The present invention relates generally to magnetoresistive random access memory (MRAM) devices, and more particularly to magnetic shielding of MRAM chips.
Semiconductors are used in integrated circuits for electronic applications, including radios, televisions, cell phones, and personal computing devices, as examples. One type of semiconductor device is a semiconductor storage device, such as a dynamic random access memory (DRAM) or a flash memory, both of which use charge to store information.
A more recent development in semiconductor memory devices involves spin electronics, which combines semiconductor technology and magnetic materials and devices. The spins of electrons, through their magnetic moments, rather than the charge of the electrons, is used to indicate the presence of a “1” or “0”. One such spin electronic device is a magnetoresistive random access memory (MRAM), sometimes referred to as magnetic RAM, device 100, as shown in
In a cross-point magnetic memory device 100, each memory cell or magnetic tunnel junction (MTJ) 102 is disposed over and abuts one wordline WL, as shown. The MTJ 102 of a magnetoresistive memory comprises three layers: ML1, TL and ML2. The MTJ 102 includes a first magnetic layer ML1 disposed over and abutting the wordline WL. The first magnetic layer ML1 is often referred to as a fixed layer because its magnetic orientation is fixed. A tunnel layer or tunnel barrier layer TL comprising a thin dielectric layer is formed over the fixed layer ML1. A second magnetic layer ML2 is formed over the tunnel barrier layer TL. The second magnetic layer ML2 is often referred to as a free layer because its magnetic orientation can be switched along one of two directions. The first and second magnetic layers ML1 and ML2 may comprise one or more material layers, for example.
Each MTJ 102 has a second conductive line or bitline BL disposed over and abutting the second magnetic layer ML2, as shown in
Either one of the first or second magnetic layers ML1 and ML2 may comprise a hard magnetic material (and is the fixed layer), and the other comprises a soft magnetic material (and is the free layer), although in the discussion herein, the first magnetic layer ML1 comprises the hard magnetic material, and the second magnetic layer ML2 comprises the soft magnetic material. The value of the resistance of the cell or MTJ 102 depends on the way in which the magnetic moment of the soft magnetic layer ML2 is oriented in relation to the magnetic moment of the hard magnetic layer ML1. The resistance of the magnetic memory cell 102 depends on the moment's relative alignment. The resistance RC is usually lower if the magnetic layers have parallel magnetic orientations. For example, if the first and second magnetic layers ML1 and ML2 are oriented in the same direction, as shown in
The hard magnetic layer ML1 is usually oriented once during manufacturing. The information of the cell 102 is stored in the soft magnetic layer ML2. As shown in
An advantage of MRAM devices compared to traditional semiconductor memory devices such as dynamic random access memory (DRAM) devices is that MRAM devices are non-volatile. For example, a personal computer (PC) utilizing MRAM devices would not have a long “boot-up” time as with conventional PCs that utilize DRAM devices. Also, an MRAM device does not need to be powered up and has the capability of “remembering” the stored data (also referred to as a non-volatile memory). MRAM devices have the capability to provide the density of DRAM devices and the speed of static random access memory (SRAM) devices, in addition to non-volatility. Therefore, MRAM devices have the potential to replace flash memory, DRAM and SRAM devices in electronic applications where memory devices are needed in the future.
The orientation of the magnetic fields of the MRAM memory device, however, may be affected by external magnetic fields. Undesired external magnetic fields may change the orientation of the MRAM memory so that the memory may record wrong states. The sources of external magnetic fields include conducted interference via wire or cable. Other unwanted fields including electromagnetic pulses of wide dynamic range can be caused by local severe thunderstorms and improperly grounded power cable systems acting as antennas for switching transients on the power lines, or for the low-frequency power currents. Unexpected and unpredictable sources and combinations may not be completely identified and avoided. Conventionally, magnetic shielding is fabricated on/in chip packages of the MRAM chips. However, since different materials from conventional packaging materials are used, packaging is more expensive. Additionally, the shielding effect is limited.
Therefore, there is a need for a method and/or a structure for protecting the MRAM chips from external magnetic fields.
In accordance with one aspect of the present invention, an apparatus includes an MRAM module and a protective cover. The MRAM module includes a circuit board and at least one memory chip attached to the circuit board, and the memory chip includes magnetoresistive random access memory (MRAM) cells. The protective cover is formed of magnetic shielding material and at least partially encloses the memory chip. All edges and sides of the MRAM module are preferably enclosed except the edge with contact pads. In some embodiments, openings may be formed in the protective layer. An insulating layer is preferably formed between the protective cover and conductive components on the circuit board.
In accordance with another aspect of the present invention, instead of substantially enclosing the entire MRAM module, the protective cover covers one or more MRAM chips from the topside and extends to the surface of the circuit board that the MRAM chip is attached to. However, the protective cover does not extend to edges of the circuit board. An additional protective cover can be further attached to the opposite side of the circuit board where the MRAM chips are attached.
In accordance with another aspect of the present invention, an MRAM chip is magnetically shielded with a protective cover. The MRAM chip is packaged through standard packaging processes. The protective cover is pre-formed and assembled to the MRAM chip.
In accordance with yet another aspect of the present invention, a method of manufacturing a memory device includes attaching a protective cover to a circuit board, wherein the circuit board includes a memory chip that contains MRAM cells. The protective cover at least partially encloses the memory chip after the attaching. The protective cover can be pre-formed and assembled to the circuit, or molded to the circuit board if the protective cover contains material containing magnetic shielding particles.
An advantageous feature of the present invention is that no customized MRAM chip packaging is required and thus cost is lowered. Another advantageous feature of the present invention is that the shielding effectiveness can be adjusted according to the work environment the MRAM chips are subjected to.
For a more complete understanding of the present invention, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:
The making and using of the presently preferred embodiments are discussed in detail below. It should be appreciated, however, that the present invention provides many applicable inventive concepts that can be embodied in a wide variety of specific contexts. The specific embodiments discussed are merely illustrative of specific ways to make and use the invention, and do not limit the scope of the invention.
Standard memory chips and memory modules are typically not magnetically shielded. This posts a problem for MRAM chips and may cause states of MRAM cells to be wrongfully changed. A protective cover 206, sometimes referred to as a protective casing, is attached to the memory module 201. In the preferred embodiment, the protective cover 206 is made of materials with high permeability such as Mu-metal. As known in the art, Mu-metal is nickel-iron alloy generally used for magnetic shielding. One typical Mu-metal includes about 5 percent copper, 2 percent chromium, 77 percent nickel, and 16 percent iron. Another well-known Mu-metal alloy comprises about 77 percent nickel, 15 percent iron, and other materials such as copper and molybdenum.
In another embodiment of the present invention, the protective cover 206 may have a composite structure including two or more layers. Each of the layers serves one purpose. When combined, the composite structure has an improved magnetic shielding effect. For example, a protective cover 206 suitable for both high and low frequency shielding has a first layer formed of Mu-metal, and a second layer formed of materials such as copper, galvanized steel, aluminum, and some specially treated rubber and plastics. The second layer shields the memory module from high frequencies through its high conductivity characteristics.
In yet other embodiments, the composite protective layer 206 includes a first layer with higher permeability and a second layer with a higher saturation value, wherein the second layer is used to extend the limiting point so that very strong magnetic fields can be shielded. The protective cover preferably reduces the magnitude of the magnetic field at the MRAM chip by about 20 percent, more preferably by about 50 percent, and even more preferably by about 80 percent. Since magnetic shield effectiveness is generally proportional to the thickness of the protective cover 206, particularly at low frequencies, a thicker protective cover is preferred. It is to be appreciated that the appropriate material and thickness depend on the magnitude and characteristics of the magnetic field the memory module is subjected to, and can be found out through measurements.
In the preferred embodiment, the protective cover 206 can be pre-formed and attached to the memory module. Preferably, a shielding material with high permeability, such as a Mu-metal sheet, is bent and shaped to a desired shape, and attached to the memory module by commonly used methods such as crimping, soldering, screwing, and the like. An advantage of this embodiment is that the attenuation, which measures the ratio of the magnetic field being shielded, can be adjusted easily according to the work environment of the MRAM chips. If one protective cover does not provide adequate shielding by reducing magnetic fields to an acceptable level, it can be replaced with another one with better shielding effects. If magnetic shielding material is integrated into the MRAM chip package, changing packaging processes is much more costly.
Alternatively, the protective cover 206 can be molded to the memory module so that the protective cover 206 and the memory module become an integrated unit. The molding material is preferably a magnetic shielding material, such as materials containing magnetic shielding particles. The molding material may also contain materials such as epoxy, plastic, rubber, glue, and the like, and the resulting mixture will have a good permeability.
Since magnetic shielding material is typically electrically conductive, a non-conductive layer is preferably formed to insulate the protective cover 206 and other conductive components on the memory module 201.
Although a protective cover 206 provides better magnetic shielding when the ends 205, 207, 209, and top and bottom sides are wrapped inside, sometimes openings have to be formed. For example, sockets are commonly formed at the end 205 and/or the topside for incoming or outgoing signals. Contact pads may also be distributed along more than one edge so that these edges must also be exposed through the protective cover.
Enclosing the entire board is not always convenient. A circuit board may have a limited number of memory chips, and other components cannot be magnetically shielded. Therefore, instead of enclosing most of the board, as illustrated in
In the preferred embodiment, the protective cover 226 is formed by molding or otherwise adhering a magnetic material on the memory chip 224. Similar to the molding of a memory module as shown in the previously discussed embodiment, the molding material includes magnetic shielding materials, such as materials containing magnetic shielding particles, and other materials such as epoxy, plastic, rubber, glue, etc. Both the insulating layer 228 and the protective cover 226 preferably have good heat conductivity. In alternative embodiments, the protective cover 226 can be pre-made and assembled to the circuit board 220, and the protective cover 226 may be formed of sheet metals such as alloys with high permeability. In yet other embodiments, if more than one MRAM chips are closely spaced, one protective cover is preferably used to shield all closely spaced MRAM chips.
In each of the embodiments described above, the magnetic shielding was described as surrounding the MRAM chips after they are attached to circuit boards. While this configuration minimizes any effects of magnetic radiation, it may be inconvenient for manufacturing purposes. Therefore, another embodiment of the present invention envisions a magnetic shielding that covers MRAM chips, as illustrated in
In
If among four edges of the MRAM chips, one or more sides have no pins, the top and bottom protective covers 2461, 2462 can be in contact physically on these sides.
In other embodiments, the protective 246 is an integrated unit, instead of being formed of two portions, and better magnetic shielding effect can be achieved. However, some shaping may be required after the protective cover is attached to the MRAM chip 244.
The embodiment shown in
The preferred embodiments of the present invention have some advantageous features. Firstly, the magnetic shielding is not fabricated along with the MRAM chip package, and standard packaging processes can be performed. This avoids expensive customized packaging. Secondly, since the magnetic shielding is assembled after the MRAM chips are attached to the MRAM modules, appropriate magnetic shielding can be applied according to the strength of the external magnetic field. For example, at locations where high magnetic fields are present, thicker protective covers with composite structures and high permeability can be used. In locations where magnetic fields are low, thin and less expensive protective covers can be used. Thirdly, the preferred embodiments of the present invention can be easily formed and assembled.
Although the present invention and its advantages have been described in detail, it should be understood that various changes, substitutions and alterations can be made herein without departing from the spirit and scope of the invention as defined by the appended claims. Moreover, the scope of the present application is not intended to be limited to the particular embodiments of the process, machine, manufacture, and composition of matter, means, methods and steps described in the specification. As one of ordinary skill in the art will readily appreciate from the disclosure of the present invention, processes, machines, manufacture, compositions of matter, means, methods, or steps, presently existing or later to be developed, that perform substantially the same function or achieve substantially the same result as the corresponding embodiments described herein may be utilized according to the present invention. Accordingly, the appended claims are intended to include within their scope such processes, machines, manufacture, compositions of matter, means, methods, or steps.