using light concentrators or collectors or condensers

Industry

CPC
G01J3/0216

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/0216using light concentrators or collectors or condensers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
- Patent number 12,140,475
- Issue date Nov 12, 2024
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter and spectrometer
- Patent number 12,135,239
- Issue date Nov 5, 2024
- Viavi Solutions Inc.
- Paula Smith
- G02 - OPTICS
Information Patent Grant
Spectrometer and method of detecting an electromagnetic (EM) wave s...
- Patent number 12,098,950
- Issue date Sep 24, 2024
- National University of Singapore
- Guangya James Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
- Patent number 12,066,328
- Issue date Aug 20, 2024
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Grant
Compact spectral analyzer
- Patent number 12,061,116
- Issue date Aug 13, 2024
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and imaging device
- Patent number 12,055,437
- Issue date Aug 6, 2024
- ANSWERAY INC.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution spectral image fast acquisition apparatus and method
- Patent number 12,025,497
- Issue date Jul 2, 2024
- Tsinghua Shenzhen International Graduate School
- Yongbing Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for reference switching
- Patent number 12,007,275
- Issue date Jun 11, 2024
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Compact Raman sensor and apparatus for estimating bio-component
- Patent number 11,898,910
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Ho Jun Chang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
- Patent number 11,885,681
- Issue date Jan 30, 2024
- Pendar Technologies, LLC
- Daryoosh Vakhshoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical element for light concentration and production method for a...
- Patent number 11,867,890
- Issue date Jan 9, 2024
- Robert Bosch GmbH
- Benedikt Stein
- G02 - OPTICS
Information Patent Grant
Compact material analyzer
- Patent number 11,841,268
- Issue date Dec 12, 2023
- Si-Ware Systems
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry systems, methods, and applications
- Patent number 11,781,910
- Issue date Oct 10, 2023
- VERIFOOD LTD.
- Damian Goldring
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
- Patent number 11,688,581
- Issue date Jun 27, 2023
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectrometer
- Patent number 11,639,874
- Issue date May 2, 2023
- PerkinElmer Health Sciences, Inc.
- David M. Aikens
- G01 - MEASURING TESTING
Information Patent Grant
Optical spectrum analyzer
- Patent number 11,598,669
- Issue date Mar 7, 2023
- Anritsu Corporation
- Shinji Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Compact Raman sensor and apparatus for estimating bio-component
- Patent number 11,530,948
- Issue date Dec 20, 2022
- Samsung Electronics Co., Ltd.
- Ho Jun Chang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for colour imaging a three-dimensional structure
- Patent number 11,528,463
- Issue date Dec 13, 2022
- Align Technology, Inc.
- Noam Babayoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analysis device
- Patent number 11,506,534
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeshi Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
- Patent number 11,486,761
- Issue date Nov 1, 2022
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for colour imaging a three-dimensional structure
- Patent number 11,418,770
- Issue date Aug 16, 2022
- Align Technology, Inc.
- Noam Babayoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cubesat infrared atmospheric sounder (CIRAS)
- Patent number 11,378,453
- Issue date Jul 5, 2022
- California Institute of Technology
- Thomas S. Pagano
- G01 - MEASURING TESTING
Information Patent Grant
Accessories for handheld spectrometer
- Patent number 11,333,552
- Issue date May 17, 2022
- VERIFOOD, LTD.
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Apertureless spectrometer
- Patent number 11,307,091
- Issue date Apr 19, 2022
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Light source for variable path length systems
- Patent number 11,300,447
- Issue date Apr 12, 2022
- C Technologies Inc.
- I-Tsung Shih
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
- Patent number 11,300,448
- Issue date Apr 12, 2022
- Pendar Technologies, LLC
- Daryoosh Vakhshoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical system for reference switching
- Patent number 11,243,115
- Issue date Feb 8, 2022
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter and spectrometer
- Patent number 11,237,049
- Issue date Feb 1, 2022
- VIAVI Solutions Inc.
- Paula Smith
- G01 - MEASURING TESTING
Information Patent Grant
High-throughput compact static-Fourier-transform spectrometer
- Patent number 11,215,504
- Issue date Jan 4, 2022
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Jiangquan Mai
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer device and system
- Patent number 11,162,843
- Issue date Nov 2, 2021
- trinamiX GmbH
- Sebastian Valouch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL FILTER AND SPECTROMETER
- Publication number 20250052610
- Publication date Feb 13, 2025
- VIAVI SOLUTIONS INC.
- Paula SMITH
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
- Publication number 20250003797
- Publication date Jan 2, 2025
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Application
CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...
- Publication number 20240377252
- Publication date Nov 14, 2024
- National University of Singapore
- Zi Heng LIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM FOR REFERENCE SWITCHING
- Publication number 20240288306
- Publication date Aug 29, 2024
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
- Publication number 20240271999
- Publication date Aug 15, 2024
- Tsubasa SAITO
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY SYSTEMS, METHODS, AND APPLICATIONS
- Publication number 20240255349
- Publication date Aug 1, 2024
- Verifood Ltd
- Damian GOLDRING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
- Publication number 20240159588
- Publication date May 16, 2024
- Pendar Technologies, LLC
- Daryoosh VAKHSHOORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20240110830
- Publication date Apr 4, 2024
- OSAKA UNIVERSITY
- Katsumasa FUJITA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20240077424
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- Hyunwoo RYOO
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
- Publication number 20240011830
- Publication date Jan 11, 2024
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING
- Publication number 20230392984
- Publication date Dec 7, 2023
- Bruno FIGEYS
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSPECTROSCOPIC MEASUREMENT DEVICE, AND METHOD FOR CALIBRA...
- Publication number 20230314219
- Publication date Oct 5, 2023
- SHIMADZU CORPORATION
- Tomoki SASAYAMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS AND METHOD OF ANALYZING CONTENT OF MATERIAL USIN...
- Publication number 20230280276
- Publication date Sep 7, 2023
- SAMSUNG DISPLAY CO., LTD.
- YONG WOON LIM
- G01 - MEASURING TESTING
Information Patent Application
Detector for Detecting Electromagnetic Radiation, Image Sensor, and...
- Publication number 20230280208
- Publication date Sep 7, 2023
- IMEC vzw
- Jan Genoe
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR COLOUR IMAGING A THREE-DIMENSIONAL STRUCTURE
- Publication number 20230224446
- Publication date Jul 13, 2023
- Align Technology, Inc.
- Noam Babayoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT SOURCE, SPECTROSCOPIC ANALYSIS SYSTEM, AND SPECTROSCOPIC ANAL...
- Publication number 20230168124
- Publication date Jun 1, 2023
- TOKYO ELECTRON LIMITED
- Yasutoshi UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
- Publication number 20230131208
- Publication date Apr 27, 2023
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Application
COMPACT RAMAN SENSOR AND APPARATUS FOR ESTIMATING BIO-COMPONENT
- Publication number 20230055190
- Publication date Feb 23, 2023
- Samsung Electronics Co., Ltd.
- Ho Jun CHANG
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING MODULE
- Publication number 20230036675
- Publication date Feb 2, 2023
- InnoSpectra Corporation
- Fei-Peng Chang
- G02 - OPTICS
Information Patent Application
COMPACT SPECTRAL ANALYZER
- Publication number 20230036551
- Publication date Feb 2, 2023
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...
- Publication number 20220381611
- Publication date Dec 1, 2022
- National University of Singapore
- Guangya James ZHOU
- G01 - MEASURING TESTING
Information Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
- Publication number 20220333985
- Publication date Oct 20, 2022
- Pendar Technologies, LLC
- Daryoosh VAKHSHOORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SPECTRUM ANALYZER
- Publication number 20220307901
- Publication date Sep 29, 2022
- ANRITSU CORPORATION
- Shinji MORIMOTO
- G02 - OPTICS
Information Patent Application
SPECTROMETER AND IMAGING DEVICE
- Publication number 20220283028
- Publication date Sep 8, 2022
- ANSWERAY INC.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION SPECTRAL IMAGE FAST ACQUISITION APPARATUS AND METHOD
- Publication number 20220276093
- Publication date Sep 1, 2022
- Tsinghua Shenzhen International Graduate School
- Yongbing ZHANG
- G01 - MEASURING TESTING
Information Patent Application
COMPACT MATERIAL ANALYZER
- Publication number 20220244101
- Publication date Aug 4, 2022
- SI-WARE SYSTEMS
- Yasser M. Sabry
- G02 - OPTICS
Information Patent Application
Echelle Spectrometer
- Publication number 20220221340
- Publication date Jul 14, 2022
- PerkinElmer Health Sciences, Inc.
- David M. Aikens
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE FOR VARIABLE PATH LENGTH SYSTEMS
- Publication number 20220187125
- Publication date Jun 16, 2022
- C Technologies Inc.
- I-Tsung Shih
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER AND SPECTROMETER
- Publication number 20220146308
- Publication date May 12, 2022
- VIAVI Solutions Inc.
- Paula SMITH
- G01 - MEASURING TESTING
Information Patent Application
Optical System for Reference Switching
- Publication number 20220136899
- Publication date May 5, 2022
- Apple Inc.
- Mark Alan ARBORE
- G01 - MEASURING TESTING

using light concentrators or collectors or condensers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Photothermal infrared spectroscopy utilizing spatial light manipula...

Optical filter and spectrometer

Spectrometer and method of detecting an electromagnetic (EM) wave s...

Photothermal infrared spectroscopy utilizing spatial light manipula...

Compact spectral analyzer

Spectrometer and imaging device

High-resolution spectral image fast acquisition apparatus and method

Optical system for reference switching

Compact Raman sensor and apparatus for estimating bio-component

Methods and devices for standoff differential Raman spectroscopy wi...

Optical element for light concentration and production method for a...

Compact material analyzer

Spectrometry systems, methods, and applications

Apparatus for transmission electron microscopy cathodoluminescence

Echelle spectrometer

Optical spectrum analyzer

Compact Raman sensor and apparatus for estimating bio-component

Method and apparatus for colour imaging a three-dimensional structure

Automated analysis device

Photothermal infrared spectroscopy utilizing spatial light manipula...

Method and apparatus for colour imaging a three-dimensional structure

Cubesat infrared atmospheric sounder (CIRAS)

Accessories for handheld spectrometer

Apertureless spectrometer

Light source for variable path length systems

Methods and devices for standoff differential Raman spectroscopy wi...

Optical system for reference switching

Optical filter and spectrometer

High-throughput compact static-Fourier-transform spectrometer

Spectrometer device and system

Patents Applicationslast 30 patents

OPTICAL FILTER AND SPECTROMETER

PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...

CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...

OPTICAL SYSTEM FOR REFERENCE SWITCHING

SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...

SPECTROMETRY SYSTEMS, METHODS, AND APPLICATIONS

Methods and Devices for Standoff Differential Raman Spectroscopy wi...

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE

PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...

DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING

RAMAN MICROSPECTROSCOPIC MEASUREMENT DEVICE, AND METHOD FOR CALIBRA...

ANALYSIS APPARATUS AND METHOD OF ANALYZING CONTENT OF MATERIAL USIN...

Detector for Detecting Electromagnetic Radiation, Image Sensor, and...

METHOD AND APPARATUS FOR COLOUR IMAGING A THREE-DIMENSIONAL STRUCTURE

LIGHT SOURCE, SPECTROSCOPIC ANALYSIS SYSTEM, AND SPECTROSCOPIC ANAL...

PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...

COMPACT RAMAN SENSOR AND APPARATUS FOR ESTIMATING BIO-COMPONENT

SAMPLING MODULE

COMPACT SPECTRAL ANALYZER

SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...

Methods and Devices for Standoff Differential Raman Spectroscopy wi...

OPTICAL SPECTRUM ANALYZER

SPECTROMETER AND IMAGING DEVICE

HIGH-RESOLUTION SPECTRAL IMAGE FAST ACQUISITION APPARATUS AND METHOD

COMPACT MATERIAL ANALYZER

Echelle Spectrometer

LIGHT SOURCE FOR VARIABLE PATH LENGTH SYSTEMS

OPTICAL FILTER AND SPECTROMETER

Optical System for Reference Switching