Tester hardware

Industry

CPC
G01R31/319

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/319Tester hardware

Industries

Patents Grantslast 30 patents

Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error rate measurement apparatus and error rate measurement method
- Patent number 12,265,120
- Issue date Apr 1, 2025
- Anritsu Corporation
- Hiroyuki Onuma
- G01 - MEASURING TESTING
Information Patent Grant
Universal test chiplet
- Patent number 12,265,123
- Issue date Apr 1, 2025
- Nanjing University Of Posts And Telecommunications
- Zhikuang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Test time reduction in circuits with redundancy flip-flops
- Patent number 12,265,124
- Issue date Apr 1, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
System and method for separation and classification of signals usin...
- Patent number 12,265,125
- Issue date Apr 1, 2025
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock recovery unit adjustment
- Patent number 12,255,979
- Issue date Mar 18, 2025
- Keysight Technologies, Inc.
- Marlin E. Viss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Output voltage compensation method
- Patent number 12,248,023
- Issue date Mar 11, 2025
- CHROMA ATE INC.
- Chih-Huan Fang
- G01 - MEASURING TESTING
Information Patent Grant
Estimation of unknown electronic load
- Patent number 12,241,939
- Issue date Mar 4, 2025
- KEITHLEY INSTRUMENTS, LLC
- William C. Weeman
- G01 - MEASURING TESTING
Information Patent Grant
Test system that converts command syntaxes
- Patent number 12,235,317
- Issue date Feb 25, 2025
- Teradyne, Inc.
- Richard W. Fanning
- G01 - MEASURING TESTING
Information Patent Grant
Current shunt probe
- Patent number 12,235,291
- Issue date Feb 25, 2025
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Integrated communication link testing
- Patent number 12,222,388
- Issue date Feb 11, 2025
- Tektronix, Inc.
- Pirooz Hojabri
- G01 - MEASURING TESTING
Information Patent Grant
Output voltage glitch reduction in test systems
- Patent number 12,216,164
- Issue date Feb 4, 2025
- Analog Devices, Inc.
- Michael E. Harrell
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of testing devices using CXL for increased para...
- Patent number 12,216,163
- Issue date Feb 4, 2025
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,216,159
- Issue date Feb 4, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for parallel testing of electronic device
- Patent number 12,203,982
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Grant
Random function selection and insertion during compilation for post...
- Patent number 12,203,986
- Issue date Jan 21, 2025
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Electronic instrument for analyzing a DUT
- Patent number 12,196,809
- Issue date Jan 14, 2025
- Rohde & Schwarz GmbH & Co. KG
- Mathias Hellwig
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Device under test simulation equipment
- Patent number 12,174,244
- Issue date Dec 24, 2024
- Teradyne (Asia) Pte. Ltd.
- Min Nie
- G01 - MEASURING TESTING
Information Patent Grant
Bias generator testing using grouped bias currents
- Patent number 12,174,253
- Issue date Dec 24, 2024
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING
Information Patent Grant
Delay measurement system and measurement method
- Patent number 12,169,222
- Issue date Dec 17, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Shang Hsien Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,165,728
- Issue date Dec 10, 2024
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring circuit, integrated circuit including the same, and oper...
- Patent number 12,158,501
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Yongwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Bit error ratio estimation using machine learning
- Patent number 12,146,914
- Issue date Nov 19, 2024
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement system for identifying aggressor signals
- Patent number 12,140,631
- Issue date Nov 12, 2024
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
POWER VECTOR ANALYZER
- Publication number 20250130279
- Publication date Apr 24, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...
- Publication number 20250110175
- Publication date Apr 3, 2025
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION CIRCUIT
- Publication number 20250110176
- Publication date Apr 3, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Weibing Jing
- G01 - MEASURING TESTING
Information Patent Application
TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN
- Publication number 20250102570
- Publication date Mar 27, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDE...
- Publication number 20250102573
- Publication date Mar 27, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING
- Publication number 20250102562
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Jess Gillespie
- G01 - MEASURING TESTING
Information Patent Application
TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS
- Publication number 20250102574
- Publication date Mar 27, 2025
- STMicroelectronics International N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20250093415
- Publication date Mar 20, 2025
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085337
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM
- Publication number 20250085348
- Publication date Mar 13, 2025
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250085338
- Publication date Mar 13, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST SYSTEM AND METHOD THEREOF
- Publication number 20250085347
- Publication date Mar 13, 2025
- WISTRON NEWEB CORPORATION
- Fang-Ching CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED HARDWARE-IN-THE-LOOP (HIL) SYSTEM FOR TESTING HARDWARE D...
- Publication number 20250085349
- Publication date Mar 13, 2025
- L&T TECHNOLOGY SERVICES LIMITED
- AYYAMPERUMAL NARAYANASAMY
- G01 - MEASURING TESTING
Information Patent Application
RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND...
- Publication number 20250076381
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan LEE
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
- Publication number 20250076377
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Junhee Shin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROCESSOR DEBUGGING OVER AN INTERCONNECT FABRIC
- Publication number 20250076375
- Publication date Mar 6, 2025
- International Business Machines Corporation
- Michael James BECHT
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION
- Publication number 20250067804
- Publication date Feb 27, 2025
- Advantest Corporation
- Matthias SAUER
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...
- Publication number 20250067805
- Publication date Feb 27, 2025
- Samsung Electronics Co., Ltd.
- Yongwoo KIM
- G01 - MEASURING TESTING
Information Patent Application
DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20250060410
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHANG HSIEN YANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF
- Publication number 20250044353
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
- Publication number 20250044345
- Publication date Feb 6, 2025
- MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
- Guoliang MAO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST
- Publication number 20250027986
- Publication date Jan 23, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Thorsten LUECK
- G01 - MEASURING TESTING
Information Patent Application
TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT
- Publication number 20250023646
- Publication date Jan 16, 2025
- Yangtze Memory Technologies Co., Ltd.
- Yangyang Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...
- Publication number 20250012858
- Publication date Jan 9, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...
- Publication number 20250004040
- Publication date Jan 2, 2025
- VESTAS WIND SYSTEMS A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Application
GENERATING A TEST PROGRAM
- Publication number 20240426906
- Publication date Dec 26, 2024
- Teradyne, Inc.
- Charles J. Carline
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND
- Publication number 20240418777
- Publication date Dec 19, 2024
- Analog Devices, Inc.
- Christopher C. McQuilkin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...
- Publication number 20240418778
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...
- Publication number 20240418775
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING

Tester hardware

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Component die validation built-in self-test (VBIST) engine

Error rate measurement apparatus and error rate measurement method

Universal test chiplet

Test time reduction in circuits with redundancy flip-flops

System and method for separation and classification of signals usin...

Clock recovery unit adjustment

Method for producing a probe used for testing integrated electronic...

Output voltage compensation method

Estimation of unknown electronic load

Test system that converts command syntaxes

Current shunt probe

Integrated communication link testing

Output voltage glitch reduction in test systems

On-die aging measurements for dynamic timing modeling

Systems and methods of testing devices using CXL for increased para...

Circuit and method to measure simulation to silicon timing correlation

System and method for parallel testing of electronic device

Random function selection and insertion during compilation for post...

Electronic instrument for analyzing a DUT

Method and system for controlling actions of testbench components w...

Apparatus for performing multiple tests on a device under test

Device under test simulation equipment

Bias generator testing using grouped bias currents

Delay measurement system and measurement method

Apparatus for testing electronic devices

Automated test equipment comprising a plurality of communication in...

Monitoring circuit, integrated circuit including the same, and oper...

Modular wireless communication device testing system

Bit error ratio estimation using machine learning

Measurement system for identifying aggressor signals

Patents Applicationslast 30 patents

POWER VECTOR ANALYZER

METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...

FAULT DETECTION CIRCUIT

TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN

SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDE...

MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING

TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

AUTOMATED TEST SYSTEM AND METHOD THEREOF

INTEGRATED HARDWARE-IN-THE-LOOP (HIL) SYSTEM FOR TESTING HARDWARE D...

RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND...

BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...

PROCESSOR DEBUGGING OVER AN INTERCONNECT FABRIC

AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION

MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPER...

DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD

SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF

UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...

MEASUREMENT DEVICE FOR CHARACTERIZING A DEVICE-UNDER-TEST

TESTER CHANNEL MULTIPLEXING IN TEST EQUIPMENT

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING M...

VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...

GENERATING A TEST PROGRAM

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...

METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...