using double focusing

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H01J49/32

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/32using double focusing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Virtual slit cycloidal mass spectrometer
- Patent number 12,131,894
- Issue date Oct 29, 2024
- Duke University
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple beam secondary ion mass spectrometry device
- Patent number 11,545,352
- Issue date Jan 3, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Marina Verruno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resonance ionization filter for secondary ion and accelerator mass...
- Patent number 11,501,960
- Issue date Nov 15, 2022
- The Government of the United States of America, as represented by the Secreta...
- Evan E. Groopman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometers having segmented electrodes and associated methods
- Patent number 11,081,331
- Issue date Aug 3, 2021
- Duke University
- Zach Russell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
- Patent number 10,804,087
- Issue date Oct 13, 2020
- Takashi Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,720,317
- Issue date Jul 21, 2020
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
- Patent number 10,249,483
- Issue date Apr 2, 2019
- Takashi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,153,150
- Issue date Dec 11, 2018
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining device for hydrocarbon emissions of motors
- Patent number 10,147,594
- Issue date Dec 4, 2018
- Verwaltungsgesellschaft für Emissionsanalyse UG (haftungsbeschränkt)
- Manfred Gohl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous inorganic mass spectrometer and method of inorganic ma...
- Patent number 9,330,892
- Issue date May 3, 2016
- Spectro Analytical Instruments GmbH
- Dirk Ardelt
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Mass spectrometer and methods of mass spectrometry
- Patent number 8,569,688
- Issue date Oct 29, 2013
- Dimitrios Sideris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic achromatic mass spectrometer with double focusing
- Patent number 8,373,121
- Issue date Feb 12, 2013
- Cameca
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focal plane detector assembly of a mass spectrometer
- Patent number 7,550,722
- Issue date Jun 23, 2009
- O. I. Corporation
- Adi A. Scheidemann
- G01 - MEASURING TESTING
Information Patent Grant
Stabilization of a magnetic section of a mass spectrometer
- Patent number 7,223,972
- Issue date May 29, 2007
- O. I. Corporation
- Eustathios Vassiliou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass separator with controlled input
- Patent number 6,956,217
- Issue date Oct 18, 2005
- Archimedes Operating, LLC
- Tihiro Ohkawa
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Method and device for separating ion mass, and ion doping device
- Patent number 6,900,434
- Issue date May 31, 2005
- Ishikawajima-Harima Jukogyo Kabushiki Kaisha
- Hajime Kuwabara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and related ionizer and methods
- Patent number 6,815,674
- Issue date Nov 9, 2004
- Monitor Instruments Company, LLC
- Guenter F. Voss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High frequency wave heated plasma mass filter
- Patent number 6,787,044
- Issue date Sep 7, 2004
- Archimedes Technology Group, Inc.
- Richard L. Freeman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma mass filter with axially opposed plasma injectors
- Patent number 6,730,231
- Issue date May 4, 2004
- Archimedes Technology Group, Inc.
- Sergei Putvinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput plasma mass filter
- Patent number 6,723,248
- Issue date Apr 20, 2004
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Band gap plasma mass filter
- Patent number 6,719,909
- Issue date Apr 13, 2004
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cycloidal mass spectrometer
- Patent number 6,624,410
- Issue date Sep 23, 2003
- Monitor Instruments Company, LLC
- Guenter F. Voss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cycloidal mass spectrometer with time of flight characteristics and...
- Patent number 6,617,576
- Issue date Sep 9, 2003
- Monitor Instruments Company, LLC
- Guenter F. Voss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isotopomer mass spectrometer
- Patent number 6,596,991
- Issue date Jul 22, 2003
- Hitachi, Ltd.
- Naohiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for ionization and selective detection in mass spectrometers
- Patent number 6,590,206
- Issue date Jul 8, 2003
- Robert Evrard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stochastic cyclotron ion filter (SCIF)
- Patent number 6,515,281
- Issue date Feb 4, 2003
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-focusing mass spectrometer apparatus and methods regarding same
- Patent number 6,501,074
- Issue date Dec 31, 2002
- Regents of The University of Minnesota
- W. Ronald Gentry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method relating to charged particles
- Patent number 6,498,348
- Issue date Dec 24, 2002
- Superion Limited
- Derek Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-atom detection of isotopes
- Patent number 6,455,844
- Issue date Sep 24, 2002
- Lockheed Martin Energy Research
- Fred W. Meyer
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Partially ionized plasma mass filter
- Patent number 6,398,920
- Issue date Jun 4, 2002
- Archimedes Technology Group, Inc.
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER
- Publication number 20240290604
- Publication date Aug 29, 2024
- DUKE UNIVERSITY
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNING A MASS SPECTROMETER FILTER
- Publication number 20240087863
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THE...
- Publication number 20230352292
- Publication date Nov 2, 2023
- Shimadzu Corporation
- Xiaoqiang ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE BEAM SECONDARY ION MASS SPECTROMETRY DEVICE
- Publication number 20210104394
- Publication date Apr 8, 2021
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Marina Verruno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...
- Publication number 20190198306
- Publication date Jun 27, 2019
- Takashi HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
- Publication number 20190115201
- Publication date Apr 18, 2019
- MERIDION, LLC
- Nicholas WILTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNET ASSEMBLY WITH IMPROVED FIELD UNIFORMITY AND METHODS OF MAKIN...
- Publication number 20190115202
- Publication date Apr 18, 2019
- DUKE UNIVERSITY
- Jason J. AMSDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETERS HAVING SEGMENTED ELECTRODES AND ASSOCIATED METHODS
- Publication number 20190057854
- Publication date Feb 21, 2019
- DUKE UNIVERSITY
- Zach Russell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
- Publication number 20180068841
- Publication date Mar 8, 2018
- MERIDION, LLC
- Nicholas WILTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MA...
- Publication number 20140312219
- Publication date Oct 23, 2014
- Spectro Analytical Instruments GmbH
- Dirk ARDELT
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Mass Spectrometer and Method for Direct Measurement of Isotope Ratios
- Publication number 20120211651
- Publication date Aug 23, 2012
- John Stephen Vogel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Methods of Mass Spectrometry
- Publication number 20120181422
- Publication date Jul 19, 2012
- Dimitrios Sideris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC ACHROMATIC MASS SPECTROMETER WITH DOUBLE FOCUSING
- Publication number 20120032075
- Publication date Feb 9, 2012
- CAMECA
- Emmanuel De Chambost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MA...
- Publication number 20110155903
- Publication date Jun 30, 2011
- Spectro Analytical Instruments GmbH
- Dirk Ardelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas chromatograph and mass spectrometer
- Publication number 20060011829
- Publication date Jan 19, 2006
- OI Corporation
- Adi A. Scheidemann
- G01 - MEASURING TESTING
Information Patent Application
Focal plane detector assembly of a mass spectrometer
- Publication number 20060011826
- Publication date Jan 19, 2006
- OI Corporation
- Adi A. Scheidemann
- G01 - MEASURING TESTING
Information Patent Application
Stabilization of a magnetic section of a mass spectrometer
- Publication number 20050263714
- Publication date Dec 1, 2005
- OI Corporation
- Eustathios Vassiliou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass separator with controlled input
- Publication number 20050173630
- Publication date Aug 11, 2005
- Tihiro Ohkawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
HIGH FREQUENCY WAVE HEATED PLASMA MASS FILTER
- Publication number 20040178151
- Publication date Sep 16, 2004
- Richard L. Freeman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for separating ion mass, and ion doping device
- Publication number 20040113069
- Publication date Jun 17, 2004
- Hajime Kuwabara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT PLASMA MASS FILTER
- Publication number 20040031740
- Publication date Feb 19, 2004
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Band gap plasma mass filter
- Publication number 20030183567
- Publication date Oct 2, 2003
- Tihiro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma mass filter with axially opposed plasma injectors
- Publication number 20030183581
- Publication date Oct 2, 2003
- Sergei Putvinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method relating to charged particles
- Publication number 20020043621
- Publication date Apr 18, 2002
- Derek Aitken
- H01 - BASIC ELECTRIC ELEMENTS

using double focusing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Virtual slit cycloidal mass spectrometer

Multiple beam secondary ion mass spectrometry device

Resonance ionization filter for secondary ion and accelerator mass...

Mass spectrometers having segmented electrodes and associated methods

Ultra-compact mass analysis device and ultra-compact particle accel...

Apparatus for mass analysis of analytes by simultaneous positive an...

Ultra-compact mass analysis device and ultra-compact particle accel...

Apparatus for mass analysis of analytes by simultaneous positive an...

Determining device for hydrocarbon emissions of motors

Simultaneous inorganic mass spectrometer and method of inorganic ma...

Mass spectrometer and methods of mass spectrometry

Magnetic achromatic mass spectrometer with double focusing

Focal plane detector assembly of a mass spectrometer

Stabilization of a magnetic section of a mass spectrometer

Mass separator with controlled input

Method and device for separating ion mass, and ion doping device

Mass spectrometer and related ionizer and methods

High frequency wave heated plasma mass filter

Plasma mass filter with axially opposed plasma injectors

High throughput plasma mass filter

Band gap plasma mass filter

Cycloidal mass spectrometer

Cycloidal mass spectrometer with time of flight characteristics and...

Isotopomer mass spectrometer

System for ionization and selective detection in mass spectrometers

Stochastic cyclotron ion filter (SCIF)

Double-focusing mass spectrometer apparatus and methods regarding same

Apparatus and method relating to charged particles

Single-atom detection of isotopes

Partially ionized plasma mass filter

Patents Applicationslast 30 patents

VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER

TUNING A MASS SPECTROMETER FILTER

CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THE...

MULTIPLE BEAM SECONDARY ION MASS SPECTROMETRY DEVICE

ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...

APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...

MAGNET ASSEMBLY WITH IMPROVED FIELD UNIFORMITY AND METHODS OF MAKIN...

MASS SPECTROMETERS HAVING SEGMENTED ELECTRODES AND ASSOCIATED METHODS

APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...

SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MA...

Mass Spectrometer and Method for Direct Measurement of Isotope Ratios

Mass Spectrometer and Methods of Mass Spectrometry

MAGNETIC ACHROMATIC MASS SPECTROMETER WITH DOUBLE FOCUSING

SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MA...

Gas chromatograph and mass spectrometer

Focal plane detector assembly of a mass spectrometer

Stabilization of a magnetic section of a mass spectrometer

Mass separator with controlled input

HIGH FREQUENCY WAVE HEATED PLASMA MASS FILTER

Method and device for separating ion mass, and ion doping device

HIGH THROUGHPUT PLASMA MASS FILTER

Band gap plasma mass filter

Plasma mass filter with axially opposed plasma injectors

Apparatus and method relating to charged particles