reflection

Industry

CPC
G01N2223/052

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/052reflection

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
- Patent number 11,927,549
- Issue date Mar 12, 2024
- KLA Corporation
- Qian Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 11,860,112
- Issue date Jan 2, 2024
- NEC Corporation
- Naoya Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Substance identification device and method for extracting statistic...
- Patent number 11,619,599
- Issue date Apr 4, 2023
- Tsinghua University
- Zhi Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining a characteristic of a smoking a...
- Patent number 11,533,946
- Issue date Dec 27, 2022
- R. J. Reynolds Tobacco Co.
- Balager Ademe
- A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information Patent Grant
Thin film analyzing device and thin film analyzing method
- Patent number 11,508,630
- Issue date Nov 22, 2022
- Kioxia Corporation
- Yuki Wakisaka
- B24 - GRINDING POLISHING
Information Patent Grant
Determining one or more characteristics of light in an optical system
- Patent number 11,499,924
- Issue date Nov 15, 2022
- KLA Corp.
- Larissa Juschkin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for semiconductor metrology based on wavelength...
- Patent number 11,460,418
- Issue date Oct 4, 2022
- KLA Corporation
- Alexander Kuznetsov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for real time and on line analysis of the agricultural crop
- Patent number 11,415,694
- Issue date Aug 16, 2022
- Dinamica Generale S.p.A.
- Andrea Ghiraldi
- G02 - OPTICS
Information Patent Grant
Non-destructive testing methods and apparatus
- Patent number 11,275,036
- Issue date Mar 15, 2022
- Nanyang Technological University
- Xiao Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting an anomaly in a single crystal structure
- Patent number 11,099,143
- Issue date Aug 24, 2021
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,054,375
- Issue date Jul 6, 2021
- University of Washington
- Gerald Todd Seidler
- G02 - OPTICS
Information Patent Grant
Defect inspection device, defect inspection method, and program
- Patent number 10,989,672
- Issue date Apr 27, 2021
- FUJIFILM Corporation
- Yasuhiko Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnetic field sensor with error calculation
- Patent number 10,837,943
- Issue date Nov 17, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Composite material structure monitoring system
- Patent number 10,794,841
- Issue date Oct 6, 2020
- Infineon Technologies AG
- Saverio Trotta
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Model independent grazing incidence X-ray reflectivity
- Patent number 10,416,101
- Issue date Sep 17, 2019
- Malvern Panalytical B.V.
- Igor Alexandrovich Makhotkin
- G01 - MEASURING TESTING
Information Patent Grant
Operation guide system for X-ray analysis,operation guide method th...
- Patent number 10,393,679
- Issue date Aug 27, 2019
- Rigaku Corporation
- Akihiro Himeda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray sidescatter inspection of laminates
- Patent number 10,393,680
- Issue date Aug 27, 2019
- The Boeing Company
- Nathan R. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Detector for X-rays with high spatial and high spectral resolution
- Patent number 10,295,486
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349841
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...
- Publication number 20230194443
- Publication date Jun 22, 2023
- Rigaku Corporation
- Akihiro HIMEDA
- G01 - MEASURING TESTING
Information Patent Application
SHIELDING STRATEGY FOR MITIGATION OF STRAY FIELD FOR PERMANENT MAGN...
- Publication number 20230076175
- Publication date Mar 9, 2023
- KLA Corporation
- Qian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20220299454
- Publication date Sep 22, 2022
- NEC Corporation
- Naoya NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING AGING-DICTATED DAMAGE OR DELAMIN...
- Publication number 20220260647
- Publication date Aug 18, 2022
- SIEMENS AKTIENGESELLSCHAFT
- Robert Baumgartner
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING A CHARACTERISTIC OF A SMOKING A...
- Publication number 20210392945
- Publication date Dec 23, 2021
- R. J. Reynolds Tobacco Co.
- Balager Ademe
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM ANALYZING DEVICE AND THIN FILM ANALYZING METHOD
- Publication number 20210262951
- Publication date Aug 26, 2021
- KIOXIA Corporation
- Yuki WAKISAKA
- G01 - MEASURING TESTING
Information Patent Application
SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...
- Publication number 20210025836
- Publication date Jan 28, 2021
- TSINGHUA UNIVERSITY
- Zhi ZENG
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ONE OR MORE CHARACTERISTICS OF LIGHT IN AN OPTICAL SYSTEM
- Publication number 20200378901
- Publication date Dec 3, 2020
- KLA Corporation
- Larissa Juschkin
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING AN ANOMALY IN A SINGLE CRYSTAL STRUCTURE
- Publication number 20200225171
- Publication date Jul 16, 2020
- Rolls-Royce plc
- Jacqueline GRIFFITHS
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR REAL TIME AND ON LINE ANALYSIS OF THE AGRICULTURAL CROP
- Publication number 20190369243
- Publication date Dec 5, 2019
- DINAMICA GENERALE S.P.A.
- ANDREA GHIRALDI
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
Composite Material Structure Monitoring System
- Publication number 20190339214
- Publication date Nov 7, 2019
- INFINEON TECHNOLOGIES AG
- Saverio Trotta
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Application
NON-DESTRUCTIVE TESTING METHODS AND APPARATUS
- Publication number 20190317026
- Publication date Oct 17, 2019
- Nanyang Technological University
- Xiao HU
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND PROGRAM
- Publication number 20190170665
- Publication date Jun 6, 2019
- FUJIFILM CORPORATION
- Yasuhiko Kaneko
- G01 - MEASURING TESTING
Information Patent Application
SINGLE SCATTERER TEST USING PHASE
- Publication number 20190079026
- Publication date Mar 14, 2019
- Delphi Technologies, LLC
- Konstantin Statnikov
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH ERROR CALCULATION
- Publication number 20180340911
- Publication date Nov 29, 2018
- Allegro Microsystems, LLC
- Hemán D. Romero
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SIDESCATTER INSPECTION OF LAMINATES
- Publication number 20180202949
- Publication date Jul 19, 2018
- The Boeing Company
- Nathan R. Smith
- G01 - MEASURING TESTING
Information Patent Application
Model Independent Grazing Incidence X-Ray Reflectivity
- Publication number 20180180561
- Publication date Jun 28, 2018
- MALVERN PANALYTICAL B.V.
- Igor Alexandrovich MAKHOTKIN
- G01 - MEASURING TESTING
Information Patent Application
RETRIEVAL OF P-BAND SOIL REFLECTIVITY FROM SIGNALS OF OPPORTUNITY
- Publication number 20170343485
- Publication date Nov 30, 2017
- Purdue Research Foundation
- James L. Garrison
- G01 - MEASURING TESTING
Information Patent Application
OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS,OPERATION GUIDE METHOD TH...
- Publication number 20170336333
- Publication date Nov 23, 2017
- Rigaku Corporation
- Akihiro HIMEDA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE
- Publication number 20170102343
- Publication date Apr 13, 2017
- Samsung Electronics Co., Ltd.
- Choon-Shik Leem
- G01 - MEASURING TESTING
Information Patent Application
OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD T...
- Publication number 20170038315
- Publication date Feb 9, 2017
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL SILICON CARBIDE SUBSTRATE, METHOD FOR PRODUCING SING...
- Publication number 20160218003
- Publication date Jul 28, 2016
- Hitachi Metals, Ltd.
- Taisuke HIROOKA
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of X-ray reflectometry measurement locations
- Publication number 20070274447
- Publication date Nov 29, 2007
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Optical measuring device
- Publication number 20040075830
- Publication date Apr 22, 2004
- Akira Miyake
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray reflectometry apparatus and method thereof for measuring thre...

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Shielding strategy for mitigation of stray field for permanent magn...

Inspection apparatus and inspection method

Inspection apparatus and inspection method

X-ray reflectometry apparatus and method thereof for measuring thre...

Inspection system and inspection method

X-ray collimator and related X-ray inspection apparatus

X-ray spectrometer and methods for use

Substance identification device and method for extracting statistic...

X-ray reflectometry apparatus and method thereof for measuring thre...

System and method using x-rays for depth-resolving metrology and an...

Systems and methods for determining a characteristic of a smoking a...

Thin film analyzing device and thin film analyzing method

Determining one or more characteristics of light in an optical system

Methods and systems for semiconductor metrology based on wavelength...

Apparatus for real time and on line analysis of the agricultural crop

Non-destructive testing methods and apparatus

Method of detecting an anomaly in a single crystal structure

X-ray spectrometer and methods for use

Defect inspection device, defect inspection method, and program

Magnetic field sensor with error calculation

Composite material structure monitoring system

Model independent grazing incidence X-ray reflectivity

Operation guide system for X-ray analysis,operation guide method th...

X-ray sidescatter inspection of laminates

Detector for X-rays with high spatial and high spectral resolution

Patents Applicationslast 30 patents

PATTERNED X-RAY EMITTING TARGET

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

INSPECTION APPARATUS AND INSPECTION METHOD

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...

SHIELDING STRATEGY FOR MITIGATION OF STRAY FIELD FOR PERMANENT MAGN...

INSPECTION SYSTEM AND INSPECTION METHOD

METHOD AND APPARATUS FOR DETECTING AGING-DICTATED DAMAGE OR DELAMIN...

SYSTEMS AND METHODS FOR DETERMINING A CHARACTERISTIC OF A SMOKING A...

THIN FILM ANALYZING DEVICE AND THIN FILM ANALYZING METHOD

SUBSTANCE IDENTIFICATION DEVICE AND METHOD FOR EXTRACTING STATISTIC...

DETERMINING ONE OR MORE CHARACTERISTICS OF LIGHT IN AN OPTICAL SYSTEM

METHOD OF DETECTING AN ANOMALY IN A SINGLE CRYSTAL STRUCTURE

APPARATUS FOR REAL TIME AND ON LINE ANALYSIS OF THE AGRICULTURAL CROP

Composite Material Structure Monitoring System

NON-DESTRUCTIVE TESTING METHODS AND APPARATUS

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND PROGRAM

SINGLE SCATTERER TEST USING PHASE

MAGNETIC FIELD SENSOR WITH ERROR CALCULATION

X-RAY SIDESCATTER INSPECTION OF LAMINATES

Model Independent Grazing Incidence X-Ray Reflectivity

RETRIEVAL OF P-BAND SOIL REFLECTIVITY FROM SIGNALS OF OPPORTUNITY

OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS,OPERATION GUIDE METHOD TH...

APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE

OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD T...

SINGLE-CRYSTAL SILICON CARBIDE SUBSTRATE, METHOD FOR PRODUCING SING...

Automated selection of x-ray reflectometry measurement locations

Automated selection of X-ray reflectometry measurement locations

Optical measuring device