Nano-tube tips

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G01Q70/12

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00

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G01Q70/12Nano-tube tips

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,577,286
- Issue date Feb 14, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Nanoscale scanning electrochemical microscopy electrode method
- Patent number 11,543,429
- Issue date Jan 3, 2023
- Morgan State University
- Birol Ozturk
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,391,664
- Issue date Jul 19, 2022
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Method, atomic force microscopy system and computer program product
- Patent number 11,289,367
- Issue date Mar 29, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,040,379
- Issue date Jun 22, 2021
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 11,002,758
- Issue date May 11, 2021
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,877,065
- Issue date Dec 29, 2020
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy based on nanowire tips for high aspect rati...
- Patent number 10,840,092
- Issue date Nov 17, 2020
- Tito Busani
- G01 - MEASURING TESTING
Information Patent Grant
Conical nano-carbon material functionalized needle tip and preparat...
- Patent number 10,823,758
- Issue date Nov 3, 2020
- National Center for Nanoscience and Technology
- Jianxun Xu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Cantilever and manufacturing method for cantilever
- Patent number 10,545,172
- Issue date Jan 28, 2020
- National University Corporation Nagoya Institute of Technology
- Masaki Tanemura
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Near field scanning probe microscope, probe for scanning probe micr...
- Patent number 10,429,411
- Issue date Oct 1, 2019
- Hitachi, Ltd.
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Debris removal in high aspect structures
- Patent number 10,384,238
- Issue date Aug 20, 2019
- Rave LLC
- Tod Evan Robinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Debris removal from high aspect structures
- Patent number 10,330,581
- Issue date Jun 25, 2019
- Rave LLC
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Contactor devices with carbon nanotube probes embedded in a flexibl...
- Patent number 10,266,402
- Issue date Apr 23, 2019
- FormFactor, Inc.
- Onnik Yaglioglu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for a scanning type probe microscope
- Patent number 10,203,354
- Issue date Feb 12, 2019
- National University Corporation Nagoya Institute of Technology
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Carbon nanotube probes and structures and methods of measurement
- Patent number 10,191,082
- Issue date Jan 29, 2019
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope integrated with a multiple degrees-of-freed...
- Patent number 9,645,144
- Issue date May 9, 2017
- BOGAZICI ÜNIVERSITESI
- Hamdi Torun
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating nano-scale structures and nano-scale structur...
- Patent number 9,522,821
- Issue date Dec 20, 2016
- Bo Cui
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of making and assembling capsulated nanostructures
- Patent number 9,494,615
- Issue date Nov 15, 2016
- Massachusetts Institute of Technology
- Sang-Gook Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electrochemically-grown nanowires and uses thereof
- Patent number 9,267,964
- Issue date Feb 23, 2016
- Kansas State University Research Foundation
- Bret Flanders
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for the collective fabrication of carbon nanofibers on the s...
- Patent number 9,222,959
- Issue date Dec 29, 2015
- Commissariat a l'Engergie Atomique
- Louis Gorintin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and measurement method using same
- Patent number 9,063,168
- Issue date Jun 23, 2015
- Hitachi, Ltd.
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Telescopic nanotube device for hot nanolithography
- Patent number 8,920,700
- Issue date Dec 30, 2014
- University of South Florida
- Adrian Popescu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanned probe microscopy (SPM) probe having angled tip
- Patent number 8,893,310
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Mark C. Reuter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Carbon nanotube based micro-tip structure and method for making the...
- Patent number 8,821,675
- Issue date Sep 2, 2014
- Tsinghua University
- Yang Wei
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing a one-dimensional nano-structure-based device
- Patent number 8,795,495
- Issue date Aug 5, 2014
- Tsinghua University
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for manufacturing a one-dimensional nano-structure-based device
- Patent number 8,795,496
- Issue date Aug 5, 2014
- Tsinghua University
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for manufacturing a one-dimensional nano-structure-based device
- Patent number 8,758,588
- Issue date Jun 24, 2014
- Tsinghua University
- Yang Wei
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20240402216
- Publication date Dec 5, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
A Method of Manufacturing a MEMS Device
- Publication number 20230416080
- Publication date Dec 28, 2023
- Cytosurge AG
- Edin SARAJLIC
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE (SPM) TIP
- Publication number 20230204625
- Publication date Jun 29, 2023
- NEXT-TIP, S.L.
- Belén SANZ SANZ
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE
- Publication number 20220357360
- Publication date Nov 10, 2022
- ACTOPROBE LLC
- ALEXANDER A. UKHANOV
- G01 - MEASURING TESTING
Information Patent Application
CARBON NANOMATERIAL FUNCTIONALIZED NEEDLE TIP MODIFIED WITH LOW WOR...
- Publication number 20220308087
- Publication date Sep 29, 2022
- National Center for Nanoscience and Technology
- Jianxun XU
- G01 - MEASURING TESTING
Information Patent Application
RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...
- Publication number 20210263069
- Publication date Aug 26, 2021
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- B82 - NANO-TECHNOLOGY
Information Patent Application
NANOSCALE SCANNING ELECTROCHEMICAL MICROSCOPY ELECTRODE METHOD
- Publication number 20200341029
- Publication date Oct 29, 2020
- MORGAN STATE UNIVERSITY
- Birol Ozturk
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT
- Publication number 20200227311
- Publication date Jul 16, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Violeta Navarro Paredes
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY BASED ON NANOWIRE TIPS FOR HIGH ASPECT RATI...
- Publication number 20200185219
- Publication date Jun 11, 2020
- STC.UNM
- Tito Busani
- G01 - MEASURING TESTING
Information Patent Application
Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...
- Publication number 20190346480
- Publication date Nov 14, 2019
- Hitachi, Ltd
- Kaifeng ZHANG
- C01 - INORGANIC CHEMISTRY
Information Patent Application
TAPERED NANO-CARBON MATERIAL FUNCTIONALIZED NEEDLE TIP AND PREPARAT...
- Publication number 20190107556
- Publication date Apr 11, 2019
- National Center for Nanoscience and Technology
- Jianxun Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER AND MANUFACTURING METHOD FOR CANTILEVER
- Publication number 20190018042
- Publication date Jan 17, 2019
- National University Corporation Nagoya Institute of Technology
- Masaki TANEMURA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
ATOMIC FORCE MICROSCOPE INTEGRATED WITH A MULTIPLE DEGREES-OF-FREED...
- Publication number 20160266107
- Publication date Sep 15, 2016
- BOGAZICI UNIVERSITESI
- Hamdi TORUN
- G01 - MEASURING TESTING
Information Patent Application
NANO ELECTRODE AND MANUFACTURING METHOD THEREOF
- Publication number 20140262433
- Publication date Sep 18, 2014
- Geunbae Lim
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTROCHEMICALLY-GROWN NANOWIRES AND USES THEREOF
- Publication number 20140173786
- Publication date Jun 19, 2014
- Kansas State University Research Foundation
- Bret Flanders
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope and Measurement Method Using Same
- Publication number 20140165237
- Publication date Jun 12, 2014
- Hitachi, Ltd.
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanned Probe Microscopy (SPM) Probe Having Angled Tip
- Publication number 20140007308
- Publication date Jan 2, 2014
- Cornell University
- Mark C. Reuter
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMIONIC EMISSION DEVICE
- Publication number 20130342106
- Publication date Dec 26, 2013
- HON HAI Precision Industry CO., LTD.
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Application
CARBON NANOTUBE BASED MICRO-TIP STRUCTURE AND METHOD FOR MAKING THE...
- Publication number 20130220534
- Publication date Aug 29, 2013
- HON HAI Precision Industry CO., LTD.
- YANG WEI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPE PROBE
- Publication number 20130227749
- Publication date Aug 29, 2013
- HON HAI Precision Industry CO., LTD.
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROBE HAVING NANO-FINGERS
- Publication number 20130094020
- Publication date Apr 18, 2013
- Zhiyong Li
- B82 - NANO-TECHNOLOGY
Information Patent Application
PRODUCTION SCALE FABRICATION METHOD FOR HIGH RESOLUTION AFM TIPS
- Publication number 20130019351
- Publication date Jan 17, 2013
- KING ABDULAZIZ CITY FOR SCIENCE AND TECHNOLOGY
- Guy M. Cohen
- B82 - NANO-TECHNOLOGY
Information Patent Application
PRODUCTION SCALE FABRICATION METHOD FOR HIGH RESOLUTION AFM TIPS
- Publication number 20120331593
- Publication date Dec 27, 2012
- KING ABDULAZIZ CITY FOR SCIENCE AND TECHNOLOGY
- Guy M. Cohen
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...
- Publication number 20120291161
- Publication date Nov 15, 2012
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy...
- Publication number 20120278958
- Publication date Nov 1, 2012
- Min-Feng YU
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Method of Observing Sample Using the...
- Publication number 20120204297
- Publication date Aug 9, 2012
- HITACHI, LTD.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION SCALE FABRICATION METHOD FOR HIGH RESOLUTION AFM TIPS
- Publication number 20120090057
- Publication date Apr 12, 2012
- International Business Machines Corporation
- Guy M. Cohen
- G01 - MEASURING TESTING
Information Patent Application
MICROCONTACT PROBER
- Publication number 20120090056
- Publication date Apr 12, 2012
- Hitachi High-Technologies Corporation
- Motoyuki Hirooka
- G01 - MEASURING TESTING
Information Patent Application
SPM Probe and Inspection Device for Light Emission Unit
- Publication number 20120054924
- Publication date Mar 1, 2012
- Hitachi High-Technologies Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING

Nano-tube tips

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Debris removal from high aspect structures

Debris removal in high aspect structures

Nanoscale scanning electrochemical microscopy electrode method

Debris removal from high aspect structures

Method, atomic force microscopy system and computer program product

Debris removal in high aspect structures

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Near field scanning probe microscope, probe for scanning probe micr...

Atomic force microscopy based on nanowire tips for high aspect rati...

Conical nano-carbon material functionalized needle tip and preparat...

Cantilever and manufacturing method for cantilever

Near field scanning probe microscope, probe for scanning probe micr...

Debris removal in high aspect structures

Debris removal from high aspect structures

Contactor devices with carbon nanotube probes embedded in a flexibl...

Cantilever for a scanning type probe microscope

Carbon nanotube probes and structures and methods of measurement

Atomic force microscope integrated with a multiple degrees-of-freed...

Method of fabricating nano-scale structures and nano-scale structur...

Method of making and assembling capsulated nanostructures

Electrochemically-grown nanowires and uses thereof

Method for the collective fabrication of carbon nanofibers on the s...

Scanning probe microscope and measurement method using same

Telescopic nanotube device for hot nanolithography

Scanned probe microscopy (SPM) probe having angled tip

Carbon nanotube based micro-tip structure and method for making the...

Method for manufacturing a one-dimensional nano-structure-based device

Method for manufacturing a one-dimensional nano-structure-based device

Method for manufacturing a one-dimensional nano-structure-based device

Patents Applicationslast 30 patents

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

A Method of Manufacturing a MEMS Device

SCANNING PROBE MICROSCOPE (SPM) TIP

SEMICONDUCTOR-LASER-INTEGRATED ATOMIC FORCE MICROSCOPY OPTICAL PROBE

CARBON NANOMATERIAL FUNCTIONALIZED NEEDLE TIP MODIFIED WITH LOW WOR...

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MI...

NANOSCALE SCANNING ELECTROCHEMICAL MICROSCOPY ELECTRODE METHOD

METHOD, ATOMIC FORCE MICROSCOPY SYSTEM AND COMPUTER PROGRAM PRODUCT

ATOMIC FORCE MICROSCOPY BASED ON NANOWIRE TIPS FOR HIGH ASPECT RATI...

Near Field Scanning Probe Microscope, Probe for Scanning Probe Micr...

TAPERED NANO-CARBON MATERIAL FUNCTIONALIZED NEEDLE TIP AND PREPARAT...

CANTILEVER AND MANUFACTURING METHOD FOR CANTILEVER

ATOMIC FORCE MICROSCOPE INTEGRATED WITH A MULTIPLE DEGREES-OF-FREED...

NANO ELECTRODE AND MANUFACTURING METHOD THEREOF

ELECTROCHEMICALLY-GROWN NANOWIRES AND USES THEREOF

Scanning Probe Microscope and Measurement Method Using Same

Scanned Probe Microscopy (SPM) Probe Having Angled Tip

THERMIONIC EMISSION DEVICE

CARBON NANOTUBE BASED MICRO-TIP STRUCTURE AND METHOD FOR MAKING THE...

ATOMIC FORCE MICROSCOPE PROBE

PROBE HAVING NANO-FINGERS

PRODUCTION SCALE FABRICATION METHOD FOR HIGH RESOLUTION AFM TIPS

PRODUCTION SCALE FABRICATION METHOD FOR HIGH RESOLUTION AFM TIPS

CANTILEVER FOR MAGNETIC FORCE MICROSCOPE AND METHOD OF MANUFACTURIN...

Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy...

Scanning Probe Microscope and Method of Observing Sample Using the...

PRODUCTION SCALE FABRICATION METHOD FOR HIGH RESOLUTION AFM TIPS

MICROCONTACT PROBER

SPM Probe and Inspection Device for Light Emission Unit