Membership
Tour
Register
Log in
Spectral construction
Follow
Industry
CPC
G01J2003/284
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2003/284
Spectral construction
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Method and system for element identification via optical emission s...
Patent number
12,140,478
Issue date
Nov 12, 2024
Agilent Technologies, Inc.
Daniel Finn McCarthy
G01 - MEASURING TESTING
Information
Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
Patent number
12,031,868
Issue date
Jul 9, 2024
Wavefront Analysis Systems LLC
Okan Ersoy
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for pH sensing in fluids
Patent number
12,007,324
Issue date
Jun 11, 2024
University of Maryland, College Park
Yang Tao
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods of imaging with multi-domain image sensor
Patent number
11,982,527
Issue date
May 14, 2024
QUALCOMM Incorporated
Yun-Chieh Chang
G01 - MEASURING TESTING
Information
Patent Grant
Rolling principal component analysis for dynamic process monitoring...
Patent number
11,920,980
Issue date
Mar 5, 2024
Viavi Solutions Inc.
Lan Sun
G01 - MEASURING TESTING
Information
Patent Grant
Optical module and mobile device having same
Patent number
11,913,837
Issue date
Feb 27, 2024
TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
Hsin-Yen Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Computer storage medium, network system for distributing spectral c...
Patent number
11,573,124
Issue date
Feb 7, 2023
National University Corporation Hokkaido University
Yukihiro Takahashi
G02 - OPTICS
Information
Patent Grant
Spectral camera control device, spectral camera control system, sto...
Patent number
11,542,035
Issue date
Jan 3, 2023
National University Corporation Hokkaido University
Yukihiro Takahashi
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Imaging device with image dispersing to create a spatially coded image
Patent number
11,300,449
Issue date
Apr 12, 2022
University of Utah Research Foundation
Rajesh Menon
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Totagraphy: Coherent diffractive/digital information reconstruction...
Patent number
11,237,059
Issue date
Feb 1, 2022
Gerchberg Ophthalmic Dispensing, PLLC
Okan Ersoy
G01 - MEASURING TESTING
Information
Patent Grant
Temporal-spectral multiplexing sensor and method
Patent number
11,047,737
Issue date
Jun 29, 2021
Spectral Sciences, Inc.
Robert M. Shroll
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer, apparatus and method for measuring biometric information
Patent number
10,948,346
Issue date
Mar 16, 2021
Samsung Electronics Co., Ltd.
Dong Ho Kim
G01 - MEASURING TESTING
Information
Patent Grant
Wavemeter system using a set of optical chips
Patent number
10,900,838
Issue date
Jan 26, 2021
Honeywell International Inc.
Hugh Podmore
G01 - MEASURING TESTING
Information
Patent Grant
Method for reconstructing hyperspectral image using prism and syste...
Patent number
10,891,721
Issue date
Jan 12, 2021
Korea Advanced Institute of Science and Technology
Min Hyuk Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectral camera control device and method for controlling spectral...
Patent number
10,864,998
Issue date
Dec 15, 2020
National University Corporation Hokkaido University
Yukihiro Takahashi
G02 - OPTICS
Information
Patent Grant
Device and method for screening gemstones
Patent number
10,684,230
Issue date
Jun 16, 2020
Gemological Institute of America, Inc. (GIA)
Wuyi Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computationally-assisted multi-heterodyne spectroscopy
Patent number
10,656,016
Issue date
May 19, 2020
Massachusetts Institute of Technology
David Burghoff
G01 - MEASURING TESTING
Information
Patent Grant
Signal-to-noise enhancement
Patent number
10,643,309
Issue date
May 5, 2020
Spectral Sciences, Inc.
Steven Adler-Golden
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectral modeling for complex absorption spectrum interpretation
Patent number
10,557,792
Issue date
Feb 11, 2020
Elena S. F. Berman
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic device and method for sample characterization
Patent number
10,444,142
Issue date
Oct 15, 2019
GREENTROPISM
Antoine Laborde
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectrum detecting method for eliminating package interferenc...
Patent number
10,408,760
Issue date
Sep 10, 2019
Nuctech Company Limited
Hongqiu Wang
G01 - MEASURING TESTING
Information
Patent Grant
Spectrum measurement apparatus and method, and calibration method o...
Patent number
10,365,160
Issue date
Jul 30, 2019
Samsung Electronics Co., Ltd.
Hyo Sun Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and measuring method
Patent number
10,241,031
Issue date
Mar 26, 2019
Osaka University
Makoto Katsura
G01 - MEASURING TESTING
Information
Patent Grant
High accuracy absorbance spectrophotometers
Patent number
10,151,633
Issue date
Dec 11, 2018
Savannah River Nuclear Solutions, LLC
Patrick E. O'Rourke
G01 - MEASURING TESTING
Information
Patent Grant
Computationally-assisted multi-heterodyne spectroscopy
Patent number
10,126,170
Issue date
Nov 13, 2018
Massachusetts Institute of Technology
David Burghoff
G01 - MEASURING TESTING
Information
Patent Grant
Tag reading using targeted spatial spectral detection
Patent number
10,024,717
Issue date
Jul 17, 2018
TruTag Technologies, Inc.
Timothy Learmonth
G01 - MEASURING TESTING
Information
Patent Grant
Field lens corrected three mirror anastigmat spectrograph
Patent number
9,677,932
Issue date
Jun 13, 2017
Burt J. Beardsley
G02 - OPTICS
Information
Patent Grant
Measurement apparatus and measurement method
Patent number
9,612,108
Issue date
Apr 4, 2017
Kabushiki Kaisha Toshiba
Toru Mikami
G01 - MEASURING TESTING
Information
Patent Grant
Signal processing method and apparatus
Patent number
5,379,238
Issue date
Jan 3, 1995
Edward W. Stark
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-line process control monitoring system
Patent number
5,131,746
Issue date
Jul 21, 1992
The United States of America as represented by the United States Department o...
Patrick E. O'Rourke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGING SYSTEM
Publication number
20240422443
Publication date
Dec 19, 2024
Panasonic Intellectual Property Management Co., Ltd.
KEIKO YUGAWA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEMS AND METHODS FOR PH SENSING IN FLUIDS
Publication number
20240402078
Publication date
Dec 5, 2024
University of Maryland, College Park
Yang TAO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR EXTRACTING OVERLAPPING PEAKS BASED ON MODE DE...
Publication number
20240393177
Publication date
Nov 28, 2024
Optosky (Xiamen) Photonics Inc
HongFei Liu
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PERFORMING COLOR CALIBRATION OF MULTISPECTRAL IMAGE SENSO...
Publication number
20240302210
Publication date
Sep 12, 2024
Samsung Electronics Co., Ltd.
Woo-Shik KIM
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGE SENSOR AND SYSTEM EMPLOYING THE SAME
Publication number
20240280406
Publication date
Aug 22, 2024
Korea Advanced Institute of Science and Technology
Mooseok JANG
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
Publication number
20240271999
Publication date
Aug 15, 2024
Tsubasa SAITO
G01 - MEASURING TESTING
Information
Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
Publication number
20240167872
Publication date
May 23, 2024
VIAVI SOLUTIONS INC.
Lan SUN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...
Publication number
20240053201
Publication date
Feb 15, 2024
Daniel Finn McCarthy
G01 - MEASURING TESTING
Information
Patent Application
RECONSTRUCTION METHOD AND DEVICE FOR SPECTRAL IMAGE
Publication number
20240027269
Publication date
Jan 25, 2024
TSINGHUA UNIVERSITY
Kaiyu CUI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
Publication number
20230243699
Publication date
Aug 3, 2023
VIAVI Solutions Inc.
Lan SUN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ANALYZING A SPECTRAL PEAK
Publication number
20230194344
Publication date
Jun 22, 2023
Thermo Fisher Scientific (Bremen) GmbH
Ning Ning Pan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PH SENSING IN FLUIDS
Publication number
20230008019
Publication date
Jan 12, 2023
University of Maryland, College Park
Yang TAO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR OPTIMIZING OUTPUT RESULT OF SPECTROMETER AND ELECTRONIC...
Publication number
20220163387
Publication date
May 26, 2022
CORETRONIC CORPORATION
Feng Wang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DIFFERENTIABLE PROGRAMMING FOR HYPERSPECTRA...
Publication number
20210396580
Publication date
Dec 23, 2021
ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
John Janiczek
G01 - MEASURING TESTING
Information
Patent Application
Temporal-Spectral Multiplexing Sensor and Method
Publication number
20210123805
Publication date
Apr 29, 2021
Spectral Sciences, Inc.
Robert M. Shroll
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CAMERA CONTROL DEVICE, SPECTRAL CAMERA CONTROL SYSTEM, STO...
Publication number
20210114748
Publication date
Apr 22, 2021
National University Corporation Hokkaido University
Yukihiro TAKAHASHI
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
COMPUTER STORAGE MEDIUM, NETWORK SYSTEM FOR DISTRIBUTING SPECTRAL C...
Publication number
20210072084
Publication date
Mar 11, 2021
National University Corporation Hokkaido University
Yukihiro TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
Signal-to-Noise Enhancement
Publication number
20190139196
Publication date
May 9, 2019
Spectral Science, Inc.
Steven Adler-Golden
G01 - MEASURING TESTING
Information
Patent Application
Computationally-Assisted Multi-Heterodyne Spectroscopy
Publication number
20190041267
Publication date
Feb 7, 2019
Massachusetts Institute of Technology
David Burghoff
G01 - MEASURING TESTING
Information
Patent Application
SPECTRUM MEASUREMENT APPARATUS AND METHOD, AND CALIBRATION METHOD O...
Publication number
20190041269
Publication date
Feb 7, 2019
Samsung Electronics Co., Ltd.
HYO SUN HWANG
G01 - MEASURING TESTING
Information
Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
Publication number
20180292261
Publication date
Oct 11, 2018
TruTag Technologies, Inc.
Timothy Learmonth
G01 - MEASURING TESTING
Information
Patent Application
HIGH ACCURACY ABSORBANCE SPECTROPHOTOMETERS
Publication number
20180224334
Publication date
Aug 9, 2018
Savannah River Nuclear Solutions, LLC
Patrick E. O'Rourke
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SPECTRUM DETECTING METHOD FOR ELIMINATING PACKAGE INTERFERENC...
Publication number
20180164216
Publication date
Jun 14, 2018
Nuctech Company Limited
Hongqiu Wang
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER, APPARATUS AND METHOD FOR MEASURING BIOMETRIC INFORMATION
Publication number
20180128680
Publication date
May 10, 2018
Samsung Electronics Co., Ltd.
Dong Ho KIM
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE AND MEASURING METHOD
Publication number
20170160190
Publication date
Jun 8, 2017
OSAKA UNIVERSITY
Makoto KATSURA
G02 - OPTICS
Information
Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
Publication number
20170146402
Publication date
May 25, 2017
TruTag Technologies, Inc.
Timothy Learmonth
G01 - MEASURING TESTING
Information
Patent Application
Computationally-Assisted Multi-Heterodyne Spectroscopy
Publication number
20170138791
Publication date
May 18, 2017
Massachusetts Institute of Technology
David Burghoff
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20160139034
Publication date
May 19, 2016
KABUSHIKI KAISHA TOSHIBA
Toru MIKAMI
G01 - MEASURING TESTING