(Not Applicable)
1. Field of the Invention
The present invention relates generally to semiconductor packages and, more particularly, to a semiconductor package which includes offset etched corner leads to allow etching beyond a minimum capable distance between the die pad tie bars and adjacent lands, or leads which are etched in a manner allowing for an increase in the size of the die pad.
2. Description of the Related Art
The current trend in the electronics industry is to provide electronic devices which are multi-functional, compact, and capable of achieving high performance levels. In view of this trend, a requirement has arisen that the semiconductor packages which are used in such electronic devices be made in a “chip size”. These chip-size semiconductor packages are usable in portable products such as cellular phones and PDA's which require high levels of reliability, electrical efficiency, and a small or compact size of minimal weight.
Chip-size semiconductor packages as currently known in the electrical arts typically include a leadframe, and are fabricated in a manner wherein a plurality of input/output signal lands are formed at the peripheral edge of the bottom surface of the package. The package is electrically connected to an underlying substrate such as a printed circuit board (PCB) by soldering the lands on the bottom surface of the package to corresponding pads of the board. In addition to including leads which define the signal lands at the periphery of the bottom surface of the package, the leadframe also includes a semiconductor mounting paddle or pad, the bottom surface of which is also exposed within the package for purposes of maximizing an emission rate of heat generated by the semiconductor die mounted to the top surface thereof.
Internal to such semiconductor package is a semiconductor die having a multitude of input/output pads or terminals. Such terminals are in turn electrically connected to respective leads of the leadframe which, as indicated above, define respective ones of the signal lands. In an often used methodology for fabricating a plurality of the above-described semiconductor packages, a matrix of interconnected leadframes are etched into a leadframe strip. Subsequent to the attachment of the semiconductor dies to respective ones of the die pads and electrical connection of the terminals of the dies to respective ones of the leads, an encapsulation step facilitates the application of an encapsulant material onto the surface of the leadframe strip to which the dies are attached. This encapsulation step covers the dies, the side surfaces of the die pads, and portions of the leads within a single block of encapsulant material. The encapsulant material is then hardened, with a cutting step thereafter being used to separate individual semiconductor packages from each other and from the disposable portions of each of the leadframes within the leadframe strip. The cutting step severs the connection between each of the interconnected leadframes within the leadframe strip, and the die pad and leads of each individual leadframe. This cutting or “singulation” process is typically accomplished through either a sawing process (saw singulation) or a punching process (punch singulation). The formation of the individual leadframes within the leadframe strip is itself typically accomplished through either a chemical etching or mechanical stamping process.
An overall limitation of the design of the above-described semiconductor package pertains to the electrical connections and configurations utilized to satisfy the required electrical inputs and outputs to and from the input/output terminals of the semiconductor die. In this regard, the satisfaction of current functionality requirements typically necessitates the highest possible lead count for the semiconductor package. Those leads of each leadframe disposed adjacent to the tie bar(s) extending to the die pad are typically referred to as corner leads, and are those which are typically the least reliable due to their reduced land length attributable to the required spatial separation between such corner leads and the corresponding tie bar. The present invention addresses this reliability issue by providing a leadframe which includes purposely offset etched corner leads which allow for etching beyond a minimum capable distance between the tie bar and those corner leads adjacent thereto. The resultant added length to the lands defined by these corner leads provides a highest lead count semiconductor package with better board level reliability attributable to longer land lengths.
In accordance with the present invention, there is provided a semiconductor package which, in one embodiment of the present invention, includes a leadframe comprising a die pad defining opposed, generally planar top and bottom die pad surfaces and a peripheral edge. Connected to and extending from the peripheral edge of the die pad is at least one tie bar of the leadframe, which also includes a plurality of leads extending at least partially about the die pad in spaced relation to the peripheral edge thereof. Each of the leads includes opposed, generally planar top and bottom lead surfaces, with at least two of the leads comprising corner leads which extend along opposed sides of the tie bar. Each of the corner leads further defines an angularly offset distal portion which extends along and in spaced relation to the tie bar. The distal portion has a top surface which extends in generally co-planar relation to the top lead surface, and a bottom distal surface which is recessed relative to the bottom lead surface.
In an alternative embodiment of the present invention, the leads of the leadframe are identically configured, with each such lead including a recessed lead shelf formed within the top lead surface adjacent the peripheral edge of the die pad. In the alternative embodiment, each of the leads further includes a pair of ear portions extending laterally from respective sides of each of the leads in opposed relation to each other. The ear portions each have a top ear surface which extends in generally co-planar relation to the top lead surface and a bottom ear surface which is recessed relative to the bottom lead surface. The inclusion of the recessed lead shelf within each of the leads of this alternative embodiment allows for an increase in the size of the die pad of the leadframe.
In each embodiment of the present invention, the bottom lead surfaces define lands which are of increased length to provide superior board level reliability. In addition to the increased length lands defined by the leads of the leadframes constructed in accordance with the present invention, the structural attributes of such leadframes also provide any semiconductor package fabricated to include the same with a maximum lead count in addition to the optimum board level reliability attributable to the increased land lengths.
The present invention is best understood by reference to the following detailed description when read in conjunction with the accompanying drawings.
These, as well as other features of the present invention, will become more apparent upon reference to the drawings wherein:
Common reference numerals are used throughout the drawings and detailed description to indicate like elements.
Referring now to the drawings,
Referring now to
Each leadframe 16 further comprises a multiplicity of leads 26 which are integrally connected to the outer frame portion 18 and protrude therefrom into the opening 20 toward the peripheral edge of the die pad 22. The leads 26 are segregated into four sets, with each set being disposed in spaced relation to a respective one of the four peripheral edge segments defined by the die pad 22. The leads 26 of each set are also equidistantly spaced from each other, with narrow gaps of equal width being defined therebetween. As indicated above, the free, distal ends of the leads 26 are disposed in spaced relation to the peripheral edge of the die pad 22.
As shown in
In the leadframe 16, each of the leads 26 defines an enlarged inner end portion or distal portion 30 having a generally triangular configuration. Additionally, each of the corner leads 28 defines an angularly offset distal portion 32 which extends along and in spaced relation to a respective one of the tie bars 24. As indicated above, the leadframe 16 is not fabricated to be of uniform thickness. In this regard, the die pad 22 is preferably formed in a manner wherein a recessed shoulder or shelf 34 extends about the periphery of the bottom surface of the die pad 22. Additionally, the distal portion 30 of each lead 26 is half-etched so as to be of reduced thickness in comparison to the remainder thereof. In this regard, as is seen in
With particular regard to the corner leads 28, as is seen in
Within each leadframe 16, those portions of the leads 26 and corner leads 28 which are integrally connected to the outer frame portion 18 are also of reduced thickness, as are portions of the outer frame portion 18 itself. In this regard, that portion of each lead 26 integrally connected to the outer frame portion 18 is laterally offset or recessed relative to the bottom surface of the remainder of such lead 26. Similarly, that portion of each corner lead 26 integrally connected to the outer frame portion 18 is laterally offset or recessed relative to the bottom surface of the remainder of such corner lead 28. Thus, in each completely formed leadframe 16, the top surfaces of the leads 26, corner leads 28, distal portions 30, 32, tie bars 24, and die pad 22 extend in generally co-planar relation to each other. Additionally, the shelves 34, 36, bottom surfaces of the distal portions 30, 32 and bottom surfaces of the tie bars 24 extend in generally co-planar relation to each other, with the bottom surfaces of the leads 26, corner leads 28 and die pad 22 themselves extending in generally coplanar relation to each other. The reduced thickness portions of the leads 26 and corner leads 28 integrally connected to the outer frame portion 18 also extend in generally co-planar relation to the bottom surfaces of the distal portions 30, 32 and tie bars 24.
The leadframe strip 10, and hence the individual leadframes 16 defined thereby, is preferably manufactured from a conductive metal material, such as copper, through the use of either a chemical etching or a mechanical stamping process. Chemical etching (also known as chemical milling) is a process that uses photolithography and metal dissolving chemicals to etch a pattern into a metal strip. A photoresist is exposed to ultraviolet light through a photomask having a desired pattern, and is subsequently developed and cured. Chemicals are sprayed or otherwise applied to the masked strip, and exposed portions of the strip are etched away, leaving the desired pattern. Mechanical stamping uses sets of progressive dies to mechanically remove metal from a metal strip. Each of a plurality of stamping stations uses one of the dies to punch a distinct small area of metal from the strip as the strip moves through the stations. The formation of the leadframe 16 within the strip 10 is preferably accomplished through the application of etching chemicals to both sides of the strip 10 as results in each leadframe 16 having the above-described structural attributes and cross-sectional configurations. The strip 10 may be formed by chemically etching rolled strip metal stock from both sides using conventional liquid etchant.
Referring now to
In the semiconductor package 38, the die pad 22, the semiconductor die 40, the conductive wires 44, and the leads 26, 28 are each completely or partially covered with a sealing material, such as an epoxy molding compound. The hardened sealing material defines a package body 46 of the semiconductor package 38. As seen in
The sealing material used to form the package body 46 also underfills the reduced thickness distal portions 30, 32 of the leads 26, 28, in addition to underfilling the reduced thickness portions of the leads 26, 28 which are integrally connected to the outer frame portion 18 of the leadframe 16. The sealing material further flows into and covers the shelves 36 formed within the corner leads 28. However, the bottom surfaces of the leads 26 and corner leads 28 are not covered by the sealing material, and thus are exposed within and substantially flush with the bottom surface of the package body 46 as shown in
The complete fabrication of the semiconductor package 38 shown in
Advantageously, in the completed semiconductor package 38, the length of the lands defined by the bottom surfaces of the corner leads 28 is maximized as a result of the formation of the corner leads 28 to include the angularly offset, half-etched distal portions 32. As indicated above, the conductive wires 44 are attached to the top surfaces of such distal portions 32, and to the top surfaces of the distal portions 30 of the remaining leads 26. The increased length of the lands defined by the corner leads 28 produces superior board level reliability. Additionally, the resultant ability to effectively utilize the corner leads 28 for electrical connection to the terminals 42 of the semiconductor die 40 provides the semiconductor package 38 with a maximum lead count in addition to the optimum board level reliability. The design of the leads 26 and corner leads 28 in the leadframe 16 allows for the use of either a punch or saw singulation process to facilitate the complete formation of each semiconductor package 38. The formation of the pullback feature shown in
Referring now to
Within the leadframe 16a, each of the leads 26a, 28a includes a shelf 36a formed within the top surface thereof at the distal end which is disposed closest to the peripheral edge of the die pad 22a. Additionally, integrally connected to and extending laterally outward from respective ones of the opposed sides of each of the leads 26a, 28a is a pair of ear portions 48a. The ear portions 48a extend in opposed relation to each other, and include top surfaces which are continuous with the top surface of the remainder of the corresponding lead 26a, 28a. As is seen in
Referring now to
The sealing material used to form the package body 46a also covers the top surfaces and shelves 36a of the leads 26a, 28a, in addition to flowing about and encapsulating the ear portions 48a of each of the leads 26a, 28a. However, the bottom surfaces of the leads 26a, 28a are not covered by the sealing material, and thus are exposed within and substantially flush with the bottom surface of the package body 46a as shown in
The complete fabrication of the semiconductor package 38a also involves the singulation process described above in relation to the semiconductor package 38. Upon the completion of such singulation process, the severed outer ends of the leads 26a, corner leads 28a and tie bars 24a are exposed within and substantially flush with respective ones of the four side surfaces defined by the package body 46a. The singulation process is completed such that the exposed outer ends of the leads 26a, 28a are not of reduced thickness, thus resulting in the leads 26a, 28a each having a “full lead” configuration, i.e., the bottom surfaces or lands of each of the leads 26a, 28a extend to respective ones of the four side surfaces defined by the package body 46a. Despite the absence of the above-described pullback, inadvertent dislodgement of the leads 26a and corner leads 28a from within the package body 46a is prevented by the mechanical interlock facilitated through the encapsulation of the ear portions 48a of each of the leads 26a, 28a by the package body 46a. The configuration of the leads 26a, 28a in the semiconductor package 38a provide the same benefits and advantages described above in relation to the semiconductor package 38.
As indicated above and as is best seen in
Referring now to
Additional modifications and improvements of the present invention may also be apparent to those of ordinary skill in the art. Thus, the particular combination of parts described and illustrated herein is intended to represent only certain embodiments of the present invention, and is not intended to serve as limitations of alternative devices within the spirit and scope of the invention.
The present application is a divisional of U.S. application Ser. No. 10/358,621 entitled OFFSET ETCHED CORNER LEADS FOR SEMICONDUCTOR PACKAGE filed Feb. 5, 2003 now U.S. Pat. No. 6,847,099.
Number | Name | Date | Kind |
---|---|---|---|
2596993 | Gookin | May 1952 | A |
3435815 | Forcier | Apr 1969 | A |
3734660 | Davies et al. | May 1973 | A |
3838984 | Crane et al. | Oct 1974 | A |
4054238 | Lloyd et al. | Oct 1977 | A |
4189342 | Kock | Feb 1980 | A |
4258381 | Inaba | Mar 1981 | A |
4289922 | Devlin | Sep 1981 | A |
4301464 | Otsuki et al. | Nov 1981 | A |
4332537 | Slepcevic | Jun 1982 | A |
4417266 | Grabbe | Nov 1983 | A |
4451224 | Harding | May 1984 | A |
4496965 | Orcutt et al. | Jan 1985 | A |
4530152 | Roche et al. | Jul 1985 | A |
4541003 | Otsuka et al. | Sep 1985 | A |
4646710 | Schmid et al. | Mar 1987 | A |
4707724 | Suzuki et al. | Nov 1987 | A |
4727633 | Herrick | Mar 1988 | A |
4737839 | Burt | Apr 1988 | A |
4756080 | Thorp, Jr. et al. | Jul 1988 | A |
4812896 | Rothgery et al. | Mar 1989 | A |
4862245 | Pashby et al. | Aug 1989 | A |
4862246 | Masuda et al. | Aug 1989 | A |
4907067 | Derryberry | Mar 1990 | A |
4920074 | Shimizu et al. | Apr 1990 | A |
4935803 | Kalfus et al. | Jun 1990 | A |
4942454 | Mori et al. | Jul 1990 | A |
4951120 | Hagiwara et al. | Aug 1990 | A |
4987475 | Schlesinger et al. | Jan 1991 | A |
5018003 | Yasunaga | May 1991 | A |
5029386 | Chao et al. | Jul 1991 | A |
5041902 | McShane | Aug 1991 | A |
5057900 | Yamazaki | Oct 1991 | A |
5059379 | Tsutsumi et al. | Oct 1991 | A |
5065223 | Matsuki et al. | Nov 1991 | A |
5070039 | Johnson et al. | Dec 1991 | A |
5087961 | Long et al. | Feb 1992 | A |
5091341 | Asada et al. | Feb 1992 | A |
5096852 | Hobson | Mar 1992 | A |
5118298 | Murphy | Jun 1992 | A |
5122860 | Kikuchi et al. | Jun 1992 | A |
5134773 | LeMaire et al. | Aug 1992 | A |
5151039 | Murphy | Sep 1992 | A |
5157475 | Yamaguchi | Oct 1992 | A |
5157480 | McShane et al. | Oct 1992 | A |
5168368 | Gow, 3rd et al. | Dec 1992 | A |
5172213 | Zimmerman | Dec 1992 | A |
5172214 | Casto | Dec 1992 | A |
5175060 | Enomoto et al. | Dec 1992 | A |
5200362 | Lin et al. | Apr 1993 | A |
5200809 | Kwon | Apr 1993 | A |
5214845 | King et al. | Jun 1993 | A |
5216278 | Lin et al. | Jun 1993 | A |
5218231 | Kudo | Jun 1993 | A |
5221642 | Burns | Jun 1993 | A |
5250841 | Sloan et al. | Oct 1993 | A |
5252853 | Michii | Oct 1993 | A |
5258094 | Furui et al. | Nov 1993 | A |
5266834 | Nishi et al. | Nov 1993 | A |
5273938 | Lin et al. | Dec 1993 | A |
5277972 | Sakumoto et al. | Jan 1994 | A |
5278446 | Nagaraj et al. | Jan 1994 | A |
5279029 | Burns | Jan 1994 | A |
5281849 | Singh Deo et al. | Jan 1994 | A |
5294897 | Notani et al. | Mar 1994 | A |
5327008 | Djennas et al. | Jul 1994 | A |
5332864 | Liang et al. | Jul 1994 | A |
5335771 | Murphy | Aug 1994 | A |
5336931 | Juskey et al. | Aug 1994 | A |
5343076 | Katayama et al. | Aug 1994 | A |
5358905 | Chiu | Oct 1994 | A |
5365106 | Watanabe | Nov 1994 | A |
5381042 | Lerner et al. | Jan 1995 | A |
5391439 | Tomita et al. | Feb 1995 | A |
5406124 | Morita et al. | Apr 1995 | A |
5410180 | Fujii et al. | Apr 1995 | A |
5414299 | Wang et al. | May 1995 | A |
5417905 | LeMaire et al. | May 1995 | A |
5424576 | Djennas et al. | Jun 1995 | A |
5428248 | Cha | Jun 1995 | A |
5435057 | Bindra et al. | Jul 1995 | A |
5444301 | Song et al. | Aug 1995 | A |
5452511 | Chang | Sep 1995 | A |
5454905 | Fogelson | Oct 1995 | A |
5474958 | Djennas et al. | Dec 1995 | A |
5484274 | Neu | Jan 1996 | A |
5493151 | Asada et al. | Feb 1996 | A |
5508556 | Lin | Apr 1996 | A |
5517056 | Bigler et al. | May 1996 | A |
5521429 | Aono et al. | May 1996 | A |
5528076 | Pavio | Jun 1996 | A |
5534467 | Rostoker | Jul 1996 | A |
5539251 | Iverson et al. | Jul 1996 | A |
5543657 | Diffenderfer et al. | Aug 1996 | A |
5544412 | Romero et al. | Aug 1996 | A |
5545923 | Barber | Aug 1996 | A |
5581122 | Chao et al. | Dec 1996 | A |
5592019 | Ueda et al. | Jan 1997 | A |
5592025 | Clark et al. | Jan 1997 | A |
5594274 | Suetaki | Jan 1997 | A |
5595934 | Kim | Jan 1997 | A |
5604376 | Hamburgen et al. | Feb 1997 | A |
5608265 | Kitano et al. | Mar 1997 | A |
5608267 | Mahulikar et al. | Mar 1997 | A |
5625222 | Yoneda et al. | Apr 1997 | A |
5633528 | Abbott et al. | May 1997 | A |
5639990 | Nishihara et al. | Jun 1997 | A |
5640047 | Nakashima | Jun 1997 | A |
5641997 | Ohta et al. | Jun 1997 | A |
5643433 | Fukase et al. | Jul 1997 | A |
5644169 | Chun | Jul 1997 | A |
5646831 | Manteghi | Jul 1997 | A |
5650663 | Parthasaranthi | Jul 1997 | A |
5661088 | Tessier et al. | Aug 1997 | A |
5665996 | Williams et al. | Sep 1997 | A |
5673479 | Hawthorne | Oct 1997 | A |
5683806 | Sakumoto et al. | Nov 1997 | A |
5689135 | Ball | Nov 1997 | A |
5696666 | Miles et al. | Dec 1997 | A |
5701034 | Marrs | Dec 1997 | A |
5703407 | Hori | Dec 1997 | A |
5710064 | Song et al. | Jan 1998 | A |
5723899 | Shin | Mar 1998 | A |
5724233 | Honda et al. | Mar 1998 | A |
5726493 | Yamashita | Mar 1998 | A |
5736432 | Mackessy | Apr 1998 | A |
5745984 | Cole, Jr. et al. | May 1998 | A |
5753532 | Sim | May 1998 | A |
5753977 | Kusaka et al. | May 1998 | A |
5763942 | Suzuki | Jun 1998 | A |
5766972 | Takahashi et al. | Jun 1998 | A |
5770888 | Song et al. | Jun 1998 | A |
5776798 | Quan et al. | Jul 1998 | A |
5783861 | Son | Jul 1998 | A |
5801440 | Chu et al. | Sep 1998 | A |
5814877 | Diffenderfer et al. | Sep 1998 | A |
5814881 | Alagaratnam et al. | Sep 1998 | A |
5814883 | Sawai et al. | Sep 1998 | A |
5814884 | Davis et al. | Sep 1998 | A |
5817540 | Wark | Oct 1998 | A |
5818105 | Kouda | Oct 1998 | A |
5821457 | Mosley et al. | Oct 1998 | A |
5821615 | Lee | Oct 1998 | A |
5834830 | Cho | Nov 1998 | A |
5835988 | Ishii | Nov 1998 | A |
5844306 | Fujita et al. | Dec 1998 | A |
5856911 | Riley | Jan 1999 | A |
5859471 | Kuraishi et al. | Jan 1999 | A |
5866939 | Shin et al. | Feb 1999 | A |
5871782 | Choi | Feb 1999 | A |
5874784 | Aoki et al. | Feb 1999 | A |
5877043 | Alcoe et al. | Mar 1999 | A |
5886397 | Ewer | Mar 1999 | A |
6143981 | Glenn | Nov 2000 | A |
6169329 | Farnworth et al. | Jan 2001 | B1 |
6177718 | Kozono | Jan 2001 | B1 |
6181002 | Juso et al. | Jan 2001 | B1 |
6184465 | Corisis | Feb 2001 | B1 |
6184573 | Pu | Feb 2001 | B1 |
6194777 | Abbott et al. | Feb 2001 | B1 |
6197615 | Song et al. | Mar 2001 | B1 |
6198171 | Huang et al. | Mar 2001 | B1 |
6201186 | Daniels et al. | Mar 2001 | B1 |
6201292 | Yagi et al. | Mar 2001 | B1 |
6204554 | Ewer et al. | Mar 2001 | B1 |
6208020 | Minamio et al. | Mar 2001 | B1 |
6208021 | Ohuchi et al. | Mar 2001 | B1 |
6208023 | Nakayama et al. | Mar 2001 | B1 |
6211462 | Carter, Jr. et al. | Apr 2001 | B1 |
6218731 | Huang et al. | Apr 2001 | B1 |
6222258 | Asano et al. | Apr 2001 | B1 |
6222259 | Park et al. | Apr 2001 | B1 |
6225146 | Yamaguchi et al. | May 2001 | B1 |
6229200 | Mclellan et al. | May 2001 | B1 |
6229205 | Jeong et al. | May 2001 | B1 |
6239367 | Hsuan et al. | May 2001 | B1 |
6239384 | Smith et al. | May 2001 | B1 |
6242281 | Mclellan et al. | Jun 2001 | B1 |
6256200 | Lam et al. | Jul 2001 | B1 |
6258629 | Niones et al. | Jul 2001 | B1 |
6281566 | Magni | Aug 2001 | B1 |
6281568 | Glenn et al. | Aug 2001 | B1 |
6282095 | Houghton et al. | Aug 2001 | B1 |
6285075 | Combs et al. | Sep 2001 | B1 |
6291271 | Lee et al. | Sep 2001 | B1 |
6291273 | Miyaki et al. | Sep 2001 | B1 |
6294100 | Fan et al. | Sep 2001 | B1 |
6294830 | Fjelstad | Sep 2001 | B1 |
6295977 | Ripper et al. | Oct 2001 | B1 |
6297548 | Moden et al. | Oct 2001 | B1 |
6303984 | Corisis | Oct 2001 | B1 |
6303997 | Lee | Oct 2001 | B1 |
6307272 | Takahashi et al. | Oct 2001 | B1 |
6309909 | Ohgiyama | Oct 2001 | B1 |
6316822 | Venkateshwaran et al. | Nov 2001 | B1 |
6316838 | Ozawa et al. | Nov 2001 | B1 |
6323550 | Martin et al. | Nov 2001 | B1 |
6326243 | Suzuya et al. | Dec 2001 | B1 |
6326244 | Brooks et al. | Dec 2001 | B1 |
6326678 | Karmezos et al. | Dec 2001 | B1 |
6335564 | Pour | Jan 2002 | B1 |
6337510 | Chun-Jen et al. | Jan 2002 | B1 |
6339255 | Shin | Jan 2002 | B1 |
6348726 | Bayan et al. | Feb 2002 | B1 |
6355502 | Kang et al. | Mar 2002 | B1 |
6369447 | Mori | Apr 2002 | B2 |
6369454 | Chung | Apr 2002 | B1 |
6373127 | Baudouin et al. | Apr 2002 | B1 |
6380048 | Boon et al. | Apr 2002 | B1 |
6384472 | Huang | May 2002 | B1 |
6388336 | Venkateshwaran et al. | May 2002 | B1 |
6395578 | Shin et al. | May 2002 | B1 |
6400004 | Fan et al. | Jun 2002 | B1 |
6410979 | Abe | Jun 2002 | B2 |
6414385 | Huang et al. | Jul 2002 | B1 |
6420779 | Sharma et al. | Jul 2002 | B1 |
6429508 | Gang | Aug 2002 | B1 |
6437429 | Su et al. | Aug 2002 | B1 |
6444499 | Swiss et al. | Sep 2002 | B1 |
6448633 | Yee et al. | Sep 2002 | B1 |
6452279 | Shimoda | Sep 2002 | B2 |
6459148 | Chun-Jen et al. | Oct 2002 | B1 |
6464121 | Reijnders | Oct 2002 | B2 |
6476469 | Hung et al. | Nov 2002 | B2 |
6476474 | Hung | Nov 2002 | B1 |
6482680 | Khor et al. | Nov 2002 | B1 |
6498099 | McLellan et al. | Dec 2002 | B1 |
6498392 | Azuma | Dec 2002 | B2 |
6507096 | Gang | Jan 2003 | B2 |
6507120 | Lo et al. | Jan 2003 | B2 |
6534849 | Gang | Mar 2003 | B1 |
6545332 | Huang | Apr 2003 | B2 |
6545345 | Glenn et al. | Apr 2003 | B1 |
6559525 | Huang | May 2003 | B2 |
6566168 | Gang | May 2003 | B2 |
6583503 | Akram et al. | Jun 2003 | B2 |
6603196 | Lee et al. | Aug 2003 | B2 |
6624005 | Di Caprio et al. | Sep 2003 | B1 |
6667546 | Huang et al. | Dec 2003 | B2 |
20010008305 | McLellan et al. | Jul 2001 | A1 |
20010014538 | Kwan et al. | Aug 2001 | A1 |
20020011654 | Kimura | Jan 2002 | A1 |
20020024122 | Jung et al. | Feb 2002 | A1 |
20020027297 | Ikenaga et al. | Mar 2002 | A1 |
20020140061 | Lee | Oct 2002 | A1 |
20020140068 | Lee et al. | Oct 2002 | A1 |
20020163015 | Lee et al. | Nov 2002 | A1 |
20030030131 | Lee et al. | Feb 2003 | A1 |
20030073265 | Hu et al. | Apr 2003 | A1 |
20040056277 | Karnezos | Mar 2004 | A1 |
20040061212 | Karnezos | Apr 2004 | A1 |
20040061213 | Karnezos | Apr 2004 | A1 |
20040063242 | Karnezos | Apr 2004 | A1 |
20040063246 | Karnezos | Apr 2004 | A1 |
20040065963 | Karnezos | Apr 2004 | A1 |
Number | Date | Country |
---|---|---|
19734794 | Aug 1997 | DE |
0393997 | Oct 1990 | EP |
0459493 | Dec 1991 | EP |
0720225 | Mar 1996 | EP |
0720234 | Mar 1996 | EP |
0794572 | Oct 1997 | EP |
0844665 | May 1998 | EP |
0936671 | Aug 1999 | EP |
098968 | Mar 2000 | EP |
1032037 | Aug 2000 | EP |
55163868 | Dec 1980 | JP |
5745959 | Mar 1982 | JP |
58160095 | Aug 1983 | JP |
592O8756 | Nov 1984 | JP |
59227143 | Dec 1984 | JP |
60010756 | Jan 1985 | JP |
60116239 | Aug 1985 | JP |
60195957 | Oct 1985 | JP |
60231349 | Nov 1985 | JP |
6139555 | Feb 1986 | JP |
629639 | Jan 1987 | JP |
6333854 | Feb 1988 | JP |
63067762 | Mar 1988 | JP |
63188964 | Aug 1988 | JP |
63205935 | Aug 1988 | JP |
63233555 | Sep 1988 | JP |
63249345 | Oct 1988 | JP |
63289951 | Nov 1988 | JP |
63316470 | Dec 1988 | JP |
64054749 | Mar 1989 | JP |
1106456 | Apr 1989 | JP |
1175250 | Jul 1989 | JP |
1205544 | Aug 1989 | JP |
1251747 | Oct 1989 | JP |
2129948 | May 1990 | JP |
369248 | Jul 1991 | JP |
3177060 | Aug 1991 | JP |
4098864 | Sep 1992 | JP |
5129473 | May 1993 | JP |
5166992 | Jul 1993 | JP |
5283460 | Oct 1993 | JP |
692076 | Apr 1994 | JP |
6140563 | May 1994 | JP |
6260532 | Sep 1994 | JP |
7297344 | Nov 1995 | JP |
7312405 | Nov 1995 | JP |
864634 | Mar 1996 | JP |
8083877 | Mar 1996 | JP |
8125066 | May 1996 | JP |
8222682 | Aug 1996 | JP |
8306853 | Nov 1996 | JP |
98205 | Jan 1997 | JP |
98206 | Jan 1997 | JP |
98207 | Jan 1997 | JP |
992775 | Apr 1997 | JP |
9293822 | Nov 1997 | JP |
10022447 | Jan 1998 | JP |
10163401 | Jun 1998 | JP |
10199934 | Jul 1998 | JP |
10256240 | Sep 1998 | JP |
00150765 | May 2000 | JP |
556398 | Oct 2000 | JP |
2001060648 | Mar 2001 | JP |
200204397 | Aug 2002 | JP |
941979 | Jan 1994 | KR |
9772358 | Nov 1997 | KR |
100220154 | Jun 1999 | KR |
0049944 | Jun 2002 | KR |
9956316 | Nov 1999 | WO |
9967821 | Dec 1999 | WO |
Number | Date | Country | |
---|---|---|---|
Parent | 10358621 | Feb 2003 | US |
Child | 10910089 | US |