The present disclosure is generally related to filled vias and more particularly is related to a method and apparatus for an improved filled via.
Filled vias are utilized in circuit manufacturing. As an example, a circuit may be formed on each side of a substantially flat substrate. To electrically connect elements on opposing sides of the substrate, a hole or via may be formed in the substrate, which is filled with a conductive material or fill. The electrical elements then utilize the conductive material to form an electrical path through the substrate. The hole filled with conductive material is an example of a filled via.
One common method of forming a filled via is to insert a paste made substantially with metal and glass. The paste is heated to a high temperature and, as it cools within the via, it forms a mechanical connection with the walls of the via. Up to approximately 80-85% of the paste may be metal and at least 10% of the paste may be glass. The glass is important because without the glass, or a comparable substance, the metal would be unable to form an adequate mechanical connection with the walls of the via. Also, other conductive metals beyond gold may be utilized in the paste, but gold is recognized as having more favorable properties as compared with other available metals. Tungsten and Copper Tungsten are examples of other compatible metals, for this process, although each still requires a significant percentage of glass or comparable substance.
While described as ‘pastes’, it should be noted that, after cooling, each of the pastes has the approximate rigidity of metal. Also, as glass is not a good conductor of heat or electricity, a metal and glass paste is not as good a conductor of heat or electricity as a pure metal system would be.
A via filling process that requires fewer process steps, provides a hermetic bond to the substrate, and/or allows for greater thermal and electrical conductivity would be desirable.
Embodiments of the present disclosure provide a system and method for filling a via. Briefly described, in architecture, one embodiment of the system, among others, can be implemented as follows. The system includes a substrate. At least one opening is formed in the substrate. The opening includes at least one wall. A metallic adhesion layer is formed in the opening and chemically bonded to the wall. A braze fill material is deposited in the opening and chemically bonded to the metallic adhesion layer.
The present disclosure can also be viewed as providing methods for filling a via. In this regard, one embodiment of such a method, among others, can be broadly summarized by the following steps: forming an opening in a substrate, wherein the opening comprises at least one wall; chemically bonding a metallic adhesion layer to the wall; and chemically bonding a braze fill material to the metallic adhesion layer to fill the opening.
Other systems, methods, features, and advantages of the present disclosure will be or become apparent to one with skill in the art upon examination of the following drawings and detailed description. It is intended that all such additional systems, methods, features, and advantages be included within this description, be within the scope of the present disclosure, and be protected by the accompanying claims.
Many aspects of the invention can be better understood with reference to the following drawings. The components in the drawings are not necessarily to scale. Instead emphasis is being placed upon illustrating clearly the principles of the present disclosure. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
The braze fill material 122 may be a single metal, such as gold, or it may be an alloy such as TiCuSiI. The metallic adhesion layer 120 is used to cover the laser residue 126. Once the metallic adhesion layer 120 is applied, the braze fill material 122 may be applied. The braze fill material 122 may be heated to an approximate melting point of the braze fill material 122 and completing the bonding to the metallic adhesion layer 120.
As is shown by block 302, an opening 116 is formed in a substrate 112, wherein the opening 116 includes at least one wall 118. A metallic adhesion layer 120 is chemically bonded to the wall 118 (block 304). The braze fill material 122 is chemically bonded to the metallic adhesion layer 120 (block 306).
The metallic adhesion layer 120 and the braze fill material 122 may be chemically bonded by heating the materials to their melting points before applying them to the wall 118 of the substrate 112. The braze fill material 122 will not chemically bond directly to the wall 118 without application of the metallic adhesion layer 120 as an intermediary. The belief is that the materials that have been utilized for the braze fill material 122 cannot bond to a rough surface, such as a surface that contains laser residue 126. While it is called laser residue 126, drilling and water-jet machining can leave a similar uneven surface. The metallic adhesion layer 120 may be applied by sputtering. Either chemical bonding step may be performed in a controlled atmosphere chamber, which may be useful at least for the purpose of diminishing and/or avoiding oxidation of the metallic adhesion layer 120 or the braze fill material 122, if either material is susceptible to oxidation. The braze fill material 122 may be primarily a single metal, at least 90% by weight. The braze fill material 122 may be primarily gold, at least 90% by weight. The braze fill material 122 may be approximately 100% gold.
It should be emphasized that the above-described embodiments of the present disclosure, particularly, any “preferred” embodiments, are merely possible examples of implementations, merely set forth for a clear understanding of the principles of the disclosed system and method. Many variations and modifications may be made to the above-described embodiments of the disclosure without departing substantially from the spirit and principles of the disclosure. All such modifications and variations are intended to be included herein within the scope of this disclosure and protected by the following claims.
This application claims benefit of U.S. Provisional Application Ser. No. 61/172,935 filed Apr. 27, 2009, the entire disclosure of which is incorporated herein by reference.
Number | Name | Date | Kind |
---|---|---|---|
4032350 | Greenstein | Jun 1977 | A |
4925723 | Bujatti et al. | May 1990 | A |
4942076 | Panicker et al. | Jul 1990 | A |
5159433 | Kazami et al. | Oct 1992 | A |
5285107 | Kazami et al. | Feb 1994 | A |
5519176 | Goodman et al. | May 1996 | A |
5565706 | Miura et al. | Oct 1996 | A |
5599744 | Koh et al. | Feb 1997 | A |
5717247 | Koh et al. | Feb 1998 | A |
5832600 | Hashimoto | Nov 1998 | A |
5916425 | Leader et al. | Jun 1999 | A |
5922245 | Mohri et al. | Jul 1999 | A |
6066889 | Jones et al. | May 2000 | A |
6090436 | Miyoshi | Jul 2000 | A |
6243945 | Fujimoto et al. | Jun 2001 | B1 |
6830823 | Kodas et al. | Dec 2004 | B1 |
7297469 | Toyota et al. | Nov 2007 | B2 |
20010006456 | Fujimoto et al. | Jul 2001 | A1 |
20050064707 | Shinha | Mar 2005 | A1 |
20050146049 | Kripesh et al. | Jul 2005 | A1 |
20060078829 | Toyota et al. | Apr 2006 | A1 |
20070222083 | Kripesh et al. | Sep 2007 | A1 |
20080000678 | Johnston et al. | Jan 2008 | A1 |
20080247703 | Kodama et al. | Oct 2008 | A1 |
Number | Date | Country |
---|---|---|
2001332650 | Nov 2001 | JP |
1020000059312 | Oct 2000 | KR |
Number | Date | Country | |
---|---|---|---|
20100270062 A1 | Oct 2010 | US |
Number | Date | Country | |
---|---|---|---|
61172935 | Apr 2009 | US |