Membership
Tour
Register
Log in
manipulator for positioning a part
Follow
Industry
CPC
G01N2223/321
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/321
manipulator for positioning a part
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Imaging environment testing fixture and methods thereof
Patent number
12,222,302
Issue date
Feb 11, 2025
SAEC/Kinetic Vision, Inc.
James Anthony Topich
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
Patent number
12,078,604
Issue date
Sep 3, 2024
BRUKER TECHNOLOGIES LTD.
Alexander Krokhmal
G01 - MEASURING TESTING
Information
Patent Grant
Medical x-ray imaging systems and methods
Patent number
11,986,327
Issue date
May 21, 2024
MOBIUS IMAGING, LLC
Eugene A. Gregerson
G01 - MEASURING TESTING
Information
Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
Patent number
11,933,746
Issue date
Mar 19, 2024
Paul Scherrer Institut
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
Patent number
11,774,380
Issue date
Oct 3, 2023
Sichuan University
Yuanjun Xu
G01 - MEASURING TESTING
Information
Patent Grant
Imaging environment testing fixture and methods thereof
Patent number
11,733,181
Issue date
Aug 22, 2023
SAEC/Kinetic Vision, Inc.
James Anthony Topich
G01 - MEASURING TESTING
Information
Patent Grant
Inline x-ray measurement apparatus and method
Patent number
11,714,054
Issue date
Aug 1, 2023
Illinois Tool Works Inc.
Mark B. Kirschenman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device, inspection method, and method for producing obje...
Patent number
11,639,904
Issue date
May 2, 2023
Nikon Corporation
Takeshi Ohbayashi
G01 - MEASURING TESTING
Information
Patent Grant
Device for adjusting and exchanging beamstops
Patent number
11,307,155
Issue date
Apr 19, 2022
Wolfgang Gehrlein
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Medical x-ray imaging systems and methods
Patent number
11,197,643
Issue date
Dec 14, 2021
MOBIUS IMAGING, LLC
Eugene A. Gregerson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
Patent number
11,152,130
Issue date
Oct 19, 2021
Massachusetts Institute of Technology
Akintunde I. Akinwande
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray imaging system
Patent number
11,150,202
Issue date
Oct 19, 2021
Konica Minolta, Inc.
Yasunori Tsuboi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device and computer program
Patent number
11,125,703
Issue date
Sep 21, 2021
Horiba, Ltd.
Azusa Taroura
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for analyzing core using X-Ray fluorescence
Patent number
11,110,844
Issue date
Sep 7, 2021
BLY IP INC.
Peter Kanck
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Mobile radiographic imaging apparatus having counterbalanced slewab...
Patent number
11,103,202
Issue date
Aug 31, 2021
MICRO-X LIMITED
Peter Rowland
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Vacuum chuck for clamping workpieces, measuring devices and method...
Patent number
11,062,934
Issue date
Jul 13, 2021
Helmut Fischer GmbH Institut für Elektronik und Messtechnik
Werner Volz
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid inspection system
Patent number
10,983,073
Issue date
Apr 20, 2021
Rigaku Corporation
Kiyoshi Ogata
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
Patent number
10,800,315
Issue date
Oct 13, 2020
BLY IP INC.
Peter Kanck
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Inline x-ray measurement apparatus and method
Patent number
10,803,574
Issue date
Oct 13, 2020
Illinois Tool Works Inc.
Mark B. Kirschenman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Robotic arm with X-ray source
Patent number
10,743,827
Issue date
Aug 18, 2020
General Electric Company
G. S. Sampath Kumar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for scanning palletized cargo
Patent number
10,724,973
Issue date
Jul 28, 2020
IDSS Holdings, Inc.
Joseph S. Paresi
G01 - MEASURING TESTING
Information
Patent Grant
Vacuum chuck for clamping workpieces, measuring devices and method...
Patent number
10,707,112
Issue date
Jul 7, 2020
Helmut Fischer GmbH Institut für Elektronik und Messtechnik
Werner Volz
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
X-ray analysis of drilling fluid
Patent number
10,564,115
Issue date
Feb 18, 2020
Malvern Panalytical B.V.
Mark Alexander Pals
G01 - MEASURING TESTING
Information
Patent Grant
Medical image diagnostic apparatus
Patent number
10,537,296
Issue date
Jan 21, 2020
Canon Medical Systems Corporation
Takuya Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Analysis with preliminary survey
Patent number
10,527,563
Issue date
Jan 7, 2020
Oxford Instruments Nanotechnology Tools Limited
Christian Lang
G01 - MEASURING TESTING
Information
Patent Grant
X-ray imaging method and apparatus using positioning assemblies hav...
Patent number
10,070,835
Issue date
Sep 11, 2018
General Electric Company
Laurence Vancamberg
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Shifting turn table for x-ray imaging manipulator
Patent number
10,031,091
Issue date
Jul 24, 2018
Avonix Imaging, LLC
Jeffrey Diehm
G01 - MEASURING TESTING
Information
Patent Grant
Device for spatially orienting an X-ray optical unit and apparatus...
Patent number
9,971,121
Issue date
May 15, 2018
Bruker Nano GmbH
Thomas Baumann
G02 - OPTICS
Information
Patent Grant
X-ray device
Patent number
9,820,707
Issue date
Nov 21, 2017
Siemens Aktiengesellschaft
Michael Atzinger
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...
Publication number
20240410838
Publication date
Dec 12, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
Publication number
20240410837
Publication date
Dec 12, 2024
Nuctech Company Limited
Qingping HUANG
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYZER
Publication number
20240402101
Publication date
Dec 5, 2024
Shimadzu Corporation
Tetsuya YONEDA
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
Publication number
20240286541
Publication date
Aug 29, 2024
Veracio Ltd
Peter Kanck
B60 - VEHICLES IN GENERAL
Information
Patent Application
RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
Publication number
20240288385
Publication date
Aug 29, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Imaging Apparatus and Subject Holding Mechanism
Publication number
20240230559
Publication date
Jul 11, 2024
Shimadzu Corporation
Masashi HAYAKAWA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
Publication number
20240219323
Publication date
Jul 4, 2024
SMITHS DETECTION GERMANY GMBH
Philipp FISCHER
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT
Publication number
20240210333
Publication date
Jun 27, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...
Publication number
20240151660
Publication date
May 9, 2024
Diagnostic Instruments, Inc.
Philip T. Merlo
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
Publication number
20240151661
Publication date
May 9, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF
Publication number
20230333030
Publication date
Oct 19, 2023
SAEC/Kinetic Vision, Inc.
James Anthony Topich
G01 - MEASURING TESTING
Information
Patent Application
Multi-fraction sample holder for 3D particle analysis
Publication number
20230146198
Publication date
May 11, 2023
Carl Zeiss X-ray Microscopy, Inc.
Matthew Andrew
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND MEASURING DEVICE FOR MEASURING OBJECTS BY MEANS OF X-RAY...
Publication number
20230127587
Publication date
Apr 27, 2023
Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
Martin Leibfritz
G01 - MEASURING TESTING
Information
Patent Application
Medical X-Ray Imaging Systems And Methods
Publication number
20220061780
Publication date
Mar 3, 2022
Mobius Imaging, LLC
Eugene A. Gregerson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
Publication number
20210354616
Publication date
Nov 18, 2021
BLY IP INC.
PETER KANCH
B60 - VEHICLES IN GENERAL
Information
Patent Application
INLINE X-RAY MEASUREMENT APPARATUS AND METHOD
Publication number
20200408705
Publication date
Dec 31, 2020
Illinois Tool Works Inc.
Mark B. Kirschenman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR PRODUCING OBJE...
Publication number
20200300784
Publication date
Sep 24, 2020
Nikon Corporation
Takeshi OHBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR ANALYZING CORE USING X-RAY FLUORESCENCE
Publication number
20200070711
Publication date
Mar 5, 2020
BLY IP INC.
PETER KANCK
B60 - VEHICLES IN GENERAL
Information
Patent Application
SYSTEMS AND METHODS FOR ANALYZING CORE USING X-RAY FLUORESCENCE
Publication number
20190351804
Publication date
Nov 21, 2019
BLY IP INC.
PETER KANCK
B60 - VEHICLES IN GENERAL
Information
Patent Application
RADIATION DETECTION DEVICE AND COMPUTER PROGRAM
Publication number
20190331618
Publication date
Oct 31, 2019
HORIBA, LTD.
Azusa TAROURA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGING SYSTEM
Publication number
20190317027
Publication date
Oct 17, 2019
Konica Minolta, Inc.
Yasunori TSUBOI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HYBRID INSPECTION SYSTEM
Publication number
20190227006
Publication date
Jul 25, 2019
Rigaku Corporation
Kiyoshi Ogata
G01 - MEASURING TESTING
Information
Patent Application
IMPROVED ANALYSIS WITH PRELIMINARY SURVEY
Publication number
20190187079
Publication date
Jun 20, 2019
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Christian Lang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEDICAL IMAGE DIAGNOSTIC APPARATUS
Publication number
20180242937
Publication date
Aug 30, 2018
Canon Medical Systems Corporation
Takuya HASEGAWA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SHIFTING TURN TABLE FOR X-RAY IMAGING MANIPULATOR
Publication number
20180031495
Publication date
Feb 1, 2018
Avonix Imaging, LLC
Jeffrey Diehm
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20120112068
Publication date
May 10, 2012
Shusaku Maeda
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR MATERIALS TESTING OF TEST OBJECTS USING X-RAYS
Publication number
20120045033
Publication date
Feb 23, 2012
Ingo Stuke
G01 - MEASURING TESTING
Information
Patent Application
Method and Gripping Device For Automatically Transferring a Sample...
Publication number
20100318217
Publication date
Dec 16, 2010
Jean-Luc Ferrer
G01 - MEASURING TESTING