Many activities require secure electronic communications. To facilitate secure electronic communications, an encryption/decryption system may be implemented on an electronic assembly or printed circuit board assembly that is included in equipment connected to a communications network. Such an electronic assembly is an enticing target for malefactors since it may contain codes or keys to decrypt intercepted messages, or to encode fraudulent messages. To prevent this, an electronic assembly may be mounted in an enclosure, which is then wrapped in a security sensor, and encapsulated with polyurethane resin. A security sensor may be, in one or more embodiments, a web or sheet of insulating material with circuit elements, such as closely-spaced, conductive lines fabricated on it. The circuit elements are disrupted if the sensor is torn, and the sensor can be sensed in order to generate an alarm signal. The alarm signal may be conveyed to a monitor circuit in order to reveal an attack on the integrity of the assembly. The alarm signal may also trigger an erasure of encryption/decryption keys stored within the electronic assembly.
In the above configuration, the electronic package, or tamper-proof electronic package, may be difficult to test due to the presence of the security sensor wrapped fully around the enclosure. Additionally, in this configuration it is difficult to recover components from the electronic package, for instance, should a manufacturing defect in the package be detected.
Provided herein, in one or more aspects, is a method of fabricating an electronic circuit. The method includes: providing a multilayer circuit board; and providing a tamper-respondent sensor embedded within the multilayer circuit board, the tamper-respondent sensor defining, at least in part, a secure volume associated with the multilayer circuit board.
In one or more additional aspects, a fabrication method is presented which includes forming a multilayer circuit board, the forming including: providing a tamper-respondent sensor embedded within the multilayer circuit board, the tamper-respondent sensor comprising multiple tamper-respondent layers within the multilayer circuit board, at least one tamper-respondent layer of the multiple tamper-respondent layers being at least one tamper-respondent frame, and at least one other tamper-respondent layer of the multiple tamper-respondent layers being at least one tamper-respondent mat layer, the at least one tamper-respondent frame being disposed within the multilayer circuit board above the at least one tamper-respondent mat layer, and the tamper-respondent sensor defines, at least in part, a secure volume associated with the multilayer circuit board.
Additional features and advantages are realized through the techniques of the present invention. Other embodiments and aspects of the invention are described in detail herein and are considered a part of the claimed invention.
One or more aspects of the present invention are particularly pointed out and distinctly claimed as examples in the claims at the conclusion of the specification. The foregoing and other objects, features, and advantages of the invention are apparent from the following detailed description taken in conjunction with the accompanying drawings in which:
Aspects of the present invention and certain features, advantages, and details thereof, are explained more fully below with reference to the non-limiting example(s) illustrated in the accompanying drawings. Descriptions of well-known materials, fabrication tools, processing techniques, etc., are omitted so as not to unnecessarily obscure the invention in detail. It should be understood, however, that the detailed description and the specific example(s), while indicating aspects of the invention, are given by way of illustration only, and are not by way of limitation. Various substitutions, modifications, additions, and/or arrangements, within the spirit and/or scope of the underlying inventive concepts will be apparent to those skilled in the art for this disclosure. Note further that reference is made below to the drawings, which are not drawn to scale for ease of understanding, and wherein the same reference numbers used throughout different figures designate the same or similar components.
Reference is first made to
In one or more implementations, a tamper-proof electronic package such as depicted is configured or arranged to detect attempts to tamper-with or penetrate into enclosure 110. Accordingly, enclosure 110 also includes, for instance, a monitor circuit which, if tampering is detected, activates an erase circuit to erase information stored within the associated memory, as well as the encryption module within the communications card. These components may be mounted on, and interconnected by, a printed circuit board or other substrate, and be internally powered via a power supply provided within the enclosure.
In the embodiment illustrated, and as one example only, enclosure 110 is surrounded by a tamper-respondent sensor 120, an encapsulant 130, and an outer, thermally conductive enclosure 140. In one or more implementations, tamper-respondent sensor 120 may comprise a folded, tamper-respondent laminate, and encapsulant 130 may be provided in the form of a molding. Tamper-respondent sensor 120 may include various detection layers, which are monitored via a ribbon cable (discussed below) by the enclosure monitor, against sudden violent attempts to penetrate enclosure 110 and damage the enclosure monitor or erase circuit before information can be erased from the encryption module. The tamper-respondent sensor may be, for example, any such article commercially available or described in various publications and issued patents.
By way of example, tamper-respondent sensor 120 may be formed as a tamper-respondent laminate comprising a number of separate layers with, for instance, an outermost lamination-respondent layer including a matrix of diagonally-extending, semi-conductive lines printed onto a regular, thin insulating film. The matrix of lines forms a number of continuous conductors which would be broken if attempts are made to penetrate the film. The lines may be formed, for instance, by printing carbon-loaded Polymer Thick Film, PTF, ink onto the film, and selectively connecting the lines on each side, by conductive vias at the edges of the film. Connections between the lines and an enclosure monitor of the communications card may be provided via, for instance, one or more ribbon cables. The ribbon cable itself may be formed of lines of carbon-loaded ink printed onto an extension of the film, if desired. Connections between the matrix and the ribbon cable may be made via connectors formed on one edge of the film. As noted, the laminate may be folded to define the tamper-respondent sensor 120 surrounding enclosure 110.
In one or more implementations, the various elements of the laminate may be adhered together and folded around enclosure 110, in a similar manner to gift-wrapping a parcel, to define the tamper-respondent sensor 120. The assembly may be placed in a mold which is then filled with, for instance, cold-pour polyurethane, and the polyurethane may be cured and hardened to form an encapsulant 130. The encapsulant may, in one or more embodiments, completely surround the tamper-respondent sensor 120 and enclosure 110, and thus form a complete environmental seal, protecting the interior of the enclosure. The hardened polyurethane is resilient and increases robustness of the electronic package in normal use. Outer, thermally conductive enclosure 140 may optionally be provided over encapsulant 130 to, for instance, provide further structural rigidity to the electronic package.
Note that, as an enhancement, within a sealed electronic package, such as the tamper-proof electronic package depicted in
Hollow spacers 213 may be placed below dimples 206 in top metal shell 204, and rivets 214 provided, extending through openings in dimples 206, through hollow spacers 213 and through openings in printed circuit board 210 to base metal shell 202 in order to fixedly secure electronic assembly 208 within the enclosure formed by base and top metal shells 202, 204. A security mesh or tamper-respondent sensor 216 is wrapped around the top, base, and four sides of the enclosure formed by base and top metal shells 202, 204. As illustrated, in one or more embodiments, top metal shell 204 may have an opening through which a bus 220 extends. One end of bus 220 may be connected to conductors (not shown) on printed circuit board 210, and the other end may be connected to conductors (not shown) on a printed circuit board 222. As bus 220 passes through the opening, the bus extends between an inner edge region 223 of the security mesh 216 and an overlapping, outer edge region 224 of the security mesh 216. A group of wires 226 connect, in one embodiment, security mesh 216 to conductors on printed circuit board 210. Circuitry on printed circuit board 210 is responsive to a break in security mesh 216, in which case, an alarm signal may be emitted on bus 220, and also encryption/decryption keys stored within electronic assembly 208 may be erased.
In one or more implementations, liquid polyurethane resin may be applied to security mesh 216 and cured. An outer, thermally conductive enclosure 228, such as a copper enclosure, may be filled with liquid polyurethane resin with the electronic assembly and inner enclosure and security mesh suspended within it. Upon curing the resin, the electronic assembly and inner enclosure and security mesh become embedded in a polyurethane block or encapsulant 230, as shown. The enclosure 228 is mounted on the printed circuit board 222, which can be accomplished using, for instance, legs 240 which extend through slots in printed circuit board 222 and terminate in flanges 242, which are then bent out of alignment with the slots. Bus 220 may be connected, by way of printed circuit board 222 to connectors 244 located along, for instance, one edge of printed circuit board 222.
In the configuration of
Disclosed hereinbelow with reference to
Referring collectively to
Tamper-proof electronic package 400 further includes an enclosure 420, such as a pedestal-type enclosure, mounted to multilayer circuit board 410 within, for instance, a continuous groove (or trench) 412 formed within an upper surface of multilayer circuit board 410. In one or more embodiments, enclosure 420 may comprise a thermally conductive material and operate as a heat sink for facilitating cooling of the one or more electronic components 402 within the secure volume. A security mesh 421, such as the above-described security meshes, may be associated with enclosure 420, for example, wrapping around the inner surface of enclosure 420 to facilitate defining, in combination with tamper-respondent sensor 411 embedded within multilayer circuit board 410, secure volume 401. In one or more implementations, security mesh 421 extends down into continuous groove 412 in multilayer circuit board 410 and may, for instance, even wrap partially or fully around the lower edge of enclosure 420 within continuous groove 412 to provide enhanced tamper detection where enclosure 420 couples to multilayer circuit board 410. In one or more implementations, enclosure 420 may be securely affixed to multilayer circuit board 410 using, for instance, a bonding material such as an epoxy or other adhesive.
As depicted in
As noted with reference to
Note that the embodiment depicted in
By way of further example,
As illustrated, one or more external signal lines or planes 505 enter secure volume 401 between, in this embodiment, two tamper-respondent mat layers 500, and then electrically connect upwards into the secure volume 401 through one or more conductive vias, arranged in any desired location and pattern. In the configuration depicted, the one or more tamper-respondent frames 501 are disposed at least inside of the area defined by continuous groove 412 accommodating the base of enclosure 420. Together with security mesh 421 associated with enclosure 420, tamper-respondent frames 501 define secure volume 401 where extending, in part, into multilayer circuit board 410. With secure volume 401 defined, at least in part, within multilayer circuit board 410, the external signal line(s) 505 may be securely electrically connected to, for instance, the one or more electronic components 402 (
As illustrated by the schematic of
Note also that, in this implementation, once within the secure volume is defined within multilayer circuit board 410, conductive vias within the secure volume between layers of multilayer circuit board 410 may be either aligned, or offset, as desired, dependent upon the implementation. Alignment of conductive vias may facilitate, for instance, providing a shortest connection path, while offsetting conductive vias between layers may further enhance security of the tamper-proof electronic package by making an attack into the secure volume through or around one or more tamper-respondent layers of the multiple tamper-respondent layers more difficult.
Each tamper-respondent layer of the embedded tamper-respondent sensor formed within the multilayer circuit board of the electronic circuit or electronic package may include multiple conductive traces or lines formed between, for instance, respective sets of input and output contacts or vias at the trace termination points. Any number of conductive traces or circuits may be employed in defining a tamper-respondent layer or a tamper-respondent circuit zone within a tamper-respondent layer. For instance, 4, 6, 8, etc., conductive traces may be formed in parallel (or otherwise) within a given tamper-respondent layer or circuit zone between the respective sets of input and output contacts to those conductive traces.
In one or more implementations, the multilayer circuit board may be a multilayer wiring board or printed circuit board formed, for instance, by building up the multiple layers of the board.
As illustrated in
A first photoresist 604 is provided over stack 600, and patterned with one or more openings 605, through which the overlying conductive layer 603 may be etched. Depending on the materials employed, and the etch processes used, a second etch process may be desired to remove portions of trace material layer 602 to define the conductive traces of the subject tamper-respondent layer. First photoresist 604 may then be removed, and a second photoresist 604′ is provided over the conductive layer 603 features to remain, such as the input and output contacts. Exposed portions of conductive layer 603 are then etched, and the second photoresist 604′ may be removed, with any opening in the layer being filled, for instance, with an adhesive (or pre-preg) and a next build-up layer is provided, as shown. Note that in this implementation, most of overlying conductive layer 603 is etched away, with only the conductive contacts or vias remaining where desired, for instance, at the terminal points of the traces formed within the layer by the patterning of the trace material layer 602. Note that any of a variety of materials may be employed to form the conductive lines or traces within a tamper-respondent layer. Nickel-phosphorous (NiP) is particularly advantageous as a material since it is resistant to contact by solder, or use of a conductive adhesive to bond to it, making it harder to bridge from one circuit or trace to the next during an attempt to penetrate into the protected secure volume of the electronic circuit. Other materials which could be employed include OhmegaPly®, offered by Ohmega Technologies, Inc., of Culver City, Calif. (USA), or Ticer™, offered by Ticer Technologies of Chandler, Ariz. (USA).
By way of example,
As illustrated in
The trace lines or circuits within all of the tamper-respondent layers, and in particular, the tamper-respondent circuit zones, of the embedded tamper-respondent sensor are electrically connected into monitor or compare circuitry 900 provided, for instance, within secure volume 401 of multilayer circuit board 410, as illustrated in
Note that advantageously, different tamper-respondent circuit zones on different tamper-respondent layers may be electrically interconnected into, for instance, the same comparator circuit or Wheatstone bridge of the monitor circuitry. Thus, any of a large number of interconnect configurations may be possible. For instance, if each tamper-respondent mat layer contains 30 tamper-respondent circuit zones, and each tamper-respondent frame contains four tamper-respondent circuit zones, then, for instance, the resultant sixty-eight tamper-respondent circuit zones may be connected in any configuration within the secure volume to create the desired arrangement of circuit networks within the secure volume being monitored for changes in resistance or tampering. Note in this regard, that the power supply or battery for the tamper-respondent sensor may be located external to the secure volume, with the sensor being configured to trip and destroy any protected or critical data if the power supply or battery is tampered with.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprise” (and any form of comprise, such as “comprises” and “comprising”), “have” (and any form of have, such as “has” and “having”), “include” (and any form of include, such as “includes” and “including”), and “contain” (and any form contain, such as “contains” and “containing”) are open-ended linking verbs. As a result, a method or device that “comprises”, “has”, “includes” or “contains” one or more steps or elements possesses those one or more steps or elements, but is not limited to possessing only those one or more steps or elements. Likewise, a step of a method or an element of a device that “comprises”, “has”, “includes” or “contains” one or more features possesses those one or more features, but is not limited to possessing only those one or more features. Furthermore, a device or structure that is configured in a certain way is configured in at least that way, but may also be configured in ways that are not listed.
The corresponding structures, materials, acts, and equivalents of all means or step plus function elements in the claims below, if any, are intended to include any structure, material, or act for performing the function in combination with other claimed elements as specifically claimed. The description of the present invention has been presented for purposes of illustration and description, but is not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the invention. The embodiment was chosen and described in order to best explain the principles of one or more aspects of the invention and the practical application, and to enable others of ordinary skill in the art to understand one or more aspects of the invention for various embodiments with various modifications as are suited to the particular use contemplated.
Number | Name | Date | Kind |
---|---|---|---|
3165569 | Bright et al. | Jan 1965 | A |
4160503 | Ohlbach | Jul 1979 | A |
4211324 | Olhback | Jul 1980 | A |
4324823 | Ray, III | Apr 1982 | A |
4516679 | Simpson | May 1985 | A |
4496900 | Di Stefano et al. | Jun 1985 | A |
4593384 | Kleijne | Jun 1986 | A |
4609104 | Kasper et al. | Sep 1986 | A |
4653252 | van de Haar et al. | Mar 1987 | A |
4677809 | Long et al. | Jul 1987 | A |
4691350 | Kleijne et al. | Sep 1987 | A |
4807284 | Kleijne | Feb 1989 | A |
4811288 | Kleijne et al. | Mar 1989 | A |
4847139 | Wolf et al. | Jul 1989 | A |
4860351 | Weingart | Aug 1989 | A |
4865197 | Craig | Sep 1989 | A |
5009311 | Schenk | Apr 1991 | A |
5027397 | Double et al. | Jun 1991 | A |
5060114 | Feinberg et al. | Oct 1991 | A |
5075822 | Baumler et al. | Dec 1991 | A |
5117457 | Comerford et al. | May 1992 | A |
5159629 | Double et al. | Oct 1992 | A |
5185717 | Mori | Feb 1993 | A |
5201868 | Johnson | Apr 1993 | A |
5201879 | Steele et al. | Apr 1993 | A |
5211618 | Stoltz | May 1993 | A |
5239664 | Verrier et al. | Aug 1993 | A |
5243162 | Kobayashi | Sep 1993 | A |
5389738 | Piosenka et al. | Feb 1995 | A |
5406630 | Piosenka et al. | Apr 1995 | A |
5506566 | Oldfield et al. | Apr 1996 | A |
5568124 | Joyce et al. | Oct 1996 | A |
5594439 | Swanson | Jan 1997 | A |
5675319 | Rivenberg et al. | Oct 1997 | A |
5715652 | Stahlecker | Feb 1998 | A |
5761054 | Kuhn | Jun 1998 | A |
5813113 | Stewart et al. | Sep 1998 | A |
5858500 | MacPherson | Jan 1999 | A |
5880523 | Candelore | Mar 1999 | A |
5988510 | Tuttle et al. | Nov 1999 | A |
6121544 | Petsinger | Sep 2000 | A |
6195267 | MacDonald, Jr. et al. | Feb 2001 | B1 |
6201296 | Fries et al. | Mar 2001 | B1 |
6261215 | Imer | Jul 2001 | B1 |
6301096 | Wozniczka | Oct 2001 | B1 |
6384397 | Takiar et al. | May 2002 | B1 |
6424954 | Leon | Jul 2002 | B1 |
6438825 | Kuhm | Aug 2002 | B1 |
6469625 | Tomooka | Oct 2002 | B1 |
6473304 | Stevens | Oct 2002 | B1 |
6512454 | Miglioli et al. | Jan 2003 | B2 |
6643995 | Kayama | Nov 2003 | B1 |
6686539 | Farquhar et al. | Feb 2004 | B2 |
6746960 | Goodman | Jun 2004 | B2 |
6798660 | Moss et al. | Sep 2004 | B2 |
6853093 | Cohen | Feb 2005 | B2 |
6879032 | Rosenau et al. | Apr 2005 | B2 |
6895509 | Clark | May 2005 | B1 |
6929900 | Farquhar et al. | Aug 2005 | B2 |
6946960 | Sisson et al. | Sep 2005 | B2 |
6957345 | Cesana et al. | Oct 2005 | B2 |
6970360 | Sinha | Nov 2005 | B2 |
6985362 | Mori et al. | Jan 2006 | B2 |
6991961 | Hubbard et al. | Jan 2006 | B2 |
6996953 | Perreault et al. | Feb 2006 | B2 |
7005733 | Kommerling et al. | Feb 2006 | B2 |
7015823 | Gillen et al. | May 2006 | B1 |
7054162 | Benson et al. | May 2006 | B2 |
7057896 | Matsuo et al. | Jun 2006 | B2 |
7094143 | Wolm et al. | Aug 2006 | B2 |
7094459 | Takahashi | Aug 2006 | B2 |
7095615 | Nichols | Aug 2006 | B2 |
7156233 | Clark et al. | Jan 2007 | B2 |
7180008 | Heitmann et al. | Feb 2007 | B2 |
7189360 | Ho | Mar 2007 | B1 |
7214874 | Dangler et al. | May 2007 | B2 |
7247791 | Kulpa | Jul 2007 | B2 |
7304373 | Taggart et al. | Dec 2007 | B2 |
7310737 | Patel et al. | Dec 2007 | B2 |
7465887 | Suzuki et al. | Dec 2008 | B2 |
7475474 | Heitmann et al. | Jan 2009 | B2 |
7515418 | Straznicky et al. | Apr 2009 | B2 |
7549064 | Elbert et al. | Jun 2009 | B2 |
7640658 | Pham et al. | Jan 2010 | B1 |
7643290 | Narasimhan et al. | Jan 2010 | B1 |
7663883 | Shirakami et al. | Feb 2010 | B2 |
7672129 | Ouyang et al. | Mar 2010 | B1 |
7679921 | Cesana et al. | Mar 2010 | B2 |
7731517 | Lee et al. | Jun 2010 | B2 |
7746657 | Oprea et al. | Jun 2010 | B2 |
7760086 | Hunter et al. | Jul 2010 | B2 |
7768005 | Condorelli et al. | Aug 2010 | B2 |
7783994 | Ball et al. | Aug 2010 | B2 |
7787256 | Chan et al. | Aug 2010 | B2 |
7868441 | Eaton et al. | Jan 2011 | B2 |
7898413 | Hsu et al. | Mar 2011 | B2 |
7901977 | Angelopoulos et al. | Mar 2011 | B1 |
7947911 | Pham et al. | May 2011 | B1 |
7978070 | Hunter | Jul 2011 | B2 |
8084855 | Lower et al. | Dec 2011 | B2 |
8094450 | Cole | Jan 2012 | B2 |
8133621 | Wormald et al. | Mar 2012 | B2 |
8101267 | Moh et al. | Jun 2012 | B2 |
8199506 | Janik et al. | Jun 2012 | B2 |
8287336 | Dangler et al. | Oct 2012 | B2 |
8325486 | Arshad et al. | Dec 2012 | B2 |
8516269 | Hamlet et al. | Aug 2013 | B1 |
8589703 | Lee | Nov 2013 | B2 |
8646108 | Shiakallis et al. | Feb 2014 | B2 |
8659506 | Nomizo | Feb 2014 | B2 |
8659908 | Adams et al. | Feb 2014 | B2 |
8664047 | Lower et al. | Mar 2014 | B2 |
8716606 | Kelley et al. | May 2014 | B2 |
8797059 | Boday et al. | Aug 2014 | B2 |
8836509 | Lowy | Sep 2014 | B2 |
8853839 | Gao et al. | Oct 2014 | B2 |
8879266 | Jarvis et al. | Nov 2014 | B2 |
8890298 | Buer et al. | Nov 2014 | B2 |
8947889 | Kelley et al. | Feb 2015 | B2 |
8961280 | Dangler et al. | Feb 2015 | B2 |
9003199 | Dellmo et al. | Apr 2015 | B2 |
9011762 | Seppa et al. | Apr 2015 | B2 |
9052070 | Davis et al. | Jun 2015 | B2 |
9166586 | Carapelli et al. | Oct 2015 | B2 |
9298956 | Wade et al. | Mar 2016 | B2 |
9554477 | Brodsky | Jan 2017 | B1 |
9661747 | Brodsky | May 2017 | B1 |
20010049021 | Valimont | Dec 2001 | A1 |
20010050425 | Beroz et al. | Dec 2001 | A1 |
20010056542 | Cesana et al. | Dec 2001 | A1 |
20020002683 | Benson | Jan 2002 | A1 |
20020068384 | Beroz et al. | Jun 2002 | A1 |
20020084090 | Farquhar | Jul 2002 | A1 |
20030009684 | Schwenck et al. | Jan 2003 | A1 |
20040218366 | Speigl | Nov 2004 | A1 |
20050068735 | Fissore et al. | Mar 2005 | A1 |
20050111194 | Sohn et al. | May 2005 | A1 |
20050161253 | Heitmann et al. | Jul 2005 | A1 |
20050180104 | Olesen et al. | Aug 2005 | A1 |
20060034731 | Lewis et al. | Feb 2006 | A1 |
20060072288 | Stewart et al. | Apr 2006 | A1 |
20060080348 | Cesana et al. | Apr 2006 | A1 |
20060196945 | Mendels | Sep 2006 | A1 |
20060218779 | Ooba et al. | Oct 2006 | A1 |
20070038865 | Oggioni et al. | Feb 2007 | A1 |
20070064396 | Oman et al. | Mar 2007 | A1 |
20070064399 | Mandel et al. | Mar 2007 | A1 |
20070108619 | Hsu | May 2007 | A1 |
20070125867 | Oberle | Jun 2007 | A1 |
20070211436 | Robinson et al. | Sep 2007 | A1 |
20070230127 | Peugh et al. | Oct 2007 | A1 |
20070268671 | Brandenburg et al. | Nov 2007 | A1 |
20080050512 | Lower et al. | Feb 2008 | A1 |
20080086876 | Douglas | Apr 2008 | A1 |
20080144290 | Brandt et al. | Jun 2008 | A1 |
20080159539 | Huang et al. | Jul 2008 | A1 |
20080160274 | Dang et al. | Jul 2008 | A1 |
20080191174 | Ehrensvard et al. | Aug 2008 | A1 |
20080251906 | Eaton | Oct 2008 | A1 |
20080278353 | Smith et al. | Nov 2008 | A1 |
20090040735 | Chan et al. | Feb 2009 | A1 |
20090073659 | Peng et al. | Mar 2009 | A1 |
20090166065 | Clayton et al. | Jul 2009 | A1 |
20090212945 | Steen | Aug 2009 | A1 |
20100088528 | Sion | Apr 2010 | A1 |
20100110647 | Hiew et al. | May 2010 | A1 |
20100177487 | Arshad et al. | Jul 2010 | A1 |
20100319986 | Bleau et al. | Dec 2010 | A1 |
20110001237 | Brun et al. | Jan 2011 | A1 |
20110038123 | Janik et al. | Feb 2011 | A1 |
20110103027 | Aoki et al. | May 2011 | A1 |
20110241446 | Tucholski | Oct 2011 | A1 |
20110299244 | Dede et al. | Dec 2011 | A1 |
20120050998 | Klum et al. | Mar 2012 | A1 |
20120117666 | Oggioni et al. | May 2012 | A1 |
20120140421 | Kirstine et al. | Jun 2012 | A1 |
20120149150 | Toh et al. | Jun 2012 | A1 |
20120170217 | Nishikimi et al. | Jul 2012 | A1 |
20120185636 | Leon et al. | Jul 2012 | A1 |
20120244742 | Wertz et al. | Sep 2012 | A1 |
20120256305 | Kaufmann et al. | Oct 2012 | A1 |
20120320529 | Loong et al. | Dec 2012 | A1 |
20130021758 | Bernstein et al. | Jan 2013 | A1 |
20130033818 | Hosoda et al. | Feb 2013 | A1 |
20130104252 | Yanamadala et al. | Apr 2013 | A1 |
20130141137 | Krutzik et al. | Jun 2013 | A1 |
20130154834 | Busca et al. | Jun 2013 | A1 |
20130158936 | Rich et al. | Jun 2013 | A1 |
20130208422 | Hughes et al. | Aug 2013 | A1 |
20130235527 | Wagner et al. | Sep 2013 | A1 |
20130283386 | Lee | Oct 2013 | A1 |
20140022733 | Lim et al. | Jan 2014 | A1 |
20140027159 | Salle et al. | Jan 2014 | A1 |
20140028335 | Salle et al. | Jan 2014 | A1 |
20140033331 | Salle et al. | Jan 2014 | A1 |
20140160679 | Kelty et al. | Jun 2014 | A1 |
20140184263 | Ehrenpfordt et al. | Jul 2014 | A1 |
20140204533 | Abeyasekera et al. | Jul 2014 | A1 |
20140233165 | Farkas et al. | Aug 2014 | A1 |
20140306014 | Salle et al. | Oct 2014 | A1 |
20140321064 | Bose et al. | Oct 2014 | A1 |
20140325688 | Cashin et al. | Oct 2014 | A1 |
20150007427 | Dangler et al. | Jan 2015 | A1 |
20150235053 | Lee et al. | Aug 2015 | A1 |
20150244374 | Hadley | Aug 2015 | A1 |
20160005262 | Hirato et al. | Jan 2016 | A1 |
20170006712 | Matsushima | Jan 2017 | A1 |
20170019987 | Dragone et al. | Jan 2017 | A1 |
Number | Date | Country |
---|---|---|
201430639 | Mar 2010 | CN |
104346587 | Feb 2015 | CN |
19816571 | Oct 1999 | DE |
19816572 | Oct 1999 | DE |
102012203955 | Mar 2013 | DE |
102012203955 | Sep 2013 | DE |
000566360 | Oct 1993 | EP |
0629497 | Dec 1994 | EP |
1184773 | Mar 2002 | EP |
1207444 | May 2002 | EP |
1 734 578 | Dec 2006 | EP |
1968362 | Sep 2008 | EP |
2104407 | Sep 2009 | EP |
1 672 464 | Apr 2012 | EP |
2560467 | Feb 2013 | EP |
61-297035 | Dec 1986 | JP |
2000-238141 | Sep 2000 | JP |
2013-125807 | Jun 2013 | JP |
2013125807 | Jun 2013 | JP |
2013-140112 | Jul 2013 | JP |
WO9903675 | Jan 1999 | WO |
WO1999021142 | Apr 1999 | WO |
WO2001063994 | Aug 2001 | WO |
WO 2003012606 | Feb 2003 | WO |
WO03025080 | Mar 2003 | WO |
WO2004040505 | May 2004 | WO |
WO 2009042335 | Apr 2009 | WO |
WO2009092472 | Jul 2009 | WO |
WO2010128939 | Nov 2010 | WO |
WO2013004292 | Jan 2013 | WO |
WO 2013189483 | Dec 2013 | WO |
WO2014086987 | Jun 2014 | WO |
WO2014158159 | Oct 2014 | WO |
Entry |
---|
Anonymous, “Consolidated Non-Volatile Memory in a Chip Stack”, IBM Technical Disclosure: IP.com No. IPCOM000185250, Jul. 16, 2009 (6 pages). |
Anonymous, “Selective Memory Encryption”, IBM Technical Disclosure: IP.com No. IPCOM000244183, Nov. 20, 2015 (6 pages). |
Busby et al., “Multi-Layer Stack with Embedded Tamper-Detect Protection”, U.S. Appl. No. 15/053,336, filed Feb. 25, 2016 (68 pages). |
Brodsky et al., “List of IBM Patents and/or Patent Applications Treated as Related”, U.S. Appl. No. 14/941,908, filed Nov. 16, 2015, dated Mar. 7, 2016 (2 pages). |
Pamula et al., “Cooling of Integrated Circuits Using Droplet-Based Microfluidics”, Association for Computing Machinery (ACM), GLSVLSI'03, Apr. 28-29, 2003 (pp. 84-87). |
Sample et al., “Design of an RFID-Based Battery-Free Programmable Sensing Platform”, IEEE Transactions on Instrumentation and Measurement, vol. 57, No. 11, Nov. 2008 (pp. 2608-2615). |
Cabral, Jr. et al., “Controlling Fragmentation of Chemically Strengthened Glass”, U.S. Appl. No. 14/700,877, filed Apr. 30, 2015 (48 pages). |
Isaacs et al., Office Action for U.S. Appl. No. 14/637,501, filed Mar. 4, 2015, dated May 4, 2016 (20 pages). |
Fisher et al., Office Action for U.S. Appl. No. 14/963,681, filed Dec. 9, 2015, dated May 6, 2016 (10 pages). |
Campbell et al., “Tamper-Proof Electronic Packages With Two-Phase Dielectric Fluid”, U.S. Appl. No. 15/139,503, filed Apr. 27, 2016 (60 pages). |
Busby et al., “Tamper-Proof Electronic Packages Formed With Stressed Glass”, U.S. Appl. No. 15/154,077, filed May 13, 2016 (45 pages). |
Busby et al., “Tamper-Proof Electronic Packages With Stressed Glass Component Substrate(s)”, U.S. Appl. No. 15/154,088, filed May 13, 2016 (56 pages). |
Brodsky et al., “List of IBM Patents or Patent Applications Treated As Related” for U.S. Appl. No. 14/941,908, filed Nov. 16, 2015, dated May 19, 2016 (3 pages). |
Holm, Ragnar, “Electric Contacts: Theory and Application”, Spinger-Verlag, New York, 4th Edition, 1981 (pp. 10-19). |
Clark, Andrew J., “Physical Protection of Cryptographic Devices”, Advanced in Cyprtology, Eurocrypt '87, Springer, Berlin Heidelberg (1987) (11 pages). |
Halperin et al., “Latent Open Testing of Electronic Packaging”, MCMC-194, IEEE (1994) (pp. 83-33). |
Jhang et al., “Nonlinear Ultrasonic Techniques for Non-Destructive Assessment of Micro Damage in Material: A Review”, International Journal of Prec. Eng. & Manuf., vol. 10, No. 1, Jan. 2009 (pp. 123-135). |
Isaacs et al., “Tamper Proof, Tamper Evident Encryption Technology”, Pan Pacific Symposium SMTA Proceedings (2013) (9 pages). |
Zhou et al., “Nonlinear Analysis for Hardware Trojan Detection”, ICSPCC2015, IEEE (2015) (4 pages). |
Harting Mitronics, “Saftey Caps for Payment Terminals”, http://harting-mitronics.ch/fileadmin/hartingmitronics/case_studies/Saftey_caps_for_payment_terminals.pdf, downloaded Aug. 2016 (2 pages). |
Brodsky et al., “Circuit Layouts of Tamper-Respondent Sensors”, U.S. Appl. No. 15/187,002, filed Jun. 20, 2016 (110 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Enclosure-to-Board Protection”, U.S. Appl. No. 15/193,525, filed Jun. 27, 2016 (54 pages). |
Fisher et al., “Applying Pressure to Adhesive Using CTE Mismatch Between Components”, U.S. Appl. No. 15/193,556, filed Jun. 27, 2016 (71 pages). |
Busby et al., “Tamper-Respondent Assembly with Nonlinearity Monitoring”, U.S. Appl. No. 15/194,738, filed Jun. 28, 2016 (48 pages). |
Dangler et al., “Tamper-Respondent Sensors with Formed Flexible Layer(s)”, U.S. Appl. No. 15/249,663, filed Aug. 29, 2016 (109 pages). |
Brodsky et al., “Overlapping, Discrete Tamper-Respondent Sensors”, U.S. Appl. No. 15/249,671, filed Aug. 29, 2016 (109 pages). |
Dangler et al., “Tamper-Respondent Assemblies with Region(s) of Increased Susceptibility to Damage”, U.S. Appl. No. 15/249,676, filed Aug. 29, 2016 (110 pages). |
Brodsky et al., Notice of Allowance for U.S. Appl. No. 14/974,036, filed Dec. 18, 2015, dated Jun. 3, 2016 (18 pages). |
Fisher et al., Office Action for U.S. Appl. No. 14/865,686, filed Sep. 25, 2015, dated Jun. 29, 2016 (17 pages). |
Fisher et al., Notice of Allowance for U.S. Appl. No. 14/963,681, filed Dec. 9, 2015, dated Jul. 5, 2016 (7 pages). |
Brodsky et al., Office Action for U.S. Appl. No. 14/865,651, filed Sep. 25, 2015, dated Jul. 13, 2016 (10 pages). |
Brodsky et al., “Replacement List of IBM Patents and Patent Applications Treated as Related”, U.S. Appl. No. 14/941,908, filed Nov. 16, 2015, dated Aug. 30, 2016 (2 pages). |
Brodsky et al., International Search Report and Written Opinion for PCT/IB2016/055444, filed Sep. 13, 2016, dated Dec. 22, 2016, (11 pages). |
Simek, Bob, “Tamper Restrictive Thermal Ventilation System for Enclosures Requiring Ventilation and Physical Security”, IBM Publication No. IPCOM000008607D, Mar. 1, 1998 (2 pages). |
Saran et al., “Fabrication and Characterization of Thin Films of Single-Walled Carbon Nanotube Bundles on Flexible Plastic Substrates”, Journal of the American Chemical Society, vol. 126, No. 14 (Mar. 23, 2004) (pp. 4462-4463). |
Khanna P.K. et al., “Studies on Three-Dimensional Moulding, Bonding and Assembling of Low-Temperature-Cofired Ceramics MEMS and MST Applications.” Materials Chemistry and Physics, vol. 89, No. 1 (2005) (pp. 72-79). |
Loher et al., “Highly Integrated Flexible Electronic Circuits and Modules”, 3rd International IEEE on Microsystems, Packaging, Assembly & Circuits Technology Conference (Oct. 22-24, 2008) (Abstract Only) (1 page). |
Drimer et al., “Thinking Inside the Box: System-Level Failures of Tamper Proofing”, 2008 IEEE Symposium on Security and Privacy, (Feb. 2008) (pp. 281-295). |
Fisher et al., “Embedded Venting System”, U.S. Appl. No. 14/797,232, filed Jul. 13, 2015 (35 pages). |
Isaacs et al., “Electronic Package with Heat Transfer Element(s)”, U.S. Appl. No. 14/637,501, filed Mar. 4, 2015 (30 pages). |
Isaacs et al., “Electronic Package with Heat Transfer Element(s)”, U.S. Appl. No. 14/846,897, filed Sep. 7, 2015 (27 pages). |
Dangler et al., “Tamper-Respondent Sensors with Formed Flexible Layer(s)”, U.S. Appl. No. 14/865,551, filed Sep. 25, 2015 (113 pages). |
Brodsky et al., “Overlapping, Discrete Tamper-Respondent Sensors”, U.S. Appl. No. 14/865,572, filed Sep. 25, 2015 (114 pages). |
Danger et al., “Tamper-Respondent Assemblies with Region(s) of Increased Susceptibility to Damage”, U.S. Appl. No. 14/865,591, filed Sep. 25, 2015 (114 pages). |
Brodsky et al., “Circuit Boards and Electronic Packages with Embedded Tamper-Respondent Sensor”, U.S. Appl. No. 14/865,610, filed Sep. 25, 2015 (43 pages). |
Brodsky et al, “Tamper-Respondent Assemblies”, U.S. Appl. No. 14/865,632, filed Sep. 25, 2015 (115 pages). |
Brodksky et al., “Enclosure with Inner Tamper-Respondent Sensor(s)”, U.S. Appl. No. 14/865,651, filed Sep. 25, 2015 (115 pages). |
Fisher et al., “Enclosure with Inner Tamper-Respondent Sensor(s) and Physical Security Element(s)”, U.S. Appl. No. 14/865,686, filed Sep. 25, 2015 (114 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Bond Protection”, U.S. Appl. No. 14/865,708, filed Sep. 25, 2015 (113 pages). |
Brodsky et al., “Circuit Layouts of Tamper-Respondent Sensors”, U.S. Appl. No. 14/886,179, filed Oct. 19, 2015 (113 pages). |
Isaacs, Phillip Duane, “Tamper-Respondent Assembly with Protective Wrap(s) Over Tamper-Respondent Sensor(s)”, U.S. Appl. No. 14/918,691, filed Oct. 21, 2015 (40 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Bond Protection”, U.S. Appl. No. 14/941,860, filed Nov. 16, 2015 (108 pages). |
Fisher et al., “Enclosure with Inner Tamper-Respondent Sensor(s) and Physical Security Element(s)”, U.S. Appl. No. 14/941,872, filed Nov. 16, 2015 (109 pages). |
Brodsky et al, “Tamper-Respondent Assemblies”, U.S. Appl. No. 14/941,887, filed Nov. 16, 2015 (109 pages). |
Fisher et al., “Tamper-Respondent Assembly with Vent Structure”, U.S. Appl. No. 14/955,283, filed Dec. 1, 2015 (61 pages). |
Fisher et al., “Applying Pressure to Adhesive Using CTE Mismatch Between Components”, U.S. Appl. No. 14/963,681, filed Dec. 9, 2015 (68 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Enclosure-to-Board Protection”, U.S. Appl. No. 14/974,036, filed Dec. 18, 2015 (55 pages). |
Brodsky et al., “List of IBM Patents and/or Patent Applications Treated as Related”, U.S. Appl. No. 14/941,908, filed Nov. 16, 2015, dated Jan. 18, 2016 (2 pages). |
NIST, “Security Requirements for Cryptographic Modules”, FIPS Pub. 140-2, Issued May 25, 2001 (69 pages). |
Gold Phoenix Printed Circuit Board, “Why multilayer pcb is used so widely?”, May 7, 2012, accessed online @ [http://www.goldphoenixpcb.com/html/Support_Resource/others/arc_110.html] on Feb. 15, 2017 (1 page). |
Brodsky et al., “Tamper-Respondent Assembly with Flexible Tamper-Detect Sensor(s) Overlying In-Situ-Formed Tamper-Detect Sensor”, U.S. Appl. No. 15/430,842, filed Feb. 13, 2017, (61 pages). |
Brodsky et al., Office Action for U.S. Appl. No. 14/865,632, filed Sep. 25, 2015, dated Feb. 17, 2017, (20 pages). |
Brodsky et al., Notice of Allowance for U.S. Appl. No. 15/409,851, filed Jan. 19, 2017, dated Mar. 20, 2017 (16 pages). |
Brodsky et al., Office Action for U.S. Appl. No. 14/941,860, filed Nov. 16, 2015 (U.S. Patent Publication No. 2017/0094820 A1), dated Apr. 12, 2017 (7 pages). |
Brodsky et al., Office Action for U.S. Appl. No. 14/865,708, filed Sep. 25, 2015 (U.S. Patent Publication No. 2017/0094778 A1), dated Apr. 26, 2017 (11 pages). |
Dangler et al., Office Action for U.S. Appl. No. 14/865,591, filed Sep. 25, 2015 (U.S. Patent Publication No. 2017/0094783 A1), dated May 2, 2017 (16 pages). |
Busby et al., “Tamper-Respondent Assemblies with Trace Regions of Increased Susceptibility to Breaking”, U.S. Appl. No. 15/341,108, filed Nov. 2, 2016 (56 pages). |
Brodsky et al., “Enclosure with Inner Tamper-Respondent Sensor(s)”, U.S. Appl. No. 15/409,851, filed Jan. 19, 2017 (115 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Enclosure-to-Board Protection”, U.S. Appl. No. 15/423,833, filed Feb. 3, 2017 (54 pages). |
Brodsky et al., “Tamper-Respondent Assemblies”, U.S. Appl. No. 15/800,497, filed Nov. 1, 2017 (108 pages). |
Brodsky et al., “Overlapping, Discrete Tamper-Respondent Sensors”, U.S. Appl. No. 15/819,540, filed Nov. 21, 2017 (111 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Bond Protection”, U.S. Appl. No. 15/835,557, filed Dec. 8, 2017 (111 pages). |
Brodsky et al., “Tamper-Respondent Assemblies with Bond Protection”, U.S. Appl. No. 15/835,569, filed Dec. 8, 2017 (108 pages). |
Fisher et al., “Enclosure with Inner Tamper-Respondent Sensor(s) and Physical Security Element(s)”, U.S. Appl. No. 15/835,585, filed Dec. 8, 2017 (113 pages). |
William L. Brodsky et al., “Replacement List of IBM Patents and/or Patent Applications Treated as Related”, U.S. Appl. No. 14/941,908, filed Nov. 16, 2015, dated Dec. 12, 2017 (3 pages). |
Brodsky, et al., Non-Final Office Action for U.S. Appl. No. 14/865,572, filed Sep. 25, 2015, dated Jun. 16, 2017 (14 pages). |
Brodsky, et al., Non-Final Office Action for U.S. Appl. No. 14/941,887, filed Nov. 16, 2015, dated Jun. 28, 2017 (20 pages). |
Fisher et al., Non-Final Office Action for U.S. Appl. No. 14/941,872, filed Nov. 16, 2015, dated Jul. 12, 2017 (11 pages). |
Brodsky, et al., Final Office Action for U.S. Appl. No. 14/865,632, filed Sep. 25, 2015, dated Jul. 27, 2017 (12 pages). |
Brodsky, et al., Non-Final Office Action for U.S. Appl. No. 14/865,610, filed Sep. 25, 2015, dated Aug. 2, 2017 (11 pages). |
Brodsky et al., Statement of Relevance for Information Disclosure Statement, for U.S. Appl. No. 14/941,908, filed Nov. 16, 2015 (U.S. Patent Publication No. 2017/0094808 A1), dated Oct. 31, 2017 (2 pages). |
Dangler et al., International Search Report and Written Opinon for PCT/IB2016/055447, filed Sep. 13, 2016, dated Nov. 25, 2016, (10 pages). |
Number | Date | Country | |
---|---|---|---|
20170094808 A1 | Mar 2017 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 14865610 | Sep 2015 | US |
Child | 14941908 | US |