CROSS-REFERENCE TO RELATED APPLICATIONS
The present application is based upon and claims the benefit of priority to Japanese Patent Application No. 2014-162448, filed Aug. 8, 2014, the entire contents of which are incorporated herein by reference.
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a printed wiring board and a semiconductor package. More specifically, the present invention relates to a printed wiring board that has a conductor post that extends from a wiring conductor layer that is formed on one side to the other side, and relates to a semiconductor package that includes the printed wiring board.
2. Description of Background Art
Japanese Patent Laid-Open Publication No. HEI 10-13028 describes a single-sided circuit substrate in which a conductor circuit (conductor layer) is formed on one side of an insulating substrate by patterning a metal foil, a through hole penetrates through the insulating substrate from the other side of the insulating substrate toward the conductor circuit, a conductor post is formed by filling the through hole with a conductive paste, and a front end part of the conductor post that protrudes from the other side of the insulating substrate is used as a connecting part that connects to another insulating substrate or the like. The entire contents of this publication are incorporated herein by reference.
SUMMARY OF THE INVENTION
According to one aspect of the present invention, a printed wiring board includes a wiring conductor layer having a first surface, conductor posts formed on a second surface of the wiring conductor layer on the opposite side with respect to the first surface, and a resin insulating layer embedding the wiring conductor layer such that the first surface of the wiring conductor layer is exposed on a first surface of the resin insulating layer and covering side surfaces of the conductor posts such that an end surface of each of the conductor posts is exposed from a second surface of the resin insulating layer on the opposite side with respect to the first surface of the resin insulating layer. The first surface of the wiring conductor layer is recessed with respect to the first surface of the resin insulating layer and the end surface of each of the conductor posts is recessed with respect to the second surface of the resin insulating layer such that a distance between the end surface of each of the conductor posts and the second surface of the resin insulating layer is greater than a distance between the first surface of the wiring conductor layer and the first surface of the resin insulating layer.
According to another aspect of the present invention, a semiconductor package includes a printed wiring board, a first semiconductor component mounted on a surface of the printed wiring board, and a substrate mounted on the surface of the printed wiring board and having a bump structure formed on a surface of the substrate facing the printed wiring board. The printed wiring board includes a wiring conductor layer having a first surface, conductor posts formed on a second surface of the wiring conductor layer on the opposite side with respect to the first surface, and a resin insulating layer embedding the wiring conductor layer such that the first surface of the wiring conductor layer is exposed on a first surface of the resin insulating layer and covering side surfaces of the conductor posts such that an end surface of each of the conductor posts is exposed from a second surface of the resin insulating layer on the opposite side with respect to the first surface of the resin insulating layer, the first surface of the wiring conductor layer is recessed with respect to the first surface of the resin insulating layer and the end surface of each of the conductor posts is recessed with respect to the second surface of the resin insulating layer such that a distance between the end surface of each of the conductor posts and the second surface of the resin insulating layer is greater than a distance between the first surface of the wiring conductor layer and the first surface of the resin insulating layer, and the bump structure of the substrate is connected to the wiring conductor layer of the printed wiring board.
BRIEF DESCRIPTION OF THE DRAWINGS
A more complete appreciation of the invention and many of the attendant advantages thereof will be readily obtained as the same becomes better understood by reference to the following detailed description when considered in connection with the accompanying drawings, wherein:
FIG. 1 is an explanatory cross-sectional view of a printed wiring board according to an embodiment of the present invention;
FIG. 2 is an enlarged view of a wiring conductor layer and a conductor post of the printed wiring board illustrated in FIG. 1;
FIG. 3 is a cross-sectional view of the wiring conductor layer and the conductor post of FIG. 1, on each of which a surface protection film is formed;
FIG. 4 is a cross-sectional view of the conductor post of FIG. 1 to an end surface of which solder is applied;
FIG. 5A illustrates an example of a layout of conductor posts of a printed wiring board according to an embodiment of the present invention;
FIG. 5B illustrates another example of a layout of conductor posts of a printed wiring board according to an embodiment of the present invention;
FIG. 6A is an explanatory diagram of a process of an example of a method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6B is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6C is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6D is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6E is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6F is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6G is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6H is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 6I is an explanatory diagram of a process of the example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 7A is an explanatory diagram of a process of another example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 7B is an explanatory diagram of a process of the other example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 7C is an explanatory diagram of a process of the other example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 7D is an explanatory diagram of a process of the other example of the method for manufacturing the printed wiring board illustrated in FIG. 1;
FIG. 8A is a cross-sectional view of a semiconductor package of an embodiment of the present invention;
FIG. 8B is a cross-sectional view illustrating an example in which the semiconductor package illustrated in FIG. 8A is filled with a mold resin; and
FIG. 8C is a cross-sectional view illustrating a state in which a second semiconductor component is mounted on the semiconductor package illustrated in FIG. 8B.
DETAILED DESCRIPTION OF THE EMBODIMENTS
The embodiments will now be described with reference to the accompanying drawings, wherein like reference numerals designate corresponding or identical elements throughout the various drawings.
As illustrated in FIG. 1, a printed wiring board 10 according to an embodiment of the present invention (hereinafter, the printed wiring board is also simply referred to as the wiring board) includes: a wiring conductor layer 21 that has a first surface (F1) and a second surface (F2) that is on an opposite side of the first surface (F1); a conductor post 25 that is formed on the second surface (F2) of the wiring conductor layer 21; and a resin insulating layer 30 that has a first surface (SF1) and a second surface (SF2) that is on an opposite side of the first surface (SF1), embeds the wiring conductor layer 21 such that the first surface (F1) of the wiring conductor layer 21 is exposed to the first surface (SF1) side, and covers a side surface of the conductor post 25. In the present embodiment, the first surface (F1) of the wiring conductor layer 21 is recessed relative to the first surface (SF1) of the resin insulating layer 30. Further, an end surface (25a) of the conductor post 25 on an opposite side of the wiring conductor layer 21 is exposed to the second surface (SF2) side of the resin insulating layer 30 and is recessed relative to the second surface (SF2). A distance from the second surface (SF2) of the resin insulating layer 30 to the end surface (25a) of the conductor post 25 is larger than a distance from the first surface (SF1) of the resin insulating layer 30 to the first surface (F1) of the wiring conductor layer 21.
The entire wiring conductor layer 21 is embedded in the resin insulating layer 30 on the first surface (SF1) side such that the first surface (F1) of the wiring conductor layer 21 is exposed to the first surface (SF1) side of the resin insulating layer 30. That is, the wiring conductor layer 21 and the resin insulating layer 30 are in contact with each other not only at the second surface (F2) of the wiring conductor layer 21, but also at side surfaces of the wiring conductor layer 21, specifically, at side surfaces of a first pattern (21a) and a second pattern (21b) that are formed in the wiring conductor layer 21. Therefore, even when the first pattern (21a) and the second pattern (21b) are formed at fine pitches and an area of the second surface (F2) of the wiring conductor layer 21 is reduced, the adhesion between the wiring conductor layer 21 and the resin insulating layer 30 can be maintained. Further, by embedding the wiring conductor layer 21 in the resin insulating layer 30, the wiring board 10 can be formed thin.
As described above, the first pattern (21a) and the second pattern (21b) are formed in the wiring conductor layer 21. In the present embodiment, the first pattern (21a) is a wiring pattern that electrically connects to another printed wiring board (not illustrated in the drawings) that is connected to the wiring board 10 on the second surface (SF2) side of the resin insulating layer 30. Here, the other printed wiring board may be a motherboard of an electronic device or the like in which the wiring board 10 is used, or may be a laminated body of an insulating layer and a conductor layer, the laminated body and the wiring board 10 forming a multilayer wiring board. Further, the second pattern (21b) may be, for example, connection pads to which a semiconductor component (not illustrated in the drawings) or the like is connected. Further, a wiring pattern other than the first and second patterns (21a, 21b) may also be formed in the wiring conductor layer 21. For example, among electrodes of a semiconductor component that is connected to the second pattern (21b), one electrode that is electrically connected to outside is electrically connected to the first pattern (21a) and the conductor post 25 via a wiring pattern (not illustrated in the drawings) that is formed in the wiring conductor layer 21 so that the second pattern (21b) and the first pattern (21a) are connected.
As illustrated in FIG. 1, the conductor post 25 is formed on the second surface (F2) of the first pattern (21a) of the wiring conductor layer 21. The conductor post 25 extends from the second surface (F2) of the first pattern (21a) toward the second surface (SF2) side of the resin insulating layer 30. The end surface (25a) of the conductor post 25 is exposed to the second surface (SF2) side of the resin insulating layer 30. For example, as described above, the conductor post 25 electrically connects a predetermined electrode of the semiconductor component (not illustrated in the drawings) and the above-described other printed wiring board or the like, the semiconductor component being connected to the second pattern (21b). Therefore, a number of conductor posts 25 corresponding to a number of the electrodes of the semiconductor component (not illustrated in the drawings) may be provided along an outer periphery of the second surface (SF2) of the resin insulating layer 30 or over the entire second surface (SF2).
The resin insulating layer 30 covers the side surface of the wiring conductor layer 21 and a portion of the second surface (F2) where a conductor post 25 is not formed, and also covers the side surface of the conductor post 25. The first surface (F1) of the wiring conductor layer 21 is exposed on the first surface (SF1) side of the resin insulating layer 30, and the end surface (25a) of the conductor post 25 is exposed on the second surface (SF2) side on the opposite side. A thickness of the resin insulating layer 30 is not particularly limited. However, from a point of view of having a certain degree of rigidity to allow easy handling while complying with a demand for thickness reduction in the wiring board 10, it is preferable that the thickness of the resin insulating layer 30 be about 100-200 μm.
A material of the resin insulating layer 30 may be a resin composition that does not contain a core material such as glass fiber, and may also be simply a resin composition that does not contain a core material. As the resin composition, an epoxy resin is preferably used. Further, an epoxy resin containing 30-80% by weight of an inorganic filler such as silica may also be used. Further, the material of the resin insulating layer 30 may also be a resin composition suitable to be supplied in a sheet form or a film form when the wiring board 10 is manufactured, or may also be a resin material for mold-molding suitable for a case where the resin insulating layer 30 is formed by mold-molding. When a resin material for mold-molding is selected, that the material of the resin insulating layer 30 has a thermal expansion coefficient of 6-25 ppm/° C. and an elastic modulus of 5-30 GPa is preferable in that a good flowability can be obtained in a mold during molding and an excessive stress does not occur after the molding at an interface with the wiring conductor layer 21 and at a part connecting to a semiconductor component (not illustrated in the drawings) or the like that is mounted on the first surface (SF1) side of the resin insulating layer 30. However, a material having a thermal expansion coefficient and an elastic modulus outside the above-described ranges may also be used for the resin insulating layer 30.
As illustrated in FIG. 1, the first surface (F1) of the wiring conductor layer 21 is positioned on the second surface (SF2) side more than the first surface (SF1) of the resin insulating layer 30 does, and is recessed relative to the first surface (SF1). In this way, the wiring conductor layer 21 is formed. Therefore, even when a semiconductor component (not illustrated in the drawings) on which electrodes are formed at a narrow pitch is connected to the second pattern (21b) or the like using bonding materials or the like, a portion of the resin insulating layer 30 between second patterns (21b) becomes a wall and a state can be prevented in which the bonding materials or the like become in contact with each other and cause electrical short circuiting to occur between adjacent second patterns (21b).
Further, the end surface (25a) of the conductor post 25 is positioned on the first surface (SF1) side more than the second surface (SF2) of the resin insulating layer 30 does and is recessed relative to the second surface (SF2). Therefore, when the conductor post 25 is connected to another printed wiring board (not illustrated in the drawings) or the like, a bonding material layer 27 (see FIG. 4) such as solder can be formed on the end surface (25a) of the conductor post 25 without wetly spreading to the side surface of the conductor post 25 and the like. Further, when bonding materials are melted, a portion of the resin insulating layer 30 between conductor posts 25 becomes a wall and a state can be prevented in which the bonding materials become in contact with each other and cause electrical short circuiting between adjacent conductor posts 25.
In the present embodiment, the distance from the second surface (SF2) of the resin insulating layer 30 to the end surface (25a) of the conductor post 25 is larger than the distance from the first surface (SF1) of the resin insulating layer 30 to the first surface (F1) of the wiring conductor layer 21. That is, the recess of the end surface (25a) of the conductor post 25 relative to the second surface (SF2) of the resin insulating layer 30 is deeper than the recess of the first surface (F1) of the wiring conductor layer 21 relative to the first surface (SF1) of the resin insulating layer 30. For example, when connection to a semiconductor component (not illustrated in the drawings) is performed using wire bonding or the like, a bonding layer (not illustrated in the drawings) of a material suitable for bonding can be formed using a plating method or the like on the first surface (F1) of the wiring conductor layer 21. During the formation of the bonding layer, when the end surface (25a) of the conductor post 25 is not masked, a plating film having a thickness substantially the same as that on the first surface (F1) of the wiring conductor layer 21 is also formed on the end surface (25a). In the present embodiment, the recess on the end surface (25a) of the conductor post 25 is deeper than the recess on the first surface (F1) of the wiring conductor layer 21. Therefore, even when a bonding layer that is so thick that the recess relative to the first surface (SF1) of the resin insulating layer 30 is filled is formed on the first surface (F1) of the wiring conductor layer 21, the recess of the end surface (25a) relative to the second surface (SF2) is not filled by the plating film and, for example, a space (25b) (see FIG. 3) for forming the bonding material layer 27 (see FIG. 4) can be secured on the end surface (25a). Therefore, without requiring masking or the like of the end surface (25a), the above-described bonding layer can be formed using a plating method or the like. When a semiconductor component is connected to the wiring conductor layer 21 using wire bonding or the like, a bonding material with fluidity such as solder cannot be used. Therefore, even when the recess of the first surface (F1) of the wiring conductor layer 21 relative to the first surface (SF1) of the resin insulating layer 30 is filled, it does not cause a significant problem.
A method for forming the wiring conductor layer 21 and the conductor post 25 is not particularly limited. However, it is preferable that the wiring conductor layer 21 and the conductor post 25 be formed using an electroplating method that allows a metal film to be easily formed at a low cost. Further, other than the electroplating method, for example, the wiring conductor layer 21 may also be formed using an ink jet method or the like. Further, for example, the conductor post 25 may also be formed by forming in advance a conductor pin made of a conductive material in a shape of a circular cylinder or a quadrangular prism and connecting the conductor pin to the first pattern (21a). In a method for manufacturing the wiring board 10 (to be described later), the first surface (F1) of the wiring conductor layer 21 can be made recessed relative to the first surface (SF1) of the resin insulating layer 30 by continuing etching for a proper period of time even after a base metal foil 81 (see FIG. 6H) has completely dissolved when the base metal foil 81 is removed by etching. Further, in the etching process of the base metal foil 81, a surface of the conductor post 25 that is exposed on the second surface (SF2) side of the resin insulating layer 30, is not masked and is exposed to an etching solution. Thereby, a front end portion of the conductor post 25 on the second surface (SF2) side is etched together with the base metal foil 81 and the end surface (25a) can be recessed relative to the second surface (SF2) of the resin insulating layer 30, and the recess of the end surface (25a) relative to the second surface (SF2) can be made deeper than the recess of the first surface (F1) of the wiring conductor layer 21 relative to the first surface (SF1).
The material of which the wiring conductor layer 21 and the conductor post 25 are formed is not particularly limited. However, copper that allows easy formation of the wiring conductor layer 21 and the conductor post 25 by electroplating and has excellent conductivity is mainly used. However, the wiring conductor layer 21 and the conductor post 25 may also be formed of a material other than copper, such as a copper alloy or a conductive paste obtained in a paste form by mixing a conductive material and a resin composition.
Preferred examples of dimensions of the wiring conductor layer 21 and the conductor post 25 are described with reference to FIG. 2. A distance (D1) from the first surface (SF1) of the resin insulating layer 30 to the first surface (F1) of the wiring conductor layer 21 is 0.1-5 μm, for example. Setting the distance (D1) to such a length is preferable in that the period of time over which etching is continued after the metal foil 81 (see FIG. 6H) is removed does not become too long and that bonding materials or the like become in contact with each other between adjacent second patterns (21b) or the like can be prevented. A distance (D2) from the second surface (SF2) of the resin insulating layer 30 to the end surface (25a) of the conductor post 25 is 3-10 μm, for example. Setting the distance (D2) to such a length is preferable in that it does not take a too long period of time to etch the front end portion of the conductor post 25 and the bonding material layer 27 (see FIG. 4) such as solder can be formed to have a sufficient thickness on the end surface (25a). From a point of view that the wiring conductor layer 21 can be formed in a relatively short period of time using an electroplating method while ensuring a certain conductivity, it is preferable that a thickness (t1) of the wiring conductor layer 21 be about 10-25 μm. A height (H1) of the conductor post 25 is not particularly limited as long as it is a height that allows the wiring conductor layer 21 and a motherboard or the like on the second surface (SF2) side of the resin insulating layer 30 to be connected. However, for example, the height (H1) is 50-150 μm. That the conductor post 25 is formed to have such a height is preferable in that the conductor post 25 can be applied to a resin insulating layer having a thickness of about 100 μm to 200 μm. However, the distance (D1) from the first surface (SF1) of the resin insulating layer 30 to the first surface (F1) of the wiring conductor layer 21, the distance (D2) from the second surface (SF2) of the resin insulating layer 30 to the end surface (25a) of the conductor post 25, the thickness (t1) of the wiring conductor layer 21, and the height (H1) of the conductor post 25 may respectively be distances, thicknesses or heights that exceed or are below the above-described ranges.
As illustrated in FIG. 3, a surface protection film 28 may be formed on each of the first surface (F1) of the wiring conductor layer 21 and the end surface (25a) of the conductor post 25. Here, in addition to the meaning of a film that protects the wiring conductor layer 21 or the conductor post 25 against corrosion such as oxidation, the “surface protection film” also includes the meaning of a film that is formed on the first surface (F1) or the end surface (25a) in order to obtain a good bondability with a bonding material such as solder or a bonding wire. Examples of the surface protection film 28 include plating metal films that are each formed from multiple layers or a single layer such as Ni/Au, Ni/Pd/Au or Sn, and an organic protective film (OSP). Further, the surface protection film 28 may be formed on both of the first surface (F1) of the wiring conductor layer 21 and the end surface (25a) of the conductor post 25 or may be formed on only one of the two. Further, surface protection films of different materials may be respectively formed on the first surface (F1) of the wiring conductor layer 21 and the end surface (25a) of the conductor post 25. For example, a metal film such as Ni/Au or Ni/Pd/Au may be formed on the first surface (F1) and an OSP may be formed on the end surface (25a).
Further, as illustrated in FIG. 4, the bonding material layer 27 may be formed in the space (25b) (see FIG. 3) on the end surface (25a) of the conductor post 25 that is recessed relative to the second surface (SF2) of the resin insulating layer 30. A material of the bonding material layer 27 is not particularly limited as long as the material allows the conductor post 25 and a motherboard (not illustrated in the drawings) or the like in which the wiring board 10 is mounted to be connected to each other. However, as the material, solder is preferably used. When solder is used, the bonding material layer 27 can be formed by applying paste-like solder or using a plating method. However, a method for forming the bonding material layer 27 is not particularly limited, and any other method, such as a method in which solder balls are mounted and are reflowed, may be used.
In the example illustrated in FIG. 4, the bonding material layer 27 is formed protruding from the second surface (SF2) of the resin insulating layer 30. The bonding material layer 27 may be formed not to protrude from the second surface (SF2) of the resin insulating layer 30, unlike the example illustrated in FIG. 4, or, may be formed to protrude from the second surface (SF2) in an amount more than that in the example illustrated in FIG. 4. In a case where the end surface (25a) of the conductor post 25 protrudes from the second surface (SF2), as described above, when the bonding material layer 27 made of solder or the like is formed on the end surface (25a), the bonding material, when in a melt state, is likely to wetly spread to the side surface of the conductor post 25, and bonding materials of adjacent conductor posts 25 are likely to come into contact with each other. Further, when a solder ball (not illustrated in the drawings) or the like is positioned on the end surface (25a) to form the bonding material layer, it is difficult for the solder ball to be stable on the end surface (25a). However, in the present embodiment, the end surface (25a) of the conductor post 25 is recessed relative to the second surface (SF2) of the resin insulating layer 30. Therefore, the bonding material is prevented from wetly spreading to the side surface of the conductor post 25; and, even when a solder ball or the like is positioned on the end surface (25a), due to that the solder ball is partially accommodated in the recess, it is easy for the solder ball to be stable on the end surface (25a). Further, when a material having a low wettability with respect to the bonding material such as solder is used as the material of the resin insulating layer 30, as illustrated in FIG. 4, even when the bonding material layer 27 is formed protruding from the second surface (SF2) of the resin insulating layer 30, the bonding material in a melt state does not spread along the second surface (SF2) toward adjacent conductor posts 25. Therefore, more bonding material can be supplied to the end surface (25a) of the conductor post 25 while reducing a risk of occurrence of a state in which electrical short circuiting occurs between adjacent conductor posts 25.
The conductor post 25 is a columnar body that is formed on the second surface (F2) of the wiring conductor layer 21, and usually has a circular planar shape. However, the planar shape of the conductor post 25 is not limited to a circular shape, but may also be oval, square, rectangular or rhombic shape When the conductor post 25 is formed using an electroplating method, the conductor post 25 can be formed to have any planar shape by forming an opening in a resist film in a desired shape during plating.
Further, although not illustrated in the drawings, the side surface of the conductor post 25 may be subjected to a roughening treatment that roughens the surface. By roughening the side surface of the conductor post 25, a so-called anchor effect is achieved, and the adhesion between the conductor post 25 and the resin insulating layer 30 is improved. A method of the roughening treatment is not particularly limited. For example, a soft etching treatment, a blackening (oxidation)-reduction treatment, or the like, may be adopted. Further, the side surface of the wiring conductor layer 21 and the second surface (F2) except a portion where the conductor post 25 is formed may also be subjected to the same roughening treatment as the side surface of the conductor post 25. In this case, the adhesion between the wiring conductor layer 21 and the resin insulating layer 30 can be improved.
FIGS. 5A and 5B illustrate examples of formation of conductor posts 25 of the wiring board 10 of the present embodiment on the second surface (SF2) of the resin insulating layer 30. In the example illustrated in FIG. 1, one conductor post 25 is formed on each of both sides of a region where the second pattern (21b) is positioned. However, the number of the conductor posts 25 that are formed and the positions where the conductor posts 25 are formed are not limited to those illustrated in FIG. 1. For example, as illustrated in FIG. 5A, it is also possible that two conductor post rows 26 are positioned in parallel and formed along each side of the wiring board 10, the conductor post rows 26 being each formed by positioning side by side multiple conductor posts 25 in one direction. It is also possible that three or more conductor post rows 26 are positioned in parallel. For example, it is also possible that the conductor posts 25 are formed in a lattice pattern over the entire second surface (SF2) of the resin insulating layer 30. The first pattern (21a) is formed on the first surface (SF1) of the resin insulating layer 30 at positions corresponding to the positions at which the conductor posts 25 are positioned on the second surface (SF2).
Further, as illustrated in FIG. 5B, it is also possible that the two conductor post rows 26 that are positioned in parallel are formed such that the positions of the conductor posts 25 are shifted between the two rows in a row direction. In the example illustrated in FIG. 5B, the two conductor post rows 26, which are formed adjacent to each other and in each of which the conductor posts 25 are positioned side by side at the same pitch, are formed such that the positions of the conductor posts 25 are shifted between the two rows by a length equal to one-half of the positioning pitch in the row direction. That is, the conductor posts 25 are positioned in a zigzag pattern. In this way, by positioning the conductor posts 25 in the zigzag pattern, an interval between conductor posts 25 of adjacent conductor post rows 26 becomes wider and a state in which electrical short circuiting occurs between the conductor posts 25 is less likely to occur. Therefore, the conductor post rows 26 can be positioned in parallel at a narrower pitch. Also in the example illustrated in FIG. 5B, it is also possible that the conductor post rows 26 are formed over the entire second surface (SF2) of the resin insulating layer 30.
Next, an example of a method for manufacturing the wiring board 10 of the present embodiment is described with reference to FIG. 6A-6I.
In the method for manufacturing the wiring board 10 of the present embodiment, first, as illustrated in FIG. 6A, as starting materials, a support plate 80, a carrier copper foil (80a) and a base metal foil 81 are prepared. The carrier copper foil (80a) is laminated on both sides of the support plate 80 and is bonded to both sides of the support plate 80 by applying heat and pressure. A prepreg material or the like in a semi-cured state made of a material obtained by impregnating a core material such as a glass cloth with an insulating resin such as epoxy is preferably used for the support plate 80. However, without being limited to this, other materials may also be used. A material of the base metal foil 81 is a material that allows the wiring conductor layer 21 (to be described later) (see FIG. 6B) to be formed on a surface of the material. As the material of the base metal foil 81, a material is used that can be similarly dissolved in an etching solution in which the material of the wiring conductor layer 21 and the material of conductor post 25 (to be described later) (see FIG. 6D) dissolve, and a copper foil having a thickness of 2-3 μm is preferably used. Further, as the carrier copper foil (80a), for example, a copper foil having a thickness of 15-30 μm, preferably 18 μm, is used. However, the carrier copper foil (80a) is not limited to have these thicknesses, but may also have other thicknesses.
A method for bonding the carrier copper foil (80a) and the base metal foil 81 is not particularly limited. However, for example, substantially entire sticking surfaces of the two may be bonded by a thermoplastic adhesive (not illustrated in the drawings) that allows easy peeling, or, the two may be bonded by an adhesive, or by ultrasonic connection, in a margin portion in a vicinity of an outer periphery where a conductor pattern of the wiring conductor layer 21 (to be described later) (see FIG. 6B) is not provided. Further, the carrier copper foil (80a) and the base metal foil 81 may be bonded to each other before the carrier copper foil (80a) is bonded to the support plate 80. However, without being limited to this, for example, it is also possible that a double-sided copper-clad laminated plate is used for the support plate 80; a copper foil on surface of the double-sided copper-clad laminated plate is used as the carrier copper foil (80a); and the single base metal foil 81 is bonded to the copper foil using the above-described method or the like.
In FIG. 6A-6G, an example of an manufacturing method is illustrated in which the base metal foil 81 is bonded to surfaces on both sides of the support plate 80 and the wiring conductor layer 21, the conductor post 25 and the resin insulating layer 30 are formed on each of the surfaces. Such a manufacturing method is preferable in that two wiring boards each including the wiring conductor layer 21, the conductor post 25 and the like are simultaneously formed. However, it is also possible that the wiring conductor layer 21 and the like are formed on only one side of the support plate 80. Further, it is also possible that wiring conductor layers having mutually different circuit patterns are respectively formed on the two sides of the support plate 80. The following description is given with reference to an example in which the same circuit patterns are formed on both sides of the support plate 80. Therefore, the description is given regarding only one side, and the description regarding the other side and reference numeral symbols for the other side in the drawings are omitted.
As illustrated in FIG. 6B, the wiring conductor layer 21 is formed on the base metal foil 81. A method for forming the wiring conductor layer 21 is not particularly limited. However, for example, an electroplating method is used. Specifically, first, a resist material (not illustrated in the drawings) is applied to or laminated on an entire surface of the base metal foil 81 and is patterned. Thereby, plating resist film (not illustrated in the drawings) is formed in a predetermined region other than a portion where the wiring conductor layer 21 is formed. Next, a plating film is formed, for example, by electroplating using the base metal foil 81 as a seed layer on a portion of the base metal foil 81 where the plating resist film is not formed. Thereafter, the plating resist film is removed. As a result, as illustrated in FIG. 6B, the wiring conductor layer 21 (in which the first pattern (21a) and the second pattern (21b) are formed) is formed in a predetermined circuit pattern on the base metal foil 81. The wiring conductor layer 21 is preferably formed of the same material as that of the conductor post (to be described later), and is preferably formed of copper. Further, the wiring conductor layer 21 can be preferably formed to have a thickness of 10-30 μm. However, the present invention is not limited to this.
Next, the conductor post 25 is formed on the first pattern (21a) of the wiring conductor layer 21. Specifically, first, as illustrated in FIG. 6C, a plating resist film 85 is formed on a surface (second surface (F2)) of the wiring conductor layer 21 on a side opposite to a surface (first surface (F1)) that is in contact with the base metal foil 81, excluding a portion where the conductor post 25 (see FIG. 6D) is formed, and on the base metal foil 81 that is exposed without being covered by the wiring conductor layer 21. The plating resist film 85 is formed to have a thickness of at least about 50-150 μm. Next, a plating layer 250 is formed, for example, by electroplating using the base metal foil 81 as a seed layer on the first pattern (21a) where the plating resist film 85 is not formed. Thereafter, the plating resist film 85 is removed. As a result, as illustrated in FIG. 6D, the conductor post 25 made of the plating layer is formed on the second surface (F2) of the first pattern (21a), the plating layer being formed by electroplating. The conductor post 25 is preferably formed of the same material as that of the wiring conductor layer 21, and is preferably formed of copper. Further, the conductor post 25 can be preferably formed to have a thickness of 50-150 μm. However, the present invention is not limited to this.
After the conductor post 25 is formed, it is preferable that, in order to enhance the adhesion to the resin insulating layer 30 (to be described later), the side surface (25c) and the end surface (25a) of the conductor post 25, and the side surface of the wiring conductor layer 21 and the portion of the second surface (F2) where the conductor post 25 is not formed, be subjected to a roughening treatment. A method of the roughening treatment is not particularly limited. However, for example, a soft etching treatment, a blackening (oxidation)-reduction treatment, or the like, may be adopted. The surfaces that are roughened are preferably processed to have a surface roughness of 0.1-1 μm in arithmetic average roughness. Further, in the case where the roughening treatment is performed, between the removal of the plating resist film 85 and the roughening treatment, in order to stabilize the roughening, an annealing treatment that allows electroplating copper crystals to grow may be performed.
The resin insulating layer 30 (see FIG. 6F) that covers the wiring conductor layer 21 and the conductor post 25 is formed. Specifically, first, as illustrated in FIG. 6E, a sheet-like or film-like insulating material 33 is laminated on the conductor post 25, and is pressed toward the support plate 80 side and is heated. Due to the heating, the insulating material 33 is softened, and flows into between the first pattern (21a) and the second pattern (21b), between the second patterns (21b) and between the conductor posts 25, and solidifies in a semi-cured state. Thereafter, the insulating material 33 is completely cured by being further heated and, as illustrated in FIG. 6F, the resin insulating layer 30 is formed that covers the side surface of the first pattern (21a) and the portion of the second surface (F2) of the first pattern (21a) where the conductor post 25 is not formed, the side surface and the second surface (F2) of the second pattern (21b), and the entire side surface and end surface (25a) of the conductor post 25. Such a method in which the sheet-like or film-like insulating material is laminated to form the resin insulating layer 30 is preferable in that the resin insulating layer 30 can be manufactured using common equipment for manufacturing a wiring board. After the resin insulating layer 30 is formed, preferably, buffing is performed and burrs that occur during the formation of the resin insulating layer 30 are removed.
As illustrated in FIG. 6G, a surface (second surface (SF2)) of the resin insulating layer 30 on an opposite side of the base metal foil 81 side is polished by buffing, CMP (Chemical Mechanical Polishing) or the like until the front end of the conductor post 25 is exposed to the second surface (SF2).
Next, the support plate 80 and the carrier copper foil (80a) are separated from the base metal foil 81. Specifically, first, for example, in a state in which a half-way product (10a) of wiring boards illustrated in FIG. 6G is heated and the thermoplastic adhesive (not illustrated in the drawings) that bonds the carrier copper foil (80a) and the base metal foil 81 is softened, a force is applied to the support plate 80 and the carrier copper foil (80a) in a direction along an interface with the base metal foil 81, so that the carrier copper foil (80a) and the base metal foil 81 are pulled apart from each other. Or, as described above, when the carrier copper foil (80a) and the base metal foil 81 are bonded by an adhesive or by ultrasound connection in a margin portion of a vicinity of an outer periphery, it is also possible that the carrier copper foil (80a), the base metal foil 81 and the support plate 80 together with the resin insulating layer 30 and the like are cut on an inner peripheral side than the bonding area, and the bonding area due to the adhesive or the like is removed, and thereby, the carrier copper foil (80a) and the base metal foil 81 are separated. As a result, the half-way product (10a) of wiring boards becomes two separate half-way products. This state is illustrated in FIG. 6H. Only a half-way product (10a) of a wiring board illustrated on a lower side of the support plate 80 in FIG. 6G is illustrated in FIG. 6H.
Next, the base metal foil 81 is removed, for example, by etching or the like. As an etching solution for the etching, an etching solution that allows all the materials of the base metal foil 81, the wiring conductor layer 21 and the conductor post 25 to be dissolved is used. Therefore, when the base metal foil 81 is etched, the surface of the conductor post 25 that is exposed to the second surface (SF2) of the resin insulating layer 30 is exposed to the etching solution and thereby, the front end portion of the conductor post 25 is etched together with the base metal foil 81. Then, even after the base metal foil 81 is completely removed, the etching process is continued such that the first surface (F1) of the wiring conductor layer 21 that is exposed to the first surface (SF1) of the resin insulating layer 30 due to the removal of the base metal foil 81, and the front end portion of the conductor post 25, are exposed to the etching solution. Thereby, the first surface (F1) side of the wiring conductor layer 21 is etched, and the front end portion of the conductor post 25 is also etched in the same way as when the base metal foil 81 is etched. As a result, as illustrated in FIG. 6I, the first surface (F1) of the wiring conductor layer 21 is recessed relative to the first surface (SF1) of the resin insulating layer 30; the end surface (25a) of the conductor post 25 is recessed relative to the second surface (SF2) of the wiring conductor layer 21; and the recess of the end surface (25a) of the conductor post 25 relative to the second surface (SF2) of the resin insulating layer 30 is deeper than the recess of the first surface (F1) of the wiring conductor layer 21 relative to the first surface (SF1) of the resin insulating layer 30.
After the removal of the base metal foil 81, preferably, the surface protection film 28 (see FIG. 3) is formed on the first surface (F1) of the wiring conductor layer 21 and on the end surface (25a) of the conductor post 25. The formation of the surface protection film 28 may be performed by forming multiple metal films or a single metal film such as Ni/Au, Ni/Pd/Au, Sn, or the like, using a plating method. Further, an OSP may be formed by immersion in a liquid protective material, spraying a protective material, or the like. The surface protection film may be formed on both of the first surface (F1) of the wiring conductor layer 21 and the end surface (25a) of the conductor post 25 or may be formed on only one of the two. Surface protection films of different materials may be respectively formed on the first surface (F1) of the wiring conductor layer 21 and the end surface (25a) of the conductor post 25.
Further, in addition to the formation of the surface protection film, or without forming the surface protection film, the bonding material layer 27 (see FIG. 4) made of a bonding material that bonds the conductor post 25 and an external motherboard or the like may be formed on the end surface (25a) of the conductor post 25. Solder is preferably used as a material of the bonding material layer 27. The bonding material layer 27 can be formed by applying a paste-like solder or positioning solder balls and melting the solder once and then hardening the solder, or using a plating method. However, the material and the formation method of the bonding material layer are not particularly limited. Other materials and methods can also be used.
Through the above-described processes, the wiring board 10 of the present embodiment illustrated in FIG. 1 is completed. A semiconductor component (not illustrated in the drawings) may be connected on the second pattern (21b) of the completed wiring board 10. Further, the end surface (25a) of the conductor post 25 may be connected to a motherboard or the like of an electronic device or the like in which the wiring board 10 is used, or may be connected to another printed wiring board (not illustrated in the drawings) as a part of a multilayer printed wiring board.
In the above description presented with reference to FIG. 6A-6I, an example of the method for manufacturing the wiring board 10 of the present embodiment is described in which the sheet-like or film-like insulating material 33 is laminated and is heated and pressed and thereby the resin insulating layer 30 is formed. However, the resin insulating layer 30 of the wiring board 10 of the present embodiment may also be formed by mold-molding, and such a method as another example of the method for manufacturing the wiring board 10 of the present embodiment (hereinafter, this example is simply referred to as the present manufacturing method) is described below with reference to FIG. 7A-7D. When the resin insulating layer 30 is formed by mold-molding, during molding, the support plate 80 is supported by a lower mold of a molding mold and is covered with an upper mold of the molding mold. Therefore, there are cases where forming the resin insulating layer 30 on both sides of the support plate 80 is difficult. Therefore, in the following description, an example is described in which the wiring board 10 is formed on only one side of the support plate 80. In FIG. 7A-7D, an example is illustrated in which the wiring conductor layer 21 and the like are formed only on the upper side of the support plate 80. However, when the resin insulating layer 30 can be formed on both sides of the support plate 80 simultaneously or sequentially one side at a time, such as when the support plate 80 can be supported by being only partially in contact with the lower mold, it is also possible that the wiring conductor layer 21 and the like are formed on both sides of the support plate 80 and the resin insulating layer 30 is formed on both sides of the support plate 80 by mold-molding. In the present manufacturing method, processes other than the process for forming the resin insulating layer 30 are the same as in the manufacturing method described with reference to FIG. 6A-6I. Therefore, drawings corresponding to FIGS. 6A-6C, 6H and 6I and description about the processes of these drawings are omitted as appropriate.
In the present manufacturing method, through the same processes as those described with reference to FIG. 6A-6C, as illustrated in FIG. 7A, the conductor post 25 is formed on the first pattern (21a) of the wiring conductor layer 21 that is formed on one side of the support plate 80. After the conductor post 25 is formed, it is preferable that, in order to enhance the adhesion to the resin insulating layer 30 (to be described later) (see FIG. 7C), the side surface (25c) and the end surface (25a) of the conductor post 25, and the side surface of the wiring conductor layer 21 and the portion of the second surface (F2) where the conductor post 25 is not formed, be subjected to a roughening treatment. A method of the roughening treatment is not particularly limited. However, for example, a soft etching treatment, a blackening (oxidation)-reduction treatment, or the like, may be adopted. The surfaces that are roughened are preferably processed to have a surface roughness of 0.1-1 μm in arithmetic average roughness. Further, after the formation of the conductor post 25 and before the roughening treatment, in order to stabilize the roughening, an annealing treatment that allows electroplating copper crystals to grow may be performed.
Next, the resin insulating layer 30 (see FIG. 7C) is formed. Specifically, first, as illustrated in FIG. 7B, a mold 88 having a cavity 89 is set on the support plate 80. The first and second patterns (21a, 21b) and the conductor post 25 are accommodated in the cavity 89 of which an opening is closed by the support plate 80. Subsequently, a mold-molding resin 34 is injected into the cavity 89, and the cavity 89 is filled with the mold-molding resin 34. The mold-molding resin 34 solidifies in a semi-cured state. Thereafter, the mold 88 is separated from the support plate 80. The mold-molding resin 34 is completely cured by being further heated. As illustrated in FIG. 7C, the resin insulating layer 30 is formed that covers the side surface of the first pattern (21a) and the portion of the second surface (F2) of the first pattern (21a) where the conductor post 25 is not formed, the side surface and the second surface (F2) of the second pattern (21b), and the entire side surface and end surface (25a) of the conductor post 25. After the resin insulating layer 30 is formed, preferably, buffing is performed and burrs that occur during the formation of the resin insulating layer 30 are removed.
Next, a surface (second surface (SF2)) of the resin insulating layer 30 on an opposite side of the base metal foil 81 side is polished by buffing, CMP or the like until the front end of the conductor post 25 is exposed to the second surface (SF2). This state after the polishing is illustrated in FIG. 7D.
Thereafter, through the same processes as those described with reference to FIGS. 6H and 6I, the wiring board 10 illustrated in FIG. 1 is completed. A method such as the present manufacturing method in which the resin insulating layer 30 is formed by mold-molding is preferable in that a material that is the same as a packaging material of a common electronic component that is packaged using a mold-molding resin can be used, and thus a stress due to a difference in thermal expansion coefficient is unlikely to occur at a bonding place or the like between the wiring board 10 and an electronic component mounted on the wiring board 10.
Further, the method for manufacturing the wiring board 10 of the present embodiment is not limited to the methods described with reference to FIG. 6A-6I and FIG. 7A-7D. The conditions, processing order and the like of the methods may be arbitrarily modified. Further, certain processes may be omitted and other processes may be added.
Next, a semiconductor package of an embodiment of the present invention is described with reference to the drawings. As illustrated in FIG. 8A, a semiconductor package 100 of the present embodiment includes a printed wiring board 110 and a substrate 130. A first semiconductor component 115 is mounted on a surface (SF3) of the printed wiring board 110. The substrate 130 is mounted on the surface (SF3) of the printed wiring board 110. Preferably, the printed wiring board of which an example is illustrated in FIG. 1 is used as the printed wiring board 110. An example of this is illustrated in FIG. 8A. Therefore, most of structural components in the printed wiring board 110 illustrated in FIG. 8A are the same as those of the printed wiring board 10 illustrated in FIG. 1, and such structural components are indicated using the same reference numeral symbols and detailed description thereof is omitted. However, the printed wiring board 110 is not limited to the printed wiring board 10 illustrated in FIG. 1, but may incorporate various modifications and variations with respect to the respective structural components as indicated in the above description of the printed wiring board 10.
As illustrated in FIG. 8A, similar to the printed wiring board 10 illustrated in FIG. 1, the printed wiring board 110 has the wiring conductor layer 21 that is embedded in the resin insulating layer 30 such that the first surface (F1) of the wiring conductor layer 21 is exposed to the first surface (SF1) of the resin insulating layer 30, and the first pattern (21a) and the second pattern (21b) are formed in the wiring conductor layer 21. The conductor post 25 is formed on the second surface (F2) on the opposite side of the first surface (F1) of the first pattern (21a), and the resin insulating layer 30 covers the side surface of the conductor post 25. The first surface (F1) of the wiring conductor layer 21 is recessed relative to the first surface (SF1) of the resin insulating layer 30. The end surface (25a) of the conductor post 25 on the opposite side of the wiring conductor layer 21 is recessed relative to the second surface (SF2) side on the opposite side of the first surface (SF1) of the resin insulating layer 30. Further, the distance from the second surface (SF2) of the resin insulating layer 30 to the end surface (25a) of the conductor post 25 is larger than the distance from the first surface (SF1) of the resin insulating layer 30 to the first surface (F1) of the wiring conductor layer 21.
In the example illustrated in FIG. 8A, two first patterns (21a) are formed on each of left and right outer sides in FIG. 8A of the region where the second pattern (21b) is formed, and a conductor post 25 is formed on the second surface (F2) of each of the first patterns (21a). Also in the semiconductor package 100 of the present embodiment, the conductor posts 25 may be positioned in one conductor post row or in multiple conductor post rows in one direction along an outer periphery of the printed wiring board 110 and, as described above, may also be positioned over the entire second surface (SF2) of the resin insulating layer 30,
The substrate 130 has a bump 124 on a surface on the printed wiring board 110 side, and the bump 124 is connected to a first pattern (21a) that is formed in the wiring conductor layer 21. In the example illustrated in FIG. 1, the bump 124 is connected to the first pattern (21a) formed on an outer peripheral side of the printed wiring board 110.
Further, the first semiconductor component 115 is positioned in a space secured between the printed wiring board 110 and the substrate 130, depending on a height of the bump 124. Further, the first semiconductor component 11 has electrodes 116. The electrodes 116 are connected by a bonding material 122 to the second pattern (21b) formed in the wiring conductor layer 21.
The semiconductor package 100 of the present embodiment includes the printed wiring board 110 that has the same structure as above-described printed wiring board 10 of which an embodiment is illustrated in FIG. 1. Therefore, as described above, even when the first and second patterns (21a, 21b) of the wiring conductor layer 21 and the like are formed at fine pitches, adhesion to the resin insulating layer 30 can be easily maintained. Further, on each of the first surface (SF1) and the second surface (SF2) of the printed wiring board 110, short circuiting between connecting parts that connect to the first semiconductor component 115 or a motherboard (not illustrated in the drawings) or the like can be prevented.
The structure and material of the substrate 130 are not particularly limited. For the substrate 130, a printed wiring board that is formed by an interlayer resin insulating layer made of a resin material and conductor layer made of a copper foil or the like, a wiring board obtained by forming a conductor film on a surface of an insulating substrate made of an inorganic material such as alumina or aluminum nitride, and a motherboard substrate which may be manufactured using a method described in FIG. 8-13 of International Publication No. WO/2011/122246 may be utilized. The entire contents of this publication are incorporated herein by reference. Further, the first semiconductor component 115 is also not particularly limited. Any semiconductor component, such as a microcomputer, a memory, and an ASIC, can be used as the first semiconductor component 115.
The materials for the bonding material 122 and the bump 124 are also not particularly limited. Any conductive material, preferably, metal such as solder, gold and copper can be used. Further, it is also possible that, without using the bonding material 122, the electrodes 116 of the first semiconductor component 115 and the second pattern (21b) are connected by forming an inter-metal junction between the two by applying heat, pressure and/or vibration.
FIG. 8B illustrates an example in which a space between the printed wiring board 110 and the substrate 130 of the semiconductor package 100 illustrated in FIG. 8A is filled with a mold resin 126. In this way, when the space is filled with the mold resin 126, there are advantages such as that the first semiconductor component 115 is protected from a mechanical stress, and that the behavior of the printed wiring board 110 due to ambient temperature variation is limited, a stress that occurs in a portion connecting to the first semiconductor component 115 is reduced and connection reliability is improved. The material for the mold resin 126 is not particularly limited. However, for example, a material that has a thermal expansion coefficient close to that of the first semiconductor component 115 and/or that of the resin insulating layer 30 and has good insulation performance is used. Preferably, as the mold resin 126, a thermosetting epoxy resin containing a suitable amount of filler such as silica is used. A method for filling the space with the mold resin 126 is not particularly limited. For example, the filling may be performed by transfer molding in a mold (not illustrated in the drawings), or by injecting a liquid resin and thereafter applying heat to perform curing.
FIG. 8C illustrates an example in which a second semiconductor component 135 is mounted on the substrate 130 of the semiconductor package 100 illustrated in FIG. 8B. As illustrated in FIG. 8C, electrodes (not illustrated in the drawings) that are provided on one surface of the second semiconductor component 135 are connected to the substrate 130 by a bonding wire 137, or, the connection may be performed using a flip-chip mounting method by inverting the second semiconductor component 135 so that the surface on which the electrodes are provided faces downward. In this way, by making the semiconductor package in a package-on-package structure in which the second semiconductor component 135 is mounted, a size in a plan view can be reduced and a sophisticated semiconductor device can be provided.
In a printed wiring board used in a package of a semiconductor device, when a desired electrical circuit is formed on one side alone, a wiring pattern that includes connecting parts for connecting a semiconductor component may be formed only on one side, and only connecting parts for connecting a motherboard may be provided on the other side.
As a semiconductor component becomes sophisticated in recent years, there is a tendency that electrodes of the semiconductor component are formed at a narrow pitch and the number of the electrodes is also increasing. Therefore, wirings of a conductor pattern in a printed wiring board are formed at a fine pitch. In particular, when a wiring pattern is formed on only one side of a printed wiring board in order to achieve cost reduction of the printed wiring board, a fine-pitch wiring pattern may be formed so that a desired circuit can be formed on only one side of the printed wiring board. Further, in such a printed wiring board in which a semiconductor component is connected, connecting parts that connect a motherboard are also formed at a narrow pitch.
In a circuit substrate, a conductor layer may be formed on a surface of an insulating substrate. Therefore, when a wiring pattern is formed at a fine pitch, there is a risk that a contact area between the wiring pattern and the insulating substrate is reduced and adhesion is decreased. Further, there is also a risk that bonding materials flow between connecting parts of a semiconductor component and become in contact with each, causing short circuiting to occur. Further, in the circuit substrate, a front end part of a conductor post may protrude from the surface of the insulating substrate. Therefore, when the circuit substrate is mounted on a motherboard or the like, when a layer of a bonding material such as solder is formed on a front end surface of the conductor post, the bonding material may also wetly spread to a side surface. Therefore, also for connecting parts that connect to the motherboard, along with the connecting parts formed at a narrow pitch, there is a risk that bonding materials may come into contact with each other and cause short circuiting between the connecting parts.
A printed wiring board according to an embodiment of the present invention allows good adhesion to be maintained between a conductor layer and an insulating layer and allows short circuiting between adjacent connecting parts to be suppressed both for connecting parts for connecting a semiconductor component or the like on one side and for connecting parts for connecting a motherboard or the like on the other side, even when a wiring pattern is formed at a fine pitch, and another embodiment of the present invention is a semiconductor package containing such a printed wiring board.
A printed wiring board according to an embodiment of the present invention includes: a wiring conductor layer that has a first surface and a second surface that is on an opposite side of the first surface; a conductor post that is formed on the second surface of the wiring conductor layer; and a resin insulating layer that has a first surface and a second surface that is on an opposite side of the first surface, embeds the wiring conductor layer such that the first surface of the wiring conductor layer is exposed to the first surface of the resin insulating layer, and covers a side surface of the conductor post. The first surface of the wiring conductor layer is recessed relative to the first surface of the resin insulating layer. An end surface of the conductor post on an opposite side of the wiring conductor layer is exposed to the second surface side of the resin insulating layer and is recessed relative to the second surface. A distance from the second surface of the resin insulating layer to the end surface of the conductor post is larger than a distance from the first surface of the resin insulating layer to the first surface of the wiring conductor layer.
A semiconductor package according to an embodiment of the present invention includes a printed wiring board and a substrate. A first semiconductor component is mounted on a surface of the printed wiring board. The substrate is mounted on the surface of the printed wiring board. The printed wiring board includes: a wiring conductor layer that has a first surface and a second surface that is on an opposite side of the first surface; a conductor post that is formed on the second surface of the wiring conductor layer; and a resin insulating layer that has a first surface and a second surface that is on an opposite side of the first surface, embeds the wiring conductor layer such that the first surface of the wiring conductor layer is exposed to the first surface of the resin insulating layer, and covers a side surface of the conductor post. The first surface of the wiring conductor layer is recessed relative to the first surface of the resin insulating layer. An end surface of the conductor post on an opposite side of the wiring conductor layer is exposed to the second surface side of the resin insulating layer and is recessed relative to the second surface. A distance from the second surface of the resin insulating layer to the end surface of the conductor post is larger than a distance from the first surface of the resin insulating layer to the first surface of the wiring conductor layer. The substrate has a bump on a surface on the printed wiring board side. The bump is connected to the wiring conductor layer.
According to an embodiment to the present invention, the wiring conductor layer is embedded in the resin insulating layer on the first surface side. Therefore, a contact area between the wiring conductor layer and the resin insulating layer is increased. Therefore, even when a wiring pattern is formed at a fine pitch in the wiring conductor layer, the adhesion to the resin insulating layer can be maintained. Further, the first surface of the wiring conductor layer and the end surface of the conductor post are respectively recessed relative to the first surface and the second surface of the resin insulating layer. Therefore, on both sides of the printed wiring board, short circuiting between connecting parts can be prevented.
Obviously, numerous modifications and variations of the present invention are possible in light of the above teachings. It is therefore to be understood that within the scope of the appended claims, the invention may be practiced otherwise than as specifically described herein.
Patent Application
20160043024
