for sequential circuits

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CPC
G01R31/318392

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/318392for sequential circuits

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Patents Grantslast 30 patents

Information Patent Grant
One-shot circuit
- Patent number 10,996,272
- Issue date May 4, 2021
- Teradyne, Inc.
- Jan Paul Antonie van der Wagt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and device for testing a chain of flip-flops
- Patent number 10,684,326
- Issue date Jun 16, 2020
- STMicroelectronics (Crolles 2) SAS
- Sylvain Clerc
- G01 - MEASURING TESTING
Information Patent Grant
Sequential circuit, scan chain circuit including the same and integ...
- Patent number 10,422,832
- Issue date Sep 24, 2019
- Samsung Electronics Co., Ltd.
- Taiki Uemura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to force equivalent outputs at start-up for re...
- Patent number 10,162,914
- Issue date Dec 25, 2018
- Apple Inc.
- Harsha Krishnamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor chip, test system, and method of testing the semicond...
- Patent number 10,132,865
- Issue date Nov 20, 2018
- Samsung Electronics Co., Ltd.
- Seon-kyoo Lee
- G01 - MEASURING TESTING
Information Patent Grant
Methods for generating test patterns for sequential circuits
- Patent number 8,156,395
- Issue date Apr 10, 2012
- Yardstick Research, L.L.C.
- Delmas R. Buckley, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Single-pass, concurrent-validation methods for generating test patt...
- Patent number 7,958,421
- Issue date Jun 7, 2011
- Yardstick Research, L.L.C.
- Delmas R. Buckley, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device, diagnostic method, program, and recording medium
- Patent number 7,913,144
- Issue date Mar 22, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting a malfunction in a state machine
- Patent number 7,620,868
- Issue date Nov 17, 2009
- STMicroelectronics S.A.
- Francois Tailliet
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus
- Patent number 7,188,287
- Issue date Mar 6, 2007
- Matsushita Electric Industrial Co., Ltd.
- Genichiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error detection in dynamic logic circuits
- Patent number 6,954,912
- Issue date Oct 11, 2005
- Fujitsu Limited
- Pranjal Srivastava
- G01 - MEASURING TESTING
Information Patent Grant
One-chip microcomputer and control method thereof as well as an IC...
- Patent number 6,934,884
- Issue date Aug 23, 2005
- Sharp Kabushiki Kaisha
- Masaki Wakabayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test pattern generation for functional register transfer...
- Patent number 6,823,486
- Issue date Nov 23, 2004
- Fujitsu Limited
- Indradeep Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
Sequential test pattern generation using combinational techniques
- Patent number 6,728,917
- Issue date Apr 27, 2004
- Agere Systems Inc.
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability, test sequence generation method a...
- Patent number 6,651,206
- Issue date Nov 18, 2003
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating test pattern for semiconductor integrated circ...
- Patent number 6,427,218
- Issue date Jul 30, 2002
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Verification of sequential circuits with same state encoding
- Patent number 6,408,424
- Issue date Jun 18, 2002
- Fujitsu Limited
- Rajarshi Mukherjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault diagnosis method and system for a sequential circuit
- Patent number 6,397,362
- Issue date May 28, 2002
- NEC Corporation
- Toshio Ishiyama
- G01 - MEASURING TESTING
Information Patent Grant
On-line partitioning for sequential circuit test generation
- Patent number 6,378,096
- Issue date Apr 23, 2002
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Testable integrated circuit, integrated circuit design-for-testabil...
- Patent number 6,334,200
- Issue date Dec 25, 2001
- Semiconductor Technology Academic Research Center
- Hideo Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability and method of test sequence genera...
- Patent number 6,292,915
- Issue date Sep 18, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability test sequence generation method an...
- Patent number 6,253,343
- Issue date Jun 26, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Vector restoration using accelerated validation and refinement
- Patent number 6,223,316
- Issue date Apr 24, 2001
- NEC USA, Inc.
- Surendra K. Bommu
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically generating behavioral environment for mode...
- Patent number 6,074,426
- Issue date Jun 13, 2000
- Interantional Business Machines Corporation
- Jason Raymond Baumgartner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pipeline circuit with a test circuit with small circuit scale and a...
- Patent number 6,073,265
- Issue date Jun 6, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Michio Komoda
- G01 - MEASURING TESTING
Information Patent Grant
Partitioning and reordering methods for static test sequence compac...
- Patent number 5,983,381
- Issue date Nov 9, 1999
- NEC USA Inc.
- Srimat Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Estimation of failure section region with small simulation calculat...
- Patent number 5,968,195
- Issue date Oct 19, 1999
- NEC Corporation
- Toshio Ishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing and for generating a mapping for an electronic d...
- Patent number 5,943,485
- Issue date Aug 24, 1999
- Motorola, Inc.
- Gabriel Bracha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatically determining test patterns for a netlist having multip...
- Patent number 5,938,785
- Issue date Aug 17, 1999
- VLSI Technology, Inc.
- Alain Dargelas
- G01 - MEASURING TESTING
Information Patent Grant
Automatic generation of test vectors for sequential circuits
- Patent number 5,910,958
- Issue date Jun 8, 1999
- VLSI Technology, Inc.
- Christian Y. Jay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEQUENTIAL CIRCUIT, SCAN CHAIN CIRCUIT INCLUDING THE SAME AND INTEG...
- Publication number 20180088176
- Publication date Mar 29, 2018
- Samsung Electronics Co., Ltd.
- Taiki UEMURA
- G01 - MEASURING TESTING
Information Patent Application
One-Shot Circuit
- Publication number 20160065183
- Publication date Mar 3, 2016
- Teradyne, Inc.
- Jan Paul Antonie van der Wagt
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20100064191
- Publication date Mar 11, 2010
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR GENERATING TEST PATTERNS FOR SEQUENTIAL CIRCUITS
- Publication number 20100023824
- Publication date Jan 28, 2010
- Delmas R. Buckley, JR.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Single-pass, concurrent-validation methods for generating test patt...
- Publication number 20090049354
- Publication date Feb 19, 2009
- Yardstick Research, LLC
- Delmas R. Buckley, JR.
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING A MALFUNCTION IN A STATE MACHINE
- Publication number 20070204191
- Publication date Aug 30, 2007
- STMicroelectronics S.A.
- Francois Tailliet
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor apparatus
- Publication number 20040216021
- Publication date Oct 28, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Genichiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Error detection in dynamic logic circuits
- Publication number 20030217307
- Publication date Nov 20, 2003
- Pranjal Srivastava
- G01 - MEASURING TESTING
Information Patent Application
Sequential test pattern generation using combinational techniques
- Publication number 20020112209
- Publication date Aug 15, 2002
- Miron Abramovici
- G01 - MEASURING TESTING
Information Patent Application
Automatic test pattern generation for functional register transfer...
- Publication number 20020032889
- Publication date Mar 14, 2002
- Indradeep Ghosh
- G01 - MEASURING TESTING
Information Patent Application
Method of design for testability, test sequence generation method a...
- Publication number 20020026611
- Publication date Feb 28, 2002
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
Method of generating test pattern for semiconductor integrated circ...
- Publication number 20020013921
- Publication date Jan 31, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Sadami Takeoka
- G01 - MEASURING TESTING

for sequential circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

One-shot circuit

Method and device for testing a chain of flip-flops

Sequential circuit, scan chain circuit including the same and integ...

Apparatus and method to force equivalent outputs at start-up for re...

Semiconductor chip, test system, and method of testing the semicond...

Methods for generating test patterns for sequential circuits

Single-pass, concurrent-validation methods for generating test patt...

Diagnostic device, diagnostic method, program, and recording medium

Method for detecting a malfunction in a state machine

Semiconductor apparatus

Error detection in dynamic logic circuits

One-chip microcomputer and control method thereof as well as an IC...

Automatic test pattern generation for functional register transfer...

Sequential test pattern generation using combinational techniques

Method of design for testability, test sequence generation method a...

Method of generating test pattern for semiconductor integrated circ...

Verification of sequential circuits with same state encoding

Fault diagnosis method and system for a sequential circuit

On-line partitioning for sequential circuit test generation

Testable integrated circuit, integrated circuit design-for-testabil...

Method of design for testability and method of test sequence genera...

Method of design for testability test sequence generation method an...

Vector restoration using accelerated validation and refinement

Method for automatically generating behavioral environment for mode...

Pipeline circuit with a test circuit with small circuit scale and a...

Partitioning and reordering methods for static test sequence compac...

Estimation of failure section region with small simulation calculat...

Method for testing and for generating a mapping for an electronic d...

Automatically determining test patterns for a netlist having multip...

Automatic generation of test vectors for sequential circuits

Patents Applicationslast 30 patents

SEQUENTIAL CIRCUIT, SCAN CHAIN CIRCUIT INCLUDING THE SAME AND INTEG...

One-Shot Circuit

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM

METHODS FOR GENERATING TEST PATTERNS FOR SEQUENTIAL CIRCUITS

Single-pass, concurrent-validation methods for generating test patt...

METHOD FOR DETECTING A MALFUNCTION IN A STATE MACHINE

Semiconductor apparatus

Error detection in dynamic logic circuits

Sequential test pattern generation using combinational techniques

Automatic test pattern generation for functional register transfer...

Method of design for testability, test sequence generation method a...

Method of generating test pattern for semiconductor integrated circ...