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using light concentrators or collectors or condensers
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G01J3/0216
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/0216
using light concentrators or collectors or condensers
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Compact Raman sensor and apparatus for estimating bio-component
Patent number
11,898,910
Issue date
Feb 13, 2024
Samsung Electronics Co., Ltd.
Ho Jun Chang
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
Patent number
11,885,681
Issue date
Jan 30, 2024
Pendar Technologies, LLC
Daryoosh Vakhshoori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical element for light concentration and production method for a...
Patent number
11,867,890
Issue date
Jan 9, 2024
Robert Bosch GmbH
Benedikt Stein
G02 - OPTICS
Information
Patent Grant
Compact material analyzer
Patent number
11,841,268
Issue date
Dec 12, 2023
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometry systems, methods, and applications
Patent number
11,781,910
Issue date
Oct 10, 2023
VERIFOOD LTD.
Damian Goldring
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
Patent number
11,688,581
Issue date
Jun 27, 2023
Gatan, Inc.
John Andrew Hunt
G01 - MEASURING TESTING
Information
Patent Grant
Echelle spectrometer
Patent number
11,639,874
Issue date
May 2, 2023
PerkinElmer Health Sciences, Inc.
David M. Aikens
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectrum analyzer
Patent number
11,598,669
Issue date
Mar 7, 2023
Anritsu Corporation
Shinji Morimoto
G01 - MEASURING TESTING
Information
Patent Grant
Compact Raman sensor and apparatus for estimating bio-component
Patent number
11,530,948
Issue date
Dec 20, 2022
Samsung Electronics Co., Ltd.
Ho Jun Chang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for colour imaging a three-dimensional structure
Patent number
11,528,463
Issue date
Dec 13, 2022
Align Technology, Inc.
Noam Babayoff
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated analysis device
Patent number
11,506,534
Issue date
Nov 22, 2022
HITACHI HIGH-TECH CORPORATION
Takeshi Ishida
G01 - MEASURING TESTING
Information
Patent Grant
Photothermal infrared spectroscopy utilizing spatial light manipula...
Patent number
11,486,761
Issue date
Nov 1, 2022
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for colour imaging a three-dimensional structure
Patent number
11,418,770
Issue date
Aug 16, 2022
Align Technology, Inc.
Noam Babayoff
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cubesat infrared atmospheric sounder (CIRAS)
Patent number
11,378,453
Issue date
Jul 5, 2022
California Institute of Technology
Thomas S. Pagano
G01 - MEASURING TESTING
Information
Patent Grant
Accessories for handheld spectrometer
Patent number
11,333,552
Issue date
May 17, 2022
VERIFOOD, LTD.
Damian Goldring
G01 - MEASURING TESTING
Information
Patent Grant
Apertureless spectrometer
Patent number
11,307,091
Issue date
Apr 19, 2022
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
Light source for variable path length systems
Patent number
11,300,447
Issue date
Apr 12, 2022
C Technologies Inc.
I-Tsung Shih
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
Patent number
11,300,448
Issue date
Apr 12, 2022
Pendar Technologies, LLC
Daryoosh Vakhshoori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical system for reference switching
Patent number
11,243,115
Issue date
Feb 8, 2022
Mark Alan Arbore
G01 - MEASURING TESTING
Information
Patent Grant
Optical filter and spectrometer
Patent number
11,237,049
Issue date
Feb 1, 2022
VIAVI Solutions Inc.
Paula Smith
G01 - MEASURING TESTING
Information
Patent Grant
High-throughput compact static-Fourier-transform spectrometer
Patent number
11,215,504
Issue date
Jan 4, 2022
Hong Kong Applied Science and Technology Research Institute Co., Ltd.
Jiangquan Mai
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer device and system
Patent number
11,162,843
Issue date
Nov 2, 2021
trinamiX GmbH
Sebastian Valouch
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometry systems, methods, and applications
Patent number
11,118,971
Issue date
Sep 14, 2021
VERIFOOD LTD.
Damian Goldring
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Self-referenced spectrometer
Patent number
11,085,825
Issue date
Aug 10, 2021
Si-Ware Systems
Mostafa Medhat
G01 - MEASURING TESTING
Information
Patent Grant
Cold stage actuation of optical elements including an optical light...
Patent number
11,079,281
Issue date
Aug 3, 2021
UVIA GROUP LLC
Michele Hinnrichs
G01 - MEASURING TESTING
Information
Patent Grant
Correction of curved projection of a spectrometer slit line
Patent number
11,067,441
Issue date
Jul 20, 2021
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Huibert Visser
G01 - MEASURING TESTING
Information
Patent Grant
Compact spectrometer modules
Patent number
11,067,446
Issue date
Jul 20, 2021
ams Sensors Singapore Pte. Ltd.
Peter Roentgen
G01 - MEASURING TESTING
Information
Patent Grant
Optics to reduce skew in integrated cavity output spectroscopic dev...
Patent number
11,047,736
Issue date
Jun 29, 2021
The University of Chicago
Benjamin W. Clouser
G01 - MEASURING TESTING
Information
Patent Grant
Raman probe and biological component analyzing apparatus using the...
Patent number
10,983,001
Issue date
Apr 20, 2021
Samsung Electronics Co., Ltd.
Ho Jun Chang
G01 - MEASURING TESTING
Information
Patent Grant
Light measuring probes, light measuring systems, and related methods
Patent number
10,983,000
Issue date
Apr 20, 2021
HERAEUS NOBLELIGHT AMERICA LLC
Brett Skinner
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
Publication number
20240110830
Publication date
Apr 4, 2024
OSAKA UNIVERSITY
Katsumasa FUJITA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
Publication number
20240077424
Publication date
Mar 7, 2024
Samsung Electronics Co., Ltd.
Hyunwoo RYOO
G01 - MEASURING TESTING
Information
Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
Publication number
20240011830
Publication date
Jan 11, 2024
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND A METHOD FOR POLARIZATION DEPENDENT IMAGING
Publication number
20230392984
Publication date
Dec 7, 2023
Bruno FIGEYS
G01 - MEASURING TESTING
Information
Patent Application
RAMAN MICROSPECTROSCOPIC MEASUREMENT DEVICE, AND METHOD FOR CALIBRA...
Publication number
20230314219
Publication date
Oct 5, 2023
SHIMADZU CORPORATION
Tomoki SASAYAMA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS AND METHOD OF ANALYZING CONTENT OF MATERIAL USIN...
Publication number
20230280276
Publication date
Sep 7, 2023
SAMSUNG DISPLAY CO., LTD.
YONG WOON LIM
G01 - MEASURING TESTING
Information
Patent Application
Detector for Detecting Electromagnetic Radiation, Image Sensor, and...
Publication number
20230280208
Publication date
Sep 7, 2023
IMEC vzw
Jan Genoe
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR COLOUR IMAGING A THREE-DIMENSIONAL STRUCTURE
Publication number
20230224446
Publication date
Jul 13, 2023
Align Technology, Inc.
Noam Babayoff
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT SOURCE, SPECTROSCOPIC ANALYSIS SYSTEM, AND SPECTROSCOPIC ANAL...
Publication number
20230168124
Publication date
Jun 1, 2023
TOKYO ELECTRON LIMITED
Yasutoshi UMEHARA
G01 - MEASURING TESTING
Information
Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
Publication number
20230131208
Publication date
Apr 27, 2023
Photothermal Spectroscopy Corp.
Derek Decker
G01 - MEASURING TESTING
Information
Patent Application
COMPACT RAMAN SENSOR AND APPARATUS FOR ESTIMATING BIO-COMPONENT
Publication number
20230055190
Publication date
Feb 23, 2023
Samsung Electronics Co., Ltd.
Ho Jun CHANG
G01 - MEASURING TESTING
Information
Patent Application
SAMPLING MODULE
Publication number
20230036675
Publication date
Feb 2, 2023
InnoSpectra Corporation
Fei-Peng Chang
G02 - OPTICS
Information
Patent Application
COMPACT SPECTRAL ANALYZER
Publication number
20230036551
Publication date
Feb 2, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...
Publication number
20220381611
Publication date
Dec 1, 2022
National University of Singapore
Guangya James ZHOU
G01 - MEASURING TESTING
Information
Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
Publication number
20220333985
Publication date
Oct 20, 2022
Pendar Technologies, LLC
Daryoosh VAKHSHOORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL SPECTRUM ANALYZER
Publication number
20220307901
Publication date
Sep 29, 2022
ANRITSU CORPORATION
Shinji MORIMOTO
G02 - OPTICS
Information
Patent Application
SPECTROMETER AND IMAGING DEVICE
Publication number
20220283028
Publication date
Sep 8, 2022
ANSWERAY INC.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Application
HIGH-RESOLUTION SPECTRAL IMAGE FAST ACQUISITION APPARATUS AND METHOD
Publication number
20220276093
Publication date
Sep 1, 2022
Tsinghua Shenzhen International Graduate School
Yongbing ZHANG
G01 - MEASURING TESTING
Information
Patent Application
COMPACT MATERIAL ANALYZER
Publication number
20220244101
Publication date
Aug 4, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G02 - OPTICS
Information
Patent Application
Echelle Spectrometer
Publication number
20220221340
Publication date
Jul 14, 2022
PerkinElmer Health Sciences, Inc.
David M. Aikens
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SOURCE FOR VARIABLE PATH LENGTH SYSTEMS
Publication number
20220187125
Publication date
Jun 16, 2022
C Technologies Inc.
I-Tsung Shih
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FILTER AND SPECTROMETER
Publication number
20220146308
Publication date
May 12, 2022
VIAVI Solutions Inc.
Paula SMITH
G01 - MEASURING TESTING
Information
Patent Application
Optical System for Reference Switching
Publication number
20220136899
Publication date
May 5, 2022
Apple Inc.
Mark Alan ARBORE
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY SYSTEMS, METHODS, AND APPLICATIONS
Publication number
20220074791
Publication date
Mar 10, 2022
VERIFOOD, LTD.
Damian Goldring
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT SOURCE FOR VARIABLE PATH LENGTH SYSTEMS
Publication number
20220026272
Publication date
Jan 27, 2022
C Technologies Inc.
Eric Shih
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE
Publication number
20210313141
Publication date
Oct 7, 2021
GATAN, INC.
John Andrew Hunt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-THROUGHPUT COMPACT STATIC-FOURIER-TRANSFORM SPECTROMETER
Publication number
20210310864
Publication date
Oct 7, 2021
Hong Kong Applied Science and Technology Research Institute Co., Ltd.
Jiangquan Mai
G01 - MEASURING TESTING
Information
Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
Publication number
20210223100
Publication date
Jul 22, 2021
Pendar Technologies, LLC
Daryoosh VAKHSHOORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT MEASURING PROBES, LIGHT MEASURING SYSTEMS, AND RELATED METHODS
Publication number
20210207994
Publication date
Jul 8, 2021
Heraeus Noblelight America LLC
Brett Skinner
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER DEVICE AND SYSTEM
Publication number
20210190585
Publication date
Jun 24, 2021
trinamiX GmbH
Sebastian Valouch
G01 - MEASURING TESTING