This invention relates to a flexible circuit board, and more particularly to a layout structure of a flexible circuit board.
Flexible circuit board, which is small in size, bendable and thin, is widely used in mobile devices, such as smartphones, laptops and smartwatches. The current mobile devices are becoming more and more light and thin, the thickness and overall dimension of the flexible circuit board have to be reduced, but that means it is more difficult to manufacture the flexible circuit board. Conventionally, in flip-chip bonding process, a chip is aligned with a flexible substrate, and bumps on the chip are eutectic bonded to circuit layer on the flexible substrate by heating and pressure contacting. As a result, the bumps on the chip may generate stress on the flexible substrate during flip-chip bonding to pull a circuit layer and break circuits.
One object of the present invention is to provide anti-stress circuits to strengthen the area on a flexible substrate where is connected to bumps so as to protect bonding circuits on the area from breaking caused by stress generated during flip-chip bonding.
A layout structure of flexible circuit board includes a flexible substrate, a circuit layer, a flip-chip element and an anti-stress circuit layer. A chip mounting area and a circuit area are defined on a top surface of the flexible substrate. The circuit layer includes a plurality of bonding circuits and transmission circuits which are connected to each other and located on the chip mounting area and the circuit area, respectively. The flip-chip element is disposed on the chip mounting area and includes a chip and a plurality of bumps, the chip includes a long side margin and a plurality of conductive pads, the bumps are provided to connect the conductive pads of the chip and the bonding circuits. The anti-stress circuit layer includes a plurality of anti-stress circuits which are disposed on the chip mounting area and parallel to the long side margin of the chip. The bumps are located between the anti-stress circuits and the long side margin of the chip.
The anti-stress circuits of the present invention are parallel to the long side margin of the chip and used to reduce the stress acting on the flexible substrate and generated by the bumps during flip-chip bonding, thus the bonding circuits of the circuit layer are protected from breaking.
With reference to
With reference to
The flip-chip element 130 is disposed on the chip mounting area 111a defined on the top surface 111 of the flexible substrate 110, and it includes a chip 131 and a plurality of bumps 132. The chip 131 has a long side margin L and a plurality of conductive pads 131a, each of the bumps 132 is provided to connect one of the conductive pads 131a of the chip 131 to one of the bonding circuits 121 of the circuit layer 120. The bumps 132 can be formed on the chip 131 in advance by well known method in the art using gold, copper, nickel, or other metallic or alloy materials.
Preferably, the layout structure of flexible circuit board 100 further includes an anti-stress circuit layer 140. The anti-stress circuit layer 140 includes a plurality of first anti-stress circuits 141 and second anti-stress circuits 142 which are both located on the chip mounting area 111a. The first anti-stress circuits 141 are located adjacent to the first long side margin L1 and aligned in a line parallel to the first long side margin L1, thus the first anti-stress circuits 141 are also parallel to the first long side margin L1. The first bumps B1 of the flip-chip element 130 are located between the first anti-stress circuits 141 and the first long side margin L1, and the first anti-stress circuits 141 are provided to reduce stress, which is acting on the flexible substrate 110 and generated by the first bumps B1, during flip-chip bonding, thus the bonding circuits 121 connected to the first bumps B1 are protected from breaking. The second anti-stress circuits 142 are located adjacent to the second long side margin L2 and aligned in a line parallel to the second long side margin L2, in other words, the second anti-stress circuits 142 are parallel to the second long side margin L2. The second bumps B2 of the flip-chip element 130 are located between the second anti-stress circuits 142 and the second long side margin L2. The second anti-stress circuits 142 can reduce stress, which is acting on the flexible substrate 110 and generated by the second bumps B2 during flip-chip bonding. As a result, the bonding circuits 121 connected to the second bumps B2 are protected from breaking.
In this embodiment, stress generated during flip-chip bonding may damage the bonding circuits 121 due to there are no bumps or circuits between the first anti-stress circuits 141 and the second anti-stress circuits 142, for this reason, the first anti-stress circuits 141 and the second anti-stress circuits 142 have to be arranged adjacent to the first bumps B1 and the second bumps B2 respectively to reduce the stress acting on the bonding circuits 121.
Preferably, in order to prevent the anti-stress circuit layer 140 from obstructing the flow of underfill of the chip 131, a space S having a width W greater than 50 um is provided between the adjacent first anti-stress circuits 141 and between the adjacent second anti-stress circuits 142. Thus, the underfill can flow between the chip 131 and the flexible substrate 110 via the space S.
With reference to
In the present invention, the anti-stress circuits parallel to the long side margin L of the chip 131 are provided to reduce the stress which is generated by the bumps 132 of the flip-chip element 130 and acting on the flexible substrate 110 during flip-chip bonding so as to prevent the bonding circuits 121 of the circuit layer 120 from breaking.
While this invention has been particularly illustrated and described in detail with respect to the preferred embodiments thereof, it will be clearly understood by those skilled in the art that is not limited to the specific features shown and described and various modified and changed in form and details may be made without departing from the scope of the claims.
Number | Date | Country | Kind |
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110129353 | Aug 2021 | TW | national |