Semiconductor device voltage supply for a system with at least two, especially stacked, semiconductor devices

Abstract

The invention relates to a system (1) comprising a first semiconductor device (2a), and a second semiconductor device (2b), wherein the first semiconductor device (2a) comprises a voltage supply means (3a), and wherein the voltage supply means (3a) of the first semiconductor device (2a) is connected to the second semiconductor device (2b), so that the voltage supply means (3a) of the first semiconductor device (2a) can provide a supply voltage for the second semiconductor device (2b).

Description

In accordance with the preamble of claim 1, the invention relates to a system with two—especially stacked—semiconductor devices and a semiconductor device voltage supply for such a system, respectively.

Semiconductor devices, in particular memory devices such as DRAMS (DRAM=Dynamic Random Access Memory or dynamic read-write-memory, respectively) in general comprise one or several voltage supply means.

A voltage supply means serves to generate, from an—externally provided—voltage, a voltage used internally in the semiconductor device.

The voltage level of the internal voltage generated by the semiconductor device voltage supply means may differ from the level of the external voltage.

In particular, the internally used voltage level may be lower than the externally used voltage level.

An internal voltage level that is reduced vis-à-vis the externally used voltage level has, for instance, the advantage that the power loss in the semiconductor device can be reduced.

Furthermore, the external voltage may be subject to relatively strong fluctuations. Therefore, a so-called voltage regulator is frequently used as voltage supply means, which—in order that the device may be operated without fault—converts the external voltage into an internal voltage that is subject to relatively minor fluctuations only and is regulated at a particular, constant (possibly reduced) value.

Conventional voltage regulators may, for instance, comprise a differential amplifier and a field effect transistor. The gate of the field effect transistor may be connected to an output of the differential amplifier, and the source of the field effect transistor may e.g. be connected to the external voltage.

A reference voltage—which is subject to relatively minor fluctuations only—is applied to the positive input of the differential amplifier. The voltage output at the drain of the field effect transistor may be fed back to the negative input of the differential amplifier directly, or e.g. by the interposition of a voltage divider.

The differential amplifier regulates the voltage available at the gate connection of the field effect transistor such that the (fed back) drain voltage—and thus the voltage output by the voltage regulator—is constant and as high as the reference voltage, or e.g. by a certain factor higher.

Semiconductor devices are usually incorporated in appropriate housings, e.g. appropriate surface mountable housings (SMD housings) or plug mountable housings (e.g. corresponding Dual-In-Line (DIL) housings, Pin-Grid-Array (PGA) housings, etc.).

In one single housing, there may also be arranged two or more semiconductor devices instead of only one single semiconductor device.

In the case of memory devices, in particular DRAMs for increasing the storage density, several semiconductor devices may, for instance, be mounted in a stacked manner in one single housing.

For instance, two 256 Mbit memory devices may be provided in one single housing, this effecting a 512 Mbit chip.

The semiconductor devices, in particular memory devices, provided in one single housing comprise voltage supply means that are independent of one another.

When a memory device is accessed (i.e. when corresponding external data are stored on the memory device, or when data that are stored on the memory device are read out), there will flow, in general, relatively high currents that are generated by the corresponding voltage supply means.

Contrary to this, only relatively low currents will flow in standby or refresh operation (e.g. for supplying leakage currents or operating currents).

The standby or refresh currents each may, for instance, be in the range of approx. 50 μA—i.e. amount to a total of 100 μA in the case of e.g. two stacked memory devices (with the operating currents of the respective voltage supply means constituting the major part of these currents).

It is an object of the invention to provide a novel system with two—especially stacked—semiconductor devices, and—in particular—a semiconductor device voltage supply for such a system, respectively.

The invention achieves this and further objects by the subject matter of claim 1.

Advantageous further developments of the invention are indicated in the subclaims.

In accordance with a basic idea of the invention, a system, in particular a semiconductor device system, is provided, comprising

• • a first semiconductor device, and
  • a second semiconductor device, wherein the first semiconductor device comprises a voltage supply means, and wherein the voltage supply means of the first semiconductor device is connected to the second semiconductor device, so that the voltage supply means of the first semiconductor device can provide a supply voltage for the second semiconductor device.

It is of particular advantage when the second semiconductor device additionally also comprises a voltage supply means.

Preferably, in a first operating mode of the second semiconductor device, the voltage supply means of the second semiconductor device provides the voltage supply for the second semiconductor device, and in a second operating mode of the second semiconductor device—in particular in a standby or refresh mode—, this is effected by the voltage supply means of the first semiconductor device.

The voltage supply means of the second semiconductor device may then be deactivated, so that the operating current thereof may be saved (and thus, altogether, the currents required for operating the semiconductor devices).

In an advantageous development of the invention, the first semiconductor device and the second semiconductor device are arranged in one and the same housing.

Preferably, the first and second semiconductor devices are arranged in the housing in a stacked manner.

Advantageously, the housing may be a plug mountable semiconductor device housing, or e.g. a surface mountable semiconductor device housing.

It is particularly preferred when the first and/or the second semiconductor devices are corresponding memory devices, in particular corresponding DRAM memory devices.

In an advantageous development of the invention, the voltage supply means of the first semiconductor device is connected to a corresponding pad of the first semiconductor device.

Preferably, the pad of the first semiconductor device is connected to a corresponding pad of the second semiconductor device, which the voltage supply means of the second semiconductor device can be connected to.

The pad of the first semiconductor device may, for instance, be connected directly to the corresponding pad of the second semiconductor device, in particular by means of an appropriate bonding wire.

Alternatively, the pad of the first semiconductor device may, for instance, also be connected to the corresponding pad of the second semiconductor device indirectly, e.g. via an interposer.

In the following, the invention will be explained in detail by means of several embodiments and the enclosed drawing. The drawing shows:

FIG. 1 a a schematic representation of a system with two stacked semiconductor devices with a semiconductor device voltage supply in accordance with a first embodiment of the present invention; and

FIG. 1 b a schematic representation of a system with two stacked semiconductor devices with a semiconductor device voltage supply in accordance with a second embodiment of the present invention.

FIG. 1 a is a schematic representation of a system 1 with two stacked semiconductor devices 2a, 2b in accordance with a first embodiment of the present invention.

The two semiconductor devices 2a, 2b are—apart, in particular, from the components serving for voltage supply of the semiconductor devices 2a, 2b or controlling the voltage supply, respectively, which will be explained in more detail in the following—substantially of identical structure.

The semiconductor devices 2a, 2b may, on principle, be any type of logic and/or memory devices, e.g. functional memory devices, in particular PLDs or PLAs, or e.g. table memory devices, in particular ROM or RAM table memory devices, etc.

For instance, appropriate DRAM table memory devices, e.g. a 256 Mbit, a 512 Mbit, or a 1 Gbit DRAM table memory device 2a, 2b, for instance appropriate DDR-DRAMs (Double Data Rate DRAMs), may be used as semiconductor devices 2a, 2b.

As is illustrated schematically in FIG. 1a, the semiconductor devices 2a, 2b are arranged in the same semiconductor device housing 4.

The housing 4 may, for instance, be an appropriate plug mountable semiconductor device housing, e.g. a Dual-In-Line (DIL) housing, a Pin-Grid-Array (PGA) housing, etc., or a surface mountable semiconductor device housing (SMD housing), etc.

As results further from FIG. 1a, the semiconductor devices 2a, 2b are mounted in the housing 4 such that they are substantially stacked.

By the stacking of the semiconductor devices 2a, 2b in the same housing 4, the system 1 can—e.g. when two 256 Mbit memory devices 2a, 2b are used as semiconductor devices 2a, 2b—altogether be used as a 512 Mbit memory device (or e.g. when two 512 Mbit memory devices are used, as a 1 Gbit memory device, etc.).

As is further illustrated in FIG. 1a, each semiconductor device 2a, 2b comprises a voltage supply means 3a, 3b having a structure similar to that of conventional voltage supply means (or—alternatively—a plurality of, e.g. two, three, four, five, six, or seven, voltage supply means having a structure corresponding to that of the voltage supply means 3a, 3b).

The voltage supply means 3a, 3b serve to generate, from an external voltage—provided by a voltage source (not illustrated) arranged externally of the semiconductor devices 2a, 2b and of the housing, respectively—a corresponding internal voltage—used, for instance, internally in the respective semiconductor device 2a, 2b (cf. explanations below).

The external voltage provided by the external voltage source may, for instance, be supplied to the voltage supply means 3a, 3b via one or a plurality of supply pins (not illustrated) of the semiconductor device housing 4, and via semiconductor device pads connected therewith (e.g. the pads 5c, 5d illustrated in FIG. 1a), as well as via corresponding lines 7a, 7b connected to the pads 5c, 5d or extending in the semiconductor devices 2a, 2b, respectively.

As voltage supply means 3a, 3b, e.g. appropriate charge pumps may be used that have a structure similar to that of conventional charge pumps, or e.g.—as in the embodiment illustrated here—voltage regulating means 3a, 3b that have a structure similar to that of conventional voltage regulating means.

These means serve to convert the external voltage—which may be subject to relatively strong fluctuations—into the above-mentioned internal voltage—which is subject to relatively minor fluctuations only and is regulated at a particular, constant value.

The internal voltage may, for instance, have substantially the same, or alternatively e.g. a lower, voltage level as/than the external voltage. The external voltage may, for instance, lie in the range of between 1.5 V and 2.5 V, e.g. at 1.8 V, and the internal voltage e.g. in the range of between 1.3 V and 2.0 V, e.g. at 1.5 V.

The voltage supply means 3a, 3b or voltage regulating means 3a, 3b, respectively, each may, for instance, comprise a differential amplifier and a field effect transistor. The gate of the field effect transistor may be connected to an output of the differential amplifier, and the source of the field effect transistor may be connected e.g. to the above-mentioned external voltage.

A reference voltage that is subject to relatively minor fluctuations only is applied to the positive input of the differential amplifier. The voltage output at the drain of the field effect transistor may be fed back to the negative input of the differential amplifier directly, or e.g. by the interposition of a voltage divider.

The differential amplifier regulates the voltage available at the gate connection of the field effect transistor such that the (fed back) drain voltage—and thus the voltage output by the corresponding voltage supply means 3a, 3b or voltage regulating means 3a, 3b, respectively, e.g. at corresponding lines 7c, 7d or connections, respectively (i.e. the above-mentioned voltage used internally on the semiconductor devices 2a, 2b (internal voltage))—is constant and as high as the reference voltage, or e.g. by a certain factor higher.

The first and the second semiconductor devices 2a, 2b are operated in several, different modes.

In a first mode (working mode), an external access to the first or second semiconductor device 2a, 2b may, for instance, be effected (similar as with conventional memory devices). In so doing, corresponding—external—data may, for instance, be stored on the first or second semiconductor device 2a, 2b (with the data being input e.g. at corresponding pins of the semiconductor device housing 4), or data stored on the first or second semiconductor device 2a, 2b may be read out externally (with the data being output at corresponding pins of the semiconductor device housing 4).

A second operating mode may, for instance, be a standby mode (similar as with conventional memory devices), or, e.g. a refresh mode (also similar as with conventional memory devices).

During a refresh mode (or more exactly: during a refresh operation), the capacitors of the memory cells on which the data stored on the semiconductor devices 2a, 2b are stored, are correspondingly refreshed.

A refresh cycle may be performed at regular time intervals, e.g. every 1 to 10 ms or every 10 to 1000 ms, etc.

As will be explained in more detail in the following, in the semiconductor device system 1 illustrated in FIG. 1a, the voltage supply means 3b of the second semiconductor device 2b is activated in the above-mentioned first operating mode (and possibly in one or several further operating mode(s))—e.g. during the above-mentioned working mode—, and in the above-mentioned second operating mode (and possibly in one or several further operating mode(s))—e.g. during the standby mode and/or during the refresh mode—the voltage supply means 3b of the second semiconductor device 2b is deactivated.

This happens e.g. by corresponding activating/deactivating signals being fed to the voltage supply means 3b of the second semiconductor device 2b by an activating/deactivating control means 8.

In the activated state, the voltage supply means 3b of the second semiconductor device 2b is switched on (is, in particular, connected to the supply or external voltage, so that corresponding operating currents—e.g. of between 20 μA and 80 μA, e.g. 50 μA—are flowing), and in the deactivated state it is switched off (is, in particular, separated from the supply or external voltage, so that corresponding operating currents are prevented from flowing).

As is further illustrated in FIG. 1a, the voltage supply means 3a of the first semiconductor device 2a is connected—here: via the line 7c—to a corresponding semiconductor device pad 5a of the first semiconductor device 2a.

The pad 5a is connected to a corresponding semiconductor device pad 5b of the second semiconductor device 2b by means of a bonding wire 6.

The pad 5b of the second semiconductor device 2b is connected—here: via the line 7d—to the voltage supply means 3b of the second semiconductor device 2b (or to a line or a connection, respectively, at which—in the activated state of the voltage supply means 3b of the second semiconductor device 2b—the internal voltage then generated thereby is output).

By the above-described connection of the voltage supply means 3a of the first semiconductor device 2a to the second semiconductor device 2b it is achieved that, in the above-mentioned second operating mode of the second semiconductor device 2b (and possibly in one or several further operating mode(s))—e.g. during the standby mode and/or during the refresh mode—, the voltage supply means 3a of the first semiconductor device 2a can, in addition to the—internal—supply voltage (internal voltage) for the first semiconductor device 2a, provide the—internal—supply voltage (internal voltage) for the second semiconductor device 2b.

In other words, in the above-mentioned second operating mode the voltage supply means 3a of the first semiconductor device 2a generates the respectively required (internal) voltages for both semiconductor devices 2a, 2b—the voltage supply means 3b of the second semiconductor device 2b is deactivated, so that the operating current thereof may be saved (this, altogether, reducing the currents required for operating the semiconductor devices 2a, 2b).

Contrary to this—as has already been explained above—in the above-mentioned first operating mode of the second semiconductor device 2b (and possibly in one or several further operating mode(s))—e.g. during the working mode—the voltage supply means 3b of the second semiconductor device 2b is put to an active state (and the voltage supply means 3a of the first semiconductor device 2a is possibly additionally separated from the voltage supply means 3b of the second semiconductor device 2b, or the above-mentioned line or the connection, respectively, at which the voltage supply means 3b of the second semiconductor device 2b outputs the internal voltage generated thereby (e.g. by controlling the activating/deactivating control means 8, or alternatively e.g. a corresponding control means provided on the first semiconductor device 2a)).

By this it is achieved that, in the above-mentioned first operating mode of the second semiconductor device 2b (and possibly in one or several further operating mode(s))—e.g. during the first working mode—the voltage supply means 3b of the second semiconductor device 2b provides the—internal—supply voltage (internal voltage) for the second semiconductor device 2b (and the voltage supply means 3a of the first semiconductor device 2a the—internal—supply voltage (internal voltage) for the first semiconductor device 2a).

Advantageously, the first and the second semiconductor devices 2a, 2b are—in particular until passing through the device function adjusting step which will be explained in more detail in the following—(at first) of substantially identical structure.

By means of the device function adjusting step it is determined during the manufacturing of the semiconductor devices whether a corresponding semiconductor device is to fulfill a function that corresponds to the function of the above-mentioned first semiconductor device 2a, i.e. the function of a “master” which, in the above-mentioned second operating mode (and possibly in one or several further operating mode(s)), is to provide—in addition to its own voltage supply—the respectively required (internal) voltage also for one or several further semiconductor device(s), or a function corresponding to the function of the above-mentioned second semiconductor device 2b, i.e. the function of a “slave” which is to obtain, in the above-mentioned second operating mode (and possibly in one or several further operating mode(s)) the respectively required (internal) voltage from another semiconductor device (“master”).

For determining the function of a corresponding semiconductor device, an appropriate device function adjusting means, in particular an appropriate fuse, may be provided on the semiconductor devices.

An appropriate laser fuse or e.g. an appropriate electrical fuse may, for instance, be used as a fuse.

When the fuse is shot, the corresponding device assumes e.g. a “master” function, and otherwise a “slave” function (or vice versa).

As is shown by means of the alternative embodiment for a semiconductor device system 1 illustrated in FIG. 1b, the voltage supply means 3a of the first semiconductor device 2a may also be connected in any other way than in that illustrated in FIG. 1a to the second semiconductor device 2b (or more exactly: the voltage supply means 3b of the second semiconductor device 2b (or the line or the connection, respectively, at which the voltage supply means 3b of the second semiconductor device 2b outputs the internal voltage generated thereby in the activated state).

For instance, in accordance with FIG. 1b, the voltage supply means 3a of the first semiconductor device 2a may be connected—as described above—to a semiconductor device pad 5a of the first semiconductor device 2a which—other than with the embodiment illustrated in FIG. 1a—is connected to a corresponding contact of an interposer 9 (or to a corresponding leadframe connection 10 of the housing 4) by means of a bonding wire 6.

The interposer contact (or the leadframe connection 10) is connected to the pad 5b of the second semiconductor device 2b by means of a further bonding wire 6b, which is connected to the voltage supply means 3b of the second semiconductor device 2b (or the above-mentioned line or the connection, respectively, at which—in the activated state of the voltage supply means 3b of the second semiconductor device 2b—the internal voltage then generated thereby is output).

By this it can be achieved—similar as with the embodiment illustrated in FIG. 1a—that in the second operating mode of the second semiconductor device 2b (e.g. during the standby mode and/or during the refresh mode) the voltage supply means 3a of the first semiconductor device 2a can—in addition to the voltage supply (internal voltage) for the first semiconductor device 2a—also provide the supply voltage (internal voltage) for the second semiconductor device 2b.

When—corresponding to the first embodiment—the voltage supply means 3b of the second semiconductor device 2b is correspondingly deactivated in the second operating mode, the operating current of the voltage supply means 3b can—corresponding to the embodiment illustrated in FIG. 1a—be saved in the above-mentioned second operating mode (and thus, altogether, the currents required for operating the semiconductor devices 2a, 2b).

List of Reference Signs

1 semiconductor device system

2 a semiconductor device

2 b semiconductor device

3 a voltage supply means

3 b voltage supply means

4 semiconductor device housing

5 a semiconductor device pad

5 b semiconductor device pad

5 c semiconductor device pad

5 d semiconductor device pad

6 bonding wire

6 a bonding wire

6 b bonding wire

7 a line

7 b line

7 c line

7 d line

8 activating/deactivating control means

9 interposer

10 connection

Claims

1. A system (1) comprising first semiconductor device (2a), and second semiconductor device (2b), wherein the first semiconductor device (2a) comprises a voltage supply means (3a), characterized in that said voltage supply means (3a) of said first semiconductor device (2a) is connected to said second semiconductor device (2b), so that said voltage supply means (3a) of said first semiconductor device (2a) can provide a supply voltage for said second semiconductor device (2b).

2. The system (1) according to claim 1, wherein said first semiconductor device (2a) and said second semiconductor device (2b) are arranged in the same housing (4).

3. The system (1) according to claim 2, wherein said first and second semiconductor devices (2a, 2b) are arranged in said housing (4) in a stacked manner.

4. The system (1) according to claim 2, wherein said housing (4) is a plug mountable semiconductor device housing.

5. The system (1) according to claim 4, wherein said plug mountable semiconductor device housing is a Dual-In-Line (DIL) housing.

6. The system (1) according to claim 4, wherein said plug mountable semiconductor device housing is a Pin-Grid-Array (PGA) housing.

7. The system (1) according to claim 2, wherein said housing (4) is a surface mountable semiconductor device housing.

8. The system (1) according to claim 1, said system comprising one or several further semiconductor devices.

9. The system (1) according to claim 8, wherein said one or said several further semiconductor device(s) is/are arranged in the same housing (4), in particular in the same semiconductor device housing, as are said first and said second semiconductor devices (2a, 2b).

10. The system according to claim 8, wherein said voltage supply means (3a) of said first semiconductor device (2a) is additionally also connected to said one or to said several further semiconductor device(s), so that said voltage supply means (3a) of said first semiconductor device (2a) can additionally provide a supply voltage for said one or said several further semiconductor device(s).

11. The system (1) according to any of claim 8, wherein said first semiconductor device (2a) comprises a further voltage supply means that is connected to said one or said several further semiconductor device(s), so that said further voltage supply means of said first semiconductor device (2a) can provide a supply voltage for said one or said several further semiconductor device(s).

12. The system (1) according to claim 1, wherein said first and/or said second semiconductor devices (2a, 2b), and/or said one and/or said several further semiconductor devices are memory devices.

13. The system (1) according to claim 12, wherein said memory device is a table memory device or said memory devices (2a, 2b) are table memory devices, respectively.

14. The system (1) according to claim 13, wherein said table memory device is a RAM table memory device or said table memory device or said table memory devices are RAM table memory devices, respectively.

15. The system (1) according to claim 14, wherein said RAM table memory device is a DRAM table memory device or said RAM table memory devices are DRAM table memory devices, respectively.

16. The system (1) according to claim 13, wherein said table memory device is a ROM table memory device or said table memory devices are ROM table memory devices, respectively.

17. The system (1) according to claim 12, wherein said memory device is a functional memory device or said memory devices are fundamental memory devices, respectively, in particular PLDs and/or PLAs.

18. The system (1) according to claim 1, wherein said voltage supply means (3a) and/or said further voltage supply means provide a voltage supply for said first semiconductor device (2a).

19. The system (1) according to claim 1, wherein said voltage supply means (3a) and/or said further voltage supply means generate(s) the respective supply voltage from an external voltage.

20. The system (1) according to claim 1, wherein said voltage supply means (3a) and/or said further voltage supply means are or comprise a voltage regulating means.

21. The system (1) according to claim 1, wherein said voltage supply means (3a) and/or said further voltage supply means are or comprise a charge pump.

22. The system (1) according to claim 1, wherein said second semiconductor device (2b) comprises a voltage supply means (3b), and wherein, in a first operating mode of said second semiconductor device (2b), said voltage supply means (3b) of said second semiconductor device (2b) provides the supply voltage for said second semiconductor device (2b), and wherein, in a second operating mode of said second semiconductor device (2b), said voltage supply means (3a) of said first semiconductor device (2a) provides the supply voltage for said second semiconductor device (2b).

23. The system (1) according to claim 22, wherein said voltage supply means (3b) of said second semiconductor device (2b) is activated in the first operating mode, and wherein said supply voltage means (3b) of said second semiconductor device (2b) is deactivated in the second operating mode.

24. The system (1) according to claim 22, wherein the second operating mode is a standby mode.

25. The system (1) according to claims claim 22, wherein the second operating mode is a refresh mode.

26. The system (1) according to claim 22, wherein the first operating mode is a working mode, in particular a mode in which external access to the second semiconductor device (2b) is performed.

27. The system (1) according to claim 1, wherein a device function adjusting means, in particular an appropriate fuse, is provided on said first and/or second semiconductor device(s) (2a, 2b), by means of which it is determined whether the corresponding semiconductor device (2a, 2b) is to assume the function of said first semiconductor device (2a) or the function of said second semiconductor device (2b).

28. The system (1) according to claim 1, wherein said voltage supply means (3a) of said first semiconductor device (2a) is connected to a corresponding pad (5a) of said first semiconductor device (2a).

29. The system (1) according to claim 28, wherein said pad (5a) of said first semiconductor device (2a) is connected to a corresponding pad (5b) of said second semiconductor device (2b), in particular to a pad (5b) which said voltage supply means (3b) of said second semiconductor device (2b) can be connected to.

30. The system (1) according to claim 29, wherein said pad (5a) of said first semiconductor device (2a) is connected directly to the corresponding pad (5b) of said second semiconductor device (2b), in particular by means of an appropriate bonding wire (6).

31. The system (1) according to claim 29, wherein said pad (5a) of said first semiconductor device (2a) is connected indirectly to the corresponding pad (5b) of said second semiconductor device (2b), in particular via an interposer (9).