SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

CPC
G01Q

Parent Industries

Current Industry

G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Sub Industries

G01Q10/00Scanning or positioning arrangements G01Q20/00Monitoring the movement or position of the probe G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus G01Q40/00Calibration G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof G01Q70/00General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00 G01Q80/00Applications, other than SPM, of scanning-probe techniques G01Q90/00Scanning-probe techniques or apparatus not otherwise provided for

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for quantitatively evaluating surface roughness o...
- Patent number 11,965,734
- Issue date Apr 23, 2024
- NORTHEAST PETROLEUM UNIVERSITY
- Shansi Tian
- E21 - EARTH DRILLING MINING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Scanning probe system
- Patent number 11,959,936
- Issue date Apr 16, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of evaluating silicon wafer, method of evaluating silicon wa...
- Patent number 11,948,819
- Issue date Apr 2, 2024
- Sumco Corporation
- Keiichiro Mori
- B24 - GRINDING POLISHING
Information Patent Grant
Method and control unit for demodulation
- Patent number 11,946,949
- Issue date Apr 2, 2024
- Technische Universitat Wien
- Dominik Kohl
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Heterodyne scanning probe microscopy method and system
- Patent number 11,940,416
- Issue date Mar 26, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, ultrasound acoustic microscopy device comprising the ca...
- Patent number 11,927,564
- Issue date Mar 12, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Maarten Hubertus Van Es
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electrochemical microscopy with oscillating probe tip
- Patent number 11,921,130
- Issue date Mar 5, 2024
- The University of Warwick
- Patrick Unwin
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Crude sterol as an additive in asphalt binder
- Patent number 11,912,874
- Issue date Feb 27, 2024
- A.L.M. Holding Company
- Gerald H. Reinke
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Method for referencing a near-field measurement with drift and fluc...
- Patent number 11,899,041
- Issue date Feb 13, 2024
- ATTOCUBE SYSTEMS AG
- Ivan Malovichko
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for simultaneous independent motion measurement o...
- Patent number 11,892,471
- Issue date Feb 6, 2024
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
- Patent number 11,860,188
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for nanoscale infrared absorption tomography
- Patent number 11,860,087
- Issue date Jan 2, 2024
- The Board of Trustees of the University of Illinois
- Rohit Bhargava
- G01 - MEASURING TESTING
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for small molecule detection by nanopipette
- Patent number 11,852,624
- Issue date Dec 26, 2023
- The Florida International University Board of Trustees
- Jin He
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
- Patent number 11,852,654
- Issue date Dec 26, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating nano measurement scale and standard material...
- Patent number 11,852,581
- Issue date Dec 26, 2023
- KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Kyung Joong Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
- Patent number 11,846,653
- Issue date Dec 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Grant
In situ mechanical characterization of a single cell-cell adhesion...
- Patent number 11,846,611
- Issue date Dec 19, 2023
- Nutech Ventures
- Ruiguo Yang
- G01 - MEASURING TESTING
Information Patent Grant
Polaritonic fiber probe and method for nanoscale measurements
- Patent number 11,841,274
- Issue date Dec 12, 2023
- Baylor University
- Zhenrong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Sensor probe assembly
- Patent number 11,841,330
- Issue date Dec 12, 2023
- Physik-Instrumente (PI) GmbH & Co. KG
- Scott Jordan
- G01 - MEASURING TESTING
Information Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
- Patent number 11,839,709
- Issue date Dec 12, 2023
- Fresenius Medical Care Holdings, Inc.
- Stephen Merchant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration component measurement device, Kelvin probe force microsco...
- Patent number 11,835,548
- Issue date Dec 5, 2023
- Osaka University
- Yasuhiro Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of nanoindented and scratch induced accoustic events
- Patent number 11,835,546
- Issue date Dec 5, 2023
- Nanometronix LLC
- Antanas Daugela
- G01 - MEASURING TESTING
Information Patent Grant
Systems, method and computer-accessible medium for providing balanc...
- Patent number 11,835,545
- Issue date Dec 5, 2023
- The Trustees of Columbia University In the City of New York
- Alexander Swinton McLeod
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for detecting mechanical and magnetic features with nanoscal...
- Patent number 11,835,547
- Issue date Dec 5, 2023
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...
- Publication number 20240133919
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Gyubaek Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...
- Publication number 20240133918
- Publication date Apr 25, 2024
- MSSCORPS CO., LTD.
- MAO-NAN CHANG
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHANICAL TRANSDUCER
- Publication number 20240094240
- Publication date Mar 21, 2024
- Centre National de la Recherche Scientifique
- Cyprien LEMOUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...
- Publication number 20240094241
- Publication date Mar 21, 2024
- TOHOKU UNIVERSITY
- Yoshiomi HIRANAGA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...
- Publication number 20240077516
- Publication date Mar 7, 2024
- Virginia Commonwealth University
- Jason REED
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
- Publication number 20240069095
- Publication date Feb 29, 2024
- Intel Corporation
- Huei Hao YAP
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...
- Publication number 20240061014
- Publication date Feb 22, 2024
- KIOXIA Corporation
- Kiminori YOSHINO
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20240027425
- Publication date Jan 25, 2024
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
CASSETTE FOR HOLDING A PROBE
- Publication number 20240027491
- Publication date Jan 25, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE
- Publication number 20240012021
- Publication date Jan 11, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleks Labuda
- G01 - MEASURING TESTING
Information Patent Application
Atomic-force Microscopy for Identification of Surfaces
- Publication number 20240012022
- Publication date Jan 11, 2024
- Trustees of Tufts College
- Igor Sokolov
- G01 - MEASURING TESTING
Information Patent Application
SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...
- Publication number 20240002220
- Publication date Jan 4, 2024
- ZHEJIANG UNIVERSITY
- Huan HU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
A Method of Manufacturing a MEMS Device
- Publication number 20230416080
- Publication date Dec 28, 2023
- Cytosurge AG
- Edin SARAJLIC
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A SAMPLE
- Publication number 20230418153
- Publication date Dec 28, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...
- Publication number 20230417795
- Publication date Dec 28, 2023
- University of Central Florida Research Foundation, Inc.
- Laurene Tetard
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM, COMPUTING DEVICE AND STORAGE MEDIUM FOR OPTICAL MEA...
- Publication number 20230408544
- Publication date Dec 21, 2023
- Shanghai Ideaoptics Corp., Ltd.
- Tongyu Li
- G01 - MEASURING TESTING
Information Patent Application
IN SITU MECHANICAL CHARACTERIZATION OF A SAMPLE STRAIN
- Publication number 20230393170
- Publication date Dec 7, 2023
- Board of Regents of the University of Nebraska
- Ruiguo Yang
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...
- Publication number 20230393169
- Publication date Dec 7, 2023
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DETECTION OF CELLULAR STRESS
- Publication number 20230384288
- Publication date Nov 30, 2023
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION
- Publication number 20230386941
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THIN FILM METROLOGY
- Publication number 20230375330
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih Hung CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES
- Publication number 20230358724
- Publication date Nov 9, 2023
- UNIVERSITAT BASEL
- Marija PLODINEC
- G01 - MEASURING TESTING

SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Device and method for operating a bending beam in a closed control...

Method and system for quantitatively evaluating surface roughness o...

Debris removal from high aspect structures

Scanning probe system

Large radius probe

Method of evaluating silicon wafer, method of evaluating silicon wa...

Method and control unit for demodulation

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Heterodyne scanning probe microscopy method and system

Cantilever, ultrasound acoustic microscopy device comprising the ca...

Scanning electrochemical microscopy with oscillating probe tip

Crude sterol as an additive in asphalt binder

Coated active cantilever probes for use in topography imaging in op...

Method for referencing a near-field measurement with drift and fluc...

Method and device for simultaneous independent motion measurement o...

Probe for scanning probe microscope and binary state scanning probe...

Method and apparatus for nanoscale infrared absorption tomography

Modified method to fit cell elastic modulus based on Sneddon model

Method and apparatus for small molecule detection by nanopipette

Cantilever with a collocated piezoelectric actuator-sensor pair

Method for calibrating nano measurement scale and standard material...

Scanning probe microscope and method for resonance-enhanced detecti...

In situ mechanical characterization of a single cell-cell adhesion...

Polaritonic fiber probe and method for nanoscale measurements

Sensor probe assembly

System for tailoring dialysis treatment based on sensed potassium c...

Vibration component measurement device, Kelvin probe force microsco...

Characterization of nanoindented and scratch induced accoustic events

Systems, method and computer-accessible medium for providing balanc...

Method for detecting mechanical and magnetic features with nanoscal...

Patents Applicationslast 30 patents

METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVI...

METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC...

SCANNING PROBE MICROSCOPE

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

OPTOMECHANICAL TRANSDUCER

HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...

DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...

PROBE ASSESSMENT METHOD AND SPM

LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVE...

NANOSCALE SCANNING SENSORS

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

CASSETTE FOR HOLDING A PROBE

ATOMIC FORCE MICROSCOPE

Atomic-force Microscopy for Identification of Surfaces

SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFA...

A Method of Manufacturing a MEMS Device

METHOD AND APPARATUS FOR PROCESSING A SAMPLE

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEM...

METHOD, SYSTEM, COMPUTING DEVICE AND STORAGE MEDIUM FOR OPTICAL MEA...

IN SITU MECHANICAL CHARACTERIZATION OF A SAMPLE STRAIN

ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN...

DEVICE FOR DETECTION OF CELLULAR STRESS

MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION

THIN FILM METROLOGY

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES