Sockets or component fixtures for RF or HF testing

Industry

CPC
G01R1/045

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/045Sockets or component fixtures for RF or HF testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for fabricating test socket
- Patent number 12,105,133
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment for testing a device under test having an antenna
- Patent number 12,099,088
- Issue date Sep 24, 2024
- Advantest Corporation
- Jan Hesselbarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing devices and method for testing semiconductor devices
- Patent number 12,092,655
- Issue date Sep 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket assemblies with liquid cooled frame for semiconductor i...
- Patent number 12,032,000
- Issue date Jul 9, 2024
- Smiths Interconnect Americas, Inc.
- Quynh Ngoc Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Heat exchanger for thermal control of heat producing devices
- Patent number 12,019,095
- Issue date Jun 25, 2024
- Mikros Manufacturing, Inc.
- Jesse D. McGowan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket having an automated lid
- Patent number 12,007,411
- Issue date Jun 11, 2024
- Teradyne, Inc.
- John P. Toscano
- G01 - MEASURING TESTING
Information Patent Grant
Frame for contact unit and socket
- Patent number 12,009,614
- Issue date Jun 11, 2024
- Enplas Corporation
- Yuki Ueyama
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for integrated circuit package
- Patent number 11,994,534
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shao-Chun Chiu
- G01 - MEASURING TESTING
Information Patent Grant
Modular automated test system
- Patent number 11,953,519
- Issue date Apr 9, 2024
- Teradyne, Inc.
- Christopher James Bruno
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device characterization systems and methods
- Patent number 11,940,478
- Issue date Mar 26, 2024
- Duke University
- Aaron D. Franklin
- G01 - MEASURING TESTING
Information Patent Grant
Radio frequency ejector pin for production testing and radio freque...
- Patent number 11,927,602
- Issue date Mar 12, 2024
- SPREADTRUM COMMUNICATIONS (SHENZHEN) CO., LTD.
- Chuan He
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 11,892,472
- Issue date Feb 6, 2024
- Leeno Industrial Inc.
- Chang-hyun Song
- G01 - MEASURING TESTING
Information Patent Grant
Over the air (OTA) chip testing system
- Patent number 11,879,925
- Issue date Jan 23, 2024
- Johnstech International Corporation
- Mike Andres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Socket side thermal system
- Patent number 11,879,910
- Issue date Jan 23, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,846,669
- Issue date Dec 19, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus for testing semiconductor devices
- Patent number 11,802,910
- Issue date Oct 31, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Grant
Test system including active thermal interposer device
- Patent number 11,774,492
- Issue date Oct 3, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Test and burn-in apparatus that provides variable thermal resistance
- Patent number 11,768,224
- Issue date Sep 26, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Test site configuration in an automated test system
- Patent number 11,754,596
- Issue date Sep 12, 2023
- Teradyne, Inc.
- Michael O. McKenna
- G01 - MEASURING TESTING
Information Patent Grant
DUT placement and handling for active thermal interposer device
- Patent number 11,754,620
- Issue date Sep 12, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control system for an automated test system
- Patent number 11,754,622
- Issue date Sep 12, 2023
- Teradyne, Inc.
- Larry Wayne Akers
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Multistory electronic device testing apparatus
- Patent number 11,740,283
- Issue date Aug 29, 2023
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 11,726,111
- Issue date Aug 15, 2023
- LEENO INDUSTRIAL INC.
- Changhyun Song
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
- Patent number 11,719,743
- Issue date Aug 8, 2023
- Kes Systems, Inc.
- Ballson Gopal
- G01 - MEASURING TESTING
Information Patent Grant
Thermal sensor
- Patent number 11,709,200
- Issue date Jul 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Szu-Lin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier
- Patent number 11,693,026
- Issue date Jul 4, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly with antenna and related methods
- Patent number 11,662,363
- Issue date May 30, 2023
- Xcerra Corporation
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Grant
System and method for attenuating and/or terminating RF circuit
- Patent number 11,650,227
- Issue date May 16, 2023
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-thermal resistance pressing device for a socket
- Patent number 11,630,147
- Issue date Apr 18, 2023
- CHROMA ATE INC.
- Ming Cheng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing apparatus
- Patent number 11,630,148
- Issue date Apr 18, 2023
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE...
- Publication number 20240353442
- Publication date Oct 24, 2024
- Korea University Research and Business Foundation
- Moonil Kim
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD FOR FABRICATING THE SAME
- Publication number 20240248118
- Publication date Jul 25, 2024
- LEENO INDUSTRIAL INC.
- Geunsu KIM
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR TESTING ICs
- Publication number 20240230715
- Publication date Jul 11, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20240183878
- Publication date Jun 6, 2024
- TAIWAN MASK CORPORATION
- Chih-Ming CHEN
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR TESTING ICs
- Publication number 20240183879
- Publication date Jun 6, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET FOR AND A METHOD OF TESTING ELECTRONIC COMPONENTS, IN P...
- Publication number 20240168055
- Publication date May 23, 2024
- Cohu GmbH
- Stefan ENGELBRECHT
- G01 - MEASURING TESTING
Information Patent Application
IC INSPECTION SOCKET
- Publication number 20240159793
- Publication date May 16, 2024
- YOKOWO CO., LTD.
- Daigo TAKEI
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING TEST SOCKET
- Publication number 20240110947
- Publication date Apr 4, 2024
- LEENO INDUSTRIAL INC.
- Seungha BAEK
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...
- Publication number 20240077530
- Publication date Mar 7, 2024
- KIOXIA Corporation
- Tetsuharu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER AND PROBE UNIT
- Publication number 20240019460
- Publication date Jan 18, 2024
- NHK Spring Co., Ltd.
- Osamu Ito
- G01 - MEASURING TESTING
Information Patent Application
PLASMA REACTOR HAVING ARRAY OF COAXIAL MULTIPLE PINS AND PROCESSING...
- Publication number 20240006162
- Publication date Jan 4, 2024
- HANGZHOU CITY UNIVERSITY
- QI QIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20240003967
- Publication date Jan 4, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
HEAT EXCHANGER FOR THERMAL CONTROL OF HEAT PRODUCING DEVICES
- Publication number 20230408545
- Publication date Dec 21, 2023
- Mikros Manufacturing, Inc.
- Jesse D. McGowan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid cooling system, liquid cooling method and electronic device-...
- Publication number 20230400478
- Publication date Dec 14, 2023
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20230366926
- Publication date Nov 16, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Application
MULTI-BEAM CANTILEVER STYLE CONTACT PIN FOR IC TESTING
- Publication number 20230349949
- Publication date Nov 2, 2023
- EQUIPTEST ENGINEERING PTE LTD
- Michael GOH
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20230314471
- Publication date Oct 5, 2023
- Yokowo Co., Ltd.
- Masaki NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20230305053
- Publication date Sep 28, 2023
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
- Publication number 20230243869
- Publication date Aug 3, 2023
- XCERRA CORPORATION
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE FOR INTEGRATED CIRCUIT PACKAGE
- Publication number 20230228793
- Publication date Jul 20, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shao-Chun CHIU
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for the Temperature Control of a Substrate and Correspond...
- Publication number 20230148124
- Publication date May 11, 2023
- ERS electronic GmbH
- Klaus Reitinger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20230129112
- Publication date Apr 27, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER
- Publication number 20230131189
- Publication date Apr 27, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND METHOD FOR INTEGRATED CIRCUIT PACKAGE
- Publication number 20230063518
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shao-Chun CHIU
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLIES WITH LIQUID COOLED FRAME FOR SEMICONDUCTOR I...
- Publication number 20230047762
- Publication date Feb 16, 2023
- Smiths Interconnect Americas, Inc.
- Quynh Ngoc Nguyen
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING APPARATUS
- Publication number 20230048515
- Publication date Feb 16, 2023
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
Multistory Electronic Device Testing Apparatus
- Publication number 20230022501
- Publication date Jan 26, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD FOR FABRICATING THE SAME
- Publication number 20220413008
- Publication date Dec 29, 2022
- LEENO INDUSTRIAL INC.
- Geunsu KIM
- G01 - MEASURING TESTING

Sockets or component fixtures for RF or HF testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for fabricating test socket

Test equipment for testing a device under test having an antenna

Testing devices and method for testing semiconductor devices

Test socket assemblies with liquid cooled frame for semiconductor i...

Heat exchanger for thermal control of heat producing devices

Test socket having an automated lid

Frame for contact unit and socket

Testing device for integrated circuit package

Modular automated test system

Electronic device characterization systems and methods

Radio frequency ejector pin for production testing and radio freque...

Test device

Over the air (OTA) chip testing system

Socket side thermal system

Active thermal interposer device

Probe apparatus for testing semiconductor devices

Test system including active thermal interposer device

Test and burn-in apparatus that provides variable thermal resistance

Test site configuration in an automated test system

DUT placement and handling for active thermal interposer device

Thermal control system for an automated test system

Multistory electronic device testing apparatus

Test device

Method and apparatus for conducting burn-in testing of semiconducto...

Thermal sensor

Test carrier

Test socket assembly with antenna and related methods

System and method for attenuating and/or terminating RF circuit

Low-thermal resistance pressing device for a socket

Chip testing apparatus

Patents Applicationslast 30 patents

PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE...

TEST SOCKET AND METHOD FOR FABRICATING THE SAME

SOCKET DEVICE FOR TESTING ICs

TEST SYSTEM FOR TESTING SEMICONDUCTOR DEVICES

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

SOCKET DEVICE FOR TESTING ICs

TEST SOCKET FOR AND A METHOD OF TESTING ELECTRONIC COMPONENTS, IN P...

IC INSPECTION SOCKET

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

METHOD FOR FABRICATING TEST SOCKET

TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...

PROBE HOLDER AND PROBE UNIT

PLASMA REACTOR HAVING ARRAY OF COAXIAL MULTIPLE PINS AND PROCESSING...

ACTIVE THERMAL INTERPOSER DEVICE

HEAT EXCHANGER FOR THERMAL CONTROL OF HEAT PRODUCING DEVICES

Liquid cooling system, liquid cooling method and electronic device-...

PROBE APPARATUS FOR TESTING SEMICONDUCTOR DEVICES

MULTI-BEAM CANTILEVER STYLE CONTACT PIN FOR IC TESTING

INSPECTION DEVICE

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT

TESTING DEVICE FOR INTEGRATED CIRCUIT PACKAGE

Apparatus for the Temperature Control of a Substrate and Correspond...

ACTIVE THERMAL INTERPOSER DEVICE

TEST CARRIER

TESTING DEVICE AND METHOD FOR INTEGRATED CIRCUIT PACKAGE

TEST SOCKET ASSEMBLIES WITH LIQUID COOLED FRAME FOR SEMICONDUCTOR I...

CHIP TESTING APPARATUS

Multistory Electronic Device Testing Apparatus

TEST SOCKET AND METHOD FOR FABRICATING THE SAME