Patent Application
20210366788
The present disclosure relates to a method for manufacturing a semiconductor device and a method for manufacturing a power control circuit.
Japanese Patent No. 6104363 discloses a test apparatus for conducting a current-carrying test on a P-N junction diode incorporated in a semiconductor element and a test condition for the current-carrying test. The semiconductor element is a metal-oxide-semiconductor field-effect transistor (MOSFET), or the like, using silicon carbide (SiC), and the P-N junction diode is subjected to current application.
In a case where forward current is applied to a MOSFET using SiC, bipolar degradation may occur in which forward voltage increases with expanding lamination defects. In order to reduce the bipolar degradation, a buffer layer is formed on a substrate, and a drift layer is formed on the buffer layer, so that bipolar current does not reach a lamination defect in the substrate.
“High Reliable 4H—SiC Epitaxial Wafer with BPD Free Recombination-Enhanced Buffer Layer for High Current Applications”, Hironori Itoh et. al., ICSCRM, 2019 discloses a method for setting density of a lamination defect included in a buffer layer significantly smaller than density of a lamination defect included in a substrate.
However, in order to reduce occurrence of bipolar degradation in the market, it is desirable to identify a semiconductor element including a lamination defect in a buffer layer with a current-carrying test and prevent an outflow of the semiconductor element to the market. Meanwhile, a necessary and sufficient condition for a current-carrying test varies depending on a use condition, such as current density or maximum bonding temperature, of a semiconductor element. However, in order to ensure impossibility of growth of a lamination defect in the buffer layer during lifetime of the semiconductor element, a high temperature, long time, or high current-density current-carrying test may be required.
Further, Japanese Patent No. 6289287 discloses a current-carrying test conducted chip by chip by using laminated metal foil for an increase in current density in a current-carrying test.
In a case where a current-carrying test has been conducted as disclosed in Japanese Patent No. 6104363, degradation of an electrode included in a semiconductor element is required to be reduced in order to incorporate the semiconductor element into a semiconductor device after the current-carrying test. Therefore, test temperature when a current-carrying test is conducted is required be limited to 230° C. or lower. By setting test temperature high, it is possible to reduce current application time when a current-carrying test is conducted. However, the current application time is required to be set in units of minutes when the current-carrying test is actually conducted, because the test temperature is limited due to a restriction of a process after the current-carrying test. Further, in a case where a current-carrying test is conducted on a semiconductor element through which current having large current density flows, a condition for the current-carrying test is required to be strict. Therefore, longer current application time is required. In addition, depending on a specification of electrodes included in the semiconductor element or on how the electrodes are mounted, a screening test is required to be conducted at a lower temperature. Therefore, longer current application time is required. In addition, because the current-carrying test is conducted chip by chip, more test apparatuses are required to be subjected to the current-carrying test. Further, because a current-carrying test of a semiconductor element itself is conducted, a transport system for transporting the semiconductor element, a probe jig for conducting the current-carrying test, or the like, is required to be precise. As a result, costs for the test apparatuses increase. These problems reduce productivity of semiconductor devices.
In a case where a current-carrying test is conducted chip by chip by using laminated metal foil as disclosed in Japanese Patent No. 6289287, the laminated metal foil is required to be replaced every time current is applied. Therefore, an indirect member cost of the laminated metal foil increases. In addition, an operating rate of the test apparatus subjected to the current-carrying test decreases. These problems raise costs for semiconductor devices.
It is also conceivable that a current-carrying test is conducted on a semiconductor device including a plurality of modularized semiconductor elements. However, a lamination defect is more likely to be included and a defective rate may rise in a case where a current-carrying test is conducted on the semiconductor device, as compared with a case where the current-carrying test is conducted on a single non-modularized semiconductor element. In addition, a larger test apparatus to be subjected to the current-carrying test may be required. Further, heat resistant temperature of a peripheral member other than the semiconductor element may restrict test temperature for when the current-carrying test is conducted. Further, heat generated by the semiconductor element during the current-carrying test may be trapped inside the semiconductor device, raising temperature inside the semiconductor device. Further, in a case where a plurality of semiconductor elements is electrically connected in parallel, test current may unevenly flow into a specific semiconductor element having a low forward characteristic, and excessive current may flow into the specific semiconductor element due to an effect of a difference in forward characteristics of a plurality of P-N junction diodes incorporated in the respective plurality of semiconductor elements. These problems reduce productivity of semiconductor devices.
The present disclosure has been made to solve the above-mentioned problems.
An object of the present disclosure is to, in a case where a P-N junction diode current-carrying test is conducted on a semiconductor device, improve productivity of a semiconductor device, reduce a cost for the semiconductor device, and reduce an increase in temperature of a current-carrying semiconductor element in the current-carrying test.
In a method for manufacturing a semiconductor device according to the present disclosure, a back surface of each of a plurality of current-carrying semiconductor elements each having a plurality of P-N junction diodes built-in is connected to a first principal surface of a conductor plate. Further, a conductor piece is connected to a front surface of each of the plurality of current-carrying semiconductor elements. Then, a current-carrying test is conducted on the plurality of P-N junction diodes with a second principal surface of the conductor plate exposed on a bottom surface of an intermediate product of a semiconductor device including the plurality of current-carrying semiconductor elements, the conductor plate, and the conductor piece.
According to the present disclosure, a current-carrying test is conducted on a plurality of P-N junction diodes with the P-N junction diodes included in an intermediate product of a semiconductor device. Therefore, a screening test for a plurality of current-carrying semiconductor elements can be conducted simultaneously. As a result, productivity of a semiconductor device can be improved.
Further, according to the present disclosure, a test probe used for a current-carrying test can be applied to a conductor piece. Therefore, it is possible to reduce damage by the test probe to a surface electrode of a current-carrying semiconductor element. In addition, the conductor piece can be utilized as metal film for electrode bonding in a later assembly process. As a result, a cushioning material such as metal foil for protecting the surface electrode of the current-carrying semiconductor element is unnecessary, by which a cost for the semiconductor device can be reduced.
Further, according to the present disclosure, heat generated by a current-carrying semiconductor element in a current-carrying test is absorbed by the conductor plate, and is effectively released from a second principal surface of the conductor plate exposed on a bottom surface of an intermediate product to a test stage, or the like. As a result, it is possible to reduce an increase in temperature of the current-carrying semiconductor element in the current-carrying test.
These and other objects, features, aspects and advantages of the present disclosure will become more apparent from the following detailed description of the present disclosure when taken in conjunction with the accompanying drawings.
A method for manufacturing a semiconductor device according to the first preferred embodiment includes steps S1 to S12 illustrated in
A semiconductor device 1 manufactured by the method for manufacturing a semiconductor device according to the first preferred embodiment, which is illustrated in
In step S1, as illustrated in
In step S2, as illustrated in
Steps S1 and S2 may or may not be performed simultaneously. Steps S1 and S2 may be performed in any order.
In step S3, as illustrated in
In step S4, as illustrated in
In step S5, as illustrated in
A sinter bonding material used for sinter bonding performed in steps S3, S4 and S5 is a material including Ag, Cu, or the like. The sinter bonding is performed through a pressure bonding process or a pressure-free bonding process.
Steps S3, S4 and S5 may or may not be performed simultaneously. Steps S3, S4, and S5 may be performed in any order.
In step S6, as illustrated in
By performing steps S1 to S6, it is possible to obtain the first intermediate product 1A of the semiconductor device 1 including the plurality of current-carrying semiconductor elements 11, the relay board 12, the two or more gate electrodes 15, the two or more source electrodes 16, the conductor plate 31, the conductor piece 32, and the two or more conductive wires 35, which are illustrated in
In step S7, a current-carrying test is conducted on a plurality of P-N junction diodes included in the plurality of current-carrying semiconductor elements 11 of the first intermediate product 1A of the semiconductor device 1 with the second principal surface 31b of the conductor plate 31 exposed on the bottom surface 1Ab of the first intermediate product 1A of the semiconductor device 1. In a case where the current-carrying test is conducted on a semiconductor module, an insulation material is attached to the second principal surface 31b of the conductor plate 31.
When the current-carrying test is conducted, the second principal surface 31b of the conductor plate 31 is placed on a current application stage. Thus, a common drain potential is applied to the plurality of current-carrying semiconductor elements 11. Further, heat generated by the plurality of current-carrying semiconductor elements 11 can be released from the plurality of current-carrying semiconductor elements 11 via the conductor plate 31 and the current application stage. Moreover, heat for raising test temperature of the plurality of current-carrying semiconductor elements 11 when a current-carrying test is conducted can be flowed into the plurality of current-carrying semiconductor elements 11 via the current application stage and the conductor plate 31.
The second gate pad 21-2 is electrically probed when a current-carrying test is conducted. Thus, a common gate potential is applied to the two or more current-carrying semiconductor elements 11. In addition, two or more conductor pieces 32 are electrically probed. Thus, each of source potentials independent of each other is applied to each of the two or more current-carrying semiconductor elements 11. Each of source potentials independent of each other is applied to each of the two or more current-carrying semiconductor elements 11, because, as described above, each of the two or more conductor pieces 32 connected to each of the two or more source electrodes 16 is independent of each other, and each of the source potentials independent of each other is applied to each of the two or more source electrodes 16. Further, negative bias voltage is applied between a gate electrode 15 and source electrode 16 formed on each of the current-carrying semiconductor elements 11. The negative bias voltage is voltage at which source potential applied to the source electrode 16 is higher than gate potential applied to a gate electrode 15. Thus, a channel of each of the current-carrying semiconductor elements 11, which are MOSFETs, can be reliably closed. With this arrangement, most of test current flowing through each of the current-carrying semiconductor elements 11 when a current-carrying test of each of the current-carrying semiconductor elements 11 is conducted is bipolar current flowing through a P-N junction diode incorporated in each of the current-carrying semiconductor elements 11. Thus, an appropriate condition can be set for a screening test of each of the current-carrying semiconductor elements 11.
Further, when a current-carrying test is conducted, current is applied from a source electrode 16 formed on each of the current-carrying semiconductor elements 11 to a gate electrode 15 formed on each of the current-carrying semiconductor elements 11 with the above-described drain potential, gate potential, and source potential applied to each of the current-carrying semiconductor elements 11. Thus, a current-carrying test is conducted on each of the plurality of P-N junction diodes incorporated in the plurality of current-carrying semiconductor elements 11.
When a current-carrying test is conducted, for example, a current value of test current flowing through each of the current-carrying semiconductor elements 11 is adjusted by a constant current source that supplies the test current to each of the current-carrying semiconductor elements 11. As a result, current density of the test current is controlled to a desirable current density. Further, the temperature of the current application stage is adjusted, and test temperature for each of the current-carrying semiconductor elements 11 is controlled to a desirable temperature. Temperature of the current application stage is set to lower than the desirable test temperature for each of the current-carrying semiconductor elements 11 because each of the current-carrying semiconductor elements 11 generates heat when a current-carrying test is conducted. A calorific value of each of the current-carrying semiconductor elements 11 depends on a forward loss of a P-N junction diode incorporated in each of the current-carrying semiconductor elements 11 and a current value of test current. Test temperature is predicted by, for example, multiplying thermal resistance between the current application stage and a most heated part of each of the current-carrying semiconductor elements 11 by a calorific value, and then adding the obtained value to a temperature of the current application stage. Temperature of the current application stage is set to, for example, 200° C. When a current-carrying test is conducted, current is applied to a P-N junction diode incorporated in each of the current-carrying semiconductor elements 11 during a set time.
Further, when a current-carrying test is conducted, forward characteristics of a P-N junction diode before and after the current-carrying test is compared to verify a degree of bipolar degradation. Then, in a case where an amount of change in the forward characteristics of the P-N junction diode before and after the current-carrying test is out of a standard, a current-carrying semiconductor elements 11 having the P-N junction diode built-in is excluded from shipping targets.
In step S8, as illustrated in
In step S9, as illustrated in
Steps S8 and S9 may or may not be performed simultaneously. Steps S8 and S9 may be performed in any order.
By performing steps S1 to S9, it is possible to obtain a second intermediate product 1B of the semiconductor device 1 including the plurality of current-carrying semiconductor elements 11, the relay board 12, the two or more gate electrodes 15, the two or more source electrodes 16, the conductor plate 31, the conductor pieces 32, the conductive wires 35, the conductive wires 36, and the conductive wires 37, which are illustrated in
In step S10, as illustrated in
Step S10 may be performed either before or after steps S8 and S9 are performed. Step S10 may be performed before step S7 is performed.
In step S11, resin sealing material 41 is formed as illustrated in
In step S12, as illustrated in
In the method for manufacturing a semiconductor device according to the first preferred embodiment, step S7 is performed after steps S1 to S6 are performed. Further, steps S8 to S12 are performed after S7 is performed.
By performing steps S1 to S12, it is possible to obtain a semiconductor device 1 including the plurality of current-carrying semiconductor elements 11, the relay board 12, the two or more gate electrodes 15, the two or more source electrodes 16, the conductor plate 31, the conductor pieces 32, the plurality of spacer conductors 33, the conductive wires 35, the conductive wires 36, the conductive wires 37, and the resin sealing material 41, which are illustrated in
A method for manufacturing the power control circuit according to the first preferred embodiment includes steps S1 to S13 illustrated in
In manufacturing of a power control circuit, a plurality of semiconductor devices 1 is manufactured by the method for manufacturing a semiconductor device according to the first preferred embodiment including steps S1 to S12.
In step S13, a power control circuit including the manufactured plurality of semiconductor devices 1 is manufactured. The manufactured power control circuit constitutes a semiconductor device having a circuit configuration larger than a circuit configuration of each of the semiconductor devices 1.
In a case where an equivalent circuit of the semiconductor device 1 includes one phase of MOSFET, a semiconductor device including a half-bridge circuit can be manufactured by mounting two semiconductor devices 1 on an insulating substrate with circuit pattern. In addition, a semiconductor device including a full-bridge circuit can be manufactured by mounting six semiconductor devices 1 on an insulating substrate with circuit pattern. Further, a semiconductor device including a step-up circuit, or the like, can be manufactured with a combination of a half-bridge circuit, a full-bridge circuit, or the like. After the semiconductor device 1 is mounted on the insulating substrate with circuit pattern, a signal electrode, a main current electrode, or the like, is bonded to the semiconductor device 1. The semiconductor device 1 and the insulating substrate with circuit pattern may be covered with sealing material. A pre-shipping inspection is conducted on the semiconductor device including the power control circuit. In the pre-shipping inspection, reduction or omission of screening test time is possible. This is because the screening test has already been conducted when the semiconductor device 1 is manufactured.
According to the first preferred embodiment, a current-carrying test is conducted, not on a single current-carrying semiconductor element 11, but on the plurality of P-N junction diodes of the first intermediate product 1A in the semiconductor device 1 including the plurality of current-carrying semiconductor elements 11. Thus, a current-carrying test is conducted on a plurality of P-N junction diodes with the P-N junction diodes included in the first intermediate product 1A of the semiconductor device 1. Therefore, it is possible to conduct screening tests for a plurality of current-carrying semiconductor elements 11 simultaneously. As a result, productivity of the semiconductor device 1 can be improved.
Further, according to the first preferred embodiment, a current-carrying test is conducted, not on a semiconductor device including a power control circuit, but on the plurality of P-N junction diodes of the first intermediate product 1A in the semiconductor device 1 including the plurality of current-carrying semiconductor elements 11. Thus, the number of the current-carrying semiconductor elements 11 simultaneously subjected to a current-carrying test can be reduced. As a result, a decrease in yield in a current-carrying test can be reduced. For example, in a case where a semiconductor device including a half-bridge circuit is manufactured with an equivalent circuit of the semiconductor device 1 including one phase of MOSFET, the number of the current-carrying semiconductor elements 11 to be simultaneously subjected to a current-carrying test can be halved. In a case where a semiconductor device including a full-bridge circuit is manufactured with an equivalent circuit of the semiconductor device 1 including one phase of MOSFET, the number of the current-carrying semiconductor elements 11 to be simultaneously subjected to a current-carrying test can be reduced to one-sixth. Further, in a case where an equivalent circuit of the semiconductor device 1 includes one phase of MOSFET, it is not necessary to provide insulation to a back surface 1b of the semiconductor device 1. Therefore, the semiconductor device 1 can be handled easily. In addition, a current carrying apparatus for a current-carrying test can be miniaturized.
Further, according to the first preferred embodiment, the conductor pieces 32 are connected to the front surface 11f of the current-carrying semiconductor element 11. Thus, a test probe used for a current-carrying test can be applied to a conductor piece 32. Therefore, it is possible to reduce damage by the test probe to a surface electrode of a current-carrying semiconductor element 11. In addition, the conductor pieces 32 can be utilized as metal film for electrode bonding in a later assembly process. As a result, a cushioning material such as metal foil exclusively for protecting the surface electrode of the current-carrying semiconductor element 11 is unnecessary, by which a cost for the semiconductor device 1 can be reduced. Further, it is possible to select a test probe regardless of a damage to a surface electrode of a current-carrying semiconductor element 11. As a result, it is possible to select a test probe including a simple pin having a high current-carrying capacity. Further, according to the first preferred embodiment, a conductor piece 32 is connected to a source electrode 16 of the current-carrying semiconductor element 11. Thus, current can be applied by using an electrode having a large cross-sectional area and a small resistance component in a surface direction. As a result, even with a small number of probing points, current can be uniformly passed through the current-carrying semiconductor element 11. Further, even in a case where contact resistance is generated at a probing point and heat is generated due to the contact resistance when current is applied, the generated heat spreads inside the conductor piece 32 until the heat is transferred to the current-carrying semiconductor element 11. Thus, generation of a hot-spot in the current-carrying semiconductor element 11 can be reduced. Further, according to the first preferred embodiment, heat generated by the current-carrying semiconductor element 11 in a current-carrying test is absorbed by the conductor plate 31, and is effectively released to a test stage, or the like, from the second principal surface 31b of the conductor plate 31 exposed on a bottom surface 1Ab of the first intermediate product 1A of the semiconductor device 1. As a result, it is possible to reduce an increase in temperature of the current-carrying semiconductor element 11 when a current-carrying test is conducted.
According to the first preferred embodiment, a common gate potential is applied to each of the two or more gate electrodes 15 formed on a front surface 11f of each of the two or more current-carrying semiconductor elements 11. Thus, the number of probing points for controlling gate bias can be reduced. Thus, a condition of a current-carrying test can be easily controlled. Thus, a pad size of the current-carrying semiconductor element 11 can be reduced, and an invalid region of the current-carrying semiconductor element 11 can be reduced. As a result, more current-carrying semiconductor elements 11 can be taken from each wafer.
When a current-carrying test is conducted, it is not possible to control each of test currents flowing through each of the two or more current-carrying semiconductor elements 11 independently in a case where a common gate potential is applied to the two or more current-carrying semiconductor elements 11, a common source potential is applied to the two or more current-carrying semiconductor elements 11, and a common drain potential is applied to the two or more current-carrying semiconductor elements 11. A ratio of each of the test currents is approximately equal to a ratio of each of reciprocals of forward voltages of the plurality of P-N junction diodes included in the two or more current-carrying semiconductor elements 11. Therefore, the test current varies according to a variation in a characteristic of the two or more current-carrying semiconductor elements 11. Therefore, the test current cannot be uniformed. Therefore, excessive current flows through a specific current-carrying semiconductor element 11. Therefore, yield in a current-carrying test decreases.
Meanwhile, as in the first preferred embodiment, when a current-carrying test is conducted, it is possible to independently control each of test currents flowing through each of the two or more current-carrying semiconductor elements 11 in a case where a common gate potential is applied to the two or more current-carrying semiconductor elements 11, source potentials independent of each other is applied to each of the two or more current-carrying semiconductor elements 11, and a common drain potential is applied to the two or more current-carrying semiconductor elements 11. Further, test current can be uniformed. For example, by supplying each of test currents, which flow through each of two or more current-carrying semiconductor elements 11, from each of two or more constant current sources of the same number as the number of the two or more current-carrying semiconductor elements 11, each of the test currents can be independently controlled when a current-carrying test is conducted, by which the test currents can be uniformed when a current-carrying test is conducted. Therefore, even in a case where characteristics of the two or more current-carrying semiconductor elements 11 are different from each other, test current can be uniformed. Therefore, yield in the current-carrying test increases.
In a case where test currents flowing through the two or more current-carrying semiconductor elements 11 cannot be controlled independently, test currents are usually varied more than test currents that flow through the two or more current-carrying semiconductor elements 11 in actual use. Thus, a decrease in yield in a current-carrying test due to failure to uniformize test currents is excessive. This point will be described.
Test current that flows through each of the current-carrying semiconductor elements 11 when a current-carrying test is conducted mainly includes a direct current component. Therefore, a current value of the test current mainly depends on a resistance component in a forward direction of impedance of each of the current-carrying semiconductor elements 11. Meanwhile, current that flows through each of the current-carrying semiconductor elements 11 in actual use includes a direct current component and an alternating current component. This is because a current value of the current often changes with time. Therefore, a current value of the current depends not only on a resistance component of the impedance but also on an inductance component of the impedance. Therefore, the current value of the current is relatively not affected by the forward voltage characteristic of each of the current-carrying semiconductor elements 11. In particular, in a semiconductor device that uses a synchronous rectification method to apply current to an incorporated P-N junction diode for a very short time during a dead time period, a direct current component included in current flowing through each of the current-carrying semiconductor elements in actual use. Therefore, the current value is not easily affected by a forward voltage characteristic of each of the current-carrying semiconductor elements 11. Therefore, test currents are usually varied more than each of test currents that flow through each of the two or more current-carrying semiconductor elements 11 in actual use.
Further, according to the first preferred embodiment, after a current-carrying test, a common gate potential is applied to the two or more current-carrying semiconductor elements 11, a common source potential is applied to the two or more current-carrying semiconductor elements 11, and a common drain potential is applied to the two or more current-carrying semiconductor elements 11. This is because it is not necessary to control each of test currents flowing through each of the two or more current-carrying semiconductor elements 11 independently after the current-carrying test. Thus, two or more current-carrying semiconductor elements 11 can be controlled as a single current-carrying power generation element.
According to the first preferred embodiment, a back surface 11b of each of the plurality of current-carrying semiconductor elements 11 is connected to the first principal surface 31f of the conductor plate 31 by sinter bonding. Further, a conductor piece 32 is connected to a front surface 11f of each of the plurality of current-carrying semiconductor elements 11 by sinter bonding. In addition, the relay board 12 is connected to the first principal surface 31f of the conductor plate 31 by sinter bonding. Thus, deterioration of a bonding surface can be reduced even in a case where the first intermediate product 1A of the semiconductor device 1 is exposed to a high temperature when a current-carrying test is conducted in order to reduce time during which the current-carrying test is conducted. As a result, it is possible to manufacture a semiconductor device 1 having high reliability.
Further, according to the first preferred embodiment, two or more gate electrodes 15 are reconnected to the gate circuit pattern 21 after a current-carrying test. Thus, a semiconductor device 1 having high reliability can be manufactured even in a case where, when a current-carrying test is conducted, a first intermediate product 1A of the semiconductor device 1 is exposed to a high temperature in order to reduce time during which the current-carrying test is conducted, by which long-time reliability and conductivity of a conductive wires 35 are degraded.
Further, according to the first preferred embodiment, resin sealing material 41 is formed after the current-carrying test. Thus, deterioration of the resin sealing material 41 can be reduced, and a reduction in weight of the resin sealing material 41 can be prevented even in a case where the first intermediate product 1A of the semiconductor device 1 is exposed to a high temperature when a current-carrying test is conducted in order to reduce time during which the current-carrying test is conducted. In a case where resin sealing material 41 is formed after a current-carrying test is conducted, there is no resin sealing material 41 when the current-carrying test is conducted. However, creeping discharge may not be generated in the current-carrying semiconductor element 11 even in a case where there is no resin sealing material 41, because high voltage is not applied when a current-carrying test is conducted on a P-N junction diode. Therefore, it is possible to set test temperature of a current-carrying semiconductor element 11 subjected to a current-carrying test to a test temperature suitable for reducing the time during which the current-carrying test is conducted.
Further, according to the first preferred embodiment, at least a portion of a conductor piece 32 is ground after the current-carrying test is conducted. As a result, oxide film formed on a surface of at least a portion of the conductor piece 32 when the current-carrying test is conducted is removed. As a result, it is possible to restore current-carrying capacity of at least a portion of the conductor piece 32 and bondability with a connecting material such as soldering.
Further, in a case where step S10 is performed before step S7 is performed in the first preferred embodiment, it is possible to restore current-carrying capacity of at least a portion of a plurality of spacer conductors 33 and bondability with a connecting material such as soldering, by at least a portion of each of a plurality of spacer conductors 33 being ground and a surface of each of the plurality of spacer conductors 33 being exposed on a ground surface of resin sealing material 41 after the current-carrying test is conducted.
Further, according to the first preferred embodiment, a screening test has already been conducted when the semiconductor device 1 is manufactured. As a result, it is possible to reduce time required for a pre-shipping inspection of a semiconductor device including a power control circuit. In addition, yield in the pre-shipping inspection can be increased. Because inspection equipment for pre-shipping inspection is often large in size and costly, capability of reducing time required for a pre-shipping inspection may be economically beneficial. Further, because a semiconductor device having a large circuit configuration includes many members, the semiconductor device may incur a large amount of loss cost if determined to be defective. Therefore, capability of increasing yield in pre-shipping inspection may contribute to reducing the loss cost.
The method for manufacturing a semiconductor device and method for manufacturing a power control circuit according to the second preferred embodiment are different from the method for manufacturing a semiconductor device and method for manufacturing a power control circuit according to the first preferred embodiment mainly in the points described below. For points not described below, a configuration similar to a configuration adopted for the method for manufacturing a semiconductor device and method for manufacturing the power control circuit according to the first preferred embodiment are adopted for the method for manufacturing a semiconductor device and method for manufacturing the power control circuit according to the second preferred embodiment.
The method for manufacturing a semiconductor device according to the second preferred embodiment includes steps S1 to S12, S21, and S22 illustrated in
In step S21, as illustrated in
In step S7, it is desirable to add a temperature sensed by the temperature sensing element 13 to a value obtained by multiplying thermal resistance between the current-carrying semiconductor element 11 and the temperature sensing element 13 by a calorific value, by which temperature of the current-carrying semiconductor element 11 can be predicted more accurately than in the first preferred embodiment. This is because the thermal resistance between the current-carrying semiconductor element 11 and the temperature sensing element 13 is smaller than thermal resistance between a current application stage and a most heated part of each of the current-carrying semiconductor elements 11, by which prediction error is small.
In step S22, the anode pad 43 and cathode pad 44 of the temperature sensing diode are electrically reconnected by another conductive wire to the first anode pad 23-1 and first cathode pad 24-1, respectively. The first anode pad 23-1 and first cathode pad 24-1 are included in the relay board 12. Thus, an another conductive wire can ensure long-time reliability and conductivity even in a case where long-time reliability and conductivity of the conductive wire 38 or conductive wire 39 formed before a current-carrying test are degraded in the current-carrying test.
Step S22 may or may not be performed simultaneously with steps S8 and S9.
Step S22 is performed after step S7.
The method for manufacturing a semiconductor device and method for manufacturing a power control circuit according to the third preferred embodiment are different from the method for manufacturing a semiconductor device and method for manufacturing a power control circuit according to the first preferred embodiment mainly in the points described below. For points not described below, a configuration similar to a configuration adopted for the method for manufacturing a semiconductor device and method for manufacturing the power control circuit according to the first preferred embodiment is adopted for the method for manufacturing a semiconductor device and method for manufacturing the power control circuit according to the third preferred embodiment.
The method for manufacturing a semiconductor device according to the third preferred embodiment includes steps S1 to S7, S9 to S13, and S31, which are illustrated in
In a relay board 12 connected a the first principal surface 31f of a conductor plate 31 in step S5, a second source pad 22-2 is divided two or more second source pads as illustrated in
Further, in the relay board 12 connected to the first principal surface 31f of the conductor plate 31 in step S5, bonding film is provided on a surface of the second gate pad 21-2 and a surface of each of two or more second source pads 22-2. The bonding film is film capable of bonding such as solder bonding and sinter bonding. Plating film, or the like, in which NiP film, Pd film, and Au film are laminated in order, can be used as the bonding film.
In step S31, as illustrated in
A spacer conductor 33 connected to the source circuit pattern 22 in step S10 electrically connects two or more patterns included in the source circuit pattern 22 to each other. Thus, a common source potential is applied to the two or more source electrodes 16. In the third preferred embodiment, the spacer conductor 33 connected to the source circuit pattern 22 is connected to a connection region for the spacer conductor 33, which extends over two or more second source pads 22-2. Thus, the two or more patterns included in the source circuit pattern 22 are electrically connected to each other, and a plurality of current-carrying semiconductor elements 11 can be electrically connected in parallel. Step S10 is performed after step S7.
A spacer conductor 33 connected to a second gate pad 21-2 in step S10 is bonded to bonding film provided on a surface of the second gate pad 21-2. Further, the spacer conductor 33 connected to the two or more second source pads 22-2 is bonded to bonding film provided on a surface of the two or more second source pads 22-2.
Bonding film including the above-described plating film may be provided on a surface of a gate electrode 15 formed in step S1 and on a source electrode 16 formed in step S2. In a case where the bonding film is provided on a surface of a gate electrode 15, a conductive wire 35 is bonded to the bonding film provided on the surface of the gate electrode 15 in step S6. Further, in step S31, a conductive wire 36 is bonded to bonding film provided on a surface of a source electrode 16.
According to the third preferred embodiment, even in a case where the two or more source electrodes 16 are electrically connected to the source circuit pattern 22, each of two or more source potentials independent of each other is electrically applied to each of two or more current-carrying semiconductor elements 11. Thus, it is possible to independently control each of test currents flowing through the two or more current-carrying semiconductor elements 11 when a current-carrying test is conducted. Further, test current can be uniformed. Therefore, even in a case where characteristics of the two or more current-carrying semiconductor elements 11 are different from each other, test current can be uniformed. Therefore, yield in the current-carrying test increases.
Further, according to the third preferred embodiment, it is not necessary to electrically connect each of the two or more source electrodes 16 to each of two or more first source pads 22-1 with each of the two or more conductive wires 36 after a current-carrying test. As a result, productivity of the semiconductor device 1 can be improved.
Further, in a case where the bonding film including the above-described plating film is provided on a surface of a source electrode 16 in the third preferred embodiment, it is possible to reduce oxidation of a surface of the bonding film due to a temperature increase in a current-carrying test conducted in step S7 and welling up of Ni, which is included in film of a lower layer, on Au film by the heating. As a result, it is possible to reduce connection failure of a conductor piece 32 in a case where the conductor piece 32 is connected to a source electrode 16 after a current-carrying test. Therefore, step S4 can be performed after step S7.
Further, in the third preferred embodiment, it is not necessary to electrically reconnect each of two or more source electrodes 16 to each of the two or more first source pads 22-1 with each of the two or more conductive wires 36 after a current-carrying test in a case where heat stress due to an increase in temperature during the current-carrying test conducted in step S7 is reduced to a degree where a bonding surface of a conductive wire 36 and first source pad 22-1 does not deteriorate. Further, in a case where the heat stress is reduced to a degree where a bonding surface of a conductive wire 35 and first gate pad 21-1 does not deteriorate, it is possible to omit step S9, similarly, in which two or more gate electrodes 15 are electrically reconnected to each other via a gate circuit pattern 21.
The respective preferred embodiments can be freely combined, or the respective preferred embodiments can be appropriately modified or omitted.
While the present disclosure has been described in detail, the foregoing description is in all aspects illustrative and not restrictive. It is therefore understood that numerous modifications and variations not illustrated can be devised.
While the disclosure has been shown and described in detail, the foregoing description is in all aspects illustrative and not restrictive. It is therefore understood that numerous modifications and variations can be devised.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2020-087244 | May 2020 | JP | national |
