using a combination of at least two kinds of measurements, with at least one measurement of secondary emission

Industry

CPC
G01N23/2206

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2206using a combination of at least two kinds of measurements, with at least one measurement of secondary emission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...
- Patent number 12,061,159
- Issue date Aug 13, 2024
- FEI Company
- Daniel Totonjian
- G01 - MEASURING TESTING
Information Patent Grant
Mammography imaging system using X-ray fluorescence
- Patent number 12,029,599
- Issue date Jul 9, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,971,372
- Issue date Apr 30, 2024
- FEI Company
- Jan Klusácek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Integrated system for assessing and modeling integrity of wheels an...
- Patent number 11,921,084
- Issue date Mar 5, 2024
- CleanSolv International LTD
- Thomas Shumka
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detection and identification of foreign eleme...
- Patent number 11,867,645
- Issue date Jan 9, 2024
- Security Matters LTD.
- Yair Grof
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
Through-tubing, cased-hole sealed material density evaluation using...
- Patent number 11,815,478
- Issue date Nov 14, 2023
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging method and system
- Patent number 11,733,183
- Issue date Aug 22, 2023
- DETECTION TECHNOLOGY OYJ
- Alex Winkler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Edge phase effects removal using wavelet correction and particle cl...
- Patent number 11,645,792
- Issue date May 9, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for calibrating a PET scanner
- Patent number 11,619,755
- Issue date Apr 4, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu Lyu
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,598,733
- Issue date Mar 7, 2023
- FEI Company
- Tomas Tûma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, devices, and methods for x-ray fluorescence analysis of ge...
- Patent number 11,592,407
- Issue date Feb 28, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based evaluation of a status of a structure of a substrate
- Patent number 11,543,368
- Issue date Jan 3, 2023
- Applied Materials Israel Ltd.
- Dror Shemesh
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Faulted condition determination device and faulted condition determ...
- Patent number 11,378,526
- Issue date Jul 5, 2022
- Mitsubishi Heavy Industries, Ltd.
- Nobuhiko Saito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Density analysis of geological sample
- Patent number 11,366,073
- Issue date Jun 21, 2022
- Orexplore AB
- Alexander Hansson
- G01 - MEASURING TESTING
Information Patent Grant
Method and installation for determining an improved mineralogical c...
- Patent number 11,340,207
- Issue date May 24, 2022
- Schlumberger Technology Corporation
- Yohann Rocher
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN
- Publication number 20240361262
- Publication date Oct 31, 2024
- ETROLOGY, LLC
- Vladislav Kaplan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING
Information Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
- Publication number 20240331179
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20240280517
- Publication date Aug 22, 2024
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20240192153
- Publication date Jun 13, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
- Publication number 20240044820
- Publication date Feb 8, 2024
- ASML NETHERLANDS B.V.
- Kuo-Feng TSENG
- G01 - MEASURING TESTING
Information Patent Application
Positive Electrode Active Material, and Positive Electrode and Lith...
- Publication number 20230387405
- Publication date Nov 30, 2023
- LG CHEM, LTD.
- Won Sig Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349843
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349845
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349844
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20230341341
- Publication date Oct 26, 2023
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING
Information Patent Application
Multi-Physical Field Imaging Method and System Based on PET-CT and DAS
- Publication number 20230296797
- Publication date Sep 21, 2023
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Zizhuo Ma
- G01 - MEASURING TESTING
Information Patent Application
A Detection System and Method for Investigating a Content of an Item
- Publication number 20230266257
- Publication date Aug 24, 2023
- Dynaxion B.V.
- Emma Wooldridge
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
- Publication number 20230243988
- Publication date Aug 3, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu LYU
- G01 - MEASURING TESTING
Information Patent Application
GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...
- Publication number 20230175992
- Publication date Jun 8, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE
- Publication number 20230170179
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Yongxin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230112447
- Publication date Apr 13, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE LOGGING WITH CUTTINGS-BASED ROCK PETROPHYSICS ANALYSIS
- Publication number 20230105670
- Publication date Apr 6, 2023
- Baker Hughes Oilfield Operations LLC
- Yanhua Yao
- E21 - EARTH DRILLING MINING
Information Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
- Publication number 20230096574
- Publication date Mar 30, 2023
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- G01 - MEASURING TESTING
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EXAMINATION DEVICE
- Publication number 20220381712
- Publication date Dec 1, 2022
- ANTON PAAR GMBH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...
- Publication number 20220373484
- Publication date Nov 24, 2022
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Application
Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...
- Publication number 20220366620
- Publication date Nov 17, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING

using a combination of at least two kinds of measurements, with at least one measurement of secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...

Mammography imaging system using X-ray fluorescence

Inspection apparatus and inspection method

Method of examining a sample using a charged particle microscope

Inspection apparatus and inspection method

Method for improving an EBSD/TKD map

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Integrated system for assessing and modeling integrity of wheels an...

Lateral recess measurement in a semiconductor specimen

System and method for detection and identification of foreign eleme...

X-ray examination device

Through-tubing, cased-hole sealed material density evaluation using...

Method of examining a sample using a charged particle beam apparatus

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Imaging method and system

Edge phase effects removal using wavelet correction and particle cl...

System and method for calibrating a PET scanner

Method of examining a sample using a charged particle microscope

Systems, devices, and methods for x-ray fluorescence analysis of ge...

X-ray reflectometry apparatus and method thereof for measuring thre...

System and method using x-rays for depth-resolving metrology and an...

X-ray based evaluation of a status of a structure of a substrate

X-ray analyzer

Charged particle beam irradiation apparatus and control method

Faulted condition determination device and faulted condition determ...

Density analysis of geological sample

Method and installation for determining an improved mineralogical c...

Patents Applicationslast 30 patents

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

AN X-RAY FLUORESCENCE SYSTEM

Analysis Device and Analysis Method

INSPECTION APPARATUS AND INSPECTION METHOD

SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...

3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

CHARGED PARTICLE DETECTOR

NONDESTRUCTIVE INSPECTION SYSTEM

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES

Positive Electrode Active Material, and Positive Electrode and Lith...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...

Multi-Physical Field Imaging Method and System Based on PET-CT and DAS

A Detection System and Method for Investigating a Content of an Item

SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER

GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...

ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

SURFACE LOGGING WITH CUTTINGS-BASED ROCK PETROPHYSICS ANALYSIS

CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

X-RAY EXAMINATION DEVICE

THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...

Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...