X-ray

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G01N2223/1016

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/1016X-ray

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray radioscope
- Patent number 12,360,061
- Issue date Jul 15, 2025
- BEAMSENSE Co., Ltd.
- Sueki Baba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
- Patent number 12,360,067
- Issue date Jul 15, 2025
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray identification of connections in a tubular string
- Patent number 12,345,664
- Issue date Jul 1, 2025
- Weatherford Technology Holdings, LLC
- Benjamin Sachtleben
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive analyzer of patient tissue
- Patent number 12,336,851
- Issue date Jun 24, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Alpha diffractometer
- Patent number 12,332,192
- Issue date Jun 17, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,292,395
- Issue date May 6, 2025
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,285,656
- Issue date Apr 29, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Correction amount specifying apparatus, method, program, and jig
- Patent number 12,287,301
- Issue date Apr 29, 2025
- Rigaku Corporation
- Takuya Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
- Patent number 12,287,300
- Issue date Apr 29, 2025
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a specimen container for use in cabinet x-ray...
- Patent number 12,281,971
- Issue date Apr 22, 2025
- Kub Technologies Inc
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
- Patent number 12,163,904
- Issue date Dec 10, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo-Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection Method and Inspection Device
- Publication number 20250224349
- Publication date Jul 10, 2025
- Shimadzu Corporation
- Koichi TANABE
- G01 - MEASURING TESTING
Information Patent Application
X-BAND SMALL-FOCUS ACCELERATOR FOR NON-DESTRUCTIVE TESTING
- Publication number 20250227835
- Publication date Jul 10, 2025
- Nuctech Company Limited
- Yaohong LIU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...
- Publication number 20250198950
- Publication date Jun 19, 2025
- Illinois Tool Works Inc.
- Nicole Wilson
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...
- Publication number 20250198955
- Publication date Jun 19, 2025
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Bruno Schroth
- G01 - MEASURING TESTING
Information Patent Application
CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...
- Publication number 20250203744
- Publication date Jun 19, 2025
- Siemens Healthineers AG
- Joerg FREUDENBERGER
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE
- Publication number 20250180497
- Publication date Jun 5, 2025
- PHOTOELECTRON INTELLECTUAL PROPERTY HOLDINGS LLC
- Peter Cumpson
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE
- Publication number 20250180495
- Publication date Jun 5, 2025
- Rigaku Corporation
- Aya Ogi
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING
- Publication number 20250172511
- Publication date May 29, 2025
- Siemens Healthineers AG
- Philipp ROSER
- G01 - MEASURING TESTING
Information Patent Application
X-Ray System for Generating Multi-Spectrum Image Data
- Publication number 20250172512
- Publication date May 29, 2025
- Teledyne Dalsa B.V.
- Korthout Alouisius Wilhelmus Marinus
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250172510
- Publication date May 29, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING
- Publication number 20250164416
- Publication date May 22, 2025
- GE Precision Healthcare LLC
- Johannes Loberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250164415
- Publication date May 22, 2025
- Rayence Co., Ltd.
- Seungman YUN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Nanophotonic Scintillators for High-Energy Particles Detection, Ima...
- Publication number 20250137942
- Publication date May 1, 2025
- Massachusetts Institute of Technology
- Marin Soljacic
- B82 - NANO-TECHNOLOGY
Information Patent Application
DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...
- Publication number 20250130183
- Publication date Apr 24, 2025
- Applied Materials, Inc.
- Alexander Buhse Brady
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...
- Publication number 20250003892
- Publication date Jan 2, 2025
- Anritsu Corporation
- Takeshi YAMAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
- Publication number 20240361256
- Publication date Oct 31, 2024
- Konica Minolta, Inc.
- Mika Matsusaka
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray radioscope

X-ray fluorescence system and x-ray source with electrically insula...

X-ray identification of connections in a tubular string

Diffractive analyzer of patient tissue

Alpha diffractometer

Method for quantitatively characterizing dendrite segregation and d...

Customizable axes of rotation for industrial radiography systems

Device for closing the input opening in the sample chamber in an x-...

Serial synchrotron crystallography sample holding system

X-ray analysis system and method with multi-source design

Method and system utilizing imaging analysis for golf balls

Correction amount specifying apparatus, method, program, and jig

Single piece droplet generation and injection device for serial cry...

Device and method for analyzing diffraction pattern of mixture, and...

System and method for a specimen container for use in cabinet x-ray...

X-ray fluorescence spectrometer

Inspection apparatus and inspection method

Spectrometer

Non-destructive detection method and system for Conopomorpha sinens...

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Method of detecting internal stress distribution of transparent mat...

Nitride semiconductor substrate, laminated structure, and method fo...

System, method, and apparatus for x-ray backscatter inspection of p...

Quantitative analysis method of carbon based hybrid negative electrode

X-ray fluorescence analyzer

X-ray spectrometer and pulse height prediction program

Device and method for measuring short-wavelength characteristic X-r...

Scan procedure generation systems and methods to generate scan proc...

Patents Applicationslast 30 patents

Inspection Method and Inspection Device

X-BAND SMALL-FOCUS ACCELERATOR FOR NON-DESTRUCTIVE TESTING

Analysis System, Analysis Method, and Analysis Program

MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...

ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...

CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...

IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE

X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE

MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING

X-Ray System for Generating Multi-Spectrum Image Data

X-RAY INSPECTION APPARATUS

MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING

SPECTROMETER

X-RAY IMAGING APPARATUS

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

Nanophotonic Scintillators for High-Energy Particles Detection, Ima...

DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

Non-destructive Detection Method and System for Conopomorpha Sinens...

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...

PATTERNED X-RAY EMITTING TARGET

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD