This application is a continuation-in-part of three parent applications: 1. U.S. patent application Ser. No. 916,165 filed Jul. 17, 1992 entitled "System for Detecting Threshold Phenomena Associated with and/or Atomic or Molecular Spectra of a Substance;" now U.S. Pat. No. 5,268,573. 2. U.S. patent application Ser. No. 979,597 filed Nov. 20, 1992 entitled "System for Imaging and Detecting Threshold Phenomena Associated with and/or Atomic or Molecular Spectra of a Substance by Reflection of an AC Electrical Signal;" now U.S. Pat. No. 5,281,814 and 3. U.S. patent application Ser. No. 08/056,348, filed Apr. 30, 1993, now abandoned, entitled "Multiple Source and Detection Frequencies in Detecting Threshold Phenomena Associated with and/or Atomic or Molecular Spectra," which is a continuation-in-part application of U.S. patent application Ser. No. 916,165 filed Jul. 17, 1992, now U.S. Pat. No. 5,268,573. This application is also related to U.S. application entitled "Multiple Source and Detection Frequencies in Detecting Threshold Phenomena Associated with and/or Atomic or Molecular Spectra," by Paul S. Weiss and Stephan J. Stranick, filed on the same day as this application and referred to below as the companion application. The parent applications and the companion application are incorporated herein by reference in their entirety.
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3566262 | Thompson | Feb 1971 | |
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4941753 | Wickramasinghe | Jul 1990 | |
5060248 | Dumoulin | Oct 1991 | |
5268573 | Weiss et al. | Dec 1993 | |
5281814 | Weiss et al. | Jan 1994 |
Number | Date | Country |
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0073304 | Mar 1983 | EPX |
0272935 | Jun 1988 | EPX |
0307210 | Mar 1989 | EPX |
0307211 | Mar 1989 | EPX |
0363147 | Apr 1990 | EPX |
0435645 | Jul 1991 | EPX |
1173533 | Jul 1964 | DEX |
2157876 | Oct 1985 | GBX |
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Number | Date | Country | |
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Parent | 916165 | Jul 1992 | |
Parent | 916165 | Jul 1992 |