The present invention relates to a substrate attaching/detaching unit for a substrate holder, a wet-type substrate processing apparatus including the same, a substrate holder conveying method, a substrate processing apparatus, and a substrate conveying method.
Conventionally, a wiring has been formed in a fine wiring groove, a hole, or a resist opening provided on a surface of a semiconductor wafer, and a bump (projection-shaped electrode) electrically connected to an electrode of a package has been formed on the surface of the semiconductor wafer. Examples of a method for forming the wiring and the bump include an electrolytic plating method, an evaporation method, a printing method, and a ball bump method. In recent years, the electrolytic plating method in which a semiconductor chip can be refined and is relatively stable in performance as the number of inputs/outputs (I/Os) of a semiconductor chip increases and a pitch of the semiconductor chip is refined has been frequently used.
In a process for forming a wiring in a resist opening using the electrolytic plating method, the wiring is formed in the resist opening, and is then removed by stripping a resist formed on a substrate and etching a seed layer (or a barrier metal). The process for forming the wiring, a process for stripping the resist, and a process for etching the seed layer are performed while the substrate is immersed in a processing bath containing a predetermined processing liquid. The processing bath includes one capable of vertically housing a substrate (see International Publication No. WO 01/68952).
A wet-type substrate processing apparatus that performs processing such as cleaning processing and etching processing for a substrate such as a semiconductor wafer is roughly classified into a batch type apparatus and a sheet-fed type apparatus. The batch type apparatus holds a plurality of substrates in one carrier and immerses the substrates in a processing bath at once, and the sheet-fed type apparatus holds respective one substrates in substrate holding units and processes the substrates one at a time. Further, a substrate processing system in the sheet-fed type apparatus is classified into a system for conveying a substrate to processing baths with a robot and holding the substrate in a substrate holding unit included in each of the processing baths and a system for holding a substrate in a substrate holding unit called a substrate holder, conveying the substrate, together with the substrate holder, to the processing bath, and performing immersion processing. Examples of the wet-type substrate processing apparatus using a system for conveying a substrate holder that holds a substrate include an etching processing apparatus and a plating apparatus including a substrate attaching/detaching unit that automatically performs work for attaching and detaching the substrate to and from the substrate holder.
In a state where the wet-type substrate processing apparatus waits, the substrate holder is suspended in a vertical posture, and is stored in a stocker. On the other hand, when the wet-type substrate processing apparatus starts to operate, a substrate holder conveying device takes out the substrate holder from the stocker, and places the substrate holder on the substrate attaching/detaching unit. In the substrate attaching/detaching unit, a conveyance robot transfers the substrate to the substrate holder. The substrate holder conveying device carries the substrate holder, which holds the substrate, to a pre-wetting bath, for example, and first processing is performed for the substrate. At this time, in the conventional wet-type substrate processing apparatus, the stocker and the substrate attaching/detaching unit are separately arranged (see International Publication No. WO 01/68952).
However, the invention related to the above-mentioned conventional technique has the following issues. That is, in a processing bath that processes a substrate with the substrate vertically housed, the substrate is conveyed above the processing bath with a normal to its substrate surface facing in a horizontal direction and facing in a conveyance direction. When the substrate is thus conveyed, if another substrate is taken into and out of the processing bath, the other substrate, which is taken into and out of the processing bath, prevents the substrate from being conveyed. Thus, the substrate processing apparatus needs to wait for the conveyance of the substrate while the other substrate is taken into and out of the processing bath. Therefore, the throughput of the entire substrate processing apparatus decreases.
A stocker accommodates a large number of substrate holders, and occupies a wide place within a wet-type substrate processing apparatus. Thus, the wet-type substrate processing apparatus increases in size as a whole. After the substrate holder, which holds a substrate, is conveyed from a substrate attaching/detaching unit, the substrate attaching/detaching unit waits without doing anything until the subsequent substrate holder is conveyed from the stocker. That is, the speed at which the substrate is put into a processing unit in the wet-type substrate processing apparatus is reduced.
The present invention has been made to solve at least one of the above-mentioned issues, and has as its one object to provide a substrate attaching/detaching unit capable of accommodating a large number of substrate holders in a wet-type substrate processing apparatus without increasing the footprint of the wet-type substrate processing apparatus and capable of quickly transferring the substrate holder.
The present invention has as its other object to make it difficult for conveyance of a substrate to be obstructed by another substrate that is taken into and out of a processing bath.
According to an aspect of the present invention, there is provided a substrate attaching/detaching unit. The substrate attaching/detaching unit includes a stocker accommodating a plurality of substrate holders and adapted so that the substrate holders are aligned in a vertical direction with one another in a horizontal posture, a first substrate holder conveying mechanism that takes the substrate holder into and out of the stocker, an elevating mechanism that raises and lowers the first substrate holder conveying mechanism in the vertical direction, a second substrate holder conveying mechanism that transfers the substrate holder to and from the first substrate holder conveying mechanism, and a substrate attaching/detaching mechanism that attaches and detaches the substrate to and from the substrate holder held in the second substrate holder conveying mechanism.
According to this aspect, the stocker is arranged below the second substrate holder conveying mechanism and the substrate attaching/detaching mechanism. Thus, a large number of substrate holders can be accommodated without increasing the footprint, as viewed from above, of the wet-type substrate processing apparatus. Even when the second substrate holder conveying mechanism or the substrate attaching/detaching mechanism grip the substrate holder, the first substrate holder conveying mechanism can wait while gripping the subsequent substrate holder. Thus, a period of time required for the second substrate holder conveying mechanism or the substrate attaching/detaching mechanism to wait can be shortened.
According to another aspect of the present invention, there is provided a substrate processing apparatus. The substrate processing apparatus includes a conveying machine including a holding unit that holds a substrate and a conveying unit that conveys the substrate held by the holding unit, and a processing bath that houses the substrate with a normal to its substrate surface facing in a conveyance direction, to process the substrate, in which the holding unit is adapted to hold the substrate with the normal to the substrate surface facing in a horizontal direction and facing in a direction perpendicular to the conveyance direction, and the conveyance unit is adapted to convey the substrate with the normal to the substrate surface facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction.
According to this aspect, the conveyance of the substrate can be inhibited from being obstructed by another substrate that is taken into and out of the processing bath.
According to a still another aspect of the present invention, there is provided a substrate conveying method. The substrate conveying method includes the steps of conveying the substrate with a normal to its substrate surface facing in a horizontal direction and facing in a direction perpendicular to a conveyance direction, swirling the substrate so that the normal to the substrate surface faces in the conveyance direction, and housing the substrate in a processing bath with the normal to the substrate surface facing in the conveyance direction.
According to a further aspect of the present invention, there is provided a substrate processing apparatus. The substrate processing apparatus includes a substrate holder that holds a substrate, a conveying machine including a holding unit that holds the substrate holder and a conveying unit that conveys the substrate holder held in the holding unit, and a processing bath that houses the substrate and the substrate holder with a normal to its substrate surface facing in a conveyance direction of the conveying machine, to process the substrate, in which the holding unit is adapted to hold the substrate beside the processing bath when the conveying unit conveys the substrate.
According to a first aspect of the present invention, there is provided a substrate attaching/detaching unit. The substrate attaching/detaching unit includes a stocker accommodating a plurality of substrate holders and adapted so that the substrate holders are aligned in a vertical direction with one another in a horizontal posture, a first substrate holder conveying mechanism that takes the substrate holder into and out of the stocker, an elevating mechanism that raises and lowers the first substrate holder conveying mechanism in the vertical direction, a second substrate holder conveying mechanism that transfers the substrate holder to and from the first substrate holder conveying mechanism, and a substrate attaching/detaching mechanism that attaches and detaches the substrate to and from the substrate holder held in the second substrate holder conveying mechanism.
According to the first aspect, the stocker is arranged below the second substrate holder conveying mechanism and the substrate attaching/detaching mechanism. Thus, the large number of substrate holders can be accommodated without increasing the footprint, as viewed from above, of the wet-type substrate processing apparatus. Even when the second substrate holder conveying mechanism or the substrate attaching/detaching mechanism grips the substrate holder, the first substrate holder conveying mechanism can wait while gripping the subsequent substrate holder. Thus, a period of time required for the second substrate holder conveying mechanism or the substrate attaching/detaching mechanism to wait can be shortened.
According to a second aspect of the present invention, the substrate attaching/detaching unit according to the first aspect includes a plurality of substrate holder accommodating portions that respectively accommodate the plurality of substrate holders, in which each of the substrate holder accommodating portions includes holder receiving portions at at least three points, the respective heights of which are equal to one another.
According to a third aspect of the present invention, in the substrate attaching/detaching unit according to the first or second aspect, the substrate holder includes a linear first portion and two second portions each extending in a direction substantially perpendicular to the first portion and having a leading end bent in a hook shape, the substrate being held between the two second portions, and the holder receiving portion receives both ends of the first portion and the leading ends of the second portions.
According to a fourth aspect of the present invention, in the substrate attaching/detaching unit according to any one of the first to third aspects, the first substrate holder conveying mechanism holds the substrate holder at three points from inside the first portion and the second portions, and is movable in the vertical direction by the elevating mechanism.
According to a fifth aspect of the present invention, in the substrate attaching/detaching unit according to any one of the first to fourth aspects, the substrate attaching/detaching mechanism includes a base member, a linear guide that movably supports the base member in a linear direction, an actuator that moves the base member along the linear guide, and a substrate guide that is arranged on the base member to hold the substrate in a horizontal posture.
According to a sixth aspect of the present invention, in the substrate attaching/detaching unit according to any one of the third to fifth aspects, the second substrate holder conveying mechanism includes a clamper that holds the two second portions from outside, and a rotary actuator for pressing the substrate toward the leading ends of the second portions.
According to a seventh aspect of the present invention, in the substrate attaching/detaching unit according to any one of the first to sixth aspects, the second substrate holder conveying mechanism includes two sets of chucks that hold the substrate holders.
According to an eighth aspect of the present invention, in the substrate attaching/detaching unit according to any one of the first to seventh aspects, the elevating mechanism includes a linear guide extending in the vertical direction, a ball screw coupled to the first substrate holder conveying mechanism, a threaded shaft threadably mounted on the ball screw and extending in the vertical direction, and an electric motor that rotates the threaded shaft via a timing belt.
According to a ninth aspect of the present invention, in the substrate attaching/detaching unit according to any one of the first to eighth aspects, the stocker is provided below the substrate attaching/detaching mechanism and the second substrate holder conveying mechanism.
According to a tenth aspect of the present invention, there is provided a wet-type substrate processing apparatus. The wet-type substrate processing apparatus includes a substrate holder that holds a substrate, a processing bath accommodating the substrate holder to perform processing, a conveying machine that conveys the substrate holder to the processing bath, and the substrate attaching/detaching unit in any one of the first to ninth aspects.
According to an eleventh aspect of the present invention, the wet-type substrate processing apparatus according to the tenth aspect further includes a second elevating mechanism that raises and lowers the second substrate holder conveying mechanism in the vertical direction, in which the second elevating mechanism is adapted to transfer the substrate holder that holds the substrate to the conveying machine.
According to a twelfth aspect of the present invention, in the wet-type substrate processing apparatus according to the tenth or eleventh aspect, the second substrate holder conveying mechanism includes two sets of chucks each holding the substrate holder.
According to a thirteenth aspect of the present invention, there is provided a substrate holder conveying method using the wet-type substrate processing apparatus according to the twelfth aspect. In the substrate holder conveying method, the second substrate holder conveying mechanism receives a first substrate holder that grips the substrate before the processing with one of the sets of chucks while receiving a second substrate holder that grips the substrate after the processing with the other set of chucks, and transfers the first substrate holder to the conveying machine while removing the substrate from the second substrate holder, and transfers the second substrate holder to the first substrate holder conveying mechanism.
According to a fourteenth aspect of the present invention, there is provided a substrate processing apparatus. The substrate processing apparatus includes a conveying machine including a holding unit that holds a substrate and a conveying unit that conveys the substrate held by the holding unit, and a processing bath that houses the substrate with a normal to its substrate surface facing in a conveyance direction, to process the substrate, in which the holding unit is adapted to hold the substrate with the normal to the substrate surface facing in a horizontal direction and facing in a direction perpendicular to the conveyance direction, and the conveying unit is adapted to convey the substrate with the normal to the substrate surface facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction.
According to the fourteenth aspect, the conveyance of the substrate can be inhibited from being obstructed by another substrate that is taken into and out of the processing bath.
According to a fifteenth aspect, in the substrate processing apparatus according to the fourteenth aspect, when the conveying unit conveys the substrate with the normal to the substrate surface facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction, the holding unit is adapted to hold the substrate beside the processing bath.
According to a sixteenth aspect of the present invention, the substrate processing apparatus according to the fifteenth aspect further includes a liquid receiving unit provided beside the processing bath, in which the holding unit is adapted to hold the substrate above the liquid receiving unit when the conveying unit conveys the substrate with the normal to the substrate surface facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction.
According to a seventeenth aspect of the present invention, the substrate processing apparatus according to the fifteenth or sixteenth aspect further includes a first gas jetting unit forming an air curtain for atmospherically separating the substrate, which is held with the normal to the substrate surface facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction, and the processing bath.
According to an eighteenth aspect of the present invention, the substrate processing apparatus according to any one of the fourteenth to seventeenth aspects further includes a second gas jetting unit for spraying gas in an in-plane direction on both sides of the substrate when the substrate is positioned above the processing bath.
According to a nineteenth aspect of the present invention, in the substrate processing apparatus according to any one of the fourteenth to eighteenth aspects, the conveying machine includes a first driving mechanism that swirls the holding unit around its axis in the horizontal direction and the direction perpendicular to the conveyance direction and a second driving mechanism that swirls the holding unit around its axis in the conveyance direction.
According to a twentieth aspect of the present invention, in the substrate processing apparatus according to any one of the fourteenth to eighteenth aspects, the conveying machine includes a third driving mechanism that swirls the holding unit around its axis in a vertical direction.
According to a twenty-first aspect of the present invention, there is provided a substrate conveying method. The substrate conveying method includes the steps of conveying the substrate with a normal to its substrate surface facing in a horizontal direction and facing in a direction perpendicular to a conveyance direction, swirling the substrate so that a normal to the substrate surface faces in the conveyance direction, and housing the substrate in a processing bath with the normal to the substrate facing in the conveyance direction.
According to a twenty-second aspect of the present invention, there is provided a substrate processing apparatus. The substrate processing apparatus includes a substrate holder that holds a substrate, a conveying machine including a holding unit that holds the substrate holder and a conveying unit that conveys the substrate holder held in the holding unit, and a processing bath that houses the substrate and the substrate holder with a normal to its substrate surface facing in a conveyance direction of the conveying machine, to process the substrate, in which the holding unit is adapted to hold the substrate beside the processing bath when the conveying unit conveys the substrate.
According to a twenty-third aspect of the present invention, the substrate processing apparatus according to the twenty-second aspect further includes a liquid receiving unit provided beside the processing bath, in which the holding unit is adapted to hold the substrate above the liquid receiving unit when the conveying unit conveys the substrate.
According to a twenty-fourth aspect of the present invention, the substrate processing apparatus according to the twenty-second or twenty-third aspect further includes a first gas jetting unit forming an air curtain for atmospherically separating the substrate and the processing bath from each other when the conveying unit conveys the substrate.
According to a twenty-fifth aspect of the present invention, the substrate processing apparatus according to any one of the twenty-second to twenty-fourth aspects further includes a second gas jetting unit that sprays gas in an in-plane direction on both sides of the substrate when the substrate is positioned above the processing bath.
According to a twenty-sixth aspect of the present invention, in the substrate processing apparatus according to any one of the twenty-second to twenty-fifth aspects, the holding unit is adapted to hold the substrate with the normal to the substrate surface facing in the direction perpendicular to the conveyance direction, and the conveying unit is adapted to convey the substrate with the normal to the substrate surface facing in the direction perpendicular to the conveyance direction.
According to a twenty-seventh aspect of the present invention, in the substrate processing apparatus according to the twenty-sixth aspect, the holding unit is adapted to hold the substrate with the normal to the substrate surface facing in a horizontal direction.
According to the twenty-eighth aspect of the present invention, in the substrate processing apparatus according to the twenty-sixth or twenty-seventh aspect, the conveying machine includes a first driving mechanism that swirls the holding unit around its axis in the horizontal direction and the direction perpendicular to the conveyance direction and a second driving mechanism that swirls the holding unit around its axis in the conveyance direction.
According to the twenty-ninth aspect of the present invention, in the substrate processing apparatus according to any one of the twenty-sixth or twenty-seventh aspect, the conveying machine includes a third driving mechanism that swirls the holding unit around its axis in a vertical direction.
Embodiments of the present invention will be described below with reference to the accompanying drawings. In the drawings, described below, identical or corresponding components are assigned the same reference numerals, and hence an overlapped description is omitted. It should be noted that an invention, which is any combination of individual components, described below, is included in a technical idea covered by the invention.
As illustrated in
A substrate to be processed by a resist stripping unit 140, described below, is taken out of the cassette 30a or 30b with a robot hand 32a, and is conveyed to the substrate attaching/detaching unit 40a. The resist stripping unit 140 then strips a resist from the substrate mounted on the substrate holder in the substrate attaching/detaching unit 40a. The substrate, from which the resist has been stripped by the resist stripping unit 140, is taken out of the substrate holder in the substrate attaching/detaching unit 40a. The substrate, which has been taken out of the substrate holder, is conveyed from the substrate attaching/detaching unit 40a to the substrate drying machine 31a with the robot hand 32a. The substrate drying machine 31a cleans and dries the substrate using Iso-Propyl Alcohol (IPA) and De-Ionized Water (DIW). The dried substrate is returned to the cassette 30a or 30b with the robot hand 32a.
Similarly, a substrate to be etched by an etching unit 110, described below, is taken out of the cassette 30c or 30d with the robot hand 32b, and is conveyed to the substrate attaching/detaching unit 40b. The etching unit 110 then etches the substrate that has been mounted on the substrate holder in the substrate attaching/detaching unit 40b. The substrate, which has been etched by the etching unit 110, is taken out of the substrate holder in the substrate attaching/detaching unit 40b. The substrate, which has been taken out of the substrate holder, is conveyed to the substrate drying machine 31b from the substrate attaching/detaching unit 40b with the robot hand 32b. The substrate drying machine 31b cleans and dries the substrate using IPA and DIW. The dried substrate is returned to the cassette 30c or 30d with the robot hand 32b.
The wet-type substrate processing apparatus 250 includes the resist stripping unit 140 that strips the resist formed on the substrate. The resist striping unit 140 includes two pre-wetting baths 145a and 145b for improving a hydrophilic property on a surface of the substrate, and three resist stripping modules 150 for stripping the resist formed on the substrate. Each of the resist stripping modules 150 includes a plurality of baths. Along both sides of the pre-wetting baths 145a and 145b, there are provided lifters 70 capable of horizontal movement, which house or take out the substrate holder in and from each of the pre-wetting baths 145a and 145b. Similarly, along both sides of the resist stripping module 150, there are provided lifters 70 capable of horizontal movement, which house or take out the substrate holder in or from each of the plurality of baths constituting the resist stripping module 150. The resist stripping unit 140 includes a substrate attaching/detaching unit 40a, and a substrate conveying device 50a (corresponding to an example of a conveying machine) that conveys the substrate between the lifters 70 provided for the pre-wetting baths 145a and 145b and the lifters 70 provided for the resist stripping module 150.
When the resist on the substrate is stripped, the substrate holder that holds the substrate is transferred to the substrate conveying device 50a from the substrate attaching/detaching unit 40a, and is transfers to the lifters 70 provided for the pre-wetting baths 145a and 145b by the substrate conveying device 50a. The lifters 70 house the transferred substrate holder in empty one of the pre-wetting baths 145a and 145b. DIW and IPA are sprayed to the substrate in the pre-wetting bath 145a or 145b. After the substrate is processed in the pre-wetting bath 145a or 145b, the substrate holder is taken out of the pre-wetting bath 145a or 145b by the lifters 70, and is transferred to the substrate conveying device 50a. The substrate holder is transferred to the lifters 70 provided for any one of the resist stripping modules 150 by the substrate conveying device 50a, and is housed in a processing bath in the resist stripping modules 150 by the lifters 70. After the substrate is processed in the resist stripping module 150, the substrate holder is taken out of the processing bath by the lifters 70 provided for the resist stripping module 150, and is transferred to the substrate conveying device 50a. The substrate conveying device 50a returns the substrate holder to the substrate attaching/detaching unit 40a.
The wet-type substrate processing apparatus 250 includes the etching unit 110 that etches a seed layer formed on a substrate. The etching unit 110 includes two pre-wetting baths 115a and 115b for improving a hydrophilic property on a surface of the substrate and three etching modules 120 for etching the seed layer formed on the substrate. Each of the etching modules 120 includes a plurality of baths. Along both sides of the pre-wetting baths 115a and 115b, there are provided lifters 70 that house or take out the substrate holder in or from each of the pre-wetting baths. Similarly, along both sides of the etching module 120, there are provided lifters 70 that house or take out the substrate holder in or from the plurality of baths constituting the etching module 120. The etching unit 110 includes the substrate attaching/detaching unit 40b, and a substrate conveying device 50b (corresponding to an example of a conveying machine) that conveys the substrate between the lifters 70 provided for the pre-wetting baths 115a and 115b and the lifters 70 provided for the etching module 120.
When the seed layer on the substrate is etched, the substrate holder, which holds the substrate, is transferred to the substrate conveying device 50b from the substrate attaching/detaching unit 40b, and is transferred to the lifters 70 provided for the pre-wetting baths 115a and 115b by the substrate conveying device 50b. The lifters 70 house the transferred substrate holder in empty one of the pre-wetting baths 115a and 115b. DIW or IPA is sprayed to the substrate in the pre-wetting bath 115a or 115b. After the substrate is processed in the pre-wetting bath 115a or 115b, the substrate holder is taken out of the pre-wetting bath 115a or 115b by the lifters 70, and is transferred to the substrate conveying device 50b. The substrate holder is transferred to the lifters 70 provided for any one of the etching modules 120 by the substrate conveying device 50b, and is housed in a processing bath in the etching module 120 by the lifters 70. After the substrate is processed in the etching module 120, the substrate holder is taken out of the processing bath by the lifters 70 provided for the etching module 120, and is transferred to the substrate conveying device 50b. The substrate holder is returned to the substrate attaching/detaching unit 40b by the substrate conveying device 50b.
The holding mechanism 54 includes a chuck 54A vertically opened or closed, and can grip the substrate holder 80. Further, the holding mechanism 54 includes a substrate presser 57 to prevent a substrate W from coming off the substrate holder 80. When the substrate conveying device 50b receives the substrate holder 80, which holds the substrate W, in the substrate attaching/detaching unit 40b, the substrate holder 80 is gripped with an in-plane direction of the substrate W being a horizontal direction. The holding mechanism 54, which grips the substrate holder 80, can travel along a guide rail 53 from one end to the other end of the guide rail 53 by the conveying mechanism 51. The conveying mechanism 51 conveys the substrate holder 80 so that the substrate holder 80 passes above the processing bath 66 with the in-plane direction of the substrate W being the horizontal direction.
As illustrated in
[Substrate Attaching/Detaching Unit]
The substrate attaching/detaching units 40a and 40b as one feature point of the present embodiment will be specifically described below. Respective functions of the two substrate attaching/detaching units 40a and 40b are basically the same, and hence only the substrate attaching/detaching unit 40a will be described.
The stocker 61 includes four columnar members 65a, 65b, 65c, and 65d. A plurality of slit-shaped holder receiving portions 67, which open in the horizontal direction, are formed in each of the columnar members 65a, 65b, 65c, and 65d. For example, 41 holder receiving portions 67 are provided for each of the columnar members 65a, 65b, 65c, and 65d. In each of the columnar members 65a, 65b, 65c, and 65d, the respective heights of the corresponding four holder receiving portions 67 are equal to one another. The four holder receiving portions 67 form one holder accommodating portion. The holder accommodating portion accommodates one substrate holder 80.
[Substrate Holder]
The arm portions 82-1 and 82-2 are plate-shaped members formed extending from both ends of the base portion 81. Each of the arm portions 82-1 and 82-2 is suspended on a sidewall of the processing bath when the substrate holder 80 is immersed in the processing bath, as described later, and is supported by the lifters 70. The holder portions 83-1 and 83-2 are plate-shaped members in a substantially L shape formed in a direction substantially perpendicular from both ends of the base portion 81 to a longitudinal direction of the base portion 81. The substrate holder 80 can accommodate and hold a substrate such as a semiconductor wafer in a space 84 between the holder portions 83-1 and 83-2.
Referring to
[First Substrate Holder Conveying Mechanism]
In
The cylinder base driving cylinder 71b arranged on the elevating base 71a moves the cylinder base 71c back and forth in one direction relative to the elevating base 71a. A specific direction is a direction in which the substrate holder 80 is inserted into the holder receiving portion 67 or pulled out of the holder receiving portion 67. The cylinder base driving cylinder 71b is an actuator that operates with air pressure or hydraulic pressure. However, the cylinder base driving cylinder 71b may be an actuator using an electric motor as a driving source.
The cylinder base 71c is a plate-shaped member in a substantially T shape, and is arranged above the elevating base 71a and the cylinder base driving cylinder 71b. Three holder clamp cylinder 71d are provided on the cylinder base 71c, and can move clamp members 71e1 and 71e2 in three directions. Two of the three holder clamp cylinders 71d are arranged to move the clamp member 71e1 in opposite directions on the same straight line, and the remaining one holder clamp cylinder 71d moves the clamp member 71e2 in a direction perpendicular to the same straight line. Each of the clamp members 71e1 and 71e2 has an L shape, and clamps the substrate holder 80 on its vertical surface while lifting the substrate holder 80 on its horizontal surface. A claw is formed on the horizontal surface of the clamp member 71e2 in the one holder clamp cylinder 71d. This is for preventing the base portion 81 in the substrate holder 80 from unintentionally coming off the horizontal surface of the clamp member 71e2 when the clamp member 71e2 clamps the base portion 81 in the substrate holder 80.
[Substrate Attaching/Detaching Mechanism]
A substrate attaching/detaching mechanism 91 as illustrated in
When the substrate W is mounted on the substrate holder 80, the substrate holder 80, which is gripped by the clamp members 71e1 and 71e2 in the first substrate holder conveying mechanism 71 illustrated in
On the other hand, when the processed substrate W is removed from the substrate holder 80, the substrate holder 80, which has been returned from the processing unit (not illustrated), is transferred to the second substrate holder conveying mechanism 93. Then, the substrate attaching/detaching mechanism 91 approaches the second substrate holder conveying mechanism 93, and positions the substrate guides 91d on the outer periphery of the substrate W. In this state, the substrate attaching/detaching mechanism 91 horizontally moves the base 91c in a direction in which the substrate W is removed from the substrate holder 80. When the substrate W is removed from the substrate holder 80, the substrate holder 80 is transferred to the first substrate holder conveying mechanism 71 from the second substrate holder conveying mechanism 93. Then, the first substrate holder conveying mechanism 71 returns the substrate holder 80 to the stocker 61.
In the above-mentioned embodiment, the clamp members 71e1 and 71e2 in the first substrate holder conveying mechanism 71 support the substrate holder 80 to press the substrate holder 80 outward from inside. Thus, the substrate attaching/detaching mechanism 91 cannot mount the substrate W on the substrate holder 80 while the first substrate holder conveying mechanism 71 supports the substrate holder 80. However, the first substrate holder conveying mechanism 71 can support the substrate holder 80 from below with a clearance between the substrate holder 80 and itself, and the substrate attaching/detaching mechanism 91 can transfer the substrate W from the clearance between the first substrate holder conveying mechanism 71 and the substrate holder 80. In this case, the substrate W need not be transferred to the substrate holder 80 with the substrate holder 80 supported by the second substrate holder conveying mechanism 93.
[Second Substrate Holder Conveying Mechanism]
The second substrate holder conveying mechanism 93 will be described below with reference to
The two clampers 93b and 93c on the upper and lower sides operate to come closer to and separate from each other with an operating force of the clamper driving cylinder 93d, and can grip and release the substrate holder 80.
[Operation]
An operation of the substrate attaching/detaching unit 40a in the present exemplary embodiment will be described below with reference to
As illustrated in
Then, as illustrated in
Then, as illustrated in
Then, as illustrated in
The foregoing description has been made by paying attention to the one substrate holder 80. However, in the present embodiment, the second substrate holder conveying mechanism 93 includes two sets of clampers 93b and 93c. That is, the second substrate holder conveying mechanism 93 includes the upper clampers 93b and the lower clampers 93c. Therefore, an operation for gripping the substrate holder 80 that holds the substrate before processing in the lower clamper 93c while gripping the substrate holder 80 that holds the substrate after processing in the upper clamper 93b can be performed, for example. Thus, an operation for transferring the substrate holder 80 that holds the substrate before the processing to the substrate conveying device 50a (50b) and an operation for receiving the substrate holder 80 that holds the substrate after the processing from the substrate conveying device 50a (50b) can be performed in a short time. When the stocker 61 in the present embodiment is applied to a plating apparatus having a processing capability of approximately 150 sheets per hour, for example, the throughput of the plating apparatus can be improved to approximately 200 sheets per hour.
A second embodiment of the present invention will be described below with reference to
The elevating mechanism 71P rises to lift the substrate holder 80c upward (in a Z-direction in the figure) and falls to return the used substrate holder 80c to the stocker 61c.
A substrate transfer unit is positioned above the stocker 61c. The substrate transfer unit is used for mounting a substrate W, which is gripped with a robot hand 91P, on the substrate holder 80c. The substrate holder 80c receives the substrate W in an “open” state, i.e., a state for receiving the substrate W, and holds the substrate W in a “close” state, i.e., a state for holding the substrate W. An opening/closing mechanism for the substrate holder 80c can include a known (any) mechanism. When the substrate W, which has been processed, is removed from the substrate holder 80c, the robot hand 91P is also used. As described above, in the substrate attaching/detaching unit 40c according to the present embodiment, the stocker 61c is arranged below the substrate transfer unit. Thus, the footprint of the entire substrate attaching/detaching unit 40c can be kept small.
In a wet-type substrate processing apparatus that processes a substrate such as a semiconductor substrate, the present invention can be used for a substrate attaching/detaching unit that accommodates a substrate holder while mounting the substrate on the substrate holder.
A substrate processing apparatus according to a third embodiment will be described below with reference to the drawings. The substrate processing apparatus according to the third embodiment has a similar configuration to the entire configuration of the wet-type substrate processing apparatus illustrated in
<Lifter>
The lifters 70 respectively provided for each of pre-wetting baths 115a and 115b, the pre-wetting baths 145a and 145b, the etching module 120, and the resist stripping module 150 illustrated in
As illustrated in
The horizontal moving mechanisms 172 are provided in the horizontal direction on both sides of the etching module 120. The pair of rail portions 171 is provided to extend in a vertical direction from the horizontal moving mechanisms 172. The rail portions 171 respectively have rails for sliding the slide portion 175 provided on their opposing sides. The slide portion 175 is adapted to be slidable up and down along the rail of the rail portion 171. The slide portion 175 is slid up and down by a driving device (not illustrated).
The support portion 174 in each of the rail portions 171 is a member formed to project toward the opposing rail portion 171, and supports arm portions 82-1 and 82-2 in a substrate holder 80 from below, as illustrated. That is, the substrate holder 80 is supported by the support portions 174 to be positioned between the rail portions 171.
When the lifter 70 receives the substrate holder 80 from the substrate conveying devices 50a and 50b illustrated in
When the lifter 70 transfers the substrate holder 80 to the substrate conveying devices 50a and 50b illustrated in
<Substrate Conveying Device>
The substrate conveying device 50b illustrated in
As illustrated in
As illustrated in
The substrate conveying device 50b further includes a first driving mechanism 46 that swirls the holding mechanism 54 around an axis in the horizontal direction and the direction perpendicular to the conveyance direction (a Y-axis in the figure) and a second driving mechanism 47 that swirls the holding mechanism 54 around an axis in the conveyance direction (an X-axis in the figure). “The axis in the horizontal direction and the direction perpendicular to the conveyance direction” includes not only a case where the axis completely faces in the horizontal direction and faces in the direction perpendicular to the conveyance direction but also a case where the axis has a slight angle to the horizontal direction and the direction perpendicular to the conveyance direction. Similarly, “the axis in the conveyance direction” includes not only a case where the axis completely faces in the conveyance direction but also a case where the axis has a slight angle to the conveyance direction.
The holding mechanism 54 holds the substrate W with a normal to its substrate surface facing in the conveyance direction (the X-axis direction in the figure), as illustrated in
The first driving mechanism 46 in the substrate conveying device 50b swirls the holding mechanism 54 in a state illustrated in
The second driving mechanism 47 in the substrate conveying device 50b swirls the holding mechanism 54 in a state illustrated in
As illustrated in
A structure of the holding mechanism 54 will be specifically described below. As illustrated in
Furthermore, as illustrated in
The substrate presser 161 includes a shaft portion 162, an air cylinder 165 that slides the shaft portion 162 along its axis and rotates the shaft portion 162 around the axis, a pressing portion 163 that presses the substrate W against the substrate holder 80 in contact with the substrate W, and a substrate detection sensor 164 that detects the presence or absence of the substrate W. The shaft portion 162 has its one end connected to the air cylinder 165 and its other end connected to the pressing portion 163. The pressing portion 163 is a bar-shaped member connected to the other end of the shaft portion 162 and having its end 163a extending in a direction substantially perpendicular to an axial direction of the shaft portion 162. The end 163a of the pressing portion 163 has a notch (not illustrated) on its surface contacting the substrate W. The substrate detection sensor 164 includes an optical sensor or a magnetic sensor, for example, fixed to the other end of the pressing portion 163 via fixing means.
When the holder clamp 160 in the holding mechanism 54 grips the substrate holder 80, the air cylinder 165 in the substrate presser 161 swirls the pressing portion 163 so that the end 163a of the pressing portion 163 is positioned on an edge of the substrate W. Then, the air cylinder 165 slides the shaft portion 162 in an axial direction so that the notch formed at the end 163a of the pressing portion 163 contacts the edge of the substrate W and the substrate W is pressed against the substrate holder 80.
When the holder clamp 160 releases the gripping of the substrate holder 80, the air cylinder 165 in the substrate presser 161 moves the shaft portion 162 upward and swirls the pressing portion 163, to release contact of the pressing portion 163 with the substrate W. The holding mechanism 54 releases the gripping of the substrate holder 80 of the holder clamp 160 when it transfers the substrate holder 80 to the lifter 70 (not illustrated).
A process for causing the substrate conveying device 50b to convey the substrate W will be described below. The holding mechanism 54 in the substrate conveying device 50b receives the substrate holder 80, which holds the substrate W, from the substrate attaching/detaching unit 40b illustrated in
When the holding mechanism 54 receives the substrate W from the substrate attaching/detaching unit 40b, the second driving mechanism 47 in the substrate conveying device 50b swirls the holding mechanism 54 around the axis in the conveyance direction (the X-axis in the figure). Thus, the holding mechanism 54 holds the substrate W so that the normal to the substrate surface of the substrate W faces in the horizontal direction and faces in the direction perpendicular to the conveyance direction, as illustrated in
The conveying mechanism 51 stops the holding mechanism 54 beside the predetermined processing bath 66. Then, the second driving mechanism 47 swirls the holding mechanism 54 around the axis in the conveyance direction (the X-axis in the figure). Thus, the holding mechanism 54 holds the substrate W so that the in-plane direction of the substrate W, as illustrated in
When the substrate W is then conveyed from the processing bath 66, the lifter 70 illustrated in
The first driving mechanism 46 in the substrate conveying device 50b is driven so that the holding mechanism 54 is swirled around the axis in the horizontal direction and the direction perpendicular to the conveyance direction (the Y-axis in the figure). Thus, the holding mechanism 54 holds the substrate W so that the in-plane direction of the substrate W is the horizontal direction (see
Furthermore, when the traveling motor is driven in this state, the traveling pedestal 56 travels along the guide rail 53. Thus, the conveying mechanism 51 conveys the substrate holder 80 and the substrate W to the other processing bath 66, for example, with the normal to the substrate surface of the substrate W facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction.
As described above, in each of the substrate conveying devices 50a and 50b, the conveying mechanism 51 is adapted to convey the substrate W with the normal to the substrate surface of the substrate facing in the direction perpendicular to the conveyance direction. Thus, the area of the substrate W as viewed in the conveyance direction is reduced, and a space required to convey the substrate W can be reduced. Thus, the conveyance of the substrate W becomes difficult to obstruct by another substrate that is taken into and out of the processing bath 66. Consequently, in a limited space above the processing bath 66, the substrate W can be conveyed to avoid the other substrate that is taken into or out of the processing bath 66. Even if the substrate processing apparatus includes the lifters 70, like in the present embodiment, processing for taking in and out the substrate W by the lifter 70 and conveyance of the other substrate W by each of the substrate conveying devices 50a and 50b can be respectively performed at independent timings without interfering with each other. Even while the lifter 70 takes the substrate W into and out of the processing bath 66, therefore, the substrate processing apparatus need not wait for the conveyance of the other substrate W by each of the substrate conveying devices 50a and 50b. Thus, the throughput of the substrate processing apparatus can be improved. “The normal to the substrate surface of the substrate W faces in the direction perpendicular to the conveyance direction” includes not only a case where the normal to the substrate surface of the substrate W completely faces in the direction perpendicular to the conveyance direction but also a case where the normal to the substrate surface of the substrate W has a slight angle to the direction perpendicular to the conveyance direction.
In a conventional substrate processing apparatus, when a substrate is conveyed, the substrate is conveyed above the processing bath with a normal to a substrate surface of the substrate facing in a direction parallel to a conveyance direction. In this case, the normal to the substrate surface matches the conveyance direction. When the substrate is conveyed, therefore, the surface of the substrate W easily contacts particles in a space. Thus, a large number of particles may adhere to the surface of the substrate. On the other hand, in the substrate processing apparatus according to the present embodiment, the normal to the substrate surface of the substrate W during the conveyance does not face in the conveyance direction. Thus, the substrate surface of the substrate W does not easily contact particles in the air during the conveyance. Therefore, a large number of particles can be inhibited from adhering to the substrate surface. Further, the area of the substrate W as viewed in the conveyance direction of the substrate W during the conveyance is reduced. Thus, an air resistance, which the substrate W gets by the conveyance, can be reduced so that the substrate W can be conveyed at a relatively high speed.
In the present embodiment, the holding mechanism 54 is adapted to hold the substrate W with the normal to the substrate surface of the substrate W facing in the horizontal direction and facing in the direction perpendicular to the conveyance direction. Thus, in a limited space above the processing bath 66, the substrate W to be conveyed can be prevented from interfering with the other substrate that is taken into and out of the processing bath 66 only by conveying the substrate W with the substrate W shifted sideward from the other substrate W. Even while the substrate W is taken into and out of the processing bath 66, therefore, the substrate W need not wait for the conveyance of the other substrate W. Thus, the throughput of the substrate processing apparatus can be improved. The normal to the substrate surface of the substrate W does not face in the vertical direction. Thus, a contact area between particles that fall with a weight and the substrate W can be reduced so that the particles can be inhibited from adhering to the surface of the substrate W. “The normal to the substrate surface of the substrate W facing in the horizontal direction” includes not only a case where the normal to the substrate surface of the substrate W completely facing in the horizontal direction but also a case where the normal to the substrate surface of the substrate W has a slight angle to the horizontal direction.
In the present embodiment, the holding mechanism 54 holds the substrate W beside the processing bath 66. Thus, the other substrate W, which is taken into and out of the processing bath 66, can be prevented from interfering with the substrate W that is being conveyed. The holding mechanism 54 holds the substrate W beside the processing bath 66. Therefore, a substrate processing liquid, which has adhered to the substrate W, does not fall on the processing bath 66. In the present embodiment, the liquid receiving pan 167 is provided beside the processing bath 66, and the substrate W is held above the liquid receiving pan 167. Therefore, the liquid receiving pan 167 can receive the substrate processing liquid, which has fallen from the substrate W, so that the substrate processing liquid can be prevented from being scattered.
A modified example of each of the substrate conveying devices 50a and 50b according to the third embodiment will be described below.
As illustrated in
In the modified example illustrated in
Another modified example of each of the substrate conveying devices 50a and 50b according to the third embodiment will be described below.
As illustrated in
The second gas jetting unit 49 is adapted to jet gas vertically downward in the in-plane direction on both sides of the substrate W when the substrate conveying device 50b receives a substrate holder 80 from the lifter 70 illustrated in
A substrate processing apparatus according to a fourth embodiment of the present invention will be described below with reference to the drawings. The substrate processing apparatus according to the fourth embodiment differs from the substrate processing apparatus according to the third embodiment in terms of a configuration of each of substrate conveying devices 50a and 50b. The other configuration is similar to that in the third embodiment, and hence, illustration and description are not repeated for similar components to those in the third embodiment, and the substrate conveying devices 50a and 50b serving as different components will be described.
As illustrated in
The holding mechanism 54 holds the substrate W with a normal to a substrate surface of a substrate W facing in the conveyance direction (an X-axis direction in the figure), as illustrated in
The third driving mechanism 76 in the substrate conveying device 50b swirls the holding mechanism 54 in a state illustrated in
As illustrated in
The substrate conveying device 50b includes a first gas jetting unit 77 that is provided in the holding mechanism 54, is positioned above the substrate W, and extends in the horizontal direction along the surface of the substrate W. The first gas jetting unit 77 is positioned between a surface on the side of the processing bath 66 of the substrate W and the processing bath 66 with the holding mechanism 54 holding the substrate W so that the normal to the substrate surface of the substrate W faces in the horizontal direction and faces in the direction perpendicular to the conveyance direction, as illustrated in
The substrate conveying device 50b according to the fourth embodiment has a similar advantage to that of the substrate conveying device 50b described in
The substrate conveying device 50b according to the second embodiment can atmospherically separate the substrate W and the processing bath 66 using the first gas jetting unit 77. Thus, the lifter 70 illustrated in
A modified example of each of the substrate conveying devices 50a and 50b according to the fourth embodiment will be described below.
As illustrated in
The second gas jetting units 78a and 78b are adapted to jet gas vertically in the in-plane direction on both sides of the substrate W when the substrate conveying device 50b receives a substrate holder 80 from the lifter 70 illustrated in
When the holding mechanism 54 holds the substrate W so that the normal to the substrate surface of the substrate W faces in the horizontal direction and faces in the direction perpendicular to the conveyance direction, like in a state illustrated in
Although the embodiments of the present invention have been described above, the above-mentioned embodiments of the invention are used for making understanding of the present invention easy and not limiting the present invention. It should be noted that the present invention can be altered and improved without departing from the scope of the present invention and includes its equivalent. In a range in which at least some of the above-mentioned issues can be solved or a range in which at least some of effects are produced, any combination or omission of components described in the claims and the specification are possible.
While the substrate holder 80 holds and processes the substrate W in the above-mentioned embodiments, the substrate holder 80 need not necessarily be required, and the holding mechanism 54 may be adapted so that the substrate W can be directly held. That is, in the present invention, the holding mechanism 54 includes a holding mechanism 54 that directly holds the substrate W and a holding mechanism 54 that indirectly holds the substrate W via the substrate holder 80.
In the above-mentioned embodiments, when the substrate W is positioned beside the processing bath, the substrate W is held so that the normal to the substrate surface of the substrate W faces in the horizontal direction and faces in the direction perpendicular to the conveyance direction. However, when a sufficient conveyance space exists, for example, the normal to the substrate surface of the substrate W need not face in the horizontal direction and the direction perpendicular to the conveyance direction. That is, even if the substrate W can be positioned beside the processing bath, the substrate W conveyed beside the processing bath and the substrate W that is taken into and out of the processing bath 66 do not interfere with each other. Thus, in this case, the substrate W may face in any direction.
Number | Date | Country | Kind |
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2014-118553 | Jun 2014 | JP | national |
2014-139693 | Jul 2014 | JP | national |
This application is a divisional of U.S. patent application Ser. No. 14/734,983 filed on Jun. 9, 2015, which claims priority from Japanese Patent Application No. 2014-118553 filed on Jun. 9, 2014 and No. 2014-139693 filed on Jul. 7, 2014, the entire contents of which are hereby incorporated by reference into this application.
Number | Date | Country | |
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Parent | 14734983 | Jun 2015 | US |
Child | 16236024 | US |