Andreas Hantsch
G01 - MEASURING TESTING
Information
Patent Application
Method and Equipment for Monitoring a Failure in a High-Voltage Cir...
Publication number
20240042863
Publication date
Feb 8, 2024
Christian ALLGAEUER
B60 - VEHICLES IN GENERAL
Information
Patent Application
WAFER TESTER AND WAFER TESTING METHOD AND SYSTEM
Publication number
20240027518
Publication date
Jan 25, 2024
NANYA TECHNOLOGY CORPORATION
Ching-Chung WANG
G01 - MEASURING TESTING
Information
Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
Publication number
20240027492
Publication date
Jan 25, 2024
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ASSEMBLING OR REPAIRING A CONNECTORIZED ELECTRICAL EQUIP...
Publication number
20240029581
Publication date
Jan 25, 2024
ZIOTA TECHNOLOGY INC.
Alain LUSSIER
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Automatic Selection of Connecting Cables for In-line Test
Publication number
20240019484
Publication date
Jan 18, 2024
SoftIron Limited
Kevin Peters
G01 - MEASURING TESTING
Information
Patent Application
COST-SAVING SCHEME FOR SCAN TESTING OF 3D STACK DIE
Publication number
20240019493
Publication date
Jan 18, 2024
ADVANCED MICRO DEVICES, INC.
SongGan Zang
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC TEST SYSTEM AND AUTOMATIC TEST METHOD FOR INTEGRATED-CIRC...
Publication number
20240003963
Publication date
Jan 4, 2024
KINGSTON DIGITAL, INC.
Chao-Kun LEE
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TEST APPARATUS USING FPGA AND MEMORY CONTROL METHOD F...
Publication number
20240003964
Publication date
Jan 4, 2024
YIK Corporation
Wan Soon PARK
G01 - MEASURING TESTING
Information
Patent Application
ERGONOMIC LOADING FOR A TEST INTERFACE BOARD (TIB) / BURN-IN-BOARD...
Publication number
20230393190
Publication date
Dec 7, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
CONTROL OF AN AUTOMATED TEST EQUIPMENT BASED ON TEMPERATURE
Publication number
20230384361
Publication date
Nov 30, 2023
Advantest Corporation
Jens EDELMANN
G01 - MEASURING TESTING
Information
Patent Application
DEVICE UNDER TEST SIMULATION EQUIPMENT
Publication number
20230366922
Publication date
Nov 16, 2023
Teradyne (Asia) Pte. Ltd.
Min Nie
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT FOR CONTROLLING CALIBRATION, ELECTRONIC DEVICE, AND METHOD...
Publication number
20230349973
Publication date
Nov 2, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
Kai TIAN
G01 - MEASURING TESTING
Information
Patent Application
MITIGATING AN INFLUENCE OF A MISMATCH LOSS IN A MEASUREMENT SETUP
Publication number
20230324453
Publication date
Oct 12, 2023
Advantest Corporation
Matthias BURCZYK
G01 - MEASURING TESTING
Information
Patent Application
TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING...
Publication number
20230314498
Publication date
Oct 5, 2023
Tektronix, Inc.
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
Publication number
20230296481
Publication date
Sep 21, 2023
Myung Ki KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMMUNICATING USING CONTACTLESS COUPLING
Publication number
20230280393
Publication date
Sep 7, 2023
Teradyne, Inc.
Tushar K. Gohel
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...
Publication number
20230280394
Publication date
Sep 7, 2023
Advantest Corporation
Matthias WERNER
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...
Publication number
20230266380
Publication date
Aug 24, 2023
Advantest Corporation
Matthias WERNER
G01 - MEASURING TESTING
Information
Patent Application
DECOMPRESSION CIRCUIT, CIRCUIT GENERATION METHOD, AND IC CHIP
Publication number
20230258717
Publication date
Aug 17, 2023
Huawei Technologies Co., Ltd
Yu HUANG
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TESTING AN ELECTRONIC CIRCUIT HAVING A VOLTAGE MONITOR CIRCUIT
Publication number
20230228806
Publication date
Jul 20, 2023
STMicroelectronics S.r.l.
Nicola DE CAMPO
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE...
Publication number
20230228805
Publication date
Jul 20, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
VECTOR NETWORK ANALYZER WITH DIGITAL INTERFACE
Publication number
20230213564
Publication date
Jul 6, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Steffen HEUEL
G01 - MEASURING TESTING
Information
Patent Application
SCAN CHAIN DESIGNING AND CIRCUIT TESTING METHOD
Publication number
20230213575
Publication date
Jul 6, 2023
REALTEK SEMICONDUCTOR CORPORATION
SHIOU WEN WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR TESTING AN INTEGRATED CIRCUIT
Publication number
20230194598
Publication date
Jun 22, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chi-Che WU
G01 - MEASURING TESTING