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using a combination of at least two kinds of measurements, with at least one measurement of secondary emission
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CPC
G01N23/2206
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/2206
using a combination of at least two kinds of measurements, with at least one measurement of secondary emission
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,971,372
Issue date
Apr 30, 2024
FEI Company
Jan Klusácek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,554
Issue date
Mar 12, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,921,059
Issue date
Mar 5, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Integrated system for assessing and modeling integrity of wheels an...
Patent number
11,921,084
Issue date
Mar 5, 2024
CleanSolv International LTD
Thomas Shumka
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Lateral recess measurement in a semiconductor specimen
Patent number
11,921,063
Issue date
Mar 5, 2024
Applied Materials Israel Ltd.
Michael Chemama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detection and identification of foreign eleme...
Patent number
11,867,645
Issue date
Jan 9, 2024
Security Matters LTD.
Yair Grof
G01 - MEASURING TESTING
Information
Patent Grant
X-ray examination device
Patent number
11,821,856
Issue date
Nov 21, 2023
Anton Paar GmbH
Josef Gautsch
G01 - MEASURING TESTING
Information
Patent Grant
Through-tubing, cased-hole sealed material density evaluation using...
Patent number
11,815,478
Issue date
Nov 14, 2023
Halliburton Energy Services, Inc.
Pablo Vieira Rego
E21 - EARTH DRILLING MINING
Information
Patent Grant
Method of examining a sample using a charged particle beam apparatus
Patent number
11,815,479
Issue date
Nov 14, 2023
FEI Company
Oleksii Kaplenko
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
Patent number
11,774,380
Issue date
Oct 3, 2023
Sichuan University
Yuanjun Xu
G01 - MEASURING TESTING
Information
Patent Grant
Imaging method and system
Patent number
11,733,183
Issue date
Aug 22, 2023
DETECTION TECHNOLOGY OYJ
Alex Winkler
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Edge phase effects removal using wavelet correction and particle cl...
Patent number
11,645,792
Issue date
May 9, 2023
Carl Zeiss X-ray Microscopy, Inc.
Matthew Andrew
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for calibrating a PET scanner
Patent number
11,619,755
Issue date
Apr 4, 2023
Shanghai United Imaging Healthcare Co., Ltd.
Xinyu Lyu
G01 - MEASURING TESTING
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,598,733
Issue date
Mar 7, 2023
FEI Company
Tomas Tûma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems, devices, and methods for x-ray fluorescence analysis of ge...
Patent number
11,592,407
Issue date
Feb 28, 2023
Enersoft Inc.
Yannai Z. R. Segal
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
Patent number
11,579,099
Issue date
Feb 14, 2023
Industrial Technology Research Institute
Chun-Ting Liu
G01 - MEASURING TESTING
Information
Patent Grant
System and method using x-rays for depth-resolving metrology and an...
Patent number
11,549,895
Issue date
Jan 10, 2023
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
X-ray based evaluation of a status of a structure of a substrate
Patent number
11,543,368
Issue date
Jan 3, 2023
Applied Materials Israel Ltd.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analyzer
Patent number
11,467,103
Issue date
Oct 11, 2022
APPLIED SCIENCE LABORATORY CO., LTD.
Hiroyoshi Soejima
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Charged particle beam irradiation apparatus and control method
Patent number
11,424,100
Issue date
Aug 23, 2022
Hitachi High-Tech Science Corporation
Takuma Aso
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Faulted condition determination device and faulted condition determ...
Patent number
11,378,526
Issue date
Jul 5, 2022
Mitsubishi Heavy Industries, Ltd.
Nobuhiko Saito
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Density analysis of geological sample
Patent number
11,366,073
Issue date
Jun 21, 2022
Orexplore AB
Alexander Hansson
G01 - MEASURING TESTING
Information
Patent Grant
Method and installation for determining an improved mineralogical c...
Patent number
11,340,207
Issue date
May 24, 2022
Schlumberger Technology Corporation
Yohann Rocher
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam device
Patent number
11,328,897
Issue date
May 10, 2022
HITACHI HIGH-TECH CORPORATION
Minami Shouji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,327,032
Issue date
May 10, 2022
FEI Company
Jan Klusácek
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
Publication number
20240110880
Publication date
Apr 4, 2024
FEI Company
Maurice PEEMEN
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
Publication number
20240044820
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Kuo-Feng TSENG
G01 - MEASURING TESTING
Information
Patent Application
Positive Electrode Active Material, and Positive Electrode and Lith...
Publication number
20230387405
Publication date
Nov 30, 2023
LG CHEM, LTD.
Won Sig Jung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349843
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349845
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349844
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
Publication number
20230341341
Publication date
Oct 26, 2023
FEI Company
Daniel TOTONJIAN
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
Publication number
20230296540
Publication date
Sep 21, 2023
GATAN INC.
Johannes ÖSTERREICHER
G01 - MEASURING TESTING
Information
Patent Application
Multi-Physical Field Imaging Method and System Based on PET-CT and DAS
Publication number
20230296797
Publication date
Sep 21, 2023
Institute of Geology and Geophysics, Chinese Academy of Sciences
Zizhuo Ma
G01 - MEASURING TESTING
Information
Patent Application
A Detection System and Method for Investigating a Content of an Item
Publication number
20230266257
Publication date
Aug 24, 2023
Dynaxion B.V.
Emma Wooldridge
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
Publication number
20230243988
Publication date
Aug 3, 2023
Shanghai United Imaging Healthcare Co., Ltd.
Xinyu LYU
G01 - MEASURING TESTING
Information
Patent Application
GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...
Publication number
20230175992
Publication date
Jun 8, 2023
Enersoft Inc.
Yannai Z. R. Segal
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED ARCHITECTURE FOR HIGH-PERFORMANCE DETECTION DEVICE
Publication number
20230170179
Publication date
Jun 1, 2023
ASML NETHERLANDS B.V.
Yongxin WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
Publication number
20230112447
Publication date
Apr 13, 2023
ASML NETHERLANDS B.V.
Weiming REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SURFACE LOGGING WITH CUTTINGS-BASED ROCK PETROPHYSICS ANALYSIS
Publication number
20230105670
Publication date
Apr 6, 2023
Baker Hughes Oilfield Operations LLC
Yanhua Yao
E21 - EARTH DRILLING MINING
Information
Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
Publication number
20230096574
Publication date
Mar 30, 2023
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
G01 - MEASURING TESTING
Information
Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
Publication number
20230023363
Publication date
Jan 26, 2023
APPLIED MATERIALS ISRAEL LTD.
Michael CHEMAMA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY EXAMINATION DEVICE
Publication number
20220381712
Publication date
Dec 1, 2022
ANTON PAAR GMBH
Josef Gautsch
G01 - MEASURING TESTING
Information
Patent Application
THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...
Publication number
20220373484
Publication date
Nov 24, 2022
Halliburton Energy Services, Inc.
Pablo Vieira Rego
E21 - EARTH DRILLING MINING
Information
Patent Application
Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...
Publication number
20220366620
Publication date
Nov 17, 2022
Carl Zeiss X-ray Microscopy, Inc.
Matthew Andrew
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PULSED NEUTRON APPARATUS AND METHOD FOR USING SAME TO ANALYZE CORE...
Publication number
20220349846
Publication date
Nov 3, 2022
CORE LABORATORIES LP
Derek Raymond Beckett
G01 - MEASURING TESTING
Information
Patent Application
Multiple image segmentation and/or multiple dynamic spectral acquis...
Publication number
20220319206
Publication date
Oct 6, 2022
FEI Company
Darius Kocár
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
Publication number
20220221412
Publication date
Jul 14, 2022
BRUKER NANO GMBH
Daniel Radu GORAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGING METHOD AND SYSTEM
Publication number
20220196579
Publication date
Jun 23, 2022
Detection Technology Oyj
Alex WINKLER
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
Publication number
20220065804
Publication date
Mar 3, 2022
FEI Company
Oleksii Kaplenko
G01 - MEASURING TESTING
Information
Patent Application
DENSITY ANALYSIS OF GEOLOGICAL SAMPLE
Publication number
20210302337
Publication date
Sep 30, 2021
OREXPLORE AB
Alexander Hansson
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLED MANUFACTURE AND NANO-LEVEL EVALUATION OF KEROGEN-RICH RE...
Publication number
20210263006
Publication date
Aug 26, 2021
Saudi Arabian Oil Company
Katherine Leigh Hull
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BASED EVALUATION OF A STATUS OF A STRUCTURE OF A SUBSTRATE
Publication number
20210181128
Publication date
Jun 17, 2021
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
Publication number
20210090855
Publication date
Mar 25, 2021
HITACHI HIGH-TECH SCIENCE CORPORATION
Takuma ASO
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Semiconductor Metrology Based On Wavelength...
Publication number
20210063329
Publication date
Mar 4, 2021
KLA Corporation
Alexander Kuznetsov
G01 - MEASURING TESTING