Embodiments of the present disclosure relate in general to a microphone package, and in particular they relate to a micro-electro-mechanical system (MEMS) microphone package.
The current trend in personal electronics is toward fabricating slim, compact, lightweight and high-performance electronic devices, including microphones. A microphone is used to receive sound waves and convert acoustic signals into electric signals. Microphones are widely used in everyday life and are installed in such electronic products as telephones, mobiles phones, and recording pens. In a capacitive microphone, variations in acoustic pressure (i.e., local pressure deviation from the ambient atmospheric pressure caused by sound waves) force the diaphragm to deform correspondingly, and the deformation of the diaphragm induces a capacitance variation. The variation of acoustic pressure of the sound waves can thus be obtained by detecting voltage difference caused by capacitance variation.
This is distinct from conventional electret condenser microphones (ECM), in which mechanical and electronic elements of micro-electro-mechanical system (MEMS) microphones can be integrated on a semiconductor material using integrated circuit (IC) technology to fabricate a miniature microphone. MEMS microphones have such advantages as a compact size, being lightweight, and having low power consumption, and they have therefore entered the mainstream of miniaturized microphones.
Existing MEMS microphones usually use a wire-bonding package, which needs to reserve space for wire-bonding (e.g., the space between the chip and the MEMS microphone, or the space between the chip and the cap), so that the size (volume) of the MEMS microphone package cannot be effectively reduced.
The micro-electro-mechanical system (MEMS) microphone package in the embodiments according to the present disclosure may use a stack structure instead of wire bonding, which can effectively reduce the amount of space in the package, thereby reducing the overall size of the package.
Some embodiments of the present disclosure include a MEMS microphone package. The MEMS microphone package includes a substrate and a circuit device, the substrate has a conductive structure, and the circuit device has through silicon via structures that are electrically connected to the conductive structure. The MEMS microphone package also includes a sensor disposed on the substrate and having a connecting structure disposed on the bottom of the sensor. The connecting structure is electrically connected to the substrate and the circuit device. The MEMS microphone package further includes a cap covering the circuit device and the sensor and separated from the circuit device and the sensor.
In some embodiments, the circuit device is embedded in the substrate.
In some embodiments, a portion of the sensor is stacked on the circuit device.
In some embodiments, the MEMS microphone package further includes an underfill glue and solder balls, the underfill glue is disposed between the circuit device and the substrate, and the solder balls penetrate the underfill glue and electrically connected to the through silicon via structures and the conductive structure.
In some embodiments, the sensor includes a sensing structure for sensing sound waves.
In some embodiments, the substrate has an acoustic port corresponding to the sensing structure.
In some embodiments, the cap includes an acoustic port for receiving sound waves.
Some embodiments of the present disclosure include a MEMS microphone package. The MEMS microphone package includes a substrate and a circuit device mounted on the substrate in the form of a flip-chip. The MEMS microphone package also includes a sensor disposed on the substrate and electrically connected to the substrate and the circuit device. The MEMS microphone package further includes a cap disposed on the substrate and covering the circuit device and the sensor.
In some embodiments, the circuit device is embedded in the substrate and has through silicon via structures electrically connected to the substrate.
In some embodiments, a portion of the circuit device is disposed between the substrate and the sensor.
In some embodiments, the circuit device has a conductive pad, and the sensor has a connecting structure that is connected to the conductive pad.
In some embodiments, the sensor is adjacent to the circuit device and electrically connected to the circuit device by an interconnection structure embedded in the substrate.
In some embodiments, the MEMS microphone package further includes an acoustic port penetrating the substrate or the cap.
Aspects of the embodiments of the present disclosure can be understood from the following detailed description when read with the accompanying figures. It should be noted that, in accordance with the standard practice in the industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion.
The following disclosure provides many different embodiments, or examples, for implementing different features of the subject matter provided. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting. For example, a first feature is formed on a second feature in the description that follows may include embodiments in which the first feature and second feature are formed in direct contact, and may also include embodiments in which additional features may be formed between the first feature and second feature, so that the first feature and second feature may not be in direct contact. In addition, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.
It should be understood that additional steps may be implemented before, during, or after the illustrated methods, and some steps might be replaced or omitted in other embodiments of the illustrated methods.
Furthermore, spatially relative terms, such as “beneath,” “below,” “lower,” “on,” “above,” “upper” and the like, may be used herein for ease of description to describe one element or feature's relationship to other elements or features as illustrated in the figures. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. The apparatus may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein may likewise be interpreted accordingly.
In the present disclosure, the terms “about,” “approximately” and “substantially” typically mean +/−20% of the stated value, more typically +/−10% of the stated value, more typically +/−5% of the stated value, more typically +/−3% of the stated value, more typically +/−2% of the stated value, more typically +/−1% of the stated value and even more typically +/−0.5% of the stated value. The stated value of the present disclosure is an approximate value. That is, when there is no specific description of the terms “about,” “approximately” and “substantially”, the stated value includes the meaning of “about,” “approximately” or “substantially”.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It should be understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined in the embodiments of the present disclosure.
The present disclosure may repeat reference numerals and/or letters in following embodiments. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.
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The underfill glue 26 may include insulating material. The insulating material may include, for example, an oxide such as silicon oxide, a nitride such as silicon nitride, the like, or a combination thereof. The insulating material may be deposited in the trench formed in the substrate 10, and the insulating material may be deposited by metal organic chemical vapor deposition (MOCVD), ALD, MBE, LPE, the like, or a combination thereof.
A mask layer (not illustrated) may be disposed on the insulating material, and then an etching process is performed to etch the insulating material to form the underfill glue 26. The underfill glue 26 may have a trench and concave holes that expose the conductive pads 14 of the substrate 10.
For example, the mask layer may include a photoresist, such as a positive photoresist or a negative photoresist. Moreover, the mask layer may include a hard mask and may include silicon oxide (SiO2), silicon nitride (SiN), silicon oxynitride (SiON), silicon carbide (SiC), silicon carbonitride (SiCN), the like, or a combination thereof. The mask layer may be a single layer or a multilayer structure. The mask layer may be formed by a deposition process, a photolithography process, other suitable processes, or a combination thereof. The deposition process includes spin-on coating, CVD, ALD, the like, or a combination thereof. For example, the photolithography process may include photoresist coating (for example, spin coating), soft baking, mask aligning, exposure, post-exposure baking (PEB), developing, rinsing, drying (for example, hard baking), other suitable processes, or a combination thereof.
Then, the solder balls 28 may be formed in the concave holes, and the circuit device 20 is formed in the trench of the underfill glue 26, so that the through silicon via structures 22 are connected to the solder balls 28.
In other words, the solder balls 28 may be in direct contact with the conductive pad 14, and the inner-conductive line 16 of the substrate 10 may connect the conductive pad 14 to the conductive structure 12, so that the circuit device 20 may be electrically connected to the conductive structure 12, but the present disclosure is not limited thereto.
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The sensor 30 may be a MEMS microphone. In this embodiment, the sensor includes a sensing structure 32 for sensing sound waves. For example, the sensing structure 32 may include a backplate and a diaphragm that face each other.
The backplate may have sufficient stiffness such that it would not be bending or movable when the sound waves pass through the backplate. For example, the backplate may be a stiff perforated element, but the present disclosure is not limited thereto. The diaphragm is movable or displaceable relative to the backplate. The diaphragm is configured to sense the sound waves received from an acoustic port AP.
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For example, the connecting structure 34 may be a gold ball and surrounded by a metal glue 36. The metal glue 36 may be a silver glue, but the present disclosure is not limited thereto. Moreover, the sensor 30 may include a die-bonding glue 38 that connects the substrate 10 and the circuit device 20. The die-bonding glue 38 may include insulating material. Examples of the insulating material have described above, and will not be repeated here.
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The MEMS microphone package 104 shown in
Although the preceding figures all show that there are one circuit device 20 and one sensor 30 disposed on the substrate 10, the present disclosure is not limited thereto.
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As noted above, in the embodiments of the present disclosure, since the MEMS microphone package may use a stack structure instead of wire bonding. This can effectively reduce the amount of space in the package, thereby reducing the overall size of the package. The foregoing outlines features of several embodiments so that those skilled in the art may better understand the aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they may make various changes, substitutions, and alterations herein without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection should be determined through the claims. In addition, although some embodiments of the present disclosure are disclosed above, they are not intended to limit the scope of the present disclosure.
Reference throughout this specification to features, advantages, or similar language does not imply that all of the features and advantages that may be realized with the present disclosure should be or are in any single embodiment of the disclosure. Rather, language referring to the features and advantages is understood to mean that a specific feature, advantage, or characteristic described in connection with an embodiment is included in at least one embodiment of the present disclosure. Thus, discussions of the features and advantages, and similar language, throughout this specification may, but do not necessarily, refer to the same embodiment.
Furthermore, the described features, advantages, and characteristics of the disclosure may be combined in any suitable manner in one or more embodiments. One skilled in the relevant art will recognize, in light of the description provided herein, that the disclosure can be practiced without one or more of the specific features or advantages of a particular embodiment. In other instances, additional features and advantages may be recognized in certain embodiments that may not be present in all embodiments of the disclosure.
This application claims the benefit of U.S. Provisional Application No. 63/347,592, filed on Jun. 1, 2022, the entirety of which is incorporated by reference herein.
Number | Date | Country | |
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63347592 | Jun 2022 | US |