patterned objects electronic devices

Industry

CPC
G01N2223/611

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/611patterned objects electronic devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray radioscope
- Patent number 12,360,061
- Issue date Jul 15, 2025
- BEAMSENSE Co., Ltd.
- Sueki Baba
- G01 - MEASURING TESTING
Information Patent Grant
In situ and tunable deposition of a film
- Patent number 12,359,307
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Hsi Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of failure analysis for defect locations
- Patent number 12,339,202
- Issue date Jun 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Large die wafer, large die and method of forming the same
- Patent number 12,322,707
- Issue date Jun 3, 2025
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Sheng Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 12,320,763
- Issue date Jun 3, 2025
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for computed tomography system calibration
- Patent number 12,292,394
- Issue date May 6, 2025
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Image processing and detection of discontinuities in battery cells
- Patent number 12,203,880
- Issue date Jan 21, 2025
- GM Global Technology Operations LLC
- Sean Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Industrial x-ray workpiece measuring system and method for operatin...
- Patent number 12,203,876
- Issue date Jan 21, 2025
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup device and image generation method
- Patent number 12,181,425
- Issue date Dec 31, 2024
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20250231121
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING
Information Patent Application
E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES
- Publication number 20250231129
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250231132
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...
- Publication number 20250217960
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209587
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209585
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209586
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collimator for an X-ray inspection system, X-ray laminography syste...
- Publication number 20250198951
- Publication date Jun 19, 2025
- Comet Yxlon GmbH
- André Schu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...
- Publication number 20250201636
- Publication date Jun 19, 2025
- NGK Insulators, Ltd.
- Yoshitaka KURAOKA
- C30 - CRYSTAL GROWTH
Information Patent Application
THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...
- Publication number 20250201633
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sam Vaziri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
- Publication number 20250164411
- Publication date May 22, 2025
- KLA Corporation
- William McGahan
- G01 - MEASURING TESTING
Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Tsung-Pao FANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250124564
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250125431
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Component authentication using x-ray detectable unique features
- Publication number 20250111497
- Publication date Apr 3, 2025
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...
- Publication number 20250085241
- Publication date Mar 13, 2025
- KLA Corporation
- Rebecca Shen
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...
- Publication number 20250067691
- Publication date Feb 27, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...
- Publication number 20250052703
- Publication date Feb 13, 2025
- IMEC vzw
- XiuMei Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
- Publication number 20240394867
- Publication date Nov 28, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Lucas JALOUSTRE
- G06 - COMPUTING CALCULATING COUNTING

patterned objects electronic devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray radioscope

In situ and tunable deposition of a film

Method of failure analysis for defect locations

Charged particle beam device

Electron spectroscopy based techniques for determining various chem...

Large die wafer, large die and method of forming the same

Full beam metrology for x-ray scatterometry systems

X-ray analysis system and method with multi-source design

Apparatus and method for computed tomography system calibration

Parameterizing x-ray scattering measurement using slice-and-image t...

Characterizing and measuring in small boxes using XPS with multiple...

Method, apparatus, and program for determining condition related to...

Inspection device

Transmissive small-angle scattering device

Image processing and detection of discontinuities in battery cells

Industrial x-ray workpiece measuring system and method for operatin...

Systems and methods for voltage contrast defect detection

X-ray based measurements in patterned structure

Method and apparatus for efficient high harmonic generation

Image pickup device and image generation method

Utilize machine learning in selecting high quality averaged SEM ima...

Bonding wire for semiconductor devices

Bonding wire for semiconductor devices

System for estimating the occurrence of defects, and computer-reada...

Method and apparatus for monitoring beam profile and power

Small-angle X-ray scatterometry

Monitoring properties of X-ray beam during X-ray analysis

Defect characterization method and apparatus

Battery holder device and battery test system including the same

Estimating heights of defects in a wafer by scaling a 3D model usin...

Patents Applicationslast 30 patents

WAFER INSPECTION METHOD

E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

Analysis System, Analysis Method, and Analysis Program

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

Collimator for an X-ray inspection system, X-ray laminography syste...

METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...

THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...

Methods And Systems For Spectral Measurements Based On Perturbed Sp...

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

Component authentication using x-ray detectable unique features

Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

PATTERNED X-RAY EMITTING TARGET

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...