Flex circuit constructions for high capacity circuit module systems and methods

Information

  • Patent Grant
  • 7616452
  • Patent Number
    7,616,452
  • Date Filed
    Friday, January 13, 2006
    18 years ago
  • Date Issued
    Tuesday, November 10, 2009
    15 years ago
Abstract
Provided circuit modules employ flexible circuitry populated with integrated circuitry (ICs). The flex circuitry is disposed about a rigid substrate. Contacts distributed along the flexible circuitry provide connection between the module and an application environment. A strain relief portion of the flex circuitry has preferably fewer layers than the portion of the flex circuitry along which the integrated circuitry is disposed and may further may exhibit more flexibility than the portion of the flex circuit populated with integrated circuitry. The substrate form is preferably devised from thermally conductive materials.
Description
FIELD

The present invention relates to systems and methods for creating high density circuit modules and, in particular, to systems and methods for flex circuit construction for employment in high density circuit modules.


BACKGROUND

Memory expansion is one of the many fields where high density circuit module solutions provide space-saving advantages. For example, the well-known DIMM (Dual In-line Memory Module) has been used for years, in various forms, to provide memory expansion. A typical DIMM includes a conventional PCB (printed circuit board) with memory devices and supporting digital logic devices mounted on both sides. The DIMM is typically mounted in the host computer system by inserting a contact-bearing edge of the DIMM into a card edge connector. Typically, systems that employ DIMMs provide limited profile space for such devices and conventional DIMM-based solutions have typically provided only a moderate amount of memory expansion.


As bus speeds have increased, fewer devices per channel can be reliably addressed with a DIMM-based solution. For example, 288 ICs or devices per channel may be addressed using the SDRAM-100 bus protocol with an unbuffered DIMM. Using the DDR-200 bus protocol, approximately 144 devices may be addressed per channel. With the DDR2-400 bus protocol, only 72 devices per channel may be addressed. This constraint has led to the development of the fully-buffered DIMM (FB-DIMM) with buffered C/A and data in which 288 devices per channel may be addressed. That buffering function is provided by what is typically identified as the Advanced Memory Buffer or AMB. With the FB-DIMM, not only has capacity increased, pin count has declined to approximately 69 signal pins from the approximately 240 pins previously required.


There are several known methods to improve the limited capacity of a DIMM or other circuit board. In one strategy, for example, small circuit boards (daughter cards) are connected to the DIMM to provide extra mounting space. The additional connection may, however, cause flawed signal integrity for the data signals passing from the DIMM to the daughter card while the additional thickness of the daughter card(s) increases the profile of the module.


Multiple die packages (MDP) can also be used to increase DIMM capacity. This scheme increases the capacity of the memory devices on the DIMM by including multiple semiconductor die in a single device package. The additional heat generated by the multiple die typically requires, however, additional cooling capabilities to operate at maximum operating speed. Further, the MDP scheme may exhibit increased costs because of increased yield loss from packaging together multiple die that are not fully pre-tested.


Stacked packages are yet another way to increase module capacity. Capacity is increased by stacking packaged integrated circuits to create a high-density circuit module for mounting on the larger circuit board. In some techniques, flexible conductors are used to selectively interconnect packaged integrated circuits. Staktek Group L.P. has developed numerous systems for aggregating CSP (chipscale packaged) devices in space saving topologies. The increased component height of some stacking techniques may, however, alter system requirements such as, for example, required cooling airflow or the minimum spacing around a circuit board on its host system.


The present assignee, Staktek Group L.P., has also developed a number of new technologies for circuit modules that can supplant traditional DIMMs. Examples of these new circuit module constructions are shown in the several patent applications incorporated by reference herein. These new technologies populate flex circuitry with integrated circuits and, in preferred embodiments, dispose the IC-populated flex circuitry about a rigid substrate. Edge connector contacts are disposed along the flex circuitry to provide a connective facility for the module which, through these new constructions, provides increased capacity as well as, typically, thermal advantages. With the added IC capacity however, there typically comes a high internal density requirement for the flex circuit that may be implemented with multiple layer flex circuitry. In preferred modes, however, the flex circuitry transits through at least one bend about the end of the rigid substrate and typically passes through at least another arcuate path around a flex support that is typically part of the rigid substrate as shown in a variety of the patent applications incorporated by reference herein. These passages through one or more bends can, in some cases, be problematic where flex circuitry is employed to implement the variety of connections implicated by a complex high capacity circuit module devised to supplant a contemporary DIMM. Consequently, what is needed is a construction and technique to ameliorate difficulties in low profile, high capacity flex circuit based circuit modules.


SUMMARY

Provided circuit modules employ flexible circuitry populated with integrated circuitry (ICs). The flex circuitry is disposed about a rigid substrate. Contacts distributed along the flexible circuitry provide connection between the module and an application environment. A strain relief portion of the flex circuitry has preferably fewer layers than the portion of the flex circuitry along which the integrated circuitry is disposed and may further may exhibit more flexibility than the portion of the flex circuit populated with integrated circuitry. The substrate form is preferably devised from thermally conductive materials.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a perspective view of a circuit module in accordance with a preferred embodiment of the present invention.



FIG. 2 is an enlarged view of the area marked “C” in FIG. 1.



FIG. 3 is a depiction of one side of a flex circuit employed in a preferred embodiment of the present invention.



FIG. 4 depicts another side of a flex circuit employed in a preferred embodiment of the present invention.



FIG. 5 is a depiction of a portion of a conductive layer of a portion of a of flex circuit devised in accordance with the present invention.



FIG. 6 depicts a cross-section of a portion of a module showing a portion of a flex circuit transiting about an end of a substrate in accordance with a preferred embodiment.



FIG. 7 is a cross-sectional depiction of an exemplar module 10 according to a preferred embodiment.



FIG. 8 is an enlarged depiction of the area marked “D” in FIG. 7.



FIG. 9 is an exemplar construction detail illustrating internal layer constructions for a flex circuitry in accordance with a preferred embodiment.





DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS


FIG. 1 is a perspective view of a circuit module 10 devised in accordance with a preferred embodiment of the present invention. As depicted in FIG. 1, module 10 has two sides A and B and includes rigid substrate 14 having two opposing lateral sides 14A and 14B (shown in more detail in cross-section in FIG. 7) about which flex circuitry 12 is disposed. Substrate 14 is preferably comprised of thermally conductive material such as a metallic material with aluminum being a preferred choice for its thermal conductivity and ease of fabrication and cost while other thermally conductive materials may also be preferred such as thermally conductive plastics or carbon based materials. As shown, substrate 14 includes optional extension 16.


Flex circuitry 12 has two portions 12A and a portion 12B. Portions 12A of flex circuit 12 are populated with ICs 18 along at least one of the two major surfaces of flex circuit 12 as shown in more detail in later Figs. Portion 12B transits about end 16A of substrate 14. In a preferred embodiment, portions 12A will be rigid while portion 12B will be flexible and thus, flex circuit 12 may preferentially be devised from what is sometimes identified as “rigid-flex” with the flexible part corresponding to portion 12B and the rigid part corresponding to portions 12B of flex circuit 12. Those of skill will recognize that rigid-flex is not required for the invention and a variety of flex circuitry constructions may be employed in preferred embodiments according to the principles disclosed herein.


A part of the side of flex circuit 12 visible in part in FIG. 1 is later shown in FIG. 3 before disposition of flex circuit 12 about substrate 14. In a preferred embodiment, ICs 18 are memory devices in CSP packages. For purposes of this disclosure, the term chip-scale or “CSP” shall refer to integrated circuitry of any function with an array package providing connection to one or more die through contacts (often embodied as “bumps” or “balls” for example) distributed across a major surface of the package or die. CSP does not refer to leaded devices that provide connection to an integrated circuit within the package through leads emergent from at least one side of the periphery of the package such as, for example, a TSOP. Embodiments of the present invention may be employed with leaded or CSP devices or other devices in both packaged and unpackaged forms but where the term CSP is used, the above definition for CSP should be adopted. Consequently, although CSP excludes leaded devices, references to CSP are to be broadly construed to include the large variety of array devices (and not to be limited to memory only) and whether die-sized or other size such as BGA and micro BGA as well as flip-chip. As those of skill will understand after appreciating this disclosure, some embodiments of the present invention may be devised to employ stacks of ICs each disposed where an IC 18 is indicated in the exemplar Figs.


Multiple integrated circuit die may be included in a package depicted as a single IC 18. While in this embodiment memory ICs are used to provide a memory expansion board or module, and various embodiments may include a variety of integrated circuits and other components. Such variety may include microprocessors, FPGA's, RF transceiver circuitry, digital logic, as a list of non-limiting examples, or other circuits or systems which may benefit from a high-density circuit board or module capability.


As will be illustrated in later Figs., other ICs in addition to or other than ICs 18 may be employed with module 10 such as, for example, an IC 19 which may be, for example, an advanced memory buffer (AMB) as employed in a fully-buffered DIMM instantiation on module 10.


With continuing reference to FIG. 1, as shown, flex circuitry 12 exhibits 12A parts or portions and a 12B part or portion. In the depicted embodiment, portions 12A of flex circuit 12 are populated with ICs 18 of module 10 while portion 12B of flex circuitry 12 corresponds to a portion of flex circuit 12 that includes selected areas where flex circuitry 12 takes an arcuate path about substrate 14, such as, for example, along substrate edge or end 16A and about later shown flex support 14FS. Thus, portions 12A of flex circuit 12 may be alternatively identified as IC-mounting portions while portion 12B of flex circuit 12 may be identified as a substrate transit portion of flex circuit 12.


Contacts 20 provide a connective facility for module 10 to an application environment and are depicted as being edge connector contacts so that module 10 may supplant a traditional DIMM comprised from, for example, FR4 board populated with ICs. In portion 12B, flex circuit 12 preferably exhibits strain penetrations 13 and 15 with strain penetrations 15 being disposed proximal to the area about end 16A of substrate 14. As will be later shown in more detail, in the present embodiment, portion 12B of flex circuit 12 exhibits fewer layers than portions 12A thus providing an enhanced ability for flex circuit 12 to transit about substrate 14.



FIG. 2 is an enlarged view of the area marked “C” in FIG. 1. As shown in FIG. 2, flex circuit 12 has portions 12A and 12B. Strain penetrations 15 are disposed in flex circuit 12 along its portion that transits the end portion 16A of substrate 14. Portion 12B of flex circuit 12 that transits about end 16A of substrate 14 contains circuit pathways that provide various connections from side A to side B of circuit module 10. Thus, circuit module 10 exhibits connections from one side of the module to another side without the connections being required to pass through the substrate 14.



FIG. 3 is a depiction of side 8 of a flex circuit 12 in accordance with a preferred embodiment of the present invention. Flex circuit 12 may come in a variety of shapes including but not limited to square. Contact arrays such as array 11 are disposed beneath ICs 18 and IC 19 (shown in FIG. 4) and are comprised of array contacts 11A. An exemplar contact array 11 is shown as is exemplar IC 18 to be mounted at contact array 11 as depicted.


Those of skill will recognize that the identified pluralities F1 and F2 of ICs are, when disposed in the configurations depicted, typically described as “ranks”. Between the ranks F1 and F2, flex circuit 12 bears a plurality of module contacts allocated in this embodiment into two rows of module contacts 20. When flex circuit 12 (FIG. 4) is folded about substrate 14 as earlier depicted, side 8 depicted in FIG. 3 is presented at the outside of module 10. The opposing side 9 of flex circuit 12 (FIG. 4) is on the inside in depicted configurations of module 10 and thus side 9 is closer to the substrate 14 about which flex circuit 12 is disposed than is side 8. Other embodiments may have other numbers of ranks and combinations of plural ICs connected to create the module of the present invention. In the depicted embodiment, portions 12A and 12B are shown as being delineated from each other by dotted line 12D. Line 12D is shown for illustrative purposes. Contacts 20 are shown located near a central axis of flex circuit 12 but may be located near an edge of flex circuit 12 in embodiments that locate the circuitry on only one side of substrate 14, for example. Such examples are shown in U.S. patent application Ser. No. 11/123,721 which has been incorporated by reference herein.


Typically, flex circuit 12 is a multi-layer flex circuit having multiple conductive planes or layers from which are configured appropriate traces to implement the required connections of the module. The number of layers and their arrangement varies from portion 12A to portion 12B, however, in a preferred embodiment. Strain penetrations 15 are shown in FIG. 3 as are strain penetrations 13 in part of portion 12B.



FIG. 4 illustrates major side 9 of flex circuit 12 which is the side opposite that depicted in FIG. 3. Depicted as IC 19, an advanced memory buffer or AMB is disposed on side 9 of flex circuit 12 along with multiple iterations of ICs 18. No contacts 20 are exhibited by this exemplar depiction of side 9 given that this side of flex circuit 12 will be disposed on the “inner” side of module 10 when flex circuit 12 is disposed about substrate 14.



FIG. 5 is a depiction of a portion of a metal layer 48X of portion 12B of flex circuit 12 devised in accordance with the present invention. As shown, metal layer 48X exhibits strain penetrations 15 and 13 that pass through flex circuit 12. For further strain relief, portions of metal layer 48X of flex circuit 12 are patterned as exemplified by references 48P.



FIG. 6 depicts a cross-section of a portion of module 10 showing portion 12B of flex circuit 12 transiting about end 16A of substrate 14. Adhesive 30 is shown that may, in some embodiments, be employed to affix together substrate 14 and flex circuit 12 in the area depicted as well as other portions of the module as those of skill be recognize.



FIG. 7 is a cross-sectional depiction of an exemplar module 10 according to a preferred embodiment. As shown, module 10 includes ICs 18 and at least one IC 19 depicted with the profile of an AMB. As shown, there is a cutout area of substrate 14 into which at least a portion of IC 19 may be disposed. Further embodiments that employ cutaway and window implementations of substrate 14 are disclosed in a variety of the patent applications incorporated by reference herein. Those of skill will recognize that module 10 may be populated with integrated circuits of a variety of functions and types including but not limited to memory, logic, graphics, microprocessors, FPGA, and communications, for example. Flex support 14FS is shown as are portions 12A and 12B of flex circuit 12.



FIG. 8 is an enlarged depiction of the area marked “D” in FIG. 7. As depicted in FIG. 8, flex circuitry 12 exhibits two portions 12A and portion 12B. FIG. 8 depicts an enlarged view of the area near end or edge 16A of an exemplar module 10. While a rounded configuration is shown, edge 16A may take on other shapes devised to mate with various connectors or sockets. The form and function of various edge card connectors are well know in the art. In many preferred embodiments, flex 12 is wrapped around edge 16A of substrate 14 and may be laminated or adhesively connected to substrate 14 with adhesive 30. Flex circuit 12 may vary in thickness and is not strictly shown to scale. The depicted substrate 14 has a thickness such that when assembled with the flex 12 and adhesive 30, the thickness measured between module contacts 20 falls in the range specified for the mating connector. Although a preferred implementation of flex circuit 12 is a rigid-flex circuit, in some other embodiments, flex circuit 12 may be implemented with two rigid boards as implementations of preferably rigid portions 12A of flex circuits 12 while portion 12B may be a flexible circuit. Such a construction is shown in U.S. application Ser. No. 11/131,835, filed May 18, 2005 which application has been incorporated by reference herein. In other embodiments, contacts 20 need not be on both sides of module 10 and may be exhibited on only one side in configurations.



FIG. 9 is an exemplar construction detail illustrating internal layer constructions for flex circuit 12 in portions 12A and 12B. In portions 12A, outer layers 40a and 40b are preferably solder masks, a construction well known in the industry. Those of skill will recognize that solder mask layers are not required to implement flex circuitry that may function as flex circuit 12 in the context of the invention. Layer 42 is a first conductive layer preferably comprised of copper while layer 44 is polyimide in a preferred embodiment. As shown, those layers that continue in portion 12B of flex circuit 12 are seen on both sides of central polyimide layer 50. Layer 46 is an adhesive while layer 48 is a second conductive layer which, like layer 42, is preferably comprised of copper. Layer 52 is a third conductive layer preferably comprised of copper and layer 54 is a fourth conductive layer preferably comprised of copper. As depicted in the flex circuit 12B portion of flex circuit 12, layer 48 is identified as 48X to indicate the preferred cross-hatched nature of that layer in that portion 12B of flex circuit 12.


Although the present invention has been described in detail, it will be apparent to those skilled in the art that many embodiments taking a variety of specific forms and reflecting changes, substitutions and alterations can be made without departing from the spirit and scope of the invention. Therefore, the described embodiments illustrate but do not restrict the scope of the claims.

Claims
  • 1. A circuit module comprising: a rigid substrate comprised of thermally conductive material and having first and second opposing lateral sides and a bottom edge; anda flex circuit having multiple conductive layers and a mounting portion and a substrate transit portion, the substrate transit portion having a row of voids, the mounting portion having more conductive layers than does the substrate transit portion, the flex circuit having a first side and a second side with the first side having plural edge connector contacts for connection of the circuit module to an edge connector, the first side having mounted on the mounting portion of the flex circuit, a first set of CSPs (chip scale packaged devices), and the second side having mounted on the mounting portion of the flex circuit, a second set of CSPs (chip scale packaged devices), the substrate transit portion being disposed about the bottom edge of the rigid substrate to expose on the outside of the circuit module the plural edge connector contacts and the first set of CSPs while disposing the second set of CSPs between the flex circuit and at least one of the first or second opposing lateral sides of the rigid substrate.
  • 2. The circuit module of claim 1 in which the row of voids comprises voids that pass entirely through the substrate transit portion of the flex circuit.
  • 3. The circuit module of claim 1 in which the row of voids comprises voids that pass through only one conductive layer of the substrate transit portion of the flex circuit.
  • 4. A circuit module comprising: a rigid substrate having first and second opposing lateral sides and a bottom edge; anda flex circuit having multiple conductive layers and a mounting portion and a substrate transit portion, the mounting portion having more conductive layers than does the substrate transit portion, the multi-layered flex circuit having a first side and a second side with the first side having plural edge connector contacts for connection of the circuit module to an edge connector, the first side having mounted on the mounting portion of the flex circuit, a first set of CSPs (chip scale packaged devices), and the second side having mounted on the mounting portion of the flex circuit, a second set of CSPs (chip scale packaged devices), the substrate transit portion being disposed about the bottom edge of the rigid substrate to expose on the outside of the circuit module the plural edge connector contacts and the first set of CSPs while disposing the second set of CSPs between the flex circuit and at least one of the first or second opposing lateral sides of the rigid substrate.
RELATED APPLICATIONS

This application is a continuation-in-part of Pat. App. No. PCT/US2005/028547 filed Aug. 10, 2005; a continuation-in-part of U.S. patent application Ser. No. 11/231,418, filed Sep. 21, 2005 now U.S. Pat. No. 7,443,023, and a continuation-in-part of U.S. patent application Ser. No. 11/068,688, filed Mar. 1, 2005 now U.S. Pat. No. 7,324,352. This application is also a continuation-in-part of U.S. patent application Ser. No. 11/131,835, filed May 18, 2005. This application is also a continuation-in-part of U.S. patent application Ser. No. 11/007,551 filed Dec. 8, 2004 now U.S. Pat. No. 7,511,968, which application is a continuation-in-part of U.S. patent application Ser. No. 10/934,027 filed Sep. 3, 2004, pending. This application is also a continuation-in-part of U.S. patent application Ser. No. 11/005,992 filed Dec. 7, 2004 now U.S. Pat. No. 7,480,152, which application is a continuation-in-part of U.S. patent application Ser. No. 10/934,027 filed Sep. 3, 2004. This application is also a continuation-in-part of U.S. patent application Ser. No. 11/193,954 filed Jul. 29, 2005, pending, which application is a continuation-in-part of U.S. patent application Ser. No. 11/007,551 filed Dec. 8, 2004 now U.S. Pat. No. 7,511,968. This application is also a continuation-in-part of U.S. patent application Ser. No. 10/934,027 filed Sep. 3, 2004, pending. This application is also a continuation-in-part of U.S. patent application Ser. No. 11/123,721 filed May 6, 2005, pending, which application is a continuation-in-part of both U.S. patent application Ser. No. 11/068,688 filed Mar. 1, 2005 now U.S. Pat. No. 7,324,352 and U.S. patent application Ser. No. 11/005,992 filed Dec. 7, 2004 now U.S. Pat. No. 7,480,152. Pat. App. No. PCT/US05/28547; U.S. patent application Ser. No. 11/231,418; U.S. patent application Ser. No. 10/934,027; U.S. patent application Ser. No. 11/068,688; U.S. patent application Ser. No. 11/005,992; U.S. patent application Ser. No. 11/193,954; U.S. patent application Ser. No. 11/123,721; U.S. patent application Ser. No. 11/131,835; and U.S. patent application Ser. No. 11/007,551 are each hereby incorporated by reference herein.

US Referenced Citations (413)
Number Name Date Kind
3372310 Kantor Mar 1968 A
3436604 Hyltin Apr 1969 A
3582865 Franck et al. Jun 1971 A
3654394 Gordon Apr 1972 A
3704455 Scarbrough Nov 1972 A
3718842 Abbott, III et al. Feb 1973 A
3727064 Bottini Apr 1973 A
3746934 Stein Jul 1973 A
3766439 Isaacson Oct 1973 A
3772776 Weisenburger Nov 1973 A
4169642 Mouissie Oct 1979 A
4288841 Gogal Sep 1981 A
4342069 Link Jul 1982 A
4429349 Zachry Jan 1984 A
4437235 McIver Mar 1984 A
4495546 Nakamura Jan 1985 A
4513368 Houseman Apr 1985 A
4547834 Dumont et al. Oct 1985 A
4567543 Miniet Jan 1986 A
4587596 Bunnell May 1986 A
4645944 Uya Feb 1987 A
4656605 Clayton Apr 1987 A
4672421 Lin Jun 1987 A
4682207 Akasaki et al. Jul 1987 A
4696525 Coller et al. Sep 1987 A
4709300 Landis Nov 1987 A
4724611 Hagihara Feb 1988 A
4727513 Clayton Feb 1988 A
4733461 Nakano Mar 1988 A
4739589 Brehm et al. Apr 1988 A
4763188 Johnson Aug 1988 A
4771366 Blake et al. Sep 1988 A
4821007 Fields et al. Apr 1989 A
4823234 Konishi et al. Apr 1989 A
4833568 Berhold May 1989 A
4839717 Phy et al. Jun 1989 A
4850892 Clayton et al. Jul 1989 A
4862249 Carlson Aug 1989 A
4911643 Perry et al. Mar 1990 A
4953060 Lauffer et al. Aug 1990 A
4956694 Eide Sep 1990 A
4972580 Nakamura Nov 1990 A
4982265 Watanabe et al. Jan 1991 A
4983533 Go Jan 1991 A
4985703 Kaneyama Jan 1991 A
4992849 Corbett et al. Feb 1991 A
4992850 Corbett et al. Feb 1991 A
5014115 Moser May 1991 A
5014161 Lee et al. May 1991 A
5016138 Woodman May 1991 A
5025306 Johnson et al. Jun 1991 A
5034350 Marchisi Jul 1991 A
5041015 Travis Aug 1991 A
5053853 Haj-Ali-Ahmadi et al. Oct 1991 A
5065277 Davidson Nov 1991 A
5099393 Bentlage et al. Mar 1992 A
5104820 Go et al. Apr 1992 A
5109318 Funari et al. Apr 1992 A
5117282 Salatino May 1992 A
5119269 Nakayama Jun 1992 A
5138430 Gow, 3rd et al. Aug 1992 A
5138434 Wood et al. Aug 1992 A
5138523 Benck et al. Aug 1992 A
5140405 King et al. Aug 1992 A
5159535 Desai et al. Oct 1992 A
5173840 Kodai et al. Dec 1992 A
5191404 Wu et al. Mar 1993 A
5208729 Cipolla et al. May 1993 A
5214845 King et al. Jun 1993 A
5219377 Poradish Jun 1993 A
5222014 Lin Jun 1993 A
5224023 Smith et al. Jun 1993 A
5229916 Frankeny et al. Jul 1993 A
5229917 Harris et al. Jul 1993 A
5239198 Lin et al. Aug 1993 A
5241454 Ameen et al. Aug 1993 A
5241456 Marcinkiewiez et al. Aug 1993 A
5247423 Lin et al. Sep 1993 A
5252857 Kane et al. Oct 1993 A
5259770 Bates et al. Nov 1993 A
5261068 Gaskins et al. Nov 1993 A
5268815 Cipolla et al. Dec 1993 A
5276418 Klosowiak et al. Jan 1994 A
5281852 Normington Jan 1994 A
5285398 Janik Feb 1994 A
5289062 Wyland Feb 1994 A
5309986 Itoh May 1994 A
5313097 Haj-Ali-Ahmadi et al. May 1994 A
5343366 Cipolla et al. Aug 1994 A
5347428 Carson et al. Sep 1994 A
5362656 McMahon Nov 1994 A
5375041 McMahon Dec 1994 A
5386341 Olson et al. Jan 1995 A
5394300 Yoshimura Feb 1995 A
5397916 Normington Mar 1995 A
5400003 Kledzik Mar 1995 A
5428190 Stopperan Jun 1995 A
5438224 Papageorge et al. Aug 1995 A
5445869 Ishikawa et al. Aug 1995 A
5448511 Paurus et al. Sep 1995 A
5463742 Kobayashi Oct 1995 A
5471367 Krumweide et al. Nov 1995 A
5477082 Buckley, III et al. Dec 1995 A
5491612 Nicewarner, Jr. et al. Feb 1996 A
5502333 Bertin et al. Mar 1996 A
5513135 Dell et al. Apr 1996 A
5523619 McAllister et al. Jun 1996 A
5523695 Lin Jun 1996 A
5541812 Burns Jul 1996 A
5572065 Burns Nov 1996 A
5600178 Russell Feb 1997 A
5612570 Eide et al. Mar 1997 A
5631193 Burns May 1997 A
5642055 Difrancesco Jun 1997 A
5644161 Burns Jul 1997 A
5646446 Nicewarner et al. Jul 1997 A
5654877 Burns Aug 1997 A
5661339 Clayton Aug 1997 A
5686730 Laudon et al. Nov 1997 A
5688606 Mahulikar et al. Nov 1997 A
5708297 Clayton Jan 1998 A
5714802 Cloud et al. Feb 1998 A
5717556 Yanagida Feb 1998 A
5729894 Rostoker et al. Mar 1998 A
5731633 Clayton Mar 1998 A
5739887 Ueda et al. Apr 1998 A
5744862 Ishii Apr 1998 A
5751553 Clayton May 1998 A
5754409 Smith May 1998 A
5764497 Mizumo Jun 1998 A
5776797 Nicewarner, Jr. et al. Jul 1998 A
5777275 Mizutani et al. Jul 1998 A
5789815 Tessier et al. Aug 1998 A
5790447 Laudon et al. Aug 1998 A
5802395 Connolly et al. Sep 1998 A
5805422 Otake et al. Sep 1998 A
5818699 Fukuoka Oct 1998 A
5828125 Burns Oct 1998 A
5835988 Ishii Nov 1998 A
5869353 Levy et al. Feb 1999 A
5899705 Akram May 1999 A
5917709 Johnson et al. Jun 1999 A
5925934 Lim Jul 1999 A
5926369 Ingraham et al. Jul 1999 A
5949657 Karabatsos Sep 1999 A
5953214 Dranchak et al. Sep 1999 A
5953215 Karabatsos Sep 1999 A
5959839 Gates Sep 1999 A
5963427 Bolleson Oct 1999 A
5969945 Cutting et al. Oct 1999 A
5973395 Suzuki et al. Oct 1999 A
5995370 Nakamori Nov 1999 A
5999405 Zappacosta et al. Dec 1999 A
6002167 Hatano et al. Dec 1999 A
6002589 Perino et al. Dec 1999 A
6008538 Akram et al. Dec 1999 A
6014316 Eide Jan 2000 A
6021048 Smith Feb 2000 A
6025992 Dodge et al. Feb 2000 A
6028352 Eide Feb 2000 A
6028365 Akram et al. Feb 2000 A
6034878 Osaka et al. Mar 2000 A
6038132 Tokunaga et al. Mar 2000 A
6040624 Chambers et al. Mar 2000 A
6049975 Clayton Apr 2000 A
6060339 Akram et al. May 2000 A
6061245 Ingraham et al. May 2000 A
6072233 Corisis et al. Jun 2000 A
6078515 Nielsen et al. Jun 2000 A
6084294 Tomita Jul 2000 A
6091145 Clayton Jul 2000 A
6097087 Farnworth et al. Aug 2000 A
6111757 Dell et al. Aug 2000 A
6121676 Solberg Sep 2000 A
RE36916 Moshayedi Oct 2000 E
6157541 Hacke Dec 2000 A
6172874 Bartilson Jan 2001 B1
6178093 Bhatt et al. Jan 2001 B1
6180881 Isaak Jan 2001 B1
6187652 Chou et al. Feb 2001 B1
6205654 Burns Mar 2001 B1
6208521 Nakatsuka Mar 2001 B1
6208546 Ikeda Mar 2001 B1
6214641 Akram Apr 2001 B1
6215181 Akram et al. Apr 2001 B1
6215687 Sugano et al. Apr 2001 B1
6222737 Ross Apr 2001 B1
6222739 Bhakta et al. Apr 2001 B1
6225688 Kim et al. May 2001 B1
6232659 Clayton May 2001 B1
6233650 Johnson et al. May 2001 B1
6234820 Perino et al. May 2001 B1
6262476 Vidal Jul 2001 B1
6262895 Forthun Jul 2001 B1
6265660 Tandy Jul 2001 B1
6266252 Karabatsos Jul 2001 B1
6281577 Oppermann et al. Aug 2001 B1
6288907 Burns Sep 2001 B1
6288924 Sugano et al. Sep 2001 B1
6300679 Mukerji et al. Oct 2001 B1
6307751 Bodony et al. Oct 2001 B1
6316825 Park et al. Nov 2001 B1
6323060 Isaak Nov 2001 B1
6336262 Dalal et al. Jan 2002 B1
6343020 Lin et al. Jan 2002 B1
6347394 Ochoa et al. Feb 2002 B1
6349050 Woo et al. Feb 2002 B1
6351029 Isaak Feb 2002 B1
6357023 Co et al. Mar 2002 B1
6358772 Miyoshi Mar 2002 B2
6360433 Ross Mar 2002 B1
6368896 Farnworth et al. Apr 2002 B2
6370668 Garrett, Jr. et al. Apr 2002 B1
6376769 Chung Apr 2002 B1
6382309 Kroliczek et al. May 2002 B1
6392162 Karabatsos May 2002 B1
6392305 Huang et al. May 2002 B1
6395992 Nakayama May 2002 B1
6404043 Isaak Jun 2002 B1
6410857 Gonya Jun 2002 B1
6426240 Isaak Jul 2002 B2
6426549 Isaak Jul 2002 B1
6426560 Kawamura et al. Jul 2002 B1
6428360 Hassanzadeh et al. Aug 2002 B2
6433418 Fujisawa et al. Aug 2002 B1
6444921 Wang et al. Sep 2002 B1
6446158 Karabatsos Sep 2002 B1
6449159 Haba Sep 2002 B1
6452826 Kim et al. Sep 2002 B1
6459152 Tomita et al. Oct 2002 B1
6462412 Kamei et al. Oct 2002 B2
6465877 Farnworth et al. Oct 2002 B1
6465893 Khandros et al. Oct 2002 B1
6472735 Isaak Oct 2002 B2
6473308 Forthun Oct 2002 B2
6486544 Hashimoto Nov 2002 B1
6489687 Hashimoto Dec 2002 B1
6502161 Perego et al. Dec 2002 B1
6514793 Isaak Feb 2003 B2
6521984 Matsuura Feb 2003 B2
6528870 Fukatsu et al. Mar 2003 B2
6531772 Akram et al. Mar 2003 B2
6544815 Isaak Apr 2003 B2
6552910 Moon et al. Apr 2003 B1
6552948 Woo et al. Apr 2003 B2
6560117 Moon May 2003 B2
6566746 Isaak et al. May 2003 B2
6572387 Burns et al. Jun 2003 B2
6573593 Syri et al. Jun 2003 B1
6576992 Cady et al. Jun 2003 B1
6588095 Pan Jul 2003 B2
6590282 Wang et al. Jul 2003 B1
6590781 Kollipara et al. Jul 2003 B2
6600222 Levardo Jul 2003 B1
6614664 Lee Sep 2003 B2
6627984 Bruce et al. Sep 2003 B2
6629855 North et al. Oct 2003 B1
6646936 Hamamatsu et al. Nov 2003 B2
6660561 Forthun Dec 2003 B2
6661092 Shibata et al. Dec 2003 B2
6677670 Kondo Jan 2004 B2
6683377 Shim et al. Jan 2004 B1
6690584 Uzuka et al. Feb 2004 B2
6699730 Kim et al. Mar 2004 B2
6720652 Akram et al. Apr 2004 B2
6721181 Pfeifer et al. Apr 2004 B1
6721185 Dong et al. Apr 2004 B2
6721226 Woo et al. Apr 2004 B2
6744656 Sugano et al. Jun 2004 B2
6751113 Bhakta et al. Jun 2004 B2
6756661 Tsuneda et al. Jun 2004 B2
6760220 Canter et al. Jul 2004 B2
6762942 Smith Jul 2004 B1
6768660 Kong et al. Jul 2004 B2
6775139 Hsueh Aug 2004 B2
6833981 Suwabe et al. Dec 2004 B2
6833984 Belgacem Dec 2004 B1
6839266 Garrett, Jr. et al. Jan 2005 B1
6841868 Akram et al. Jan 2005 B2
6850414 Benisek et al. Feb 2005 B2
6873534 Bhakta et al. Mar 2005 B2
6878571 Isaak et al. Apr 2005 B2
6884653 Larson Apr 2005 B2
6888719 Janzen et al. May 2005 B1
6914324 Rapport et al. Jul 2005 B2
6919626 Burns Jul 2005 B2
6956284 Cady et al. Oct 2005 B2
6975034 Hennig et al. Dec 2005 B2
7053478 Roper et al. May 2006 B2
7094632 Cady et al. Aug 2006 B2
7106595 Foster et al. Sep 2006 B2
7154751 Furuyama et al. Dec 2006 B2
7157646 Lauffer et al. Jan 2007 B2
7180167 Partrídge et al. Feb 2007 B2
7187552 Stewart et al. Mar 2007 B1
7235871 Corsis Jun 2007 B2
7254036 Pauley et al. Aug 2007 B2
7289327 Goodwin et al. Oct 2007 B2
7393226 Clayton et al. Jul 2008 B2
7394149 Clayton et al. Jul 2008 B2
7443023 Wehrly et al. Oct 2008 B2
7446410 Wehrly et al. Nov 2008 B2
7459784 Wehrly et al. Dec 2008 B2
7480152 Goodwin Jan 2009 B2
20010001085 Hassanzadeh et al. May 2001 A1
20010006252 Kim et al. Jul 2001 A1
20010013423 Dalal et al. Aug 2001 A1
20010015487 Forthun Aug 2001 A1
20010026009 Tsuneda et al. Oct 2001 A1
20010028588 Yamada et al. Oct 2001 A1
20010035572 Isaak Nov 2001 A1
20010040793 Inaba Nov 2001 A1
20010052637 Akram et al. Dec 2001 A1
20020001216 Sugano et al. Jan 2002 A1
20020006032 Karabatsos Jan 2002 A1
20020030995 Shoji Mar 2002 A1
20020034068 Weber et al. Mar 2002 A1
20020038405 Leddige et al. Mar 2002 A1
20020076919 Peters et al. Jun 2002 A1
20020076959 Lee Jun 2002 A1
20020094603 Isaak Jul 2002 A1
20020101261 Karabatsos Aug 2002 A1
20020125039 Marketkar et al. Sep 2002 A1
20020138159 Atkinson Sep 2002 A1
20020139577 Miller Oct 2002 A1
20020164838 Moon et al. Nov 2002 A1
20020180022 Emoto Dec 2002 A1
20020185731 Akram et al. Dec 2002 A1
20020196612 Gall et al. Dec 2002 A1
20030002262 Benisek et al. Jan 2003 A1
20030016710 Kamoto Jan 2003 A1
20030026155 Yamagata Feb 2003 A1
20030035328 Hamamatsu et al. Feb 2003 A1
20030045025 Coyle et al. Mar 2003 A1
20030049886 Salmon Mar 2003 A1
20030064548 Isaak Apr 2003 A1
20030081387 Schulz May 2003 A1
20030081392 Cady et al. May 2003 A1
20030089978 Miyamoto et al. May 2003 A1
20030090879 Doblar et al. May 2003 A1
20030096497 Moore et al. May 2003 A1
20030107118 Pflughaupt et al. Jun 2003 A1
20030109078 Takahashi et al. Jun 2003 A1
20030116835 Miyamoto et al. Jun 2003 A1
20030159278 Peddle Aug 2003 A1
20030168725 Warner et al. Sep 2003 A1
20030234443 Partridge et al. Dec 2003 A1
20040000708 Rapport et al. Jan 2004 A1
20040012991 Kozaru Jan 2004 A1
20040021211 Damberg Feb 2004 A1
20040099938 Kang et al. May 2004 A1
20040105292 Matsui Jun 2004 A1
20040150107 Cha et al. Aug 2004 A1
20040229402 Cady et al. Nov 2004 A1
20040236877 Burton Nov 2004 A1
20040256731 Mao et al. Dec 2004 A1
20040262737 Haba Dec 2004 A1
20050018412 Roper et al. Jan 2005 A1
20050047776 Watanabe et al. Mar 2005 A1
20050057911 Rapport et al. Mar 2005 A1
20050082663 Wakiyama et al. Apr 2005 A1
20050105350 Zimmerman May 2005 A1
20050108468 Hazelzet et al. May 2005 A1
20050133897 Baek et al. Jun 2005 A1
20050138267 Bains et al. Jun 2005 A1
20050146031 Partridge et al. Jul 2005 A1
20050217895 Maharshak et al. Oct 2005 A1
20050242423 Partridge et al. Nov 2005 A1
20050251586 Lin Nov 2005 A1
20050263911 Igarashi et al. Dec 2005 A1
20060020740 Bartley et al. Jan 2006 A1
20060036827 Dell et al. Feb 2006 A1
20060043581 Prokofiev Mar 2006 A1
20060048385 Cady et al. Mar 2006 A1
20060049500 Goodwin Mar 2006 A1
20060049502 Goodwin et al. Mar 2006 A1
20060049512 Goodwin et al. Mar 2006 A1
20060049513 Goodwin Mar 2006 A1
20060050488 Goodwin Mar 2006 A1
20060050489 Wehrly et al. Mar 2006 A1
20060050492 Goodwin et al. Mar 2006 A1
20060050496 Goodwin Mar 2006 A1
20060050497 Goodwin Mar 2006 A1
20060050498 Cady et al. Mar 2006 A1
20060053345 Goodwin Mar 2006 A1
20060083043 Cypher Apr 2006 A1
20060090102 Wehrly et al. Apr 2006 A1
20060091529 Wehrly et al. May 2006 A1
20060095592 Borkenhagen May 2006 A1
20060111866 LeClerg et al. May 2006 A1
20060125067 Wehrly et al. Jun 2006 A1
20060129888 Szewerenko et al. Jun 2006 A1
20060198238 Partridge et al. Sep 2006 A1
20060203442 Goodwin Sep 2006 A1
20060250780 Goodwin et al. Nov 2006 A1
20060261449 Rapport et al. Nov 2006 A1
20070111606 Goodwin May 2007 A1
20070115017 Goodwin et al. May 2007 A1
20070126124 Rapport et al. Jun 2007 A1
20070126125 Rapport et al. Jun 2007 A1
20070176286 Wehrly Aug 2007 A1
20070201208 Goodwin et al. Aug 2007 A1
20070211426 Clayton et al. Sep 2007 A1
20070211711 Clayton Sep 2007 A1
20070212906 Clayton et al. Sep 2007 A1
20070212920 Clayton et al. Sep 2007 A1
20070258217 Roper et al. Nov 2007 A1
20070263359 Lai et al. Nov 2007 A1
20070290313 Partridge Dec 2007 A1
20080013282 Hoss et al. Jan 2008 A1
20080030966 Goodwin Feb 2008 A1
20080030972 Goodwin Feb 2008 A1
20080192428 Clayton et al. Aug 2008 A1
Foreign Referenced Citations (30)
Number Date Country
122-687 (A) Oct 1984 EP
0 298 211 Jan 1989 EP
0527044 Jun 1996 EP
1 119049 Jul 2001 EP
2 130 025 May 1984 GB
53-85159 Jul 1978 JP
58-96756 (A) Jun 1983 JP
63-114195 Mar 1990 JP
3-102862 Apr 1991 JP
5-29534 (A) Feb 1993 JP
5-335695 (A) Dec 1993 JP
2821315 (B2) Nov 1998 JP
11003955 Jan 1999 JP
2000031614 Jan 2000 JP
2001077294 (A) Mar 2001 JP
2001085592 (A) Mar 2001 JP
2001168268 Jun 2001 JP
2001332683 (A) Nov 2001 JP
2002009231 (A) Jan 2002 JP
2002359448 Dec 2002 JP
04-234157 Jan 2003 JP
2003031757 Jan 2003 JP
2003037246 (A) Feb 2003 JP
2003086750 (A) Mar 2003 JP
2003086761 (A) Mar 2003 JP
2003309246 (A) Oct 2003 JP
2003347503 (A) Dec 2003 JP
WO03037053 May 2003 WO
WO 03037053 May 2003 WO
WO 2004109802 Dec 2004 WO
Related Publications (1)
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20060125067 A1 Jun 2006 US
Continuation in Parts (17)
Number Date Country
Parent 11231418 Sep 2005 US
Child 11331969 US
Parent PCT/US2005/028547 Aug 2005 US
Child 11231418 US
Parent 11131835 May 2005 US
Child PCT/US2005/028547 US
Parent 11068688 Mar 2005 US
Child 11131835 US
Parent 11007551 Dec 2004 US
Child 11068688 US
Parent 10934027 Sep 2004 US
Child 11007551 US
Parent 11331969 US
Child 11007551 US
Parent 11005992 Dec 2004 US
Child 11331969 US
Parent 10934027 Sep 2004 US
Child 11005992 US
Parent 11331969 US
Child 11005992 US
Parent 11193954 Jul 2005 US
Child 11331969 US
Parent 11007551 Dec 2004 US
Child 11193954 US
Parent 11331969 US
Child 11193954 US
Parent 11123721 May 2005 US
Child 11331969 US
Parent 11068688 Mar 2005 US
Child 11123721 US
Parent 11005992 Dec 2004 US
Child 11068688 US
Parent 10934027 Sep 2004 US
Child 11005992 US