Claims
- 1. A method of manufacturing a semiconductor substrate, comprising the steps of:
- depositing an amorphous semiconductor film or a polycrystalline semiconductor film on a foundation covered at least partly with a high-melting-point metal film or a high-melting-point metal alloy film;
- disposing a transparent cooling medium on said semiconductor film;
- melting said semiconductor film by irradiating said semiconductor film with energy through said transparent cooling medium to improve the uniformity of the distribution of heat in said semiconductor film irradiated with energy; and
- growing a single-crystal region in said semiconductor film irradiated with said energy.
- 2. A method according to claim 1, in which said irradiated energy comprises energy applied by a laser beam.
- 3. A method according to claim 1, in which said transparent cooling medium comprises a liquid organic compound.
- 4. A method according to claim 1, in which said irradiated energy comprises energy selected from the group consisting of energy applied by a light beam, energy applied by an electron beam, and energy applied by a heat ray.
- 5. A method according to claim 3, in which said liquid organic compound has a melting point which is higher than that of said semiconductor film.
- 6. A method according to claim 3, in which said liquid organic compound comprises a material selected from the group consisting of polyethylene glycol, polyethylene ether, polyethylene ester and polyethylene oxide.
- 7. A method of manufacturing a solid state structure, comprising:
- providing a foundation of an electrically isolating material having an upper surface covered at least partly with a metal film;
- forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said metal film, the melting point of said metal film being higher than that of said semiconductor film;
- irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said metal film to monocrystallize said semiconductor film;
- forming grooves dividing said metal film into laterally spaced patches and dividing said monocrystallized semiconductor film at least into islands which are over the respective ones of said patches of said metal film, said grooves eclectically isolating said islands from each other in a lateral direction, and
- forming respective active devices at said islands and making electrical contact to selected portions of said active devices by making eclectrically conductive interior portions of said grooves which contact respective ones of said patches of said metal film.
- 8. A method according to claim 7, in which said irradiating step comprises melting a region of said semiconductor film and causing said region to move relative to said semiconductor film to effect monocrystallizing.
- 9. A method of manufacturing a solid state structure, comprising the steps of:
- providing a foundation of an electrically isolating material having an upper surface covered with a first metal film, and providing a second metal film over said first metal film, said second metal film being in the form of laterally spaced patches which are eclectically isolated from said first metal film by laterally spaced portions of an electrically insulating film, said insulating film being disposed between said first metal film and said second metal film;
- forming a polycrystalline semiconductor film or an amorphous semiconductor film over said foundation and over said second metal film, the melting point of said first metal film being higher than that of said semiconductor film; and
- irradiating said semiconductor film with radiant energy which passes through said semiconductor film and reaches said first metal film to monocrystallize said semiconductor film.
- 10. A method according to claim 9 including dividing said monocrystallized semiconductor film into first islands which are over said patches of said second metal film and second islands which are directly on said first metal film.
- 11. A method according to claim 10 including making selected electrical contacts to said first and second metal films by making eclectically conductive interior portions of said grooves.
Priority Claims (5)
Number |
Date |
Country |
Kind |
63-162117 |
Jun 1988 |
JPX |
|
63-162925 |
Jun 1988 |
JPX |
|
63-171326 |
Jul 1988 |
JPX |
|
63-199146 |
Aug 1988 |
JPX |
|
1-72356 |
Mar 1989 |
JPX |
|
Parent Case Info
This is a continuation of application Ser. No. 371,543, filed Jun. 26, 1989, now abandoned.
US Referenced Citations (11)
Foreign Referenced Citations (13)
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0047140 |
Aug 1981 |
EPX |
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JPX |
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Apr 1986 |
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JPX |
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Aug 1987 |
JPX |
0219510 |
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JPX |
1-227423 |
Sep 1989 |
JPX |
3508469 |
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GBX |
Non-Patent Literature Citations (1)
Entry |
"Handbook of SOI-Structure-Forming Technology", pp. 239-249, published in 1987, Tokyo Japan. |
Continuations (1)
|
Number |
Date |
Country |
Parent |
371543 |
Jun 1989 |
|