Patent Application
20230402255
The present invention relates generally to systems and methods for plasma processing, and, in particular embodiments, to equipment and methods for improved uniformity of plasma processing across an edge region of wafers.
An integrated circuit (IC) is a network of electronic components in a monolithic structure comprising a stack of patterned layers in a semiconductor wafer. A matrix of IC units is formed on each wafer by processing wafers through a series of patterning levels. At each level, a deposited layer for the IC's components is patterned by a step-and-repeat lithography technique that prints identical copies of a radiation pattern on a wafer coated with photoresist. The pattern is transferred to a layer below by a masked etch process to form the patterned component layer. Sacrificial masking layers are etched off and the sequence of deposition and patterning is repeated for the next level.
Many of the deposition and etch steps in IC fabrication involve plasma processes, where energetic ions and radicals from a gas discharge modify the wafer surface physically and chemically. The fluxes of ions and radicals toward the wafer are influenced by the electrical and chemical properties of the surface material. Generally, it is more difficult to maintain uniform ambiance across an edge region of the wafer because the surface material inevitably changes abruptly at the wafer's edge. A material discontinuity leads to discontinuities in properties such as electrical impedance and chemical reactivity that alter the ion and radical fluxes near the edge. This results in locally non-uniform plasma processing which, in turn, may result in increased yield loss of functional IC units in the edge region. Therefore, further innovation to improve edge uniformity in plasma processing is desirable.
An equipment for plasma processing including: a pedestal configured to hold a wafer; concentric with the pedestal, a focus ring including an insulator, the focus ring being positioned close to an edge region of the wafer when the wafer is held on the pedestal; and a plurality of gas discharge devices embedded in the focus ring, where each gas discharge device is configured to generate a gas discharge plasma confined within the focus ring.
A plasma processing system, the system including: a plasma process chamber; a pedestal configured to hold a wafer inside the chamber; a first radio frequency (RF) power supply coupled to a first RF electrode, the first RF electrode being configured to generate direct plasma over the pedestal using RF source power from the first RF power supply; located in the chamber, a radical distribution plenum having a plurality of exit holes arranged circularly around an edge of the wafer when the wafer is held on the pedestal, where the plenum is configured to receive a flow of radicals and distribute the flow out to the chamber through the plurality of exit holes; and a radical source coupled to the plenum, the radical source being configured to flow radicals into the plenum and, where the radical source is different from the direct plasma.
A method of plasma processing including: from a primary radical source, generating a main flow of radicals directed toward a major surface of a wafer disposed on a pedestal inside a plasma process chamber; from a secondary radical source, generating a supplemental flow of radicals directed toward an edge region of the major surface, the generating the supplemental flow of radicals including flowing radicals through a plurality of exit holes of an annular radical distribution plenum disposed in the chamber around an edge of the wafer; and exposing the major surface to a combined flow of radicals, the combined flow being a combination of the main flow and the supplemental flow.
For a more complete understanding of the present invention, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:
The plasma processing equipment and method, described in this disclosure, provide an advantage of improved process uniformity across an edge region of a semiconductor wafer when processed through a plasma processing step in accordance with various embodiments of the invention. Embodiments discussed in this application achieve these and other improvements by generating a supplemental flow of radicals directed toward an edge region of the wafer in a plasma process chamber where the wafer is being processed.
In the embodiments described in this disclosure, radicals for the supplemental flow are introduced through a circular arrangement of exit holes of an annular plenum located inside the chamber and positioned around the wafer near its edge. After exiting the plenum, a portion of the radicals flow toward the wafer and, in the edge region of the wafer, the supplemental flow mixes with a main flow of radicals directed toward a top surface of the wafer. A combination of these two independent flows contributes to the radicals that interact chemically with the surface of the edge region. The extent of the region over which the supplemental flow perceptibly influences a radical flux to the surface may be limited to, roughly, the edge region of the wafer by constraining the strength of the supplemental flow relative to that of the main flow. Thus, generating the supplemental flow, in addition to the main flow provides a mechanism for adjusting a supply of radicals to the surface over the edge region of the wafer independent of the radical supply to the surface over the central region of the wafer.
Conventional plasma processing equipment and methods do not include an additional independent source of radicals to modify a supply of radicals to the surface over the edge region of the wafer provided by the main flow. The main flow of radicals may establish a roughly uniform flux of radicals to the surface in a central region of the wafer. However, because of a discontinuity in the surface material across the edge of the wafer, the main radical flow is unable to extend the uniformity all the way to the edge of the wafer. The radical flux may deviate from the uniform central value, with the deviation becoming more prominent closer to the edge. As mentioned in the background section, discontinuities in electrical and chemical properties due to the material discontinuity across the edge may result in radial nonuniformities in the densities and energy distributions of radicals (as well as of ions and free electrons) in the edge region of the wafer.
Generally, in absence of any other flow of radicals, the main flow establishes a radial distribution of radical flux to the surface that is roughly uniform in the central region and decreases with increasing radial distance from the center in the edge region of the wafer. The resulting edge non-uniformity of the plasma process has been reduced in the embodiments of plasma processing systems described in this disclosure with two independent (i.e., different) sources for radicals: a primary radical source for the main flow and a secondary radical source for the supplemental flow. Having a distinct set of process parameters that selectively modifies the radical supply to the edge region gives the additional degrees of freedom in adjusting the radical distribution over the entire surface for more uniform plasma processing from center to edge. Furthermore, as explained in detail below in this disclosure, the supplemental flow adds a negligible number of ions to the ambiance to which the wafer is exposed; thus, providing an advantage of adjusting the radical flux to the edge region of the wafer being processed independent of the ion flux.
An example plasma processing equipment configured to provide a supplemental flow of radicals is described with reference to
Generally, plasma equipment using direct plasma to process a wafer held on a pedestal comprising conductive material includes an insulating or doped semiconductor focus ring to improve process uniformity across the wafer for a plasma process. The conventional focus ring is a ring-shaped insulator or doped semiconductor installed concentric with the pedestal and positioned on/around the pedestal close to the wafer edge. However, a conductive material such as a doped semiconductor may be unsuitable for the focus rings in the embodiments described in this disclosure, for example, for focus ring 130 in
As known to persons skilled in the art, focus rings of various shapes and materials may be used. The structure may comprise a solid insulator, doped semiconductor or partially hollow blocks. The composition of the focus ring material may comprise a single material, a core coated with a different material, or segments of multiple materials. Dielectric materials used for focus rings may include undoped silicon, quartz, amorphous silicon oxide, alumina, zirconia, yttria, and polytetrafluoroethylene (PTFE). Doped semiconductor materials include doped silicon (although it is not used in the focus rings in the embodiments described in this disclosure).
The focus ring around a pedestal designed to hold a 300 mm (diameter) wafer may have an inner diameter of about 290 mm to about 350 mm, an outer diameter of about 350 mm to about 500 mm and a thickness of about 2 mm to about 10 mm. An inner diameter less than the wafer diameter implies that a portion of the focus ring is a support ring below the wafer while the remaining portion is thicker and extends above the pedestal around the wafer edge. The upper surface of the focus ring may be located from being roughly 3 mm below the top surface of the wafer to about 6 mm above the wafer surface. Typically, a lateral gap of about 1 mm to 5 mm is allowed between the wafer and the focus ring.
In the example embodiment illustrated in
Each gas discharge device 150 comprises a cavity 132. In the example equipment 100, each cavity 132 is shaped like a vertically oriented cylinder. In various embodiments, the cavity of the gas discharge device may have various shapes. For example, the cavity may be shaped like a prism with an oval base or a polygonal base, such as a rectangular or hexagonal base.
In addition to the cavity 132, each embedded gas discharge device 150 comprises an RF resonant structure configured to generate a gas discharge plasma confined within the cavity 132. The RF resonant structure is described in detail further below with reference to
A gaseous mixture comprising a source gas for supplemental radicals and diluent gases may be introduced into the cavity 132 through a gas inlet 142 from a gas distribution channel 136. The gas inlet 142 (located in the floor of the cylindrical cavity 132 in
As illustrated in
In this example, the gas distribution channel 136 and the radical distribution plenum 134 are shown to be of equal width; hence, in the planar view (the X-Y plane) they are indicated by coincident dashed rings. In some other embodiment, the gas distribution channel 136 and the radical distribution plenum 134 may have different widths.
The gas distribution channel 136 is configured to receive gas through a gas entrance (not shown) coupled to an external supplemental gas supply system and distribute the gas to the plurality of gas discharge devices 150. The radical distribution plenum 134 receives an influx of radicals through the radical outlets 146 and distributes the radical flow to a plurality of exit holes 144 of the plenum 134. The cross-sectional view in
In the example embodiment illustrated in
When the plasma processing equipment 100 is operated, a plume of supplemental radicals may be emitted from each exit hole 144 of the circular arrangement of exit holes 144 around the wafer 110. After exiting through the exit holes 144 of the plenum 134, a portion of the radicals may flow toward an annular edge region 112 of the wafer no and merge with the main flow of radicals that is present over the entire wafer 110, including a central region 114. A boundary between the ring-shaped edge region 112 and the circular central region 114 has been indicated by a dashed circle on the surface of the wafer no extending from the center to a distance, E, from the edge. The distance, E, of the boundary from the edge is loosely defined to indicate a width of a region near the edge where, using only a primary radical source, the achieved process uniformity may be significantly worse relative to the uniformity achieved close to the center of the wafer. Without the supplemental radical flow, the process nonuniformity in the edge region 112 may exceed a tolerance limit resulting in excessive yield loss in the edge region 112. The dimension, E, of the edge region may depend on many factors such as the plasma process, chamber design, RF electrode design, RF waveform, and the surface material of the wafer being processed. Generally, for a 300 mm diameter wafer, E does not exceed 20 mm and, in some instances, E may be below 100 mm, for example 5 mm. Despite a small width of 5 mm to 100 mm, the edge region may be having about 1% to about 3% of the IC units printed on a 300 mm wafer. A yield loss of 1% is significant in high volume manufacturing. The supplemental radical flow originating from the exit holes 144 toward the edge region 112 provides an advantage of mitigating the yield loss due to nonuniform processing in the edge region 112.
Next, a plasma processing system is described that includes equipment (e.g., the example equipment 100) configured to provide a supplemental flow of radicals.
The example equipment 100, comprising the pedestal 120 and the focus ring 130, is shown holding the wafer no in the chamber 210 for processing. As mentioned above, the gas distribution channel 136 is configured to receive gas supplied by a supplemental gas supply system.
A plasma processing system further comprises electrodes and electrical power supplies coupled to the electrodes and ground. As known to persons skilled in the art, an RF power supply supplying RF power to a load impedance is, generally, coupled to an electrode of the load via an impedance matching network disposed close to the electrode. The matching network is used to suppress reflections and achieve optimum power transfer.
The example plasma processing system 200, illustrated in
In some embodiments, a second RF power supply 230 may be coupled to a second RF electrode, where the second RF electrode is configured to provide RF bias power to the plasma from the second RF power supply. In the example plasma processing system 200, a conductive part of the pedestal 120 is being used as the second RF electrode receiving bias power via a respective second matching network 232.
The schematic illustrated in
A gas discharge may be generated in each cavity 132 using RF source power supplied to the RF resonant structure at its resonant frequency to initiate oscillating electromagnetic fields that attain a high enough magnitude to ignite and sustain plasma in the cavity 132. The RF source power is provided by coupling the resonant structure to a third RF power supply 240 via a third matching network 242. As illustrated in
While in the example plasma processing system 200, RF source power is provided to the RF resonators of the gas discharge devices by capacitive coupling, in some other embodiments the coupling may be an inductive coupling, or a direct connection (or resistive coupling), or a combination of inductive and capacitive coupling.
In an embodiment where the second RF power supply 230 is also coupled to the pedestal 120 via the matching network 232 (e.g., the embodiment illustrated in
In the example plasma processing system 200, the secondary source of radicals is a plurality of gas discharge devices embedded in an insulating ring installed in a plasma process chamber, such as the devices 150 embedded in the focus ring 130, described above with reference to
In some other embodiment, the secondary source of radicals may be a remote plasma source, where the gas discharge plasma for supplemental radicals is generated at a location outside the plasma process chamber in which the wafer is processed. One advantage of using a remote plasma source as the secondary source is that the dimensions of the space in which the gas discharge plasma for generating the supplemental radicals is confined is less restrictive than the cavity (e.g., cavity 132) of each of the plurality of gas discharge devices (e.g., the gas discharge devices 150) embedded in an insulating ring (e.g., the insulating focus ring 130). Generally, igniting and sustaining a gas discharge may be achieved more reliably if dimensional constraints on the space available for confining the discharge are relaxed. The radical distribution plenum and exit holes may be housed in an insulating ring (e.g., the insulating focus ring 130), similar to the plenum 134 and exit holes 144 (see
As described above, the primary source of radicals in the example plasma processing system 200 is the direct plasma generated in the plasma process chamber 210. The direct plasma is sustained over the pedestal 120 with the wafer no exposed to the flux of various particles (e.g., ions and radicals) from the plasma. In some other embodiment, the primary source of radicals may be a remote plasma source instead of direct plasma. Accordingly, for this embodiment, the plasma process chamber has to be configured as a remote plasma process chamber.
In the embodiments of plasma processing systems described above, including the example plasma processing system 200, the wafer (e.g., wafer no) is exposed to a combination of a main flow of radicals directed toward a top surface of the wafer and a supplemental radical flow toward the edge region of the wafer. The combined flow of radicals chemically modifies the wafer surface over the edge region. As explained above, the supplemental radical flow in the plasma process chamber originates from the efflux of supplemental radicals from exit holes (e.g., exit holes 144) of an annular plenum (e.g., plenum 134) housed in a focus ring (e.g., the focus ring 130) positioned around the wafer no in the chamber. In another embodiment, an insulating ring other than the focus ring may be used to house the radical distribution plenum. In an embodiment, the insulating ring other than the focus ring may be disposed at the walls of the plasma chamber 210. Having an insulating ring exclusively for introducing the supplemental radicals to the plasma process chamber provides greater flexibility in optimizing the design of the ring and the components embedded in the ring.
Although the example resonant structure is a parallel LC resonant circuit, it is understood that other electrical resonators may be embedded in the focus ring 130 to couple RF power to excite a gas discharge in cavity 132. For example, the capacitive and inductive structures may be connected in a series LC resonant circuit configuration, and the RF resonant structures of adjacent gas discharge devices may be connected in series.
The example capacitive structure 310 is a parallel plate capacitor structure having a conductive top plate 314 and a conductive bottom plate 312, parallel to the top plate 314. The insulator of the focus ring 130, in which the two conductive plates (bottom plates 312 and top plate 314) are embedded, is the capacitor dielectric of the capacitive structure 310.
The inductive structure 320 comprises a continuous conductor having a top end and a bottom end. The continuous conductor provides a winding path along which electrical current may flow from one end to the other while circling around the vertical sidewall of the cavity 132, always either in a clockwise or in an anticlockwise direction, as indicated by solid white arrows in
The ceiling and floor of the cylindrical cavity 132 are not visible in
A typical wire-wound inductor is shaped like a helical coil wound around a core. However, nonplanar helical coils wound around a gas discharge cavity may be difficult to integrate with planar parallel-plate capacitors to fabricate the RF resonant structures that form an electrical LC resonant circuit. In the example embodiment illustrated in
As illustrated in
The topmost partial ring 322 of the inductive structure 320 is connected by a first via 324 to the top plate 314 of the capacitive structure 310, forming a first terminal of the RF resonant structure. The lowermost partial ring 322 is connected by another first via 324 to a bottom conductive plate 330 that is common to the plurality of RF resonant structures of the plurality of gas discharge devices 150. The bottom plate 312 of the capacitive structure 310 is also connected to the common bottom conductive plate 330 by a second via 316 (the second via 316 is taller than the first via 324). These connections, illustrated in
Although not visible, the common bottom conductive plate 330, the bottom plate 312, and the top plate 314 of the conductive structure depicted in
In this embodiment, none of the conductive elements of the RF resonators have a direct connection to a conductive element outside the focus ring 130 in which the plurality of gas discharge devices 150 are embedded. This includes all the conductive elements of the capacitors 310, the inductive structures 320, and the common bottom conductive plate 330. However, directly below the common bottom conductive plate 330 there is the conductive part of the pedestal 120. Between these two conductors is a portion of the insulating focus ring 120. This is the parallel plate capacitor structure of the coupling capacitor, indicated by the capacitance, CP, in the inset of
On the other hand, for the low frequency RF bias signal (or a DC bias signal), CP is equivalent to a high impedance insulator. On one side of the insulator is the conductive pedestal 120 (connected to the RF bias signal) and the opposite side is the common bottom conductive plate 330 (connected to one end of the inductive structure 320). At low frequency (or DC) the inductive structure 320 is a low impedance connection to the top plate 314. The electric field in the dielectric of the capacitance CP may polarize the conductor, resulting in a respective electric field in the insulating region above the top plate 314. One advantage of having an electric field at the top of the focus ring 130 that is reflective of the bias fields applied to the pedestal is that it extends the bias fields radially beyond the edge of the wafer 110. This helps to reduce an edge discontinuity in the electric field.
In
The flow chart in
As indicated in block 410 of the flow chart for the method 400, a wafer is held on a pedestal inside a plasma chamber.
In block 420, the method comprises generating a main flow of radicals directed toward a major surface of the wafer. In some embodiments, a primary source providing radicals for the main flow is direct plasma. Accordingly, generating the main flow of radicals includes igniting and sustaining a gas discharge located over the pedestal. The process exposes the entire major surface of the wafer to the main flow of radicals from the discharge. In addition to the main radical flow, direct plasma exposes the major surface to a flux of ions. In other embodiments, generating the main flow may comprise directing radicals from a remote plasma source. The remote plasma source comprises a gas discharge in a chamber different from the chamber in which the wafer is being processed. The radicals generated by the remote plasma source are transported through pipes coupling the remote plasma source to a gas inlet of the chamber where the wafer is held and processed. There is a loss of radicals and ions in collisions with the walls during transport. Typically, in remote plasma processing, most of the ions are either neutralized or lose kinetic energy. As a result, the ratio of radicals to energetic ions arriving at the wafer is very high.
In addition to the main flow of radicals generated from the primary source, the method 400 includes generating a supplemental flow of radicals directed toward an edge region of the major surface, as indicated in block 430. Generating the supplemental flow of radicals comprises flowing radicals through a plurality of exit holes of an annular radical distribution plenum disposed in the chamber around an edge of the wafer. An efflux of radicals from the exit holes into the ambiance of the plasma process chamber may create a plume of supplemental radicals close to the circumferential periphery of the wafer. A portion of the supplemental radicals diffusing toward the edge region is the supplemental flow of radicals.
In order to flow radicals out through the exit holes, supplemental radicals are supplied to the radical distribution plenum from a secondary source, independent of (i.e., different from) the primary source. Hence, generating the supplemental flow of radicals includes generating a gas discharge that is a suitable secondary source of radicals. In some embodiments, the secondary radical source is a plurality of gas discharge plasmas confined in an insulating ring installed in the chamber around the edge region of the surface. For example, the insulating ring may be an insulating focus ring around the wafer embedded with a plurality of gas discharge devices. Then, generating the supplemental flow of radicals comprises igniting the plurality of gas discharges in cavities of the plurality of gas discharge devices and flowing radicals from the gas discharges into the plenum. In some embodiments, the annular plenum and the gas discharge devices may be housed in the same insulating ring.
In some other devices the secondary source may be a remote plasma source independent of the primary source. Then, generating the supplemental flow of radicals comprises generating the radicals in a remote gas discharge and transporting the radicals to a gas inlet of the chamber where the wafer is held and processed.
Example 1. An equipment for plasma processing including: a pedestal configured to hold a wafer; concentric with the pedestal, a focus ring including an insulator, the focus ring being positioned close to an edge region of the wafer when the wafer is held on the pedestal; and a plurality of gas discharge devices embedded in the focus ring, where each gas discharge device is configured to generate a gas discharge plasma confined within the focus ring.
Example 2. The equipment of example 1, further including: a plasma process chamber configured to ignite and sustain plasma in the chamber; a first radio frequency (RF) power supply coupled to an RF electrode, the RF electrode being configured to generate direct plasma over the pedestal using RF source power from the first RF power supply; and a third RF power supply coupled to the plurality of gas discharge devices, where each gas discharge device is configured to generate a gas discharge plasma using RF source power from the third RF power supply.
Example 3. The equipment of one of examples 1 or 2, further including a second RF power supply coupled to the pedestal, the pedestal being configured to provide RF bias power to the direct plasma from the second RF power supply, the second RF power supply being configured to supply RF power at a first frequency.
Example 4. The equipment of one of examples 1 to 3, where the pedestal is electrically coupled to the plurality of gas discharge devices, where the third RF power supply is coupled capacitively to the plurality of gas discharge devices by coupling the third RF power supply to the pedestal, and where the third RF power supply is configured to supply RF power at a second frequency different from the first frequency.
Example 5. The equipment of one of examples 1 to 4, where the focus ring further includes: a gas distribution channel disposed inside a lower portion of the focus ring, the channel having a gas entrance, where the entrance is configured to receive gas from a gas supply system; and a radical distribution plenum disposed inside an upper portion of the focus ring, the plenum configured to receive an influx of radicals from the plurality of gas discharge devices and deliver an efflux of radicals to the chamber through a plurality of exit holes distributed azimuthally around an edge of the wafer when the wafer is held on the pedestal.
Example 6. The equipment of one of examples 1 to 5, where each gas discharge device of the plurality of gas discharge devices includes: a cavity inside the focus ring, the cavity having a sidewall, a gas inlet coupled to the gas distribution channel, and a radical outlet coupled to the radical distribution plenum; and an RF resonant structure configured to generate a gas discharge plasma confined within the cavity, where the RF resonant structure is a conductive structure including an inductive structure and a capacitive structure.
Example 7. The equipment of one of examples 0 to 6, where the inductive structure is a two-terminal inductor (L) and the capacitive structure is a two-terminal capacitor (C), the terminals being connected in a parallel LC resonant circuit configuration.
Example 8. The equipment of one of examples 0 to 7, where the inductive structure includes a continuous conductor winding around the sidewall of the cavity, the conductor having a top end and a bottom end, and where the capacitive structure includes a conductive top plate parallel to a conductive bottom plate, the plates being embedded in the insulator of the focus ring disposed between adjacent cavities.
Example 9. The equipment of one of examples 0 to 8, where the continuous conductor of the inductive structure includes an arrangement of a plurality of conductive segments shaped as partial rings around the sidewall of the cavity connected by conductive vias, each segment having a starting tip and an ending tip at two opposite ends of the segment, and a via connecting the ending tip of the segment to the starting tip of an adjacent segment.
Example 10. A plasma processing system, the system including: a plasma process chamber; a pedestal configured to hold a wafer inside the chamber; a first radio frequency (RF) power supply coupled to a first RF electrode, the first RF electrode being configured to generate direct plasma over the pedestal using RF source power from the first RF power supply; located in the chamber, a radical distribution plenum having a plurality of exit holes arranged circularly around an edge of the wafer when the wafer is held on the pedestal, where the plenum is configured to receive a flow of radicals and distribute the flow out to the chamber through the plurality of exit holes; and a radical source coupled to the plenum, the radical source being configured to flow radicals into the plenum and, where the radical source is different from the direct plasma.
Example 11. The system of example 10, further including a second RF power supply coupled to a second RF electrode, the second RF electrode being configured to provide RF bias power to the direct plasma from the second RF power supply.
Example 12. The system of one of examples 10 or 11, where the radical source is a remote plasma source, the source being configured to generate radicals using plasma generated outside the chamber.
Example 13. The system of one of examples 10 to 12, further including: an insulating ring disposed at the edge of the wafer and separated from the pedestal, the radical distribution plenum being part of the insulating ring.
Example 14. The system of one of examples 10 to 13, further including an insulating ring disposed at the chamber wall, wherein the radical distribution plenum is being part of the insulating ring.
Example 15. The system of one of examples 10 to 14, where the system further includes an insulating ring, the ring being disposed in the chamber concentric with the pedestal, where the radical source includes a plurality of gas discharge devices embedded in the ring, each gas discharge device including a cavity and an RF resonant structure configured to generate a gas discharge plasma confined within the cavity, and where the plenum having a plurality of exit holes is a portion of the ring having a plurality of orifices.
Example 16. The system of one of examples 10 to 15, where, a gas distribution channel is disposed inside a lower portion of the ring, the channel having a gas entrance configured to receive gas from a gas supply system, and where the cavity of each gas discharge device of the plurality of gas discharge devices has a gas inlet coupled to the gas distribution channel and a radical outlet coupled to the radical distribution plenum segments adjacent to the cavity.
Example 17. The equipment of one of examples 10 to 16, where the RF resonant structure of each gas discharge device of the plurality of gas discharge devices is a two-terminal LC resonant circuit, and where the plurality of the two-terminal LC resonant circuits are electrically connected to one another form a combined two-terminal LC resonant circuit.
Example 18. The equipment of one of examples 10 to 17, further including a third RF power supply coupled to each RF resonant structure of each gas discharge device of the plurality of gas discharge devices.
Example 19. A method of plasma processing including: from a primary radical source, generating a main flow of radicals directed toward a major surface of a wafer disposed on a pedestal inside a plasma process chamber; from a secondary radical source, generating a supplemental flow of radicals directed toward an edge region of the major surface, the generating the supplemental flow of radicals including flowing radicals through a plurality of exit holes of an annular radical distribution plenum disposed in the chamber around an edge of the wafer; and exposing the major surface to a combined flow of radicals, the combined flow being a combination of the main flow and the supplemental flow.
Example 20. The method of example 19, where the secondary radical source is a plurality of gas discharge plasmas confined in an insulating ring, the ring being disposed around the edge region of the surface and, where generating the supplemental flow of radicals includes igniting respective gas discharges to form the plurality of gas discharge plasmas and flowing radicals from the gas discharge plasmas into the plenum.
Example 21. The method of one of examples 19 or 20, where the primary radical source is a remote plasma source, the source being configured to generate radicals using plasma generated outside the chamber.
While this invention has been described with reference to illustrative embodiments, this description is not intended to be construed in a limiting sense. Various modifications and combinations of the illustrative embodiments, as well as other embodiments of the invention, will be apparent to persons skilled in the aft upon reference to the description. It is therefore intended that the appended claims encompass any such modifications or embodiments.
