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H01J49/32
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ELECTRICITY
H01
Electric elements
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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/00
Particle spectrometer or separator tubes
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H01J49/32
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Patents Grants
last 30 patents
Information
Patent Grant
Virtual slit cycloidal mass spectrometer
Patent number
12,131,894
Issue date
Oct 29, 2024
Duke University
M. Bonner Denton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple beam secondary ion mass spectrometry device
Patent number
11,545,352
Issue date
Jan 3, 2023
LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
Marina Verruno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Resonance ionization filter for secondary ion and accelerator mass...
Patent number
11,501,960
Issue date
Nov 15, 2022
The Government of the United States of America, as represented by the Secreta...
Evan E. Groopman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometers having segmented electrodes and associated methods
Patent number
11,081,331
Issue date
Aug 3, 2021
Duke University
Zach Russell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
Patent number
10,804,087
Issue date
Oct 13, 2020
Takashi Hosaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
Patent number
10,720,317
Issue date
Jul 21, 2020
MERIDION, LLC
Nicholas Wilton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
Patent number
10,249,483
Issue date
Apr 2, 2019
Takashi Hosaka
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
Patent number
10,153,150
Issue date
Dec 11, 2018
MERIDION, LLC
Nicholas Wilton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining device for hydrocarbon emissions of motors
Patent number
10,147,594
Issue date
Dec 4, 2018
Verwaltungsgesellschaft für Emissionsanalyse UG (haftungsbeschränkt)
Manfred Gohl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Simultaneous inorganic mass spectrometer and method of inorganic ma...
Patent number
9,330,892
Issue date
May 3, 2016
Spectro Analytical Instruments GmbH
Dirk Ardelt
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Mass spectrometer and methods of mass spectrometry
Patent number
8,569,688
Issue date
Oct 29, 2013
Dimitrios Sideris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic achromatic mass spectrometer with double focusing
Patent number
8,373,121
Issue date
Feb 12, 2013
Cameca
Emmanuel De Chambost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focal plane detector assembly of a mass spectrometer
Patent number
7,550,722
Issue date
Jun 23, 2009
O. I. Corporation
Adi A. Scheidemann
G01 - MEASURING TESTING
Information
Patent Grant
Stabilization of a magnetic section of a mass spectrometer
Patent number
7,223,972
Issue date
May 29, 2007
O. I. Corporation
Eustathios Vassiliou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass separator with controlled input
Patent number
6,956,217
Issue date
Oct 18, 2005
Archimedes Operating, LLC
Tihiro Ohkawa
B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information
Patent Grant
Method and device for separating ion mass, and ion doping device
Patent number
6,900,434
Issue date
May 31, 2005
Ishikawajima-Harima Jukogyo Kabushiki Kaisha
Hajime Kuwabara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer and related ionizer and methods
Patent number
6,815,674
Issue date
Nov 9, 2004
Monitor Instruments Company, LLC
Guenter F. Voss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High frequency wave heated plasma mass filter
Patent number
6,787,044
Issue date
Sep 7, 2004
Archimedes Technology Group, Inc.
Richard L. Freeman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma mass filter with axially opposed plasma injectors
Patent number
6,730,231
Issue date
May 4, 2004
Archimedes Technology Group, Inc.
Sergei Putvinski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High throughput plasma mass filter
Patent number
6,723,248
Issue date
Apr 20, 2004
Archimedes Technology Group, Inc.
Tihiro Ohkawa
B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information
Patent Grant
Band gap plasma mass filter
Patent number
6,719,909
Issue date
Apr 13, 2004
Archimedes Technology Group, Inc.
Tihiro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cycloidal mass spectrometer
Patent number
6,624,410
Issue date
Sep 23, 2003
Monitor Instruments Company, LLC
Guenter F. Voss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cycloidal mass spectrometer with time of flight characteristics and...
Patent number
6,617,576
Issue date
Sep 9, 2003
Monitor Instruments Company, LLC
Guenter F. Voss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Isotopomer mass spectrometer
Patent number
6,596,991
Issue date
Jul 22, 2003
Hitachi, Ltd.
Naohiro Yoshida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for ionization and selective detection in mass spectrometers
Patent number
6,590,206
Issue date
Jul 8, 2003
Robert Evrard
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stochastic cyclotron ion filter (SCIF)
Patent number
6,515,281
Issue date
Feb 4, 2003
Archimedes Technology Group, Inc.
Tihiro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Double-focusing mass spectrometer apparatus and methods regarding same
Patent number
6,501,074
Issue date
Dec 31, 2002
Regents of The University of Minnesota
W. Ronald Gentry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method relating to charged particles
Patent number
6,498,348
Issue date
Dec 24, 2002
Superion Limited
Derek Aitken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single-atom detection of isotopes
Patent number
6,455,844
Issue date
Sep 24, 2002
Lockheed Martin Energy Research
Fred W. Meyer
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Partially ionized plasma mass filter
Patent number
6,398,920
Issue date
Jun 4, 2002
Archimedes Technology Group, Inc.
Tihiro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER
Publication number
20240290604
Publication date
Aug 29, 2024
DUKE UNIVERSITY
M. Bonner Denton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TUNING A MASS SPECTROMETER FILTER
Publication number
20240087863
Publication date
Mar 14, 2024
Thermo Fisher Scientific (Bremen) GmbH
Henning Wehrs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CYCLOIDAL MASS SPECTROMETER AND METHOD FOR ADJUSTING RESOLUTION THE...
Publication number
20230352292
Publication date
Nov 2, 2023
Shimadzu Corporation
Xiaoqiang ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE BEAM SECONDARY ION MASS SPECTROMETRY DEVICE
Publication number
20210104394
Publication date
Apr 8, 2021
LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
Marina Verruno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...
Publication number
20190198306
Publication date
Jun 27, 2019
Takashi HOSAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
Publication number
20190115201
Publication date
Apr 18, 2019
MERIDION, LLC
Nicholas WILTON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNET ASSEMBLY WITH IMPROVED FIELD UNIFORMITY AND METHODS OF MAKIN...
Publication number
20190115202
Publication date
Apr 18, 2019
DUKE UNIVERSITY
Jason J. AMSDEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETERS HAVING SEGMENTED ELECTRODES AND ASSOCIATED METHODS
Publication number
20190057854
Publication date
Feb 21, 2019
DUKE UNIVERSITY
Zach Russell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
Publication number
20180068841
Publication date
Mar 8, 2018
MERIDION, LLC
Nicholas WILTON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MA...
Publication number
20140312219
Publication date
Oct 23, 2014
Spectro Analytical Instruments GmbH
Dirk ARDELT
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Mass Spectrometer and Method for Direct Measurement of Isotope Ratios
Publication number
20120211651
Publication date
Aug 23, 2012
John Stephen Vogel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometer and Methods of Mass Spectrometry
Publication number
20120181422
Publication date
Jul 19, 2012
Dimitrios Sideris
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC ACHROMATIC MASS SPECTROMETER WITH DOUBLE FOCUSING
Publication number
20120032075
Publication date
Feb 9, 2012
CAMECA
Emmanuel De Chambost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MA...
Publication number
20110155903
Publication date
Jun 30, 2011
Spectro Analytical Instruments GmbH
Dirk Ardelt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gas chromatograph and mass spectrometer
Publication number
20060011829
Publication date
Jan 19, 2006
OI Corporation
Adi A. Scheidemann
G01 - MEASURING TESTING
Information
Patent Application
Focal plane detector assembly of a mass spectrometer
Publication number
20060011826
Publication date
Jan 19, 2006
OI Corporation
Adi A. Scheidemann
G01 - MEASURING TESTING
Information
Patent Application
Stabilization of a magnetic section of a mass spectrometer
Publication number
20050263714
Publication date
Dec 1, 2005
OI Corporation
Eustathios Vassiliou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass separator with controlled input
Publication number
20050173630
Publication date
Aug 11, 2005
Tihiro Ohkawa
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
HIGH FREQUENCY WAVE HEATED PLASMA MASS FILTER
Publication number
20040178151
Publication date
Sep 16, 2004
Richard L. Freeman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and device for separating ion mass, and ion doping device
Publication number
20040113069
Publication date
Jun 17, 2004
Hajime Kuwabara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH THROUGHPUT PLASMA MASS FILTER
Publication number
20040031740
Publication date
Feb 19, 2004
Tihiro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Band gap plasma mass filter
Publication number
20030183567
Publication date
Oct 2, 2003
Tihiro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma mass filter with axially opposed plasma injectors
Publication number
20030183581
Publication date
Oct 2, 2003
Sergei Putvinski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method relating to charged particles
Publication number
20020043621
Publication date
Apr 18, 2002
Derek Aitken
H01 - BASIC ELECTRIC ELEMENTS