Claims
- 1. A semiconductor integrated circuit having a normal operation mode for operating an internal circuit and a testing mode for performing an operation test of said internal circuit, and further comprising:a timing modifying circuit for modifying an operation timing of said internal circuit in response to whether said semiconductor integrated circuit is in said normal operation mode or in said testing mode, and wherein said timing modifying circuit lengthens an activation period of a controlling signal which controls said internal circuit in said testing mode, as compared with said normal operation mode.
- 2. A semiconductor integrated circuit having a normal operation mode for operating an internal circuit and a testing mode for performing an operation test of said internal circuit, and further comprisinga timing modifying circuit for modifying an operation timing of said internal circuit in response to whether said semiconductor integrated circuit is in said normal operation mode or in said testing mode, and wherein said testing mode is a compressing test mode for connecting with each other internal data buses transmitting internal data signals, which are said internal signals, and performs read/write operation tests, and said timing modifying circuit lengthens an activation period of said controlling signal in said testing mode, as compared with said normal operation mode.
Priority Claims (1)
Number |
Date |
Country |
Kind |
11-167001 |
Jun 1999 |
JP |
|
Parent Case Info
This is a division of application Ser. No. 09/533,886 filed Mar. 22, 2000, now U.S. Pat. No. 6,212,092. The disclosure of the prior application(s) is hereby incorporated by reference herein in its entirety.
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A |
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Aug 2000 |
A |
Foreign Referenced Citations (1)
Number |
Date |
Country |
0069584 |
Apr 1982 |
JP |
Non-Patent Literature Citations (1)
Entry |
Betty Prince, “Semiconductor Memories”, 1983, Wisley, 2nd Edition, pp. 699-701. |