Semiconductor devices integrated circuits are getting smaller, semiconductor packages are getting smaller, and systems are getting smaller. Along with this, the density of component mounting on System PCB is increasing, and space-saving designs are needed.
In one arrangement, a semiconductor package comprises an integrated circuit (IC) die covered by a mold compound to form a four-sided package with a top surface and a bottom surface. A first group of no-lead contacts are exposed on a first side and on the bottom surface of the package. A second group of no-lead contacts are exposed on a second side and on the bottom surface of the package, wherein the second side is opposite the first side. A first external lead extends from a third side of the package. A second external lead extends from a fourth side of the package opposite the third side. The first and second external leads bent to extend above the top surface of the package.
The first and second external leads can be shaped as gull-wing leads each having a top end that bends away from the package. Alternatively, the first and second external leads can be J-shape leads each having a top end that bends over the top surface of the package. An opening can be formed in one or more of the first and second external leads.
The first external lead and one or more of the first group of no-lead contacts are part of a continuous leadframe segment that is attached to the IC die.
The second external lead comprises a half etched end portion within the mold compound. The end portion has half etched tabs that extend laterally from the second external lead. The tabs are not exposed on the bottom surface of the package. The second external lead is not directly electrically coupled to the IC die.
Each of the no-lead contacts comprise half etched portions that are not exposed through the mold compound on the bottom surface of the package.
In another arrangement, a semiconductor package comprises a semiconductor die electrically coupled to one or more leadframe segments, and an encapsulant covers the semiconductor die and at least a portion of the leadframe segments. The leadframe segments form a first set of no-lead contacts along a first bottom edge of the package. The leadframe segments also form a first external lead on a second bottom edge of the package. A second external lead is formed on a third bottom edge of the package opposite the second edge. The first and second external leads extend above a top surface of the encapsulant. A second set of no-lead contacts are positioned along a fourth bottom edge of the package opposite the first edge.
The first and second external leads are shaped as gull-wing leads or as J-shape leads. The gull-wing leads each have a top end that bends away from the package. The J-shape leads each have a top end that bends over the top surface of the encapsulant. An opening is formed in one or more of the first and second external leads. The first external lead is electrically coupled to one or more of the first set of no-lead contacts. The first external lead and one or more of the first set of no-lead contacts are part of a continuous leadframe segment.
The second external lead is not directly electrically coupled to semiconductor die. The second external lead comprises a half etched end portion within the encapsulant. The end portion has two half etched tabs extending laterally from the second external lead. The tabs are not exposed on a bottom surface of the package.
The first set of no-lead contacts comprise half etched portions that are not exposed through the encapsulant on a bottom surface of the package.
An electrical device, such as an inductor, capacitor, or other passive component, is attached to the top ends of the first and second external leads above the top surface of the encapsulant.
Having thus described the invention in general terms, reference will now be made to the accompanying drawings, wherein:
The present disclosure is described with reference to the attached figures. The figures are not drawn to scale, and they are provided merely to illustrate the disclosure. Several aspects of the disclosure are described below with reference to example applications for illustration. It should be understood that numerous specific details, relationships, and methods are set forth to provide an understanding of the disclosure. The present disclosure is not limited by the illustrated ordering of acts or events, as some acts may occur in different orders and/or concurrently with other acts or events. Furthermore, not all illustrated acts or events are required to implement a methodology in accordance with the present disclosure.
Corresponding numerals and symbols in the different figures generally refer to corresponding parts, unless otherwise indicated. The figures are not necessarily drawn to scale. In the drawings, like reference numerals refer to like elements throughout, and the various features are not necessarily drawn to scale. In the following discussion and in the claims, the terms “including,” “includes,” “having,” “has,” “with,” or variants thereof are intended to be inclusive in a manner similar to the term “comprising,” and thus should be interpreted to mean “including, but not limited to . . . ” Also, the terms “coupled,” “couple,” and/or or “couples” is/are intended to include indirect or direct electrical or mechanical connection or combinations thereof. For example, if a first device couples to or is electrically coupled with a second device that connection may be through a direct electrical connection, or through an indirect electrical connection via one or more intervening devices and/or connections. Elements that are electrically connected with intervening wires or other conductors are considered to be coupled. Terms such as “top,” “bottom,” “front,” “back,” “over,” “above,” “under,” “below,” and such, may be used in this disclosure. These terms should not be construed as limiting the position or orientation of a structure or element but should be used to provide spatial relationship between structures or elements.
The term “semiconductor die” is used herein. A semiconductor die refers to a thin slice of material, such as crystalline silicon, that is used to fabricate integrated circuits. A large number of integrated circuits may be created on an active surface of the semiconductor die. Discrete semiconductor devices can be integrated circuits with hundreds or thousands of transistors coupled to form a functional circuit, for example a microprocessor or memory device. The semiconductor device may also be referred to herein as a semiconductor wafer or an integrated circuit (IC) die.
The term “semiconductor package” is used herein. A semiconductor package has at least one semiconductor die electrically coupled to terminals and has a package body that protects and covers the semiconductor die. In some arrangements, multiple semiconductor dies can be packaged together. For example, a power metal oxide semiconductor (MOS) field effect transistor (FET) semiconductor device and a second semiconductor device (such as a gate driver die, or a controller die) can be packaged together to form a single packaged electronic device. Additional components such as passive components, such as capacitors, resistors, and inductors or coils, can be included in the packaged electronic device. The semiconductor die is mounted with a package substrate that provides conductive leads. A portion of the conductive leads form the terminals for the packaged device. In wire bonded integrated circuit packages, bond wires couple conductive leads of a package substrate to bond pads on the semiconductor die. The semiconductor die can be mounted to the package substrate with a device side surface facing away from the substrate and a backside surface facing and mounted to a die pad of the package substrate. The semiconductor package can have a package body formed by a thermoset epoxy resin mold compound in a molding process, or by the use of epoxy, plastics, or resins that are liquid at room temperature and are subsequently cured. The package body may provide a hermetic package for the packaged device. The package body may be formed in a mold using an encapsulation process, however, a portion of the leads of the package substrate are not covered during encapsulation, these exposed lead portions form the terminals for the semiconductor package. The semiconductor package may also be referred to as a “integrated circuit package,” a “microelectronic device package,” or a “semiconductor device package.”
The term “external lead” is used herein. In packaged integrated circuits, external leads provide an electrical connection from contacts or pads on the exterior of a semiconductor package to an internal leadframe that is coupled to a semiconductor die within the package. The external lead is a portion of the leadframe that is exposed outside of a mold compound or other protective encapsulant for the semiconductor package. The leadframe and the external leads may be etched, stamped, or cut to have a desired cross-section shape.
The terms “gull wing” and “J-lead” are used herein to describe the shape of external leads. As used herein, “gull-wing shape” refers to a pair of external leads wherein each lead has an end that is attached to a semiconductor package and a free end. The free ends of each pair of gull-wing leads bend away from each other and from the semiconductor package. As used herein, “J-shape” refers to a pair of external leads wherein each lead has an end that is attached to the semiconductor package and a free end. The free ends of each pair of J-shaped leads bend toward each other. The free ends of each pair of J-shaped leads extend toward or over the semiconductor package.
Semiconductor package 101 is a quad-side pin-layout package with reverse gull-wing leads 104 on two sides. The gullwing leads 104 utilize capabilities of existing package designs, such as a small-outline IC (SOIC), a small-outline package (SOP), or a small-outline transistor (SOT). However, the reverse gull-wing leads extend in an opposite direction compared to a typical package design (i.e., gull-wing leads 104 extend upward instead of downward from bottom surface 105).
Compared to the gull-wing leads 206 that bend outward in
A bottom face of each no-lead contact 404a-h and each gull-wing lead 405a,b is exposed on the bottom surface 406 of semiconductor package 401. This allows for electrical connections to external circuits such as when semiconductor package 401 is mounted on a PCB surface.
Bond pads on IC die 403 are electrically connected to die mount contacts 407a-f on leadframe segment 400. One or more copper posts 408 are used to connect the die mount contacts 407a-f to IC die 403. Die mount contacts 407a-e are each individually tied electronically to a no-lead contact 404a-e on the side of semiconductor package 401. No-lead contact 404a is part of a leadframe trace that ends in die mount contact 407a. No-lead contact 404b is part of a leadframe trace that ends in die mount contact 407b. No-lead contact 404c is part of a leadframe trace that ends in die mount contact 407c. No-lead contact 404d is part of a leadframe trace that ends in die mount contact 407d. No-lead contact 404h is part of a leadframe trace that ends in die mount contact 407e.
The no-lead contacts 404e-g and gull-wing lead 405a are connected as part of a common leadframe trace with die mount contact 407f. The top portions 409a,b of gull-wing leads 405a,b flare outward away from semiconductor package 401 and are adapted for attachment of an external component, such as an inductor, capacitor, or other passive device. In an alternative arrangement, the gull-wing leads 405a,b may be replaced with J-leads that have a top portion bending inward and over the top of semiconductor package 401. In the illustrated arrangement, gull-wing lead 405b does not include a leadframe trace having a die mount contact that would provide a direct connection to IC die 402. Instead, gull-wing lead 405b would provide a connection from the PCB to one end of an external component attached at 409b.
No-lead contacts 404f-h and gull-wing lead contact 405a are coupled together by a common leadframe segment. Gull-wing lead contact 405a is connected to one end of an external (Ext) component, such as an inductor. Gull-wing contact 405b is connected to the other end of the external component and provides an output voltage (Vout) for the device.
As illustrated in
A portion of leadframe segment 506b, which forms an end lead after singulation of individual devices, may also be half-etched. Leadframe segment 506b has a two tabs 602 extending laterally from end 603. In one arrangement, at least a portion of end 603 and the tabs 602 are half-etched. This allows the mold compound 503 to flow under a portion of segment 506b. The end 603 is then locked into position by mold compound 503 so that segment 506b can be bent into a gull-wing or J-lead shape after singulation of an individual device.
Referring again to
An example embodiment of a semiconductor package comprises IC die covered by a mold compound to form a four-sided package with a top surface and a bottom surface. A first group of no-lead contacts are exposed on a first side and on the bottom surface of the package. A second group of no-lead contacts are exposed on a second side and on the bottom surface of the package. The second side is opposite the first side. A first external lead extends from a third side of the package. A second external lead extends from a fourth side of the package opposite the third side. The first and second external leads are bent to extend above the top surface of the package. The first and second external leads may be shaped as gull-wing leads each having a top end that bends away from the package. The first and second external leads may be J-shape leads each having a top end that bends over the top surface of the package. The semiconductor package may further comprise an opening formed in one or more of the first and second external leads.
The first external lead and one or more of the first group of no-lead contacts may be part of a continuous leadframe segment that is attached to the IC die.
The second external lead comprises a half etched end portion within the mold compound. The end portion has half etched tabs that extend laterally from the second external lead and that are not exposed on the bottom surface of the package. The second external lead may not be directly electrically coupled to the IC die in some embodiments.
Each of the no-lead contacts may comprise half etched portions that are not exposed through the mold compound on the bottom surface of the package.
In another arrangement, a semiconductor package comprises a semiconductor die electrically coupled to one or more leadframe segments. An encapsulant covers the semiconductor die and at least a portion of the leadframe segments. The leadframe segments form a first set of no-lead contacts along a first bottom edge of the package. The leadframe segments form a first external lead on a second bottom edge of the package. A second external lead in located on a third bottom edge of the package that is opposite the second edge. The first and second external leads extend above a top surface of the encapsulant. The first and second external leads are shaped as gull-wing leads, wherein the gull-wing leads each have a top end that bends away from the package. Alternatively, the first and second external leads are J-shape leads, wherein the J-shape leads each have a top end that bends over the top surface of the encapsulant. A second set of no-lead contacts are located along a fourth bottom edge of the package opposite the first edge. The semiconductor package may further comprise an electrical device attached to top ends of the first and second external leads above the top surface of the encapsulant.
An opening may be formed in one or more of the first and second external leads. In some configurations, the first external lead is electrically coupled to one or more of the first set of no-lead contacts.
The first external lead and one or more of the first set of no-lead contacts may be part of a continuous leadframe segment.
The second external lead may not be directly electrically coupled to semiconductor die in some configurations.
The second external lead comprises a half etched end portion within the encapsulant. The end portion has half-etched tabs extending laterally from the second external lead and not exposed on a bottom surface of the package.
Each of the first set of no-lead contacts may comprise half etched portions that are not exposed through the encapsulant on a bottom surface of the package.
While various examples of the present disclosure have been described above, it should be understood that they have been presented by way of example only and not limitation. Numerous changes to the disclosed examples can be made in accordance with the disclosure herein without departing from the spirit or scope of the disclosure. Modifications are possible in the described embodiments, and other embodiments are possible, within the scope of the claims. Thus, the breadth and scope of the present invention should not be limited by any of the examples described above. Rather, the scope of the disclosure should be defined in accordance with the following claims and their equivalents.