SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

CPC
G01Q

Parent Industries

Current Industry

G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Sub Industries

G01Q10/00Scanning or positioning arrangements G01Q20/00Monitoring the movement or position of the probe G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus G01Q40/00Calibration G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00 G01Q80/00Applications, other than SPM, of scanning-probe techniques G01Q90/00Scanning-probe techniques or apparatus not otherwise provided for

Industries

Patents Grantslast 30 patents

Information Patent Grant
Manufacturing process with atomic level inspection
- Patent number 12,131,957
- Issue date Oct 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining dimensions of features of a subsurface topogr...
- Patent number 12,123,895
- Issue date Oct 22, 2024
- Nearfield Instruments B.V.
- Paul Zabbal
- G01 - MEASURING TESTING
Information Patent Grant
Probe chip, scan head, scanning probe microscopy device and use of...
- Patent number 12,117,467
- Issue date Oct 15, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Micro probe array device and manufacturing method of the device
- Patent number 12,109,409
- Issue date Oct 8, 2024
- Industry-Academic Cooperation Foundation, Dankook University
- Jae-Hyoung Park
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for optogenetic imaging
- Patent number 12,109,074
- Issue date Oct 8, 2024
- INSCOPIX, INC.
- Mark O. Trulson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for measuring optical constants of thin film of fluorine-con...
- Patent number 12,105,018
- Issue date Oct 1, 2024
- Shin-Etsu Chemical Co., Ltd.
- Takashi Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...
- Patent number 12,078,654
- Issue date Sep 3, 2024
- Steven R. J. Brueck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated III-V/silicon atomic force microscopy active optical probe
- Patent number 12,072,351
- Issue date Aug 27, 2024
- ACTOPROBE LLC
- Alexander A. Ukhanov
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Device for detection of cellular stress
- Patent number 12,055,536
- Issue date Aug 6, 2024
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for measuring heat distribution of specific space...
- Patent number 12,038,455
- Issue date Jul 16, 2024
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Method of providing a MEMS device comprising a pyramidal protrusion...
- Patent number 12,013,415
- Issue date Jun 18, 2024
- SmartTip B.V.
- Edin Sarajlic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for electrically examining electronic components of an integ...
- Patent number 12,007,408
- Issue date Jun 11, 2024
- Forschungszentrum Juelich GmbH
- Bert Voigtlaender
- G01 - MEASURING TESTING
Information Patent Grant
Polaritonic fiber probe and method for nanoscale mapping
- Patent number 12,007,409
- Issue date Jun 11, 2024
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a non-tapping mode scattering-type scanning n...
- Patent number 12,000,861
- Issue date Jun 4, 2024
- Lehigh University
- Haomin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Science-driven automated experiments
- Patent number 11,982,684
- Issue date May 14, 2024
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting thickness of bonded rubber of carbon black in...
- Patent number 11,976,193
- Issue date May 7, 2024
- SICHUAN UNIVERSITY OF SCIENCE & ENGINEERING
- Jian Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-packing three-arm thermal scanning probe for micro-nano manufa...
- Patent number 11,970,392
- Issue date Apr 30, 2024
- Zhejiang University
- Huan Hu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS nanopositioner and method of fabrication
- Patent number 11,973,441
- Issue date Apr 30, 2024
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Method and system for quantitatively evaluating surface roughness o...
- Patent number 11,965,734
- Issue date Apr 23, 2024
- NORTHEAST PETROLEUM UNIVERSITY
- Shansi Tian
- E21 - EARTH DRILLING MINING
Information Patent Grant
Scanning probe system
- Patent number 11,959,936
- Issue date Apr 16, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of evaluating silicon wafer, method of evaluating silicon wa...
- Patent number 11,948,819
- Issue date Apr 2, 2024
- Sumco Corporation
- Keiichiro Mori
- B24 - GRINDING POLISHING
Information Patent Grant
Method and control unit for demodulation
- Patent number 11,946,949
- Issue date Apr 2, 2024
- Technische Universitat Wien
- Dominik Kohl
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
DECOUPLED OPTICAL FORCE NANOSCOPY
- Publication number 20240345129
- Publication date Oct 17, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Yang Zhao
- G01 - MEASURING TESTING
Information Patent Application
SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS
- Publication number 20240319304
- Publication date Sep 26, 2024
- B. G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD.
- Yishay MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR IDENTIFICATION OF ION CHANNELS
- Publication number 20240296910
- Publication date Sep 5, 2024
- Ohio State Innovation Foundation
- Mustafa Demirtas
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...
- Publication number 20240288467
- Publication date Aug 29, 2024
- UT-Battelle, LLC
- Maxim A. Ziatdinov
- G01 - MEASURING TESTING
Information Patent Application
MEMS Nanopositioner and Method of Fabrication
- Publication number 20240283378
- Publication date Aug 22, 2024
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD
- Publication number 20240280605
- Publication date Aug 22, 2024
- WINBOND ELECTRONICS CORP.
- Hsueh-Cheng LIAO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...
- Publication number 20240272197
- Publication date Aug 15, 2024
- Technische Universitat Wien
- Markus VALTINER
- G01 - MEASURING TESTING
Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...
- Publication number 20240275130
- Publication date Aug 15, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...
- Publication number 20240264199
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Egor UKRAINTSEV
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...
- Publication number 20240264198
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Bohuslav REZEK
- G01 - MEASURING TESTING
Information Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
- Publication number 20240258066
- Publication date Aug 1, 2024
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...
- Publication number 20240241151
- Publication date Jul 18, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
Method for processing a measuring probe for recording surface prope...
- Publication number 20240241152
- Publication date Jul 18, 2024
- HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
- Christopher Seiji KLEY
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...
- Publication number 20240230710
- Publication date Jul 11, 2024
- MSSCORPS CO., LTD.
- MAO-NAN CHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
- Publication number 20240230712
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Gyubaek Lee
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20240230709
- Publication date Jul 11, 2024
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSOR, SCANNING ELECTROCHEMICAL GAS MICROSCOPE, AND METHOD OF...
- Publication number 20240230711
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Hyunpyo Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING DEFECT OF MASK
- Publication number 20240219826
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Yoonki HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM FOR PERFORMING ACOUSTIC SCANNIN...
- Publication number 20240219421
- Publication date Jul 4, 2024
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele PIRAS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY
- Publication number 20240219420
- Publication date Jul 4, 2024
- Brown University
- Daniel MITTLEMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...
- Publication number 20240210444
- Publication date Jun 27, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Gaëlle Charrier
- G01 - MEASURING TESTING

SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Manufacturing process with atomic level inspection

Method of determining dimensions of features of a subsurface topogr...

Probe chip, scan head, scanning probe microscopy device and use of...

Micro probe array device and manufacturing method of the device

Systems and methods for optogenetic imaging

Method for measuring optical constants of thin film of fluorine-con...

Rugged, single crystal wide-band-gap-material scanning-tunneling-mi...

Integrated III-V/silicon atomic force microscopy active optical probe

Automated optimization of AFM light source positioning

Device for detection of cellular stress

Measuring method for measuring heat distribution of specific space...

Method of providing a MEMS device comprising a pyramidal protrusion...

Method for electrically examining electronic components of an integ...

Polaritonic fiber probe and method for nanoscale mapping

System and method for a non-tapping mode scattering-type scanning n...

Metrological scanning probe microscope

Methods and systems for scanning probe sample property measurement...

System and method for generating and analyzing roughness measuremen...

Science-driven automated experiments

Method for detecting thickness of bonded rubber of carbon black in...

Methods and devices for extending a time period until changing a me...

Self-packing three-arm thermal scanning probe for micro-nano manufa...

MEMS nanopositioner and method of fabrication

Device and method for operating a bending beam in a closed control...

Debris removal from high aspect structures

Method and system for quantitatively evaluating surface roughness o...

Scanning probe system

Large radius probe

Method of evaluating silicon wafer, method of evaluating silicon wa...

Method and control unit for demodulation

Patents Applicationslast 30 patents

DECOUPLED OPTICAL FORCE NANOSCOPY

SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

POSITIONING SYSTEM AND METHOD

SYSTEMS AND METHODS FOR IDENTIFICATION OF ION CHANNELS

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

MACHINE LEARNING-DRIVEN OPERATION OF INSTRUMENTATION WITH HUMAN IN...

MEMS Nanopositioner and Method of Fabrication

MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE...

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCAN...

A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...

A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...

Method of Dispositioning and Control of a Semiconductor Manufacturi...

SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...

Method for processing a measuring probe for recording surface prope...

METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

GAS SENSOR, SCANNING ELECTROCHEMICAL GAS MICROSCOPE, AND METHOD OF...

METHOD OF REMOVING DEFECT OF MASK

METHOD, SYSTEM AND COMPUTER PROGRAM FOR PERFORMING ACOUSTIC SCANNIN...

SYSTEM AND METHOD FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...