DIFFERENT SCALING RATIO IN FEOL / MOL/ BEOL

Abstract

The present disclosure, in some embodiments, relates to an integrated chip. The integrated chip has a plurality of gate structures disposed over a substrate. A plurality of metal structures continuously extend from lower surfaces contacting the plurality of gate structures to upper surfaces contacting one or more interconnects within an overlying conductive interconnect layer. The plurality of metal structures are arranged at a first pitch that is larger than a second pitch of the plurality of gate structures.

Description

BACKGROUND

Over the last four decades, the density of integrated circuits (ICs) has increased according to a relation known as Moore's law. Moore's Law states that the number of transistors within an integrated circuit (IC) doubles from one technology node to another technology node (i.e., every 18 months), and consequently the chip area used for a fixed number of transistors is cut in half. The smaller sizes provide for silicon cost savings and increased IC performance (e.g., increased processing speed, memory capacity, etc.). In large part, this remarkable increase in the performance of ICs has ushered in the dawn of today's information age. However, unlike laws of nature, which hold true regardless of mankind's activities, Moore's law only holds true so long as innovators overcome the technological challenges associated with it.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a flow diagram of some embodiments of a method of generating a scaled integrated chip design having different FEOL and BEOL scaling ratios.

FIGS. 2-4 illustrate some embodiments of cross-sectional views of an integrated chip corresponding to a disclosed method of generating a scaled integrated chip design.

FIG. 5 illustrates a flow diagram of some alternative embodiments of a method of generating a scaled integrated chip design.

FIGS. 6-7 illustrate some embodiments of cross-sectional views of an integrated chip corresponding to a disclosed method of generating a scaled integrated chip design.

FIG. 8 illustrates a block diagram of some embodiments of an EDA (Electronic design automation) tool configured to execute the disclosed method of generating a scaled integrated chip design.

DETAILED DESCRIPTION

The description herein is made with reference to the drawings, wherein like reference numerals are generally utilized to refer to like elements throughout, and wherein the various structures are not necessarily drawn to scale. In the following description, for purposes of explanation, numerous specific details are set forth in order to facilitate understanding. It may be evident, however, to one skilled in the art, that one or more aspects described herein may be practiced with a lesser degree of these specific details. In other instances, known structures and devices are shown in block diagram form to facilitate understanding.

In order to meet the demands of Moore's Law, the semiconductor industry has consistently generated integrated chip (IC) designs for a new processing node by scaling entire IC designs from a previous processing node by a scaling ratio of approximately 0.7. For example, a metal line having a width of 100 nm in an IC design for a 65 nm processing node would be scaled to have a width of 70 nm in an IC design for a 45 nm processing node.

As integrated chip minimum features sizes continue to decrease, it has been appreciated that scaling entire IC designs by a constant scaling ratio may be disadvantageous for a number of reasons. For example, for an integrated chip design having a lower back-end-of-the-line (BEOL) routing density and a higher front-end-of-the-line (FEOL) gate density, the BEOL pitch could be increased to improve RC performance of the integrated chip without increasing overall chip area. Furthermore, the difficulty in scaling FEOL and BEOL design layers are different, thereby resulting in increased processing difficulty to keep scaling factors the same.

Accordingly, the present disclosure relates to a method of generating a scaled integrated chip (IC) design by scaling a FEOL and a BEOL of an original IC design at different scaling ratios, and an associated apparatus. In some embodiments, the method is performed by forming an original integrated chip (IC) design that is a graphical representation of an integrated chip. The original IC design has a front-end-of-the-line (FEOL) section, a back-end-of-the-line (BEOL) section, and a middle-of-the-line (MOL) section that is disposed between the FEOL and BEOL sections. A scaled integrated chip design is formed by scaling (i.e., shrinking) the FEOL section and the BEOL section of the original integrated chip design at different scaling ratios, and by scaling different design layers within the MOL section at different scaling ratios to avoid misalignment errors between the FEOL section and the BEOL section.

FIG. 1 illustrates a flow diagram of some embodiments of a method 100 of generating a scaled integrated chip design having different FEOL and BEOL scaling ratios.

At 102, an original integrated chip (IC) design comprising a graphical representation of an integrated chip is formed. The original IC design comprises a front-end-of-the-line (FEOL) section comprising one or more semiconductor devices, a back-end-of-the-line (BEOL) section comprising metal interconnect layers, and a middle-of-the-line (MOL) section. The MOL section is disposed between the FEOL and BEOL sections and is configured to provide an electrical connection between the FEOL section and the BEOL section. The original IC design is associated with a first processing node (e.g., a 32 nm processing node).

At 104, a scaled integrated chip (IC) design is formed by scaling the FEOL section and the BEOL section of the original integrated chip design at different scaling ratios. For example, in some embodiments, the FEOL section may be scaled at a first scaling ratio (e.g., 0.7), while the BEOL section of the original integrated chip design may be scaled at a second scaling ratio greater than the first scaling ratio (e.g., 0.6). The scaled IC design is associated with a second processing node (e.g., a 22 nm processing node), which is smaller than the first processing node.

In some embodiments, different design layers of the MOL section may be scaled at different scaling ratios to avoid misalignment errors between the FEOL section and the BEOL section, at 106. For example, a first design layer of the MOL section may be scaled at the first scaling ratio, while a second design layer of the MOL section may be scaled at the second scaling ratio.

At 108, an integrated chip may be generated on a semiconductor substrate based upon the scaled IC design.

FIGS. 2-4 illustrate some embodiments of a cross-sectional view of an integrated chip corresponding to the disclosed method 100 of generating a scaled integrated chip design. Although FIGS. 2-4 are described in relation to method 100, it will be appreciated that the structures disclosed in FIGS. 2-4 are not limited to such a method, but instead may stand alone as an integrated chip.

FIG. 2 illustrates some embodiments of a cross-sectional view of an original integrated chip (IC) 200 corresponding to an original integrated chip (IC) design, which shows the different design layers of an original integrated chip.

The original IC 200 comprises a front-end-of-the-line (FEOL) section 202, a middle-of-the-line (MOL) section 204, and a back-end-of-the-line (BEOL) section 206. The FEOL section 202 comprises an active region design layer 209 and a gate design layer, such as a poly-silicon design layer 210, which is disposed within a dielectric material 211 located over a semiconductor substrate 208. The BEOL section 206 comprises a plurality of metal via design layers 216, 220 and metal wire design layers 218, 222 disposed within inter-level dielectric layers 215, 29. The MOL section 204 comprises a MD design layer 212 configured to connect the active region design layer 209 within the semiconductor substrate 208 to the first metal via design layer 216 (i.e., an active region contact) and a MP design layer 214 configured to connect the poly-silicon design layer 210 to the first metal via design layer 216 (i.e., a poly-silicon contact).

The design layers of the FEOL section 202, the MOL section 204, and the BEOL section 206 are set up to have design shapes that may be spaced according to pitches. For example, in the FEOL section 202 the poly-silicon design layer 210 comprises poly-silicon shapes that are spaced according to a poly-silicon pitch P_PO that is equal to a distance between a first edge of a first poly-silicon shape 210a (e.g., a first poly-silicon gate) and a first edge of an adjacent poly-silicon shape 210b (e.g., a second poly-silicon gate). The MOL section 204 comprises a MD pitch P_MD and a MP pitch P_MP. The MD pitch P_MD is equal to a distance between a first edge of a first MD shape 212a and a first edge of an adjacent MD shape 212b. The MP pitch P_MP is equal to a distance between a first edge of a first MP shape 214a and a first edge of an adjacent MP shape 214b. The BEOL section 206 comprises a metal routing pitch P_M. The metal routing pitch P_M is equal to a distance between a first edge of a first metal shape (e.g., metal via shape 216a) and a first edge of an adjacent metal shape (e.g., metal via shape 216b). In some embodiments, the first metal via designs shapes connected to the MP design layer 214 are located on a different metal routing pitch than the first metal via design shapes connected to the MD design layer 212.

FIG. 3 illustrates some embodiments of cross-sectional views 300, 302 showing the scaling of a design layer of the original IC 200.

Cross-sectional view 300 illustrates metal shapes corresponding to an original IC design, which are spaced according to a metal routing pitch P_M that is equal to a distance between a first edge of a first metal via shape 216a and a first edge of an adjacent metal via shape 216b. Cross-sectional view 302 illustrates scaled metal shapes corresponding to a scaled IC design, which are separated by a scaled metal routing pitch P_M′. The scaled metal routing pitch P_M′ has been shrunk by a scaling ratio S, so that the scaled metal routing pitch P_M′ is smaller than the original metal routing pitch P_M.

FIG. 4 illustrates some embodiments of a cross-sectional view corresponding to a scaled integrated chip (IC) 400 of a scaled IC design, which shows the different design layers of a scaled IC.

The scaled IC 400 comprises a FEOL section 202′ having a scaled poly-silicon design layer 210′ that has been scaled by a FEOL scaling ratio A with respect to the poly-silicon design layer 210 of the original IC design 200. The FEOL scaling ratio A is equal to the scaling ratio of the poly-silicon pitch between the original IC 200 and the scaled IC 400. In other words, FEOL scaling ratio A is equal to the scaled poly-silicon pitch P_PO′ divided by the original poly-silicon pitch P_PO.

The scaled IC 400 further comprises a BEOL section 206′ having scaled metal interconnect design layers 216′-222′ that have been scaled by a BEOL scaling ratio C with respect to the metal interconnect design layers 216-222 of the original IC 200. The BEOL scaling ratio C is equal to the scaling ratio of the metal layer pitch between the original IC 200 and the scaled IC 400. In other words, BEOL scaling ratio C is equal to the scaled metal layer pitch P_M′ divided by the original metal layer pitch P_M.

The scaled IC 400 further comprises a MOL section 204′ having a scaled MD design layer 212′ that has been scaled by a MD scaling ratio B₁ (i.e., a first MOL scaling ratio) with respect to the MD design layer 212 of the original IC 200 and a scaled MP design layer 214′ that has been scaled by a MP scaling ratio B₂ (i.e., a second MOL scaling ratio) with respect to the MP design layer 214 of the original IC 200. The MD scaling ratio B₁ is equal to the scaling ratio of the MD pitch between the original IC 200 and the scaled IC 400 (i.e., the MD scaling ratio B₁ is equal to the scaled MD pitch P_MD′ divided by the original MD pitch P_MD). The MP scaling ratio B₂ is equal to the scaling ratio of the MP pitch between the original IC 200 and the scaled IC 400 (i.e., the MP scaling ratio B₂ is equal to the scaled MP pitch P_MP′ divided by the original MP pitch P_MP).

In some embodiments, the BEOL section 206′ is scaled at a BEOL scaling ratio C that is greater than a FEOL scaling ratio A at which the FEOL section 202′ is scaled. For example, in some embodiments, the FEOL scaling ratio A is in a range of between approximately 70% and approximately 80%, while the BEOL scaling ratio C is less than 70%. In some embodiments, the MD scaling ratio B₁ is equal to the FEOL scaling ratio C. In some embodiments, the MP scaling ratio B₂ is greater than the FEOL scaling ratio C.

FIG. 5 illustrates a flow diagram of some alternative embodiments of a method 500 of generating a scaled integrated chip design having different FEOL and BEOL scaling ratios.

While disclosed methods (e.g., methods 100 and 500) are illustrated and described below as a series of acts or events, it will be appreciated that the illustrated ordering of such acts or events are not to be interpreted in a limiting sense. For example, some acts may occur in different orders and/or concurrently with other acts or events apart from those illustrated and/or described herein. In addition, not all illustrated acts may be required to implement one or more aspects or embodiments of the description herein. Further, one or more of the acts depicted herein may be carried out in one or more separate acts and/or phases.

At 502, an original integrated chip (IC) design comprising a graphical representation of an integrated chip is formed. The original IC design comprises a front-end-of-the-line (FEOL) section, a middle-of-the-line (MOL) section, and a back-end-of-the-line (BEOL) section. The original IC design is associated with a first processing node (e.g., a 32 nm processing node).

In some embodiments, the original IC design may be formed by a designer using a design software program. In some embodiments, the BEOL section may be formed by an automatic place and route tool configured to automatically place the shapes within the original IC design. In some embodiments, the original IC design may comprise a Graphic Database System (GDS) file, such as a GDS or GDSII file. In other embodiments, the original IC design may comprise a CIF file, an OASIS file, or some other similar file format, for example.

At 504, the FEOL section of the original integrated chip design is scaled according to a FEOL scaling ratio. In some embodiments, the FEOL section comprises a FEOL design layer comprising a poly-silicon gate design layer disposed over a semiconductor substrate. In some embodiments, the FEOL scaling ratio is in a range of between approximately 70% and approximately 80% of the original IC design.

At 506, a first design layer within the MOL section of the original IC design is scaled according to a first MOL scaling ratio. The first MOL scaling ratio achieves a scaled first design layer having a first pitch that matches a pitch of a FEOL design layer. In some embodiments, the first design layer comprises a MD design layer configured to connect an active region design layer (within a semiconductor substrate) to a first metal via design layer.

At 508, a second design layer within the MOL section of the original IC design is scaled according to a second MOL scaling ratio. The second MOL scaling ratio achieves a scaled second design layer having a second pitch that does not match a pitch of a FEOL design layer. In some embodiments, the second design layer comprises a MP design layer configured to connect a poly-silicon gate design layer to the first metal via design layer.

At 510, the BEOL section of the original integrated chip design is scaled according a BEOL scaling ratio that is different than the FEOL scaling ratio. In some embodiments, the BEOL section comprises a first metal via design layer, and a first metal wire layer disposed above the first metal via design layer.

At 512, an integrated chip may be generated on a semiconductor substrate based upon a scaled IC design comprising the scaled FEOL, BEOL, and MOL sections.

FIGS. 6-7 illustrate some embodiments of a cross-sectional view of an integrated chip showing a disclosed method of generating a scaled integrated chip design. Although FIGS. 6-7 are described in relation to method 500, it will be appreciated that the structures disclosed in FIGS. 6-7 are not limited to such a method.

FIG. 6 illustrates some embodiments of a cross-sectional view 600 of a scaled integrated chip corresponding to a scaled integrated chip design, which shows scaling of a MD design layer.

As shown in cross-sectional view 600, a poly-silicon gate design layer of an original IC design is scaled at a FEOL scaling ratio A to achieve a scaled poly-silicon gate design layer 210′ having a scaled pitch P_PO′. The MD design layer of an original IC design is scaled at a MD scaling ratio B₁ to achieve a scaled MD design layer 212′ having a pitch P_MD′ that matches the scaled pitch P_PO′ of the scaled poly-silicon design layer 210′. By scaling the MD design layer at a MD scaling ratio B₁ that causes the scaled MD design layer 212′ to have pitch P_MD′ that matches a pitch P_PO′ of the scaled poly-silicon design layer 210′, misalignment problems between the scaled MD design layer 212′ and the scaled poly-silicon design layer 210′ are avoided.

FIG. 7 illustrates some embodiments of a cross-sectional view 700 of an integrated chip corresponding to a scaled integrated chip design, which shows scaling of a MP design layer.

As shown in cross-sectional view 700, the MP design layer of an original IC design at a MP is scaled at a scaling ratio B₂ to achieve a scaled MP design layer 214′ having a pitch P_MP′ that matches a scaled first metal via design layer (not shown) and that is different than the scaled pitch P_PO′ of the scaled poly-silicon design layer 210′.

Using different scaling ratios, B₁ and B₂, to respectively scale the MP and MD design layers, as shown in cross-sectional views 600 and 700, prevents misalignment problems between FEOL and BEOL sections of an integrated chip using different scaling ratio. This is because the P_MP′ pitch achieved by scaling the scaled MP design layer 214′ by a scaling ratio B₂ has a value that allows for the scaled MP design layer 214′ to electrically connect to both the scaled poly-silicon design layer 210′ (scaled by a scaling ratio B₁) and a scaled first metal via design layer (scaled by a scaling ratio C), thereby preventing opens from occurring between the FEOL and BEOL. For example, in some embodiments, the P_MP′ pitch of the scaled MP design layer 214′ may be a little bit larger than a pitch P_PO′ of the scaled poly-silicon design layer 210′ and equal to a pitch of the scaled first metal via design layer, so that the scaled MP design layer 214′ contacts the underlying scaled poly-silicon design layer 210′ at different positions while maintaining electrical contact with the overlying first metal via design layer.

FIG. 8 illustrates a block diagram of some embodiments of an EDA (Electronic design automation) tool 800 configured to execute the disclosed method of generating a scaled integrated chip design.

The EDA tool 800 comprises a computation element 802 and a memory element 804. The computation element 802 comprises a scaling element 806. The memory element 804 is configured to store an original integrated chip (IC) design 808 (e.g., a GDS or GDSII file, a CIF file, or an OASIS file), a scaled integrated chip design 810, and computer readable instructions (CRI) 812 that may provide for a method of operating one or more components of the EDA tool according to a disclosed method (e.g., method 100 and/or 500). In various embodiments, the memory element 804 may comprise an internal memory or a computer readable medium.

The original integrated chip design 808 comprises a front-end-of-the-line (FEOL) section, a middle-of-the-line (MOL) section, and a back-end-of-the-line (BEOL) section. The FEOL section comprises a gate design layer, such as a poly-silicon design layer, which is disposed over a semiconductor substrate. The BEOL section comprises a first metal via design layer, and a first metal wire design layer disposed above the first metal via design layer. The MOL section comprises a MD design layer configured to connect the poly-silicon design layer to the first metal via design layer and a MP design layer configured to connect the semiconductor substrate to the first metal via design layer.

The scaling element 806 is configured to scale (i.e., shrink) the FEOL section and the BEOL section of the original integrated chip design 808 at different scaling ratios to form the scaled integrated chip design 810. In some embodiments, the scaling element is configured to scale the MD design layer of the original IC design at a MD scaling ratio to achieve a scaled MD design layer having a first pitch that matches a pitch of the poly-silicon design layer, and to scaling the MP design layer of the original IC design at a MP scaling ratio to achieve a scaled MP design layer.

In some embodiments, the EDA tool 800 may further comprises a design tool 814 configured to generate the original IC design 808. In some embodiments, the design tool 814 may comprise an automatic place and route tool configured to selectively route shapes on a plurality of design levels to generate the original IC design 808. In other embodiments, the design tool 814 may comprise a user interactive design environment that allows for designers to generate the original IC design 808. In such embodiments, the EDA tool 800 may comprise an input device 816 and/or an output device 818. The input device 816 is configured to allow a user to interact with the original IC design 808 and in various embodiments may comprise a keyboard, mouse, and/or any other input device. The output device 818 is configured to provide a graphical representation of the original IC design 808 that can be viewed by a user. In various embodiments, the output device 818 may comprise a monitor, for example.

It will be appreciated that while reference is made throughout this document to exemplary structures in discussing aspects of methodologies described herein, that those methodologies are not to be limited by the corresponding structures presented. Rather, the methodologies (and structures) are to be considered independent of one another and able to stand alone and be practiced without regard to any of the particular aspects depicted in the Figs. Additionally, layers described herein, can be formed in any suitable manner, such as with spin on, sputtering, growth and/or deposition techniques, etc.

Also, equivalent alterations and/or modifications may occur to those skilled in the art based upon a reading and/or understanding of the specification and annexed drawings. The disclosure herein includes all such modifications and alterations and is generally not intended to be limited thereby. For example, although the figures provided herein, are illustrated and described to have a particular doping type, it will be appreciated that alternative doping types may be utilized as will be appreciated by one of ordinary skill in the art.

In addition, while a particular feature or aspect may have been disclosed with respect to only one of several implementations, such feature or aspect may be combined with one or more other features and/or aspects of other implementations as may be desired. Furthermore, to the extent that the terms “includes”, “having”, “has”, “with”, and/or variants thereof are used herein, such terms are intended to be inclusive in meaning—like “comprising.” Also, “exemplary” is merely meant to mean an example, rather than the best. It is also to be appreciated that features, layers and/or elements depicted herein are illustrated with particular dimensions and/or orientations relative to one another for purposes of simplicity and ease of understanding, and that the actual dimensions and/or orientations may differ substantially from that illustrated herein.

The present disclosure relates to a method of generating a scaled integrated chip (IC) design by scaling a FEOL and a BEOL of an original IC design at different scaling ratios, and an associated apparatus.

In some embodiments, the present disclosure relates to an integrated chip. The integrated chip comprises a plurality of gate structures arranged over a substrate. A plurality of first MOL (middle-of-line) structures are arranged at a first pitch over the substrate at locations interleaved between the plurality of gate structures. The plurality of first MOL structures are configured to connect active regions within the substrate to an overlying metal interconnect layer. A plurality of second MOL structures are arranged over the plurality of gate structures at locations interleaved between the plurality of first MOL structures, and are configured to connect the plurality of gate structures to the metal interconnect layer. The plurality of second MOL structures are arranged at a second pitch that is different than the first pitch.

In other embodiments, the present disclosure relates to an integrated chip. The integrated chip comprises a plurality of gate structures arranged over a substrate. The integrated chip further comprises a plurality of first MOL (middle-of-line) structures vertically extending from the substrate to an overlying metal interconnect layer. The plurality of first MOL structures are arranged at a first pitch. The integrated chip further comprises a plurality of second MOL structures laterally interleaved between the plurality of first MOL structures and vertically extending from the plurality of gate structures to the metal interconnect layer. The plurality of second MOL structures are arranged at a second pitch that is different than the first pitch.

In yet other embodiments, the present disclosure relates to an integrated chip. The integrated chip comprises a plurality of gate structures arranged over a substrate. The integrated chip further comprises a plurality of first MOL (middle-of-line) structures arranged at a first pitch and vertically extending from the substrate to an overlying metal interconnect layer. The integrated chip further comprises a plurality of second MOL structures laterally interleaved between the plurality of first MOL structures and vertically extending from the plurality of gate structures to the metal interconnect layer. The plurality of second MOL structures are arranged at a second pitch that is larger than a pitch of the plurality of gate structures and equal to a pitch of structures of the metal interconnect layer over the plurality of second MOL structures.

Claims

1. An integrated chip, comprising: a plurality of gate structures disposed over a substrate;a plurality of metal structures continuously extending from lower surfaces contacting the plurality of gate structures to upper surfaces contacting one or more interconnects within an overlying conductive interconnect layer; andwherein the plurality of metal structures are arranged at a first pitch that is larger than a second pitch of the plurality of gate structures.

2. The integrated chip of claim 1, further comprising: a plurality of second metal structures continuously extending from lower surfaces contacting the substrate to upper surfaces contacting the conductive interconnect layer; anda dielectric material laterally separating the plurality of second metal structures from the plurality of metal structures.

3. The integrated chip of claim 2, wherein the plurality of second metal structures are arranged at a third pitch that is different than the first pitch.

4. The integrated chip of claim 2, wherein the plurality of metal structures comprise a first metal structure;wherein the plurality of second metal structures comprise a second metal structure and a third metal structure; andwherein the dielectric material continuously extends for a first lateral distance between the first metal structure and the second metal structure and the dielectric material continuously extends for a second lateral distance between the first metal structure and the third metal structure, the first lateral distance different than the second lateral distance.

5. The integrated chip of claim 1, wherein the one or more interconnects comprise an interconnect via that vertically contacts a lower surface of an overlying interconnect wire, the interconnect wire laterally extending past one or more sidewalls of the interconnect via.

6. The integrated chip of claim 1, wherein the plurality of metal structures comprise a first metal structure arranged directly over a first sidewall of a first one of the plurality of gate structures and a second metal structure arranged directly over a second sidewall of a second one of the plurality of gate structures; andwherein the first sidewall and the second sidewall face opposite directions.

7. An integrated chip, comprising: a plurality of gate structures disposed over a substrate;a plurality of middle-of-the-line (MOL) structures disposed on the plurality of gate structures, wherein the plurality of MOL structures comprise a first MOL structure that is off-centered towards a first sidewall of a first one of the plurality of gate structures and a second MOL structure that is off-centered towards a second sidewall of a second one of the plurality of gate structures; andwherein the first sidewall and the second sidewall face opposite directions.

8. The integrated chip of claim 7, wherein neighboring ones of the plurality of gate structures are separated by a first lateral distance; andwherein neighboring ones of the plurality of MOL structures are separated by a second lateral distance that is greater than the first lateral distance.

9. The integrated chip of claim 7, wherein a first line extending along the first sidewall also extends through the first MOL structure; andwherein a second line extending along the second sidewall also extends through the second MOL structure.

10. The integrated chip of claim 7, wherein the first MOL structure laterally straddles the first sidewall and the second MOL structure laterally straddles the second sidewall.

11. The integrated chip of claim 7, wherein the first MOL structure has a first lower surface that is directly over the first sidewall and the second MOL structure has a second lower surface that is directly over the second sidewall.

12. The integrated chip of claim 7, wherein the first MOL structure is left of the second MOL structure as viewed in a cross-sectional view.

13. The integrated chip of claim 7, further comprising: a plurality of additional MOL structures vertically extending from the substrate to an overlying conductive interconnect layer, wherein the plurality of additional MOL structures comprise a first additional MOL structure separated from the first one of the plurality of gate structures by a first distance and a second additional MOL structure separated from a second one of the plurality of gate structures by a second distance that is substantially equal to the first distance.

14. The integrated chip of claim 13, further comprising: a dielectric material laterally separating the plurality of MOL structures from the plurality of additional MOL structures, wherein the plurality of MOL structures and the plurality of additional MOL structures extend to an upper surface of the dielectric material.

15. An integrated chip, comprising: a plurality of gate structures disposed over a substrate; anda plurality of middle-of-the-line (MOL) structures disposed vertically onto the plurality of gate structures, wherein the plurality of MOL structures are disposed in a pattern that causes respective ones of the plurality of MOL structures to be laterally offset from a center of an underlying one of the plurality of gate structures by different lateral distances.

16. The integrated chip of claim 15, wherein the plurality of MOL structures within the pattern comprise: a leftmost MOL structure that is left of center of a first underlying gate structure of the plurality of gate structures as viewed in a cross-sectional view; anda rightmost MOL structure that is right of center of a second underlying gate structure of the plurality of gate structures as viewed in the cross-sectional view.

17. The integrated chip of claim 16, wherein the plurality of MOL structures within the pattern further comprise: a central MOL structure that is laterally between sidewalls of an underlying third gate structure of the plurality of gate structures.

18. The integrated chip of claim 15, wherein the different lateral distances change, as viewed from left to right in a cross-sectional view, from a left of center offset to a right of center offset.

19. The integrated chip of claim 18, wherein the different lateral distances change in substantially equal increments from the left to the right in the cross-sectional view.

20. The integrated chip of claim 15, wherein the plurality of gate structures within the pattern consist of five or less gate structures.