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CPC
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H01L31/00
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H01L31/02Details
H01L31/02002Arrangements for conducting electric current to or from the device in operations
H01L31/02005for device characterised by at least one potential jump barrier or surface barrier
H01L31/02008for solar cells or solar cell modules
H01L31/0201comprising specially adapted module bus-bar structures
H01L31/02013comprising output lead wires elements
H01L31/02016Circuit arrangements of general character for the devices
H01L31/02019for devices characterised by at least one potential jump barrier or surface barrier
H01L31/02021for solar cells
H01L31/02024Position sensitive and lateral effect photodetectors; Quadrant photodiodes
H01L31/02027for devices working in avalanche mode
H01L31/0203Containers Encapsulations
H01L31/0216Coatings
H01L31/02161for devices characterised by at least one potential jump barrier or surface barrier
H01L31/02162for filtering or shielding light
H01L31/02164for shielding light
H01L31/02165using interference filters
H01L31/02167for solar cells
H01L31/02168the coatings being antireflective or having enhancing optical properties for the solar cells
H01L31/0224Electrodes
H01L31/022408for devices characterised by at least one potential jump barrier or surface barrier
H01L31/022416comprising ring electrodes
H01L31/022425for solar cells
H01L31/022433Particular geometry of the grid contacts
H01L31/022441Electrode arrangements specially adapted for back-contact solar cells
H01L31/02245for metallisation wrap-through [MWT] type solar cells
H01L31/022458for emitter wrap-through [EWT] type solar cells
H01L31/022466made of transparent conductive layers
H01L31/022475composed of indium tin oxide [ITO]
H01L31/022483composed of zinc oxide [ZnO]
H01L31/022491composed of a thin transparent metal layer
H01L31/0232Optical elements or arrangements associated with the device
H01L31/02322comprising luminescent members
H01L31/02325the optical elements not being integrated nor being directly associated with the device
H01L31/02327the optical elements being integrated or being directly associated to the device
H01L31/0236Special surface textures
H01L31/02363of the semiconductor body itself
H01L31/02366of the substrate or of a layer on the substrate
H01L31/024Arrangements for cooling, heating, ventilating or temperature compensation
H01L31/0248characterised by their semiconductor bodies
H01L31/0256characterised by the material
H01L31/0264Inorganic materials
H01L31/0272Selenium or tellurium
H01L31/02725characterised by the doping material
H01L31/028including, apart from doping material or other impurities, only elements of the fourth group of the Periodic System
H01L31/0284comprising porous silicon as part of the active layer(s)
H01L31/0288characterised by the doping material
H01L31/0296including, apart from doping material or other impurities, only AIIBVI compounds
H01L31/02963characterised by the doping material
H01L31/02966including ternary compounds
H01L31/0304including, apart from doping materials or other impurities, only AIIIBV compounds
H01L31/03042characterised by the doping material
H01L31/03044comprising a nitride compounds
H01L31/03046including ternary or quaternary compounds
H01L31/03048comprising a nitride compounds
H01L31/0312including, apart from doping materials or other impurities, only AIVBIV compounds
H01L31/03125characterised by the doping material
H01L31/032including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
H01L31/0321characterised by the doping material
H01L31/0322comprising only AIBIIICVI chalcopyrite compounds
H01L31/0323characterised by the doping material
H01L31/0324comprising only AIVBVI or AIIBIVCVI chalcogenide compounds
H01L31/0325characterised by the doping material
H01L31/0326comprising AIBIICIVDVI kesterite compounds
H01L31/0327characterised by the doping material
H01L31/0328including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L31/0272 - H01L31/032
H01L31/0336in different semiconductor regions
H01L31/03365comprising only Cu2X / CdX heterojunctions, X being an element of the sixth group of the Periodic System
H01L31/0352characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
H01L31/035209comprising a quantum structures
H01L31/035218the quantum structure being quantum dots
H01L31/035227the quantum structure being quantum wires, or nano-rods
H01L31/035236Superlattices; Multiple quantum well structures
H01L31/035245characterised by amorphous semiconductor layers
H01L31/035254including, apart from doping materials or other impurities, only elements of the fourth group of the Periodic System
H01L31/035263Doping superlattices
H01L31/035272characterised by at least one potential jump barrier or surface barrier
H01L31/035281Shape of the body
H01L31/03529Shape of the potential jump barrier or surface barrier
H01L31/036characterised by their crystalline structure or particular orientation of the crystalline planes
H01L31/0368including polycrystalline semiconductors
H01L31/03682including only elements of the fourth group of the Periodic System
H01L31/03685including microcrystalline silicon, uc-Si
H01L31/03687including microcrystalline AIVBIV alloys
H01L31/0376including amorphous semiconductors
H01L31/03762including only elements of the fourth group of the Periodic System
H01L31/03765including AIVBIV compounds or alloys
H01L31/03767presenting light-induced characteristic variations
H01L31/0384including other non-monocrystalline materials
H01L31/03845comprising semiconductor nano-particles embedded in a semiconductor matrix
H01L31/0392including thin films deposited on metallic or insulating substrates; characterised by specific substrate materials or substrate features or by the presence of intermediate layers
H01L31/03921including only elements of the fourth group of the Periodic System
H01L31/03923including AIBIIICVI compound materials
H01L31/03925including AIIBVI compound materials
H01L31/03926comprising a flexible substrate
H01L31/03928including AIBIIICVI compound
H01L31/04adapted as photovoltaic [PV] conversion devices
H01L31/041Provisions for preventing damage caused by corpuscular radiation
H01L31/042PV modules or arrays of single PV cells
H01L31/043Mechanically stacked PV cells
H01L31/044including bypass diodes
H01L31/0443comprising bypass diodes integrated or directly associated with the devices
H01L31/0445including thin film solar cells
H01L31/046PV modules composed of a plurality of thin film solar cells deposited on the same substrate
H01L31/0463characterised by special patterning methods to connect the PV cells in a module
H01L31/0465comprising particular structures for the electrical interconnection of adjacent PV cells in the module
H01L31/0468comprising specific means for obtaining partial light transmission through the module
H01L31/047PV cell arrays including PV cells having multiple vertical junctions or multiple V-groove junctions formed in a semiconductor substrate
H01L31/0475PV cell arrays made by cells in a planar
H01L31/048Encapsulation of modules
H01L31/0481characterised by the composition of the encapsulation material
H01L31/0488Double glass encapsulation
H01L31/049Protective back sheets
H01L31/05Electrical interconnection means between PV cells inside the PV module
H01L31/0504specially adapted for series or parallel connection of solar cells in a module
H01L31/0508the interconnection means having a particular shape
H01L31/0512made of a particular material or composition of materials
H01L31/0516specially adapted for interconnection of back-contact solar cells
H01L31/052Cooling means directly associated or integrated with the PV cell
H01L31/0521using a gaseous or a liquid coolant
H01L31/0525including means to utilise heat energy directly associated with the PV cell
H01L31/053Energy storage means directly associated or integrated with the PV cell
H01L31/054Optical elements directly associated or integrated with the PV cell
H01L31/0543comprising light concentrating means of the refractive type
H01L31/0547comprising light concentrating means of the reflecting type
H01L31/0549comprising spectrum splitting means
H01L31/055where light is absorbed and re-emitted at a different wavelength by the optical element directly associated or integrated with the PV cell
H01L31/056the light-reflecting means being of the back surface reflector [BSR] type
H01L31/06characterised by at least one potential-jump barrier or surface barrier
H01L31/061the potential barriers being of the point-contact type
H01L31/062the potential barriers being only of the metal-insulator-semiconductor type
H01L31/065the potential barriers being only of the graded gap type
H01L31/068the potential barriers being only of the PN homojunction type
H01L31/0682back-junction, i.e. rearside emitter, solar cells
H01L31/0684double emitter cells
H01L31/0687Multiple junction or tandem solar cells
H01L31/06875inverted grown metamorphic [IMM] multiple junction solar cells
H01L31/0693the devices including, apart from doping material or other impurities, only AIIIBV compounds
H01L31/07the potential barriers being only of the Schottky type
H01L31/072the potential barriers being only of the PN heterojunction type
H01L31/0725Multiple junction or tandem solar cells
H01L31/073comprising only AIIBVI compound semiconductors
H01L31/0735comprising only AIIIBV compound semiconductors
H01L31/074comprising a heterojunction with an element of the fourth group of the Periodic System
H01L31/0745comprising a AIVBIV heterojunction
H01L31/0747comprising a heterojunction of crystalline and amorphous materials
H01L31/0749including a AIBIIICVI compound
H01L31/075the potential barriers being only of the PIN type
H01L31/076Multiple junction or tandem solar cells
H01L31/077the devices comprising monocrystalline or polycrystalline materials
H01L31/078including different types of potential barriers provided for in two or more of groups H01L31/062 - H01L31/075
H01L31/08in which radiation controls flow of current through the device
H01L31/085the device being sensitive to very short wavelength
H01L31/09Devices sensitive to infra-red, visible or ultraviolet radiation
H01L31/095comprising amorphous semiconductors
H01L31/10characterised by at least one potential-jump barrier or surface barrier
H01L31/101Devices sensitive to infra-red, visible or ultra-violet radiation
H01L31/1013devices sensitive to two or more wavelengths
H01L31/1016comprising transparent or semitransparent devices
H01L31/102characterised by only one potential barrier or surface barrier
H01L31/1025the potential barrier being of the point contact type
H01L31/103the potential barrier being of the PN homojunction type
H01L31/1032the devices comprising active layers formed only by AIIBVI compounds
H01L31/1035the devices comprising active layers formed only by AIIIBV compounds
H01L31/1037the devices comprising active layers formed only by AIVBVI compounds
H01L31/105the potential barrier being of the PIN type
H01L31/1055the devices comprising amorphous materials of the fourth group of the Periodic System
H01L31/107the potential barrier working in avalanche mode
H01L31/1075in which the active layers
H01L31/108the potential barrier being of the Schottky type
H01L31/1085the devices being of the Metal-Semiconductor-Metal [MSM] Schottky barrier type
H01L31/109the potential barrier being of the PN heterojunction type
H01L31/11characterised by two potential barriers or surface barriers
H01L31/1105the device being a bipolar phototransistor
H01L31/111characterised by at least three potential barriers
H01L31/1113the device being a photothyristor
H01L31/1116of the static induction type
H01L31/112characterised by field-effect operation
H01L31/1121Devices with Schottky gate
H01L31/1122the device being a CCD device
H01L31/1123the device being a photo MESFET
H01L31/1124Devices with PN homojunction gate
H01L31/1125the device being a CCD device
H01L31/1126the device being a field-effect phototransistor
H01L31/1127Devices with PN heterojunction gate
H01L31/1128the device being a CCD device
H01L31/1129the device being a field-effect phototransistor
H01L31/113being of the conductor-insulator-semiconductor type
H01L31/1133the device being a conductor-insulator-semiconductor diode or a CCD device
H01L31/1136the device being a metal-insulator-semiconductor field-effect transistor
H01L31/115Devices sensitive to very short wavelength
H01L31/117of the bulk effect radiation detector type
H01L31/1175Li compensated PIN gamma-ray detectors
H01L31/118of the surface barrier or shallow PN junction detector type
H01L31/1185of the shallow PN junction detector type
H01L31/119characterised by field-effect operation
H01L31/12Structurally associated with
H01L31/125Composite devices with photosensitive elements and electroluminescent elements within one single body
H01L31/14the light source or sources being controlled by the semiconductor device sensitive to radiation
H01L31/141the semiconductor device sensitive to radiation being without a potential-jump barrier or surface barrier
H01L31/143the light source being a semiconductor device with at least one potential-jump barrier or surface barrier
H01L31/145the semiconductor device sensitive to radiation being characterised by at least one potential-jump barrier or surface barrier
H01L31/147the light sources and the devices sensitive to radiation all being semiconductor devices characterised by at least one potential or surface barrier
H01L31/153formed in, or on, a common substrate
H01L31/16the semiconductor device sensitive to radiation being controlled by the light source or sources
H01L31/161Semiconductor device sensitive to radiation without a potential-jump or surface barrier
H01L31/162the light source being a semiconductor device with at least one potential-jump barrier or surface barrier
H01L31/164Optical potentiometers
H01L31/165the semiconductor sensitive to radiation being characterised by at least one potential-jump or surface barrier
H01L31/167the light sources and the devices sensitive to radiation all being semiconductor devices characterised by at least one potential or surface barrier
H01L31/173formed in, or on, a common substrate
H01L31/18Processes or apparatus peculiar to the manufacture or treatment of these devices or of parts thereof
H01L31/1804comprising only elements of the fourth group of the Periodic System
H01L31/1808including only Ge
H01L31/1812including only AIVBIV alloys
H01L31/1816Special manufacturing methods for microcrystalline layers
H01L31/182Special manufacturing methods for polycrystalline Si
H01L31/1824Special manufacturing methods for microcrystalline Si, uc-Si
H01L31/1828the active layers comprising only AIIBVI compounds
H01L31/1832comprising ternary compounds
H01L31/1836comprising a growth substrate not being an AIIBVI compound
H01L31/184the active layers comprising only AIIIBV compounds
H01L31/1844comprising ternary or quaternary compounds
H01L31/1848comprising nitride compounds
H01L31/1852comprising a growth substrate not being an AIIIBV compound
H01L31/1856comprising nitride compounds
H01L31/186Particular post-treatment for the devices
H01L31/1864Annealing
H01L31/1868Passivation
H01L31/1872Recrystallisation
H01L31/1876Particular processes or apparatus for batch treatment of the devices
H01L31/188Apparatus specially adapted for automatic interconnection of solar cells in a module
H01L31/1884Manufacture of transparent electrodes
H01L31/1888methods for etching transparent electrodes
H01L31/1892methods involving the use of temporary, removable substrates
H01L31/1896for thin-film semiconductors
H01L31/20such devices or parts thereof comprising amorphous semiconductor materials
H01L31/202including only elements of the fourth group of the Periodic System
H01L31/204including AIVBIV alloys
H01L31/206Particular processes or apparatus for continuous treatment of the devices
H01L31/208Particular post-treatment of the devices