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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating materials by wave or particle radiation
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Patents Grants
last 30 patents
Information
Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
Patent number
12,228,529
Issue date
Feb 18, 2025
Sai Xu
G01 - MEASURING TESTING
Information
Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
Patent number
12,209,978
Issue date
Jan 28, 2025
Danmarks Tekniske Universitet
Yubin Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
Patent number
12,209,977
Issue date
Jan 28, 2025
Sigray, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Residual stress measurement method of curved surface block
Patent number
12,209,926
Issue date
Jan 28, 2025
Metal Industries Research & Development Centre
Zong Rong Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting internal stress distribution of transparent mat...
Patent number
12,203,881
Issue date
Jan 21, 2025
Zhejiang University
Haikuo Wang
G01 - MEASURING TESTING
Information
Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
Patent number
12,174,132
Issue date
Dec 24, 2024
Sumitomo Chemical Company, Limited
Takehiro Yoshida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
Patent number
12,163,903
Issue date
Dec 10, 2024
The Boeing Company
Morteza Safai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
Patent number
12,163,904
Issue date
Dec 10, 2024
LG ENERGY SOLUTION, LTD.
Hyo-Jung Yoon
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzer
Patent number
12,135,299
Issue date
Nov 5, 2024
Shimadzu Corporation
Takuro Izumi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer and pulse height prediction program
Patent number
12,105,035
Issue date
Oct 1, 2024
Rigaku Corporation
Tsutomu Tada
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Scan procedure generation systems and methods to generate scan proc...
Patent number
12,092,591
Issue date
Sep 17, 2024
Illinois Tool Works Inc.
Jackson Turner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Rotational X-ray inspection system and method
Patent number
12,061,156
Issue date
Aug 13, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,053,675
Issue date
Aug 6, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
G01 - MEASURING TESTING
Information
Patent Grant
X-ray automated calibration and monitoring
Patent number
12,044,634
Issue date
Jul 23, 2024
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device
Patent number
12,013,351
Issue date
Jun 18, 2024
ISHIDA CO., LTD.
Ryota Hatano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Serial synchrotron crystallography sample holding system
Patent number
12,007,342
Issue date
Jun 11, 2024
MITEGEN, LLC
Robert E. Thorne
G01 - MEASURING TESTING
Information
Patent Grant
X-ray beam shaping apparatus and method
Patent number
12,007,343
Issue date
Jun 11, 2024
Malvern Panalytical B.V.
Milen Gateshki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for x-ray fluorescence analysis
Patent number
12,007,380
Issue date
Jun 11, 2024
Malvern Panalytical B.V.
Bruno Vrebos
G01 - MEASURING TESTING
Information
Patent Grant
Patterned x-ray emitting target
Patent number
11,996,259
Issue date
May 28, 2024
NOVA MEASURING INSTRUMENTS INC.
David A. Reed
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray unit technology modules and automated application training
Patent number
11,988,617
Issue date
May 21, 2024
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Multi-physical field imaging method and system based on PET-CT and DAS
Patent number
11,965,995
Issue date
Apr 23, 2024
Yibo Wang
G01 - MEASURING TESTING
Information
Patent Grant
Ore component analysis device and method
Patent number
11,953,455
Issue date
Apr 9, 2024
SHANDONG UNIVERSITY
Chen Liu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for crack detection
Patent number
11,946,883
Issue date
Apr 2, 2024
United States as represented by the Administrator of NASA
Ajay M Koshti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device, recording medium, and positioning method
Patent number
11,940,397
Issue date
Mar 26, 2024
Horiba, Ltd.
Tomoki Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
Patent number
11,933,747
Issue date
Mar 19, 2024
University of Maryland, College Park
Peter Zavalij
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Grant
Sample mounting system for an X-ray analysis apparatus
Patent number
11,927,550
Issue date
Mar 12, 2024
Malvern Panalytical B.V.
Jaap Boksem
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
Publication number
20250062048
Publication date
Feb 20, 2025
UNIVERSITAET HAMBURG
Jonas BAUMANN
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
Publication number
20250060322
Publication date
Feb 20, 2025
Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
Sai Xu
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
Publication number
20250027891
Publication date
Jan 23, 2025
Saudi Arabian Oil Company
Mohamed SOUA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
Publication number
20250020602
Publication date
Jan 16, 2025
LG ENERGY SOLUTION, LTD.
Joon Hyeon KANG
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...
Publication number
20250003892
Publication date
Jan 2, 2025
Anritsu Corporation
Takeshi YAMAZAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERNED X-RAY EMITTING TARGET
Publication number
20250006451
Publication date
Jan 2, 2025
NOVA MEASURING INSTRUMENTS INC.
David A. REED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
Publication number
20240418633
Publication date
Dec 19, 2024
KLA Corporation
Shova Subedi
G01 - MEASURING TESTING
Information
Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
Publication number
20240393266
Publication date
Nov 28, 2024
Sigray, Inc.
David Vine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240369502
Publication date
Nov 7, 2024
Canon ANELVA Corporation
Takeo TSUKAMOTO
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
Publication number
20240361256
Publication date
Oct 31, 2024
Konica Minolta, Inc.
Mika Matsusaka
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20240361263
Publication date
Oct 31, 2024
Rigaku Corporation
Yasuhiko Nagoshi
G01 - MEASURING TESTING
Information
Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
Publication number
20240353355
Publication date
Oct 24, 2024
CiTEX Holding GmbH
Arno NEUMEISTER
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
Publication number
20240345007
Publication date
Oct 17, 2024
Zhejiang University
Haikuo WANG
G01 - MEASURING TESTING
Information
Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
Publication number
20240328969
Publication date
Oct 3, 2024
MITEGEN, LLC
Robert E. Thorne
G01 - MEASURING TESTING
Information
Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
Publication number
20240319120
Publication date
Sep 26, 2024
MITEGEN, LLC
Robert E. Thorne
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
Publication number
20240310308
Publication date
Sep 19, 2024
Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
Martin Leibfritz
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
Publication number
20240310300
Publication date
Sep 19, 2024
Rapiscan Holdings, Inc.
James Ollier
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20240310304
Publication date
Sep 19, 2024
TSINGHUA UNIVERSITY
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
Publication number
20240302302
Publication date
Sep 12, 2024
Sumitomo Chemical Company, Limited
Takehiro YOSHIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
Publication number
20240302303
Publication date
Sep 12, 2024
MALVERN PANALYTICAL B.V.
Milen GATESHKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
Publication number
20240295508
Publication date
Sep 5, 2024
The Boeing Company
Nicholas C. Reasoner
G01 - MEASURING TESTING
Information
Patent Application
MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS
Publication number
20240295510
Publication date
Sep 5, 2024
GILARDONI S.P.A.
Davide Baratto
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20240288592
Publication date
Aug 29, 2024
ISHIDA CO., LTD.
Futoshi YURUGI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
Publication number
20240280515
Publication date
Aug 22, 2024
Sigray, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
Publication number
20240264098
Publication date
Aug 8, 2024
Rigaku Corporation
Tsutomu TADA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
Publication number
20240255444
Publication date
Aug 1, 2024
HITACHI HIGH-TECH SCIENCE CORPORATION
Satoshi MATSUBARA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT
Publication number
20240210333
Publication date
Jun 27, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...
Publication number
20240201110
Publication date
Jun 20, 2024
KUB TECHNOLOGIES, INC. DBA KUBTEC
Chester Lowe
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IDENTIFICATION OF CONNECTIONS IN A TUBULAR STRING
Publication number
20240201108
Publication date
Jun 20, 2024
Weatherford Technology Holdings, LLC.
Benjamin SACHTLEBEN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGING APPARATUS
Publication number
20240167967
Publication date
May 23, 2024
Woorien Co., Ltd.
Taehee HAN
G01 - MEASURING TESTING