Claims
- 1. A method of electrically interconnecting microelectronic elements, comprising:
providing a first microelectronic element having a first surface and contacts exposed at the first surface, the contacts including protrusions extending away from the first surface, providing a substantially uniform layer of bonding material on a support, dipping the protrusions of the contacts into the substantially uniform layer of bonding material so as to transfer at least some of the bonding material onto the contacts, and bonding the contacts to conductive features of a second microelectronic element.
- 2. The method of claim 1, wherein the step of dipping comprises dipping the protrusions in a substantially uniform layer of bonding material so that a substantially uniform amount of bonding material is transferred onto each contact.
- 3. The method of claim 1, wherein the step of bonding includes applying heat to the bonding material.
- 4. The method of claim 1, wherein the step of bonding comprises juxtaposing the first microelectronic and the second microelectronic element with one another so that the bonding material on the protrusions is contiguous with the conductive features.
- 5. The method of claim 4, wherein the bonding material is heated before the step of juxtaposing the first microelectronic element and second microelectronic element with one another.
- 6. The method of claim 4, wherein the bonding material is heated while the first microelectronic element and second microelectronic element are juxtaposed with one another.
- 7. The method of claim 3, wherein the bonding material comprises solder paste and the step of heating comprises heating the solder paste to reflow the solder paste.
- 8. The method of claim 7, wherein the contacts of the first microelectronic element are heated before the step of dipping so as to heat the solder paste transferred to the contacts.
- 9. The method of claim 8, wherein the step of bonding comprises heating the protrusions to reflow the solder paste while the protrusions and conductive features are contiguous with the solder paste.
- 10. The method of claim 1, further comprising heating the contacts before the step of dipping.
- 11. The method of claim 1, further comprising heating the contacts after the step of dipping.
- 12. The method of claim 1, wherein the contacts comprise pads exposed at the first surface of the first microelectronic element.
- 13. The method of claim 12, wherein the protrusions of the contracts comprise studs attached to the pads.
- 14. The method of claim 13, wherein the studs comprise gold studs.
- 15. The method of claim 13, wherein the studs have a first end connected to the pads and a second end facing away from the pad for receiving bonding material.
- 16. The method of claim 15, wherein the step of dipping the studs includes applying bonding material to the second end of the studs by dipping the second end of the studs in the bonding material.
- 17. The method of claim 13, further comprising forming studs on the pad utilizing wire bonding.
- 18. The method of claim 1, wherein the first microelectronic element comprises a semiconductor wafer having a plurality of semiconductor chips, each of the semiconductor chips having contacts to be bonded to one of the conductive features of the second microelectronic element.
- 19. The method of claim 18, wherein the wafer includes a plurality of elongated leads extending along the first surface, each lead being connected to a contact.
- 20. The method of claim 19, wherein the leads have first ends connected to the contacts and second ends carrying the protrusions.
- 21. The method of claim 20, further comprising, after the step of bonding, displacing the second ends of the leads relative to the first ends so as to bend the second ends away from the wafer and so that the leads extend away from the first surface.
- 22. The method of claim 21, further comprising the step of injecting a flowable dielectric material around the leads and curing the flowable dielectric material to form a dielectric support layer around the leads.
- 23. The method of claim 22, wherein the second microelectronic element comprises a flexible dielectric layer.
- 24. The method of claim 23, wherein the step of displacing comprises moving the wafer and flexible dielectric layer with respect to one another.
- 25. The method of claim 22, further comprising the step of severing the wafer and the dielectric support layer to form a plurality of units, each unit including a semiconductor chip and a portion of the dielectric support layer.
- 26. The method of claim 1, wherein the conductive features comprise elongated leads extending along a first face of the second microelectronic element, and wherein at least some of the leads are bonded to a contact during the bonding step.
- 27. The method of claim 26, wherein the leads have first ends attached to the second microelectronic element and second ends, wherein at least some of the second ends are attached to the contacts during the bonding step.
- 28. The method of claim 27, further comprising displacing the second ends of the leads relative to the first ends so as to bend the second ends away from the second microelectronic element and so that the leads extend away from the first face.
- 29. The method of claim 28, further comprising injecting a flowable dielectric material around the leads after the step of displacing the second ends and curing the flowable dielectric material to form a dielectric support layer around the leads.
- 30. The method of claim 29, wherein the step of displacing comprises moving the second microelectronic element with respect to the first microelectronic element.
- 31. The method of claim 1, wherein the first microelectronic element comprises a dielectric layer.
- 32. The method of claim 31, wherein the second microelectronic element comprises a wafer of a plurality of semiconductor chips, the wafer having connection pads exposed at a first face of the wafer.
- 33. The method of claim 31, wherein the dielectric layer has leads with first ends attached to the contacts and second ends carrying the protrusions.
- 34. The method of claim 32, wherein the wafer has leads with fist ends attached to the pads and second ends for being bonded to the protrusions.
- 35. The method of claim 1, further comprising assembling the second microelectronic features with a layer and bonding the conductive elements of the second microelectronic element with conductive elements of the substrate.
- 36. The method of claim 1, wherein the protrusions comprise gold and the bonding material includes indium.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application claims benefit of U.S. Provisional Patent Application 60/273,993, filed Mar. 7, 2001, the disclosure of which is hereby incorporated by reference herein.
Provisional Applications (1)
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Number |
Date |
Country |
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60273993 |
Mar 2001 |
US |