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GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10
USPC classification
Y10S
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S977/00
Nanotechnology
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Y10S977/876
Nanotube tip
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for viewing through blood
Patent number
7,758,499
Issue date
Jul 20, 2010
C2Cure, Inc.
Doron Adler
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Self-sensing tweezer devices and associated methods for micro and n...
Patent number
7,735,358
Issue date
Jun 15, 2010
Insitutec, Inc.
Marcin B. Bauza
G01 - MEASURING TESTING
Information
Patent Grant
Carbon nanotube detection system
Patent number
7,610,797
Issue date
Nov 3, 2009
Xidex Corporation
Vladimir Mancevski
G01 - MEASURING TESTING
Information
Patent Grant
Carbon thin line probe
Patent number
7,543,482
Issue date
Jun 9, 2009
Olympus Corporation
Masashi Kitazawa
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Probe for scanning thermal microscope
Patent number
7,514,678
Issue date
Apr 7, 2009
Tsinghua University
Yuan Yao
G01 - MEASURING TESTING
Information
Patent Grant
Conductive carbon nanotube tip, probe having the conductive carbon...
Patent number
7,507,958
Issue date
Mar 24, 2009
Samsung Electronics Co., Ltd.
Sang-jun Choi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for and method of bonding nano-tip using electrochemical...
Patent number
7,452,432
Issue date
Nov 18, 2008
Korean Advanced Institute of Science and Technology
Soo Hyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Nano tip and fabrication method of the same
Patent number
7,442,926
Issue date
Oct 28, 2008
Korea Institute of Machinery & Materials
Chang-Soo Han
G01 - MEASURING TESTING
Information
Patent Grant
Telegraph signal microscopy device and method
Patent number
7,427,754
Issue date
Sep 23, 2008
The Regents of the University of California
Kang L. Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating a probe having a field effect transistor chan...
Patent number
7,402,736
Issue date
Jul 22, 2008
Postech Foundation
Wonkyu Moon
G11 - INFORMATION STORAGE
Information
Patent Grant
Nanotube-based vacuum devices
Patent number
7,176,478
Issue date
Feb 13, 2007
Alexander Kastalsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Carbon nanotube devices
Patent number
7,166,325
Issue date
Jan 23, 2007
The Board of Trustees of the Leland Stanford Junior University
Hongjie Dai
G11 - INFORMATION STORAGE
Information
Patent Grant
Nanotube probe and method for manufacturing same
Patent number
7,138,627
Issue date
Nov 21, 2006
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Nanotube-based vacuum devices
Patent number
7,102,157
Issue date
Sep 5, 2006
Alexander Kastalsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Heat emitting probe and heat emitting probe apparatus
Patent number
7,073,937
Issue date
Jul 11, 2006
Yoshikaza Nakayama
Yoshikazu Nakayama
G11 - INFORMATION STORAGE
Information
Patent Grant
Coated nanotube surface signal probe
Patent number
7,064,341
Issue date
Jun 20, 2006
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Nanotube, near-field light detecting apparatus and near-field light...
Patent number
6,995,367
Issue date
Feb 7, 2006
NEC Corporation
Yoshiyuki Miyamoto
G01 - MEASURING TESTING
Information
Patent Grant
Method of production, method of inspection, and method of use of sc...
Patent number
6,930,307
Issue date
Aug 16, 2005
Toyota Jidosha Kabushiki Kaisha
Nobuaki Takazawa
G01 - MEASURING TESTING
Information
Patent Grant
Emission source having carbon nanotube, electron microscope using t...
Patent number
6,930,313
Issue date
Aug 16, 2005
Hitachi, Ltd.
Tadashi Fujieda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a branched carbon nanotube for use with an atom...
Patent number
6,871,528
Issue date
Mar 29, 2005
University of South Florida
Rudiger Schlaf
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Nanotweezers and nanomanipulator
Patent number
6,805,390
Issue date
Oct 19, 2004
Yoshikazu Nakayama
Yoshikazu Nakayama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Nanotweezers and nanomanipulator
Patent number
6,802,549
Issue date
Oct 12, 2004
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Coated nanotube surface signal probe and method of attaching nanotu...
Patent number
6,800,865
Issue date
Oct 5, 2004
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Nanotube tip for atomic force microscope
Patent number
6,780,664
Issue date
Aug 24, 2004
Advanced Micro Devices, Inc.
Rama R. Goruganthu
G01 - MEASURING TESTING
Information
Patent Grant
Lithographic method using ultra-fine probe needle
Patent number
6,777,693
Issue date
Aug 17, 2004
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Catalyst-induced growth of carbon nanotubes on tips of cantilevers...
Patent number
6,755,956
Issue date
Jun 29, 2004
UT-Battelle, LLC
James Weifu Lee
G01 - MEASURING TESTING
Information
Patent Grant
Nano-magnetic head and nano-magnetic head device using the same
Patent number
6,735,046
Issue date
May 11, 2004
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
G11 - INFORMATION STORAGE
Information
Patent Grant
Probe having a microstylet
Patent number
6,727,720
Issue date
Apr 27, 2004
Agere Systems Inc.
Erik C. Houge
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication of nanotube microscopy tips
Patent number
6,716,409
Issue date
Apr 6, 2004
President and Fellows of the Harvard College
Jason H. Hafner
G01 - MEASURING TESTING
Information
Patent Grant
Light receiving and emitting probe and light receiving and emitting...
Patent number
6,703,615
Issue date
Mar 9, 2004
Daiken Chemical Co., Ltd.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Carbon nanotube detection system
Publication number
20080083270
Publication date
Apr 10, 2008
Vladimir Mancevski
G01 - MEASURING TESTING
Information
Patent Application
Self-sensing tweezer devices and associated methods for micro and n...
Publication number
20070240516
Publication date
Oct 18, 2007
INSITUTEC, INC.
Marcin B. Bauza
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Carbon thin line probe
Publication number
20070204681
Publication date
Sep 6, 2007
OLYMPUS CORPORATION
Masashi Kitazawa
G01 - MEASURING TESTING
Information
Patent Application
Conductive carbon nanotube tip, probe having the conductive carbon...
Publication number
20070164214
Publication date
Jul 19, 2007
Samsung Electronics Co., Ltd.
Sang-jun Choi
G01 - MEASURING TESTING
Information
Patent Application
Nano tip and fabrication method of the same
Publication number
20070114457
Publication date
May 24, 2007
Korea Institute of Machinery and Materials
Chang-Soo Han
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR VIEWING THROUGH BLOOD
Publication number
20070100241
Publication date
May 3, 2007
C2CURE, INC.
Doron Adler
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Probe for scanning thermal microscope
Publication number
20070085002
Publication date
Apr 19, 2007
Tsinghua University
Yuan Yao
G01 - MEASURING TESTING
Information
Patent Application
TELEGRAPH SIGNAL MICROSCOPY DEVICE AND METHOD
Publication number
20060231754
Publication date
Oct 19, 2006
Kang L. Wang
G01 - MEASURING TESTING
Information
Patent Application
Probe of scanning probe microscope having a field effect transistor...
Publication number
20060230475
Publication date
Oct 12, 2006
POSTECH FOUNDATION
Wonkyu Moon
G01 - MEASURING TESTING
Information
Patent Application
Carbon nanotube excitation system
Publication number
20060156798
Publication date
Jul 20, 2006
Vladimir Mancevski
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for and method of bonding nano-tip using electrochemical...
Publication number
20060102271
Publication date
May 18, 2006
Korea Advanced Institute of Science and Technology
Soo Hyun Kim
G01 - MEASURING TESTING
Information
Patent Application
Nanotube-based vacuum devices
Publication number
20050247929
Publication date
Nov 10, 2005
Alexander Kastalsky
B82 - NANO-TECHNOLOGY
Information
Patent Application
Nanotube-based vacuum devices
Publication number
20050161668
Publication date
Jul 28, 2005
Alexander Kastalsky
B82 - NANO-TECHNOLOGY
Information
Patent Application
Apparatus for making carbon nanotube structure with catalyst island
Publication number
20040194705
Publication date
Oct 7, 2004
The Board of Trustees of the Leland Stanford Junior University
Hongjie Dai
G01 - MEASURING TESTING
Information
Patent Application
Method of production, method of inspection, and method of use of sc...
Publication number
20040173744
Publication date
Sep 9, 2004
Toyota Jidosha Kabushiki Kaisha
Nobuaki Takazawa
G01 - MEASURING TESTING
Information
Patent Application
Coated nanotube surface signal probe
Publication number
20040168527
Publication date
Sep 2, 2004
DAIKEN CHEMICAL CO., LTD.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Intra vascular imaging method and apparatus
Publication number
20040147806
Publication date
Jul 29, 2004
Doron Adler
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Field emission cathode using carbon fibers
Publication number
20040036402
Publication date
Feb 26, 2004
Till Keesmann
B82 - NANO-TECHNOLOGY
Information
Patent Application
Emission source having carbon nanotube, electron microscope using t...
Publication number
20040026629
Publication date
Feb 12, 2004
Tadashi Fujieda
B82 - NANO-TECHNOLOGY
Information
Patent Application
Method of producing a branched carbon nanotube for use with an atom...
Publication number
20040009308
Publication date
Jan 15, 2004
Rudiger Schlaf
C30 - CRYSTAL GROWTH
Information
Patent Application
Nanotube, near-field light detecting apparatus and near-field light...
Publication number
20030197120
Publication date
Oct 23, 2003
NEC Corporation
Yoshiyuki Miyamoto
G01 - MEASURING TESTING
Information
Patent Application
Nanotweezers and nanomanipulator
Publication number
20030189350
Publication date
Oct 9, 2003
YOSHIKAZU NAKAYAMA
Yoshikazu Nakayama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Nanotweezers and nanomanipulator
Publication number
20030189351
Publication date
Oct 9, 2003
YOSHIKAZU NAKAYAMA
Yoshikazu Nakayama
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Coated nanotube surface signal probe and method of attaching nanotu...
Publication number
20030122073
Publication date
Jul 3, 2003
YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Carbon nanotube probe tip grown on a small probe
Publication number
20030094035
Publication date
May 22, 2003
Thomas Owen Mitchell
G01 - MEASURING TESTING
Information
Patent Application
Nano-magnetic head and nano-magnetic head device using the same
Publication number
20030095356
Publication date
May 22, 2003
YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
Yoshikazu Nakayama
G11 - INFORMATION STORAGE
Information
Patent Application
Carbon nanotube devices
Publication number
20030068432
Publication date
Apr 10, 2003
The Board of Trustees of the Leland Stanford Junior University
Hongjie Dai
B82 - NANO-TECHNOLOGY
Information
Patent Application
Carbon nanotube structure having a catalyst island
Publication number
20030049444
Publication date
Mar 13, 2003
Leland Stanford Junior University, the Board of Trustees
Hongjie Dai
B82 - NANO-TECHNOLOGY
Information
Patent Application
Probe having a microstylet and method of manufacturing the same
Publication number
20030042922
Publication date
Mar 6, 2003
Erik C. Houge
B82 - NANO-TECHNOLOGY
Information
Patent Application
Lithographic method using ultra-fine probe needle
Publication number
20030020025
Publication date
Jan 30, 2003
YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
Yoshikazu Nakayama
H01 - BASIC ELECTRIC ELEMENTS