Spectral construction

Industry

CPC
G01J2003/284

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2003/284Spectral construction

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and system for element identification via optical emission s...
- Patent number 12,140,478
- Issue date Nov 12, 2024
- Agilent Technologies, Inc.
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
- Patent number 12,031,868
- Issue date Jul 9, 2024
- Wavefront Analysis Systems LLC
- Okan Ersoy
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for pH sensing in fluids
- Patent number 12,007,324
- Issue date Jun 11, 2024
- University of Maryland, College Park
- Yang Tao
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of imaging with multi-domain image sensor
- Patent number 11,982,527
- Issue date May 14, 2024
- QUALCOMM Incorporated
- Yun-Chieh Chang
- G01 - MEASURING TESTING
Information Patent Grant
Rolling principal component analysis for dynamic process monitoring...
- Patent number 11,920,980
- Issue date Mar 5, 2024
- Viavi Solutions Inc.
- Lan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Optical module and mobile device having same
- Patent number 11,913,837
- Issue date Feb 27, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
- Hsin-Yen Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Computer storage medium, network system for distributing spectral c...
- Patent number 11,573,124
- Issue date Feb 7, 2023
- National University Corporation Hokkaido University
- Yukihiro Takahashi
- G02 - OPTICS
Information Patent Grant
Spectral camera control device, spectral camera control system, sto...
- Patent number 11,542,035
- Issue date Jan 3, 2023
- National University Corporation Hokkaido University
- Yukihiro Takahashi
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Imaging device with image dispersing to create a spatially coded image
- Patent number 11,300,449
- Issue date Apr 12, 2022
- University of Utah Research Foundation
- Rajesh Menon
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Totagraphy: Coherent diffractive/digital information reconstruction...
- Patent number 11,237,059
- Issue date Feb 1, 2022
- Gerchberg Ophthalmic Dispensing, PLLC
- Okan Ersoy
- G01 - MEASURING TESTING
Information Patent Grant
Temporal-spectral multiplexing sensor and method
- Patent number 11,047,737
- Issue date Jun 29, 2021
- Spectral Sciences, Inc.
- Robert M. Shroll
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer, apparatus and method for measuring biometric information
- Patent number 10,948,346
- Issue date Mar 16, 2021
- Samsung Electronics Co., Ltd.
- Dong Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Wavemeter system using a set of optical chips
- Patent number 10,900,838
- Issue date Jan 26, 2021
- Honeywell International Inc.
- Hugh Podmore
- G01 - MEASURING TESTING
Information Patent Grant
Method for reconstructing hyperspectral image using prism and syste...
- Patent number 10,891,721
- Issue date Jan 12, 2021
- Korea Advanced Institute of Science and Technology
- Min Hyuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectral camera control device and method for controlling spectral...
- Patent number 10,864,998
- Issue date Dec 15, 2020
- National University Corporation Hokkaido University
- Yukihiro Takahashi
- G02 - OPTICS
Information Patent Grant
Device and method for screening gemstones
- Patent number 10,684,230
- Issue date Jun 16, 2020
- Gemological Institute of America, Inc. (GIA)
- Wuyi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Computationally-assisted multi-heterodyne spectroscopy
- Patent number 10,656,016
- Issue date May 19, 2020
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Grant
Signal-to-noise enhancement
- Patent number 10,643,309
- Issue date May 5, 2020
- Spectral Sciences, Inc.
- Steven Adler-Golden
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectral modeling for complex absorption spectrum interpretation
- Patent number 10,557,792
- Issue date Feb 11, 2020
- Elena S. F. Berman
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic device and method for sample characterization
- Patent number 10,444,142
- Issue date Oct 15, 2019
- GREENTROPISM
- Antoine Laborde
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectrum detecting method for eliminating package interferenc...
- Patent number 10,408,760
- Issue date Sep 10, 2019
- Nuctech Company Limited
- Hongqiu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measurement apparatus and method, and calibration method o...
- Patent number 10,365,160
- Issue date Jul 30, 2019
- Samsung Electronics Co., Ltd.
- Hyo Sun Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method
- Patent number 10,241,031
- Issue date Mar 26, 2019
- Osaka University
- Makoto Katsura
- G01 - MEASURING TESTING
Information Patent Grant
High accuracy absorbance spectrophotometers
- Patent number 10,151,633
- Issue date Dec 11, 2018
- Savannah River Nuclear Solutions, LLC
- Patrick E. O'Rourke
- G01 - MEASURING TESTING
Information Patent Grant
Computationally-assisted multi-heterodyne spectroscopy
- Patent number 10,126,170
- Issue date Nov 13, 2018
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Grant
Tag reading using targeted spatial spectral detection
- Patent number 10,024,717
- Issue date Jul 17, 2018
- TruTag Technologies, Inc.
- Timothy Learmonth
- G01 - MEASURING TESTING
Information Patent Grant
Field lens corrected three mirror anastigmat spectrograph
- Patent number 9,677,932
- Issue date Jun 13, 2017
- Burt J. Beardsley
- G02 - OPTICS
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 9,612,108
- Issue date Apr 4, 2017
- Kabushiki Kaisha Toshiba
- Toru Mikami
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing method and apparatus
- Patent number 5,379,238
- Issue date Jan 3, 1995
- Edward W. Stark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-line process control monitoring system
- Patent number 5,131,746
- Issue date Jul 21, 1992
- The United States of America as represented by the United States Department o...
- Patrick E. O'Rourke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PERFORMING COLOR CALIBRATION OF MULTISPECTRAL IMAGE SENSO...
- Publication number 20240302210
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Woo-Shik KIM
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGE SENSOR AND SYSTEM EMPLOYING THE SAME
- Publication number 20240280406
- Publication date Aug 22, 2024
- Korea Advanced Institute of Science and Technology
- Mooseok JANG
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
- Publication number 20240271999
- Publication date Aug 15, 2024
- Tsubasa SAITO
- G01 - MEASURING TESTING
Information Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
- Publication number 20240167872
- Publication date May 23, 2024
- VIAVI SOLUTIONS INC.
- Lan SUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...
- Publication number 20240053201
- Publication date Feb 15, 2024
- Daniel Finn McCarthy
- G01 - MEASURING TESTING
Information Patent Application
RECONSTRUCTION METHOD AND DEVICE FOR SPECTRAL IMAGE
- Publication number 20240027269
- Publication date Jan 25, 2024
- TSINGHUA UNIVERSITY
- Kaiyu CUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
- Publication number 20230243699
- Publication date Aug 3, 2023
- VIAVI Solutions Inc.
- Lan SUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A SPECTRAL PEAK
- Publication number 20230194344
- Publication date Jun 22, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Ning Ning Pan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PH SENSING IN FLUIDS
- Publication number 20230008019
- Publication date Jan 12, 2023
- University of Maryland, College Park
- Yang TAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPTIMIZING OUTPUT RESULT OF SPECTROMETER AND ELECTRONIC...
- Publication number 20220163387
- Publication date May 26, 2022
- CORETRONIC CORPORATION
- Feng Wang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DIFFERENTIABLE PROGRAMMING FOR HYPERSPECTRA...
- Publication number 20210396580
- Publication date Dec 23, 2021
- ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY
- John Janiczek
- G01 - MEASURING TESTING
Information Patent Application
Temporal-Spectral Multiplexing Sensor and Method
- Publication number 20210123805
- Publication date Apr 29, 2021
- Spectral Sciences, Inc.
- Robert M. Shroll
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL CAMERA CONTROL DEVICE, SPECTRAL CAMERA CONTROL SYSTEM, STO...
- Publication number 20210114748
- Publication date Apr 22, 2021
- National University Corporation Hokkaido University
- Yukihiro TAKAHASHI
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
COMPUTER STORAGE MEDIUM, NETWORK SYSTEM FOR DISTRIBUTING SPECTRAL C...
- Publication number 20210072084
- Publication date Mar 11, 2021
- National University Corporation Hokkaido University
- Yukihiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
Signal-to-Noise Enhancement
- Publication number 20190139196
- Publication date May 9, 2019
- Spectral Science, Inc.
- Steven Adler-Golden
- G01 - MEASURING TESTING
Information Patent Application
Computationally-Assisted Multi-Heterodyne Spectroscopy
- Publication number 20190041267
- Publication date Feb 7, 2019
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT APPARATUS AND METHOD, AND CALIBRATION METHOD O...
- Publication number 20190041269
- Publication date Feb 7, 2019
- Samsung Electronics Co., Ltd.
- HYO SUN HWANG
- G01 - MEASURING TESTING
Information Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
- Publication number 20180292261
- Publication date Oct 11, 2018
- TruTag Technologies, Inc.
- Timothy Learmonth
- G01 - MEASURING TESTING
Information Patent Application
HIGH ACCURACY ABSORBANCE SPECTROPHOTOMETERS
- Publication number 20180224334
- Publication date Aug 9, 2018
- Savannah River Nuclear Solutions, LLC
- Patrick E. O'Rourke
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTRUM DETECTING METHOD FOR ELIMINATING PACKAGE INTERFERENC...
- Publication number 20180164216
- Publication date Jun 14, 2018
- Nuctech Company Limited
- Hongqiu Wang
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, APPARATUS AND METHOD FOR MEASURING BIOMETRIC INFORMATION
- Publication number 20180128680
- Publication date May 10, 2018
- Samsung Electronics Co., Ltd.
- Dong Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20170160190
- Publication date Jun 8, 2017
- OSAKA UNIVERSITY
- Makoto KATSURA
- G02 - OPTICS
Information Patent Application
TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION
- Publication number 20170146402
- Publication date May 25, 2017
- TruTag Technologies, Inc.
- Timothy Learmonth
- G01 - MEASURING TESTING
Information Patent Application
Computationally-Assisted Multi-Heterodyne Spectroscopy
- Publication number 20170138791
- Publication date May 18, 2017
- Massachusetts Institute of Technology
- David Burghoff
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20160139034
- Publication date May 19, 2016
- KABUSHIKI KAISHA TOSHIBA
- Toru MIKAMI
- G01 - MEASURING TESTING

Spectral construction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for element identification via optical emission s...

Totagraphy: coherent diffractive/digital information reconstruction...

Systems and methods for pH sensing in fluids

Systems and methods of imaging with multi-domain image sensor

Rolling principal component analysis for dynamic process monitoring...

Optical module and mobile device having same

Computer storage medium, network system for distributing spectral c...

Spectral camera control device, spectral camera control system, sto...

Imaging device with image dispersing to create a spatially coded image

Totagraphy: Coherent diffractive/digital information reconstruction...

Temporal-spectral multiplexing sensor and method

Spectrometer, apparatus and method for measuring biometric information

Wavemeter system using a set of optical chips

Method for reconstructing hyperspectral image using prism and syste...

Spectral camera control device and method for controlling spectral...

Device and method for screening gemstones

Computationally-assisted multi-heterodyne spectroscopy

Signal-to-noise enhancement

Spectral modeling for complex absorption spectrum interpretation

Spectroscopic device and method for sample characterization

Raman spectrum detecting method for eliminating package interferenc...

Spectrum measurement apparatus and method, and calibration method o...

Measuring device and measuring method

High accuracy absorbance spectrophotometers

Computationally-assisted multi-heterodyne spectroscopy

Tag reading using targeted spatial spectral detection

Field lens corrected three mirror anastigmat spectrograph

Measurement apparatus and measurement method

Signal processing method and apparatus

On-line process control monitoring system

Patents Applicationslast 30 patents

METHOD OF PERFORMING COLOR CALIBRATION OF MULTISPECTRAL IMAGE SENSO...

HYPERSPECTRAL IMAGE SENSOR AND SYSTEM EMPLOYING THE SAME

SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...

ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...

METHOD AND SYSTEM FOR ELEMENT IDENTIFICATION VIA OPTICAL EMISSION S...

RECONSTRUCTION METHOD AND DEVICE FOR SPECTRAL IMAGE

ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...

METHOD OF ANALYZING A SPECTRAL PEAK

SYSTEMS AND METHODS FOR PH SENSING IN FLUIDS

METHOD FOR OPTIMIZING OUTPUT RESULT OF SPECTROMETER AND ELECTRONIC...

SYSTEMS AND METHODS FOR DIFFERENTIABLE PROGRAMMING FOR HYPERSPECTRA...

Temporal-Spectral Multiplexing Sensor and Method

SPECTRAL CAMERA CONTROL DEVICE, SPECTRAL CAMERA CONTROL SYSTEM, STO...

COMPUTER STORAGE MEDIUM, NETWORK SYSTEM FOR DISTRIBUTING SPECTRAL C...

Signal-to-Noise Enhancement

Computationally-Assisted Multi-Heterodyne Spectroscopy

SPECTRUM MEASUREMENT APPARATUS AND METHOD, AND CALIBRATION METHOD O...

TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION

HIGH ACCURACY ABSORBANCE SPECTROPHOTOMETERS

RAMAN SPECTRUM DETECTING METHOD FOR ELIMINATING PACKAGE INTERFERENC...

SPECTROMETER, APPARATUS AND METHOD FOR MEASURING BIOMETRIC INFORMATION

MEASURING DEVICE AND MEASURING METHOD

TAG READING USING TARGETED SPATIAL SPECTRAL DETECTION

Computationally-Assisted Multi-Heterodyne Spectroscopy

MEASUREMENT APPARATUS AND MEASUREMENT METHOD