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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating materials by wave or particle radiation
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G01N2223/1016
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray radioscope
Patent number
12,360,061
Issue date
Jul 15, 2025
BEAMSENSE Co., Ltd.
Sueki Baba
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
Patent number
12,360,067
Issue date
Jul 15, 2025
Sigray, Inc.
Wenbing Yun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray identification of connections in a tubular string
Patent number
12,345,664
Issue date
Jul 1, 2025
Weatherford Technology Holdings, LLC
Benjamin Sachtleben
G01 - MEASURING TESTING
Information
Patent Grant
Diffractive analyzer of patient tissue
Patent number
12,336,851
Issue date
Jun 24, 2025
Arion Diagnostics, Inc.
Alexander P. Lazarev
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Alpha diffractometer
Patent number
12,332,192
Issue date
Jun 17, 2025
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
Patent number
12,326,434
Issue date
Jun 10, 2025
NCS TESTING TECHNOLOGY CO., LTD
Dongling Li
G01 - MEASURING TESTING
Information
Patent Grant
Customizable axes of rotation for industrial radiography systems
Patent number
12,298,260
Issue date
May 13, 2025
Illinois Tool Works Inc.
Joseph Schlecht
G01 - MEASURING TESTING
Information
Patent Grant
Device for closing the input opening in the sample chamber in an x-...
Patent number
12,298,262
Issue date
May 13, 2025
Wolfgang Gehrlein
G01 - MEASURING TESTING
Information
Patent Grant
Serial synchrotron crystallography sample holding system
Patent number
12,292,395
Issue date
May 6, 2025
MITEGEN, LLC
Robert E. Thorne
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis system and method with multi-source design
Patent number
12,292,396
Issue date
May 6, 2025
SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
Xuena Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,285,656
Issue date
Apr 29, 2025
Topgolf Callaway Brands Corp.
Julie Caterina
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Correction amount specifying apparatus, method, program, and jig
Patent number
12,287,301
Issue date
Apr 29, 2025
Rigaku Corporation
Takuya Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Single piece droplet generation and injection device for serial cry...
Patent number
12,287,299
Issue date
Apr 29, 2025
Arizona Board of Regents on behalf of Arizona State University
Alexandra Ros
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
Patent number
12,287,300
Issue date
Apr 29, 2025
Rigaku Corporation
Hideo Toraya
G01 - MEASURING TESTING
Information
Patent Grant
System and method for a specimen container for use in cabinet x-ray...
Patent number
12,281,971
Issue date
Apr 22, 2025
Kub Technologies Inc
Vikram Butani
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
12,247,935
Issue date
Mar 11, 2025
Rigaku Corporation
Yasuhiko Nagoshi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
12,241,848
Issue date
Mar 4, 2025
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Spectrometer
Patent number
12,235,228
Issue date
Feb 25, 2025
EasyXAFS, LLC
William Holden
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
Patent number
12,228,529
Issue date
Feb 18, 2025
Sai Xu
G01 - MEASURING TESTING
Information
Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
Patent number
12,209,978
Issue date
Jan 28, 2025
Danmarks Tekniske Universitet
Yubin Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
Patent number
12,209,977
Issue date
Jan 28, 2025
Sigray, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Residual stress measurement method of curved surface block
Patent number
12,209,926
Issue date
Jan 28, 2025
Metal Industries Research & Development Centre
Zong Rong Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting internal stress distribution of transparent mat...
Patent number
12,203,881
Issue date
Jan 21, 2025
Zhejiang University
Haikuo Wang
G01 - MEASURING TESTING
Information
Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
Patent number
12,174,132
Issue date
Dec 24, 2024
Sumitomo Chemical Company, Limited
Takehiro Yoshida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
Patent number
12,163,903
Issue date
Dec 10, 2024
The Boeing Company
Morteza Safai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
Patent number
12,163,904
Issue date
Dec 10, 2024
LG ENERGY SOLUTION, LTD.
Hyo-Jung Yoon
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzer
Patent number
12,135,299
Issue date
Nov 5, 2024
Shimadzu Corporation
Takuro Izumi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer and pulse height prediction program
Patent number
12,105,035
Issue date
Oct 1, 2024
Rigaku Corporation
Tsutomu Tada
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Scan procedure generation systems and methods to generate scan proc...
Patent number
12,092,591
Issue date
Sep 17, 2024
Illinois Tool Works Inc.
Jackson Turner
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Inspection Method and Inspection Device
Publication number
20250224349
Publication date
Jul 10, 2025
Shimadzu Corporation
Koichi TANABE
G01 - MEASURING TESTING
Information
Patent Application
X-BAND SMALL-FOCUS ACCELERATOR FOR NON-DESTRUCTIVE TESTING
Publication number
20250227835
Publication date
Jul 10, 2025
Nuctech Company Limited
Yaohong LIU
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Analysis System, Analysis Method, and Analysis Program
Publication number
20250208076
Publication date
Jun 26, 2025
Hitachi High-Tech Corporation
Keiichi TANAKA
G01 - MEASURING TESTING
Information
Patent Application
MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...
Publication number
20250198950
Publication date
Jun 19, 2025
Illinois Tool Works Inc.
Nicole Wilson
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...
Publication number
20250198955
Publication date
Jun 19, 2025
Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
Bruno Schroth
G01 - MEASURING TESTING
Information
Patent Application
CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...
Publication number
20250203744
Publication date
Jun 19, 2025
Siemens Healthineers AG
Joerg FREUDENBERGER
G01 - MEASURING TESTING
Information
Patent Application
IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE
Publication number
20250180497
Publication date
Jun 5, 2025
PHOTOELECTRON INTELLECTUAL PROPERTY HOLDINGS LLC
Peter Cumpson
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE
Publication number
20250180495
Publication date
Jun 5, 2025
Rigaku Corporation
Aya Ogi
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING
Publication number
20250172511
Publication date
May 29, 2025
Siemens Healthineers AG
Philipp ROSER
G01 - MEASURING TESTING
Information
Patent Application
X-Ray System for Generating Multi-Spectrum Image Data
Publication number
20250172512
Publication date
May 29, 2025
Teledyne Dalsa B.V.
Korthout Alouisius Wilhelmus Marinus
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20250172510
Publication date
May 29, 2025
ISHIDA CO., LTD.
Futoshi YURUGI
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING
Publication number
20250164416
Publication date
May 22, 2025
GE Precision Healthcare LLC
Johannes Loberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECTROMETER
Publication number
20250164421
Publication date
May 22, 2025
EasyXAFS, LLC
William Holden
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGING APPARATUS
Publication number
20250164415
Publication date
May 22, 2025
Rayence Co., Ltd.
Seungman YUN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
Publication number
20250146960
Publication date
May 8, 2025
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
Nanophotonic Scintillators for High-Energy Particles Detection, Ima...
Publication number
20250137942
Publication date
May 1, 2025
Massachusetts Institute of Technology
Marin Soljacic
B82 - NANO-TECHNOLOGY
Information
Patent Application
DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...
Publication number
20250130183
Publication date
Apr 24, 2025
Applied Materials, Inc.
Alexander Buhse Brady
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
Publication number
20250067690
Publication date
Feb 27, 2025
Shimadzu Corporation
Keijiro SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
Publication number
20250067689
Publication date
Feb 27, 2025
The Boeing Company
Morteza Safai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
Publication number
20250067685
Publication date
Feb 27, 2025
Thermo EGS Gauging LLC
Carter WATSON
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
Publication number
20250062048
Publication date
Feb 20, 2025
UNIVERSITAET HAMBURG
Jonas BAUMANN
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
Publication number
20250060322
Publication date
Feb 20, 2025
Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
Sai Xu
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
Publication number
20250027891
Publication date
Jan 23, 2025
Saudi Arabian Oil Company
Mohamed SOUA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
Publication number
20250020602
Publication date
Jan 16, 2025
LG ENERGY SOLUTION, LTD.
Joon Hyeon KANG
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...
Publication number
20250003892
Publication date
Jan 2, 2025
Anritsu Corporation
Takeshi YAMAZAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERNED X-RAY EMITTING TARGET
Publication number
20250006451
Publication date
Jan 2, 2025
NOVA MEASURING INSTRUMENTS INC.
David A. REED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
Publication number
20240418633
Publication date
Dec 19, 2024
KLA Corporation
Shova Subedi
G01 - MEASURING TESTING
Information
Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
Publication number
20240393266
Publication date
Nov 28, 2024
Sigray, Inc.
David Vine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240369502
Publication date
Nov 7, 2024
Canon ANELVA Corporation
Takeo TSUKAMOTO
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
Publication number
20240361256
Publication date
Oct 31, 2024
Konica Minolta, Inc.
Mika Matsusaka
G01 - MEASURING TESTING