3676229

Information

• Patent Grant
• 3676229

• References
• Source

• Patent Number

  3,676,229

• Date Filed

  Not available

• Date Issued

  Tuesday, July 11, 1972
  52 years ago

• CPC

  • H01L22/14 - for electrical parameters
  • G01R31/2637 - for testing other individual devices
  • G01R31/2644 - Adaptations of individual semiconductor devices to facilitate the testing thereof
  • H01L22/00 - Testing or measuring during manufacture or treatment; Reliability measurements
  • H01L22/20 - Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
  • H01L29/1004 - Base region of bipolar transistors
  • Y10S148/085 - Isolated-integrated
  • Y10S148/162 - Testing steps

• US Classifications

  • 438 - Semiconductor device manufacturing: process
  • 148 - Metal treatment
  • 257 - Active solid-state devices