Claims
- 1. A process for the metallization of a photoimageable dielectric surface, said process comprising contacting said surface with a metallization solution having a pH in the range of 3 to 12 such that a metal film is thereby deposited upon the photoimageable dielectric surface in an adherent fashion.
- 2. A process according to claim 1 wherein said metallization solution has a pH in the range of 4 to 11.
- 3. A process according to claim 1 wherein said metallization solution has a pH in the range of 5 to 10.
- 4. A process according to claim 1 wherein said process also comprises contacting said photoimageable dielectric surface with a conditioning agent comprising an organosilane prior to plating.
- 5. A process according to claim 2 wherein the metallization solution is selected from the group consisting of non-formaldehyde electroless copper, electroless nickel, and electroless cobalt.
- 6. A process according to claim 2 wherein the dielectric surface is baked after contacting said surface with said metallization solution.
- 7. A process according to claim 2 wherein the adhesion of the metal deposit produced on said photoimageable dielectric surface is in the range of 3 to 9 lbs/in.
- 8. A process according to claim 7 wherein the adhesion of the metal deposit produced to said photoimageable dielectric surface after solder shock for 10 seconds at 288.degree. C. is in the range of 3 to 7 lbs/in.
- 9. A process for fabricating a circuitry package comprising:
- (a) coating the surface of the substrate with a photoimageable dielectric material;
- (b) exposing the coated substrate to an imagewise pattern of radiation, to which said photoimageable dielectric material is responsive, in an amount sufficient to at least partially cure the exposed areas of said dielectric;
- (c) developing the coated substrate with a solution which will selectively remove non-exposed areas of the photoimageable dielectric thereby yielding substrate surfaces and photoimageable dielectric surfaces;
- (d) optionally, further curing the photoimageable dielectric which remains on the surface;
- (e) optionally, repeating steps (a) through (d);
- (f) depositing a conductive material onto at least a portion of the photoimageable dielectric surfaces with a metallization solution having a pH in the range of 3 to 12;
- (g) optionally, subsequently defining circuitry and interconnects by selectively etching portions of the conductive material; and
- (h) optionally, repeating steps (a) through (g) so as to build more than one layer of circuitry.
- 10. A process according to claim 9 wherein said metallization solution has a pH in the range of 4 to 11.
- 11. A process according to claim 9 wherein said metallization solution has a pH in the range of 5 to 10.
- 12. A process according to claim 9 wherein said process also comprises contacting said photoimageable dielectric surface with a conditioning agent comprising an organosilane prior to plating.
- 13. A process according to claim 10 wherein the metallization solution is selected from the group consisting of non-formaldehyde electroless copper, electroless nickel, and electroless cobalt.
- 14. A process according to claim 10 wherein the dielectric surface is baked after contacting said surface with said metallization solution.
Parent Case Info
This application is a continuation of application Ser. No. 07/410,031, filed Mar. 22, 1995, now abandoned.
US Referenced Citations (9)
Continuations (1)
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Number |
Date |
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410031 |
Mar 1995 |
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