Patent Grant
9299596
This application claims priority to Japanese Patent Application JP 2007-340428, filed Dec. 28, 2007. The disclosure of JP 2007-340428 is hereby incorporated by reference its entirety for all purposes.
This invention relates to a substrate treating apparatus for performing a series of treatments of substrates such as semiconductor wafers, glass substrates for liquid crystal displays, glass substrates for photomasks, and substrates for optical disks (hereinafter called simply “substrates”).
Conventionally, this type of apparatus includes a substrate treating apparatus used to form a resist film on substrates, and develop the substrates exposed in a separate exposing machine. This apparatus includes a treating section having, arranged therein, a coating block for carrying out resist film forming treatment, a developing block for carrying out developing treatment, and so on. Each such treating block includes a single main transport mechanism, and various treating units. The main transport mechanism of each treating block, while transporting substrates to the treating units in that block, transfers the substrates to and from the main transport mechanism of another, adjacent treating block. Thus, a plurality of substrates are successively transported to various treating units to receive a series of treatments. The series of treatments includes a process for forming resist film on the substrates and developing the substrates, for example. This process includes a plurality of different type treatments interposed by the exposing treatment in the external exposing machine. Each main transport mechanism transports the plurality of substrates in parallel to carry out successively the processes of treatment for each substrate (as disclosed in Japanese Unexamined Patent Publication No. 2003-324139, for example).
The conventional apparatus with such a construction has the following drawbacks.
For example, it may be desired to operate the apparatus such that, while putting certain of the treating units to a test run, the other treating units are used to carry out a series of treatments for substrates. Or it may be desired to operate the apparatus to carry out the process for forming resist film and developing some substrates, and at the same time to carry out the process for forming resist film on other substrates. A “process” here may include a plurality of different types of treatment, or may include a single treatment.
However, different processes between the substrates require different substrate transport paths to the various treating units. Therefore, the main transport mechanisms cannot transport the substrates efficiently. With the conventional apparatus, it is difficult to change the processes of treatment for each substrate. In other words, the conventional apparatus has difficulty in proceeding with a plurality of processes in parallel.
This invention has been made having regard to the state of the art noted above, and its object is to provide a substrate treating apparatus that can change substrate treating processes for each substrate, thereby proceeding with two or more different processes of treatment in parallel.
The above object is fulfilled, according to this invention, by a substrate treating apparatus comprising a plurality of substrate treatment lines for carrying out plural types of treatment on substrates while transporting the substrates substantially horizontally; and a controller for changing processes of treatment carried out on the substrates for each of the substrate treatment lines.
According to this invention, a plurality of substrate treatment lines and a controller are provided so that the processes of treatment carried out for substrates can be changed for each substrate treatment line. Therefore, according to a substrate treatment line to transport the substrates, the processes of treatment carried out for substrates can be changed for each substrate. This allows the types of processes corresponding to the number of substrate treatment lines to be carried out for the substrates in parallel.
In the invention noted above, the substrate treatment lines may be arranged vertically. By arranging the plurality of substrate treatment line in a way to overlap one another in the vertical direction, an increase in footprint can be avoided.
In the invention noted above, the controller may be capable of making processes in the substrate treatment lines different between the substrate treatment lines; and capable of making processes in the substrate treatment lines uniform for all the substrate treatment lines. By making processes for treating the substrates uniform for all the substrate treatment lines, the substrates having been treated through the same process can be obtained from all the substrate treatment lines. By making processes for treating the substrates different between the substrate treatment lines, various substrates having been treated through different processes can be obtained from the substrate treatment lines.
In the invention noted above, the controller may be capable of making the processes in all the substrate treatment lines a process for forming resist film on the substrates and a process for developing the substrates. Then, the substrate treatment lines can conveniently carry out a series of treatments to form resist film on the substrates and develop the substrates. Thus, substrates having resist film formed thereon and developed can be obtained from all the substrate treatment lines.
In the invention noted above, the controller may be arranged to cause part of the substrate treatment lines to treat the substrates in a process in a normal operation, and other of the substrate treatment lines to treat the substrates in a process in a test run. The substrate treatment lines can carry out separately and in parallel a normal operation to treat the substrates in a process in the normal operation, and a test run to treat the substrates in a process in the test run. This provides the effect of inhibiting a lowering of the working rate of this apparatus even at the time of a test run.
In the invention noted above, the controller may be capable of making the process in part of the substrate treatment lines all of a process for forming resist film on the substrates and developing the substrates, and making the process in other of the substrate treatment lines part of the process for forming resist film on the substrates and developing the substrates. Then, substrates having resist film formed thereon and developed can be obtained from part of the substrate treatment lines, and substrates having undergone part of the series of treatments to form resist film and develop can be obtained from other of the substrate treatment lines.
In the invention noted above, the process in the other of the substrate treatment lines may be one of a process for forming resist film on the substrates and a process for developing the substrates. Then, substrates having resist film formed thereon or developed substrates can be obtained from the other of the substrate treatment lines.
In the invention noted above, the controller may be capable of causing part of the substrate treatment lines to carry out a process including a plurality of different type treatments, and causing other of the substrate treatment lines to carry out a process including a single treatment. Then, substrates having received a plurality of different type treatments can be obtained from part of the substrate treatment lines, and substrates having received a single treatment can be obtained from other of the substrate treatment lines.
In the invention noted above, the process including a single treatment may be a process including one of resist film material coating treatment for applying a resist film material to the substrates, developing treatment for supplying a developer to the substrates, and heat treatment for heating or cooling the substrates. Then, substrates having received only the resist film material coating treatment, developing treatment or heat treatment can be obtained from the other of the substrate treatment lines.
In the invention noted above, the controller may be capable of causing part of the substrate treatment lines to carry out a first process including a plurality of different type treatments, and causing other of the substrate treatment lines to carry out a second process including a plurality of different type treatments and different from the first process. Then, part of the substrate treatment lines and other of the substrate treatment lines can carry out a plurality of different type treatments different from each other.
In the invention noted above, at least one of the first process and the second process may include at least one of resist film material coating treatment for applying a resist film material to the substrates, developing treatment for supplying a developer to the substrates, and heat treatment for heating or cooling the substrates. Then, at least one of the substrate treatment lines can carry out a process relating to the resist film material coating treatment, a process relating to the developing treatment, or a process relating to the heat treatment.
In another aspect of this invention, a substrate treating apparatus comprises a plurality of treating blocks arranged in juxtaposition, each having treating units provided on each of stories arranged vertically for treating substrates, and a main transport mechanism provided on each of the stories for transporting the substrates to and from the treating units on each of the stories, each of the treating blocks being capable of carrying out a series of treatments for the substrates on each of the stories, with the substrates transferred between the main transport mechanisms on the same stories of the treating blocks adjacent each other; and a controller for controlling each main transport mechanism to change substrate transport paths to and from the treating units on each of the stories.
According to this invention, a plurality of treating blocks each having a plurality of stories and a controller for changing substrate transport paths for each of the stories are provided to change substrate treatment for each story. This allows the types of treatment corresponding to the number of stories of the treating blocks to be carried out in parallel.
In the invention noted above, the controller may be capable of causing all or part of the series of treatments to be carried out for the substrates on each of the stories. Then, all of the series of treatments can be carried out for the substrates on each story. Part of the series of treatments can be carried out for the substrates on each story. The controller controls treatment on each story independently of the other stories. Consequently, desired treatment can be carried out for the substrates on each story.
In the invention noted above, on a story having treating units put to a test run, the controller may be arranged to cause the substrates to be transported only to the treating units put to the test run. By transporting the substrates only to the treating units put to the test run, the quality of treatment given by the treating units to the substrates can be examined, verified and checked conveniently.
In the invention noted above, the apparatus may further comprise an input unit for inputting information to set substrate transport paths to each of the stories, wherein the controller is arranged to change the transport paths on each of the stories based on the information inputted to the input unit. With the input unit provided, the controller changes substrate transport paths to the treating units for each story. Thus, the particulars of the treatment carried out for the substrates on each story can be changed simply.
In the invention noted above, the information inputted to the input unit may be information on types and an order of treatment carried out for the substrates on each of the stories. According to the information on the types and order of treatment carried out for the substrates on each story, the controller can change properly the substrate transport paths to the treating units for each story.
In the invention noted above, the information inputted to the input unit may be information identifying treating units put to a test run. According to the information identifying treating units put to a test run, the controller can change conveniently the transport paths on the story where these treating units are provided. Preferably, for example, the controller transports the substrates only to these treating units. This is because a test run can be carried out on these treating units.
In the invention noted above, the treating blocks may include a coating block and a developing block. The coating block has as the treating units coating units for applying a treating solution to the substrates; and the developing block has as the treating units developing units for supplying a developer to the substrates. Then, coating treatment for applying a treating solution to the substrates and developing treatment for supplying a developer to the substrates can be carried out on each story of the treating section.
In the invention noted above, the controller may be capable of causing the substrates loaded onto all of the stories of the coating block to be fed out of the coating block after being treated in the coating units; and capable of causing the substrates loaded onto part of the stories of the coating block to be fed out of the coating block after being treated in the coating units, and causing the substrates loaded onto other of the stories of the coating block to be fed out of the coating block without being transported to the coating units. In the first instance the coating treatment can be carried out on all the stories of the coating block. In the second instance while the coating treatment is carried out on part of the stories of the coating block, the coating treatment can be omitted on other of the stories of the coating block.
In the invention noted above, the controller may be capable of causing the substrates loaded onto all of the stories of the developing block to be fed out of the developing block after being treated in the developing units; and capable of causing the substrates loaded onto part of the stories of the developing block to be fed out of the developing block after being treated in the developing units, and causing the substrates loaded onto other of the stories of the developing block to be fed out of the developing block without being transported to the developing units. In the first instance the developing treatment can be carried out on all the stories of the developing block. In the second instance while the developing treatment is carried out on part of the stories of the developing block, the developing treatment can be omitted on other of the stories of the developing block.
This specification discloses an invention directed to the following substrate treating apparatus:
(1) The apparatus according to an embodiment wherein each of the substrate treatment lines includes a plurality of treating units and main transport mechanisms for transporting the substrates to and from the treating units. Since each substrate treatment line has its own treating units and main transport mechanisms, the controller can conveniently change substrate transport paths to the treating units for each substrate treatment line.
(2) The apparatus according to an embodiment wherein the process in the other of the substrate treatment lines is a process including a single treatment. Then, substrates having received a single treatment can be obtained from the other of the substrate treatment lines.
(3) The apparatus according to an embodiment wherein the process including a plurality of different type treatments includes at least one of resist film material coating treatment for applying a resist film material to the substrates, developing treatment for supplying a developer to the substrates, and heat treatment for heating or cooling the substrates. Then, a process relating to the resist film material coating treatment, a process relating to the developing treatment or a process relating to the heat treatment can be carried out in the part of the substrate treatment lines which carry out the process including a plurality of different type treatments.
(4) The apparatus according to an embodiment wherein the process including a plurality of different type treatments includes at least one of resist film material coating treatment for applying a resist film material to the substrates and developing treatment for supplying a developer to the substrates. Then, substrates with resist film formed thereon or developed substrates can be obtained from the part of the substrate treatment lines which carry out the process including a plurality of different type treatments.
(5) The apparatus according to an embodiment wherein a first process and a second process each includes at least one of resist film material coating treatment for applying a resist film material to the substrates, developing treatment for supplying a developer to the substrates, and heat treatment for heating or cooling the substrates. Then, each of the different parts of the substrate treatment lines can carry out a process relating to the resist film material coating treatment, a process relating to the developing treatment, or a process relating to the heat treatment.
(6) The apparatus according to an embodiment wherein a first process is a process for forming resist film on the substrates and developing the substrates, and a second process is one of a process for forming resist film on the substrates and a process for developing the substrates. Then, substrates having resist film formed thereon and developed can be obtained from one part of the substrate treatment lines, while substrates having resist film formed thereon or developed substrates can be obtained from another part of the substrate treatment lines.
(7) The apparatus according to an embodiment wherein one of a first process and a second process is a process for forming resist film on the substrates, and another of a first process and a second process is a process for developing the substrates. Then, substrates having resist film formed thereon can be obtained from one part of the substrate treatment lines, while developed substrates can be obtained from another part of the substrate treatment lines.
(8) The apparatus according to an embodiment, wherein in one instance the controller is capable of causing all the substrate treatment lines to carry out processes for forming resist film on the substrates and developing the substrates, including resist film material coating treatment for applying a resist film material to the substrates, developing treatment for supplying a developer to the substrates, and heat treatment for heating or cooling the substrates, and in another instance is capable of causing part of the substrate treatment lines to carry out processes for forming resist film on the substrates and developing the substrates, including the resist film material coating treatment, the developing treatment and the heat treatment, and causing another part of the substrate treatment lines to carry out one of a process for forming resist film on the substrates, including the resist film material coating treatment and the heat treatment, and a process for developing the substrates, including the developing treatment and the heat treatment. Then, in the first instance substrates having resist film formed thereon and developed can be obtained from all the substrate treatment lines. In the second instance, substrates having resist film formed thereon and developed can be obtained from a part of the substrate treatment lines, while substrates having resist film formed thereon or developed substrates can be obtained from the other of the substrate treatment lines.
(9) The apparatus according to an embodiment, wherein the coating units are resist film coating units for applying a resist film material to the substrates. Then, the coating block can conveniently form resist film on the substrates.
(10) The apparatus according to claim an embodiment, wherein the coating block further includes, as the treating units, heat-treating units for heat-treating the substrates, and the developing block further includes, as the treating units, heat-treating units for heat-treating the substrates. Then, the coating block can conveniently proceed with the treatment in the coating units and heat-treating units. The developing block also can conveniently proceed with the treatment in the developing units and heat-treating units.
(11) The apparatus according to an embodiment, wherein the coating block and the developing block are arranged adjacent each other. Then, the processes including the treatments in the coating units and developing units can be carried out smoothly.
(12) The apparatus according to (11) above, further comprising an indexer section disposed adjacent the coating block for transporting substrates to and from a cassette configured to store a plurality of substrates, and transferring the substrates to and from each main transport mechanism of the coating block. Since the coating block can transfer the substrates to and from the indexer section, the particulars of treatment on each story can be changed flexibly.
(13) The apparatus according to (11) above, further comprising an interface section disposed adjacent the developing block for transporting the substrates to and from an exposing machine provided separately from the apparatus, and transferring the substrates to and from each main transport mechanism of the developing block. Since the developing block can transfer the substrates to and from the interface section, the particulars of treatment on each story can be changed flexibly.
(14) An embodiment of a substrate treating apparatus comprising a plurality of substrate treatment lines arranged vertically for carrying out a series of treatments on substrates while transporting the substrates substantially horizontally; and a controller capable of causing each of the substrate treatment lines to carry out all of the series of treatments on the substrates, and to carry out only part of the series of treatments. According to this embodiment with the plurality of substrate treatment lines and the controller, each substrate treatment line can be changed between all of the series of treatments and part of the series of treatments carried out on the substrates. It is thus possible to proceed with the types of treatment corresponding to the number of substrate treatment lines in parallel.
(15) An embodiment according to (14) above wherein the controller is capable of causing all of the substrate treatment lines to carry out all of the series of treatments on the substrates, and capable of causing part of the substrate treatment lines to carry out all of the series of treatments on the substrates, while causing other of the substrate treatment lines to carry out part of the series of treatments on the substrates. All of the substrate treatment lines can carry out all of the series of treatments on the substrates. Part of the substrate treatment lines can carry out all of the series of treatments on the substrates, while other of the substrate treatment lines can carry out part of the series of treatments on the substrates.
(16) An embodiment according to (14) above wherein the controller is capable of causing part of the substrate treatment lines to engage in a normal operation for carrying out all of the series of treatments on the substrates, and causing other of the substrate treatment lines to engage in a test run for carrying out part of the series of treatments on the substrates. Thus, part of the substrate treatment lines can engage in a normal operation while other of the substrate treatment lines is put to a test run so that the other substrate treatment line may be restored to its normal state.
For the purpose of illustrating the invention, there are shown in the drawings several forms which are presently preferred, it being understood, however, that the invention is not limited to the precise arrangement and instrumentalities shown.
A preferred embodiment of this invention will be described in detail hereinafter with reference to the drawings.
An outline of this embodiment will be described first.
This embodiment provides a substrate treating apparatus 10 for forming resist film on substrates (e.g. semiconductor wafers) W, and developing exposed wafers W. The substrate treating apparatus 10 will be abbreviated hereinafter as the apparatus 10 as appropriate. This apparatus 10 has two substrate treatment lines Lu and Ld for performing a plurality of different type treatments for the wafers W while transporting the wafers W substantially horizontally. The substrate treatment lines Lu and Ld are arranged one over the other. The substrate treatment lines Lu and Ld constitute a treating section 3. In the following description, the substrate treatment lines Lu and Ld will be referred to simply as the substrate treatment lines L when they are not distinguished. This apparatus 10 has an exposing machine EXP, which is separate from this apparatus 10, disposed adjacent an interface section described hereinafter. The exposing machine EXP is used to expose the wafers W.
The treatment that can be carried out in each substrate treatment line L is roughly divided into coating treatment, heat treatment, edge exposure and developing treatment. The coating treatment includes antireflection film material coating treatment and resist film material coating treatment. The heat treatment includes cooling treatment, heating treatment, heating and cooling treatment, and PEB (Post Exposure Bake) treatment. Although the PEB treatment is also called post-exposure baking treatment, this specification uses the term “PEB treatment”.
In
The series of treatments from the cooling treatment T1u to the edge exposure T8u and from the PEB treatment T10u to the cooling treatment T14u corresponds to the “process for forming resist film on the substrates, and for developing the substrates” in this invention. Similarly, the series of treatments from the cooling treatment T1d to the edge exposure T8d and from the PEB treatment T10d to the cooling treatment T14d corresponds to the “process for forming resist film on the substrates and for developing the substrates” in this invention. In the following description, the “process for forming resist film on the substrates and for developing the substrates” will be called the “coating and developing process” as appropriate.
The substrate treatment lines Lu and Ld carry out the coating and developing process in parallel, thereby to obtain wafers W with resist film formed thereon and developed from each substrate treatment line Lu or Ld. In
When each process in the substrate treatment line Lu or Ld is aimed at substrate treatment, the process is one executed during a normal operation. When each process in the substrate treatment line Lu or Ld is aimed at checking or testing of treatment quality, or at a test run of the treating units, the process is one executed during a test run.
In
In the example shown in
Although other examples of operation in this apparatus are not illustrated, the processes in the substrate treatment lines Lu and Ld may be changed as desired. Changes in the processes in the substrate treatment line Lu and changes in the processes in the substrate treatment line Ld can be made independently of each other.
For example, the processes in the substrate treatment lines Lu and Ld can be all or part of the coating and developing process. Part of the coating and developing process may, for example, be a process for forming resist film on the wafers W (hereinafter called “resist process” as appropriate), or a process for developing the wafers W (hereinafter called “developing process” as appropriate). The resist process may, for example, be a series of treatments from the cooling treatment T1 to the edge exposure T8. The developing process may, for example, be a series of treatments from the PEB treatment T10 to the cooling treatment T14. In addition, part of the coating and developing process may, for example, include the resist film material coating treatment T5 and processes relating thereto, the developing T12 and processes relating thereto, and heat treatment and processes relating thereto. It is also possible to select, as desired, processes from the cooling treatment T4 to the heating and cooling treatment T6, or a process consisting only of the edge exposure T8.
From a different viewpoint, each of the processes in the substrate treatment lines Lu and Ld may be a process consisting of a single treatment, or a process having a plurality of different type treatments. The process consisting of a single treatment includes any one of the treatments T1-T8 and T10-T14. The process having a plurality of different type treatments may, for example, include the cooling treatment T14, heating and cooling treatment T3, and developing treatment T12. The number of treatments included in the process having a plurality of different type treatments may be larger or smaller than the number of treatments included in the coating and developing process. The order of treatments in the process having a plurality of different type treatments may be the same as or different from the order of treatments in the coating and developing process.
Each process in the substrate treatment lines Lu and Ld may be a process during a normal operation, or a process during a test run. Therefore, processes during a test run may be executed on both substrate treatment lines Lu and Ld.
This embodiment will now be compared with a comparative example.
Thus, this apparatus 10 with two substrate treatment lines Lu and Ld can conveniently realize an operation to treat wafers W in parallel through the same process in the substrate treatment lines Lu and Ld, and an operation to treat wafers W in parallel through different processes in the substrate treatment lines Lu and Ld. In the former case, wafers W treated in the same process can be obtained from the substrate treatment lines Lu and Ld. In the latter case, wafers W treated in different processes can be obtained simultaneously from the substrate treatment lines Lu and Ld. Further, by selecting the substrate treatment line Lu or Ld for transporting wafers W, processes of treatment can be varied for different wafers W.
This embodiment will be described in greater detail hereinafter.
This apparatus 10 includes, besides the treating section 3 described above, an indexer section (hereinafter called “ID section”) 1, and an interface section (hereinafter called “IF section”) 5. The ID section 1 is located adjacent one side of the treating section 3, and IF section 5 is located adjacent the other side of the treating section 3. The exposing machine EXP, which is an external apparatus separate from this apparatus 10, is disposed adjacent to the IF section 5. The ID section 1 receives wafers W transported to the apparatus 10 from outside, and transfers the wafers W to the treating section 3. The IF section 5 transfers the wafers W between the treating section 3 and exposing machine EXP. Each of the ID section 1, treating section 3 and IF section 5 will be described hereinafter.
ID Section 1
The ID section 1 takes wafers W out of each cassette C, which stores a plurality of wafers W, and deposits wafers W in the cassette C. The ID section 1 has a cassette table 9 for receiving cassettes C. The cassette table 9 can receive four cassettes C as arranged in a row. The ID section 1 has also an ID transport mechanism TID. The ID transport mechanism TID transports wafers W to and from each cassette C, and transports wafers W to and from receivers PASS1 and PASS3 to be described hereinafter. As shown in
Treating Section 3
Each substrate treatment line L of the treating section 3 is arranged to transport wafers W substantially horizontally between the ID section 1 and IF section 5. Each substrate treatment line L has main transport mechanisms T for transporting the wafers W. In this embodiment, each substrate treatment line L has a plurality of main transport mechanisms T (two for each substrate treatment line L, and thus a total of four). The plurality of main transport mechanisms T of each substrate treatment line L are arranged in the direction in which the wafers W are transported, and the wafers W can be transferred between the main transport mechanisms T adjacent each other in the transport direction. Each main transport mechanism T, while transporting wafers W to various treating units described hereinafter, transfers wafers W to the other main transport mechanism T adjacent thereto.
Specifically, the substrate treatment line Lu includes a main transport mechanism T1 and a main transport mechanism T2 arranged in a row. The main transport mechanism T1 is disposed adjacent the ID section, while the main transport mechanism T2 is disposed adjacent the IF section 5. Similarly, the substrate treatment line Ld includes a main transport mechanism T3 and a main transport mechanism T4 arranged in a row. The main transport mechanism T3 is disposed adjacent the ID section, while the main transport mechanism T4 is disposed adjacent the IF section 5.
In this embodiment, the treating section 3 which has the above substrate treatment lines L includes a plurality of (two) treating blocks Ba and Bb arranged side by side (in substantially the same direction as the transport direction). The treating block Ba is located adjacent the ID section 1, while the treating block Bb is located adjacent the IF section 5. Each of the treating blocks Ba and Bb is vertically divided into a plurality of (two) stories K. The above main transport mechanism T1 is disposed on the upper story K1 of the treating block Ba, while the main transport mechanism T3 is disposed on the lower story K3. Similarly, the main transport mechanism T2 is disposed on the upper story K2 of the treating block Bb, while the main transport mechanism T4 is disposed on the lower story K4.
The wafers W can be transferred between the main transport mechanisms T1 and T2 on the same stories K1 and K2 of the adjoining treating blocks Ba and Bb. The stories K1 and K2 constitute the substrate treatment line Lu. Similarly, the wafers W can be transferred between the main transport mechanisms T3 and T4, and the stories K3 and K4 constitute the substrate treatment line Ld.
Treating Section 3—Treating Block Ba
Receivers PASS1 and PASS3 for receiving wafers W are provided between the ID section 1 and the respective stories K1 and K3 of the treating block Ba. The receiver PASS1 receives, as temporarily placed thereon, wafers W passed between the ID transport mechanism TID and the main transport mechanism T1. Similarly, the receiver PASS3 receives, as temporarily placed thereon, wafers W passed between the ID transport mechanism TID and the main transport mechanism T3. Seen in a sectional view, the receiver PASS1 is disposed at a height adjacent a lower part of the upper story K2, while the receiver PASS3 is disposed at a height adjacent an upper part of the lower story K3. Thus, the positions of receiver PASS1 and receiver PASS3 are relatively close to each other for allowing the ID transport mechanism TID to move between the receiver PASS1 and receiver PASS3 through using only a small amount of vertical movement.
Receivers PASS2 and PASS4 for receiving wafers W are provided also between the treating blocks Ba and Bb. The receiver PASS2 is disposed between the story K1 and story K2, and the receiver PASS4 between the story K3 and story K4. The main transport mechanisms T1 and T2 transfer wafers W through the receiver PASS2, and the main transport mechanisms T3 and T4 through the receiver PASS4.
The receiver PASS1 includes a plurality of receivers (two in this embodiment). These receivers PASS1 are arranged vertically adjacent each other. Of the two receivers PASS1, one PASS1A receives wafers W passed from the ID transport mechanism TID to the main transport mechanism T1. The other receiver PASS1B receives wafers W passed from the main transport mechanism T1 to the ID transport mechanism TID. Each of the receivers PASS2-PASS4 and receivers PASS5 and PASS6 described hereinafter similarly includes a plurality of (two) receivers, one of which is selected according to a direction for transferring wafers W. Each of the receivers PASS1A and PASS1B has a sensor (not shown) for detecting presence or absence of a wafer W. Based on detection signals of each sensor, the transfer of wafers W by the ID transport mechanism TID and main transport mechanism T1 is controlled. Similar sensors are attached also to the receivers PASS2-PASS6, respectively.
The story K1 will now be described. The main transport mechanism T1 is movable in a transporting space A1 extending substantially through the center of the story K1 and parallel to the direction of transport. The story K1 has, arranged thereon, coating units 31 for applying a treating solution to wafers W, and heat-treating units 41 for heat-treating the wafers W. The coating units 31 are arranged on one side of the transporting space A1, while the heat-treating units 41 are arranged on the other side thereof.
The coating units 31 are arranged vertically and horizontally, each facing the transporting space A1. In this embodiment, four coating units 31 in total are arranged in two columns and two rows.
The coating units 31 include anti-reflection film coating units BARC for coating an anti-reflection film material on the wafers W, and resist film coating units RESIST for coating a resist film material on the wafers W. In this specification, the treatment carried out in the anti-reflection film coating units BARC is referred to as anti-reflection film coating treatment as appropriate, and the treatment carried out in the resist film coating units RESIST as resist film coating treatment.
The plurality of (two) anti-reflection film coating units BARC are arranged at substantially the same height in the lower row. The plurality of resist film coating units RESIST are arranged at substantially the same height in the upper row. No dividing wall or partition is provided between the antireflection film coating units BARC. That is, all the antireflection film coating units BARC are only housed in a common chamber, and the atmosphere around each antireflection film coating unit BARC is not blocked off (i.e. is in communication). Similarly, the atmosphere around each resist film coating unit RESIST is not blocked off.
Reference is made to
The supply device 34 includes a plurality of nozzles 35, a gripper 36 for gripping one of the nozzles 35, and a nozzle moving mechanism 37 for moving the gripper 36 to move one of the nozzles 35 between a treating position above the wafer W and a standby position away from above the wafer W. Each nozzle 35 has one end of a treating solution pipe 38 connected thereto. The treating solution pipe 38 is arranged movable (flexible) to permit movement of the nozzle 35 between the standby position and treating position. The other end of each treating solution pipe 38 is connected to a treating solution source (not shown). Specifically, in the case of antireflection film coating units BARC, the treating solution sources supply different types of treating solution for antireflection film to the respective nozzles 35. In the case of resist film coating units RESIST, the treating solution sources supply different types of resist film material to the respective nozzles 35.
The nozzle moving mechanism 37 has first guide rails 37a and a second guide rail 37b. The first guide rails 37a are arranged parallel to each other and opposed to each other across the two cups 33 arranged sideways. The second guide rail 37b is slidably supported by the two first guide rails 37a and disposed above the two cups 33. The gripper 36 is slidably supported by the second guide rail 37b. The first guide rails 37a and second guide rail 37b take guiding action substantially horizontally and in directions substantially perpendicular to each other. The nozzle moving mechanism 37 further includes drive members (not shown) for sliding the second guide rail 37b, and sliding the gripper 36. The drive members are operable to move the nozzle 35 gripped by the gripper 36 to the treating positions above the two spin holders 32.
The plurality of heat-treating units 41 are arranged vertically and horizontally, each facing the transporting space A1. In this embodiment, three heat-treating units 41 can be arranged horizontally, and five heat-treating units 41 can be stacked vertically. Each heat-treating unit 41 has a plate 43 for receiving a wafer W. The heat-treating units 41 include cooling units CP for cooling wafers W, heating and cooling units PHP for carrying out heating and cooling treatments continually, and adhesion units AHL for heat-treating wafers W in an atmosphere of hexamethyldisilazane (HMDS) vapor in order to promote adhesion of coating film to the wafers W. As shown in
The main transport mechanism T1 will be described specifically. Reference is made to
The base 53 has a turntable 55 rotatable about a vertical axis Q. The turntable 55 has two holding arms 57a and 57b horizontally movably attached thereto for holding wafers W, respectively. The two holding arms 57a and 57b are arranged vertically close to each other. Further, drive members (not shown) are provided for rotating the turntable 55, and moving the holding arms 57a and 57b. The drive members are operable to move the turntable 55 to positions opposed to the coating units 31, heat-treating units 41 and receivers PASS1 and PASS2, and to extend and retract the holding arms 57a and 57b to and from the coating units 31 and so on.
The story K3 will be described next. Like reference numerals are used to identify like parts which are the same as in the story K1, and will not be described again. The layout (arrangement) in plan view of the main transport mechanism T3 and treating units in the story K3 is substantially the same as in the story K1. Thus, the arrangement of the various treating units of the story K3 as seen from the main transport mechanism T3 is substantially the same as the arrangement of the various treating units of the story K1 as seen from the main transport mechanism T1. The coating units 31 and heat-treating units 41 of the story K3 are stacked under the coating units 31 and heat-treating units 41 of the story K1, respectively.
In the following description, when distinguishing the resist film coating units RESIST in the stories K1 and K3, subscripts “1” and “3” will be affixed (for example, the resist film coating units RESIST in the story K1 will be referred to as “resist film coating units RESIST1”).
The other aspects of the treating block Ba will be described. As shown in
Referring to
As shown in
The pit portions PS further accommodate piping of the treating solutions, electric wiring and the like (not shown). Thus, with the pit portions PS accommodating the piping and electric wiring provided for the coating units 31 of the stories K1 and K3, the piping and electric wiring can be reduced in length.
The treating block Ba has one housing 75 for accommodating the main transport mechanisms T1 and T3, coating units 31 and heat-treating units 41 described hereinbefore. The treating block Bb described hereinafter also has a housing 75 for accommodating the main transport mechanisms T2 and T4 and the treating units of the treating block Bb. The housing 75 of the treating block Ba and the housing 75 of the treating block Bb are separate entities. Thus, with each of the treating blocks Ba and Bb having the housing 75 accommodating the main transport mechanisms T and treating units en bloc, the treating section 3 may be manufactured and assembled simply. The treating block Ba corresponds to the coating block in this invention.
Treating Section 3—Treating Block Bb
The story K2 will be described. Like reference numerals are used to identify like parts which are the same as in the story K1 and will not be described again. The story K2 has a transporting space A2 formed as an extension of the transporting space A1.
The story K2 has developing units DEV for developing wafers W, heat-treating units 42 for heat-treating the wafers W, and an edge exposing unit EEW for exposing peripheral regions of the wafers W. The developing units DEV are arranged at one side of the transporting space A2, and the heat-treating units 42 and edge exposing unit EEW are arranged at the other side of the transporting space A2. Preferably, the developing units DEV are arranged at the same side as the coating units 31. It is also preferable that the heat-treating units 42 and edge exposing unit EEW are arranged in the same row as the heat-treating units 41. In this specification, the treatment carried out in the developing units DEV is referred to as developing treatment as appropriate, and the treatment carried out in the edge exposing unit EEW is referred to as edge exposure as appropriate.
The number of developing units DEV is four, and sets of two units DEV arranged horizontally along the transporting space A2 are stacked one over the other. As shown in
The plurality of heat-treating units 42 are arranged sideways along the transporting space A2, and stacked one over the other. The heat-treating units 42 include heating units HP for heating wafers W, cooling units CP for cooling wafers W, and heating and cooling units PHP for carrying out heating and cooling treatment.
The plurality of heating and cooling units PHP are vertically stacked in the column closest to the IF section 5, each having one side facing the IF section 5. The heating and cooling units PHP on the story K2 have transport ports formed in the sides thereof for passage of wafers W. IF transport mechanisms TIF to be described hereinafter transports wafers W through the above transport ports to the heating and cooling units PHP. The heating and cooling units PHP arranged on the story K2 carry out post-exposure baking (PEB) treatment. Thus, the heating and cooling treatment carried out in the heating and cooling units PHP on the story K2 is referred to herein as PEB treatment in particular. Similarly, the heating and cooling treatment carried out in the heating and cooling units PHP on the story K4 is referred to herein as PEB treatment in particular.
The single edge exposing unit EEW is disposed in a predetermined position. The edge exposing unit EEW includes a spin holder (not shown) for holding and spinning a wafer W, and a light emitter (not shown) for exposing edges of the wafer W held by the spin holder.
The receiver PASS5 is formed on top of the heating and cooling units PHP. The main transport mechanism T2 and IF transport mechanisms TIF to be described hereinafter transfer wafers W through the receiver PASS5.
The main transport mechanism T2 is disposed substantially centrally of the transporting space A2 in plan view. The main transport mechanism T2 has the same construction as the main transport mechanism T1. The main transport mechanism T2 transports wafers W to and from the receiver PASS2, various heat-treating units 42, edge exposing unit EEW and receiver PASS5.
The story K4 will be described briefly. The relationship in construction between story K2 and story K4 is similar to that between stories K1 and K3. The treating units on the story K4 are developing units DEV, heat-treating units 42 and an edge exposing unit EEW. The heat-treating units 42 on the story K4 include heating units HP, cooling units CP and heating and cooling units PHP. The receiver PASS6 is formed on top of the heating and cooling units PHP on the story K4. The main transport mechanism T4 and IF transport mechanisms TIF described hereinafter transfer wafers W through the receiver PASS6. The heating and cooling units PHP arranged on the story K4 also carry out post-exposure baking (PEB) treatment.
In the following description, when distinguishing the developing units DEV, edge exposing units EEW and so on provided on the stories K2 and K4, subscripts “2” and “4” will be affixed (for example, the heating units HP on the story K2 will be referred to as “heating units HP2”).
Each of the transporting spaces A2 and A4 of the stories K2 and K4 also has constructions corresponding to the first blowout unit 61 and exhaust unit 62. Each developing unit DEV of the stories K2 and K4 also has constructions corresponding to the second blowout unit 67 and second gas exhaust pipe 66. The treating block Bb corresponds also to the developing block in this invention.
IF Section 5
The IF section 5 transfers wafers W between each of the substrate treatment lines Lu and Ld (stories K2 and K4) of the treating section 3 and the exposing machine EXP. The IF section 5 has IF transport mechanisms TIF for transporting wafers W. The IF transport mechanisms TIF include a first transport mechanism TIFA and a second transport mechanism TIFB that can transfer wafers W to and from each other. The first transport mechanism TIFA transports wafers W to and from the substrate treatment lines Lu and Ld. In this embodiment, as described hereinbefore, the first transport mechanism TIFA transports wafers W to and from the receivers PASS5 and PASS6 on the stories K2 and K4, and to and from the heating and cooling units PHP on the stories K3 and K4. The second transport mechanism TIFB transports wafers W to and from the exposing machine EXP.
As shown in
As shown in
A control system of this apparatus 10 will be described next. This apparatus 10 further includes a control section 90 and an input unit 101.
The input unit 101 is operable to input information for setting substrate transport paths for each of the substrate treatment lines Lu and Ld. The information inputted to this input unit 101 is outputted to a main controller 91. The information for setting substrate transport paths for each story includes the types and order of treating units to/in which substrates are to be transported, for example. Or, it is information identifying treating units or particulars of treatment for which a test run is made. The information for setting transport paths for the substrate treatment line Lu may be divided into each transport path for the stories K1 and K2. This applies also to the substrate treatment line Ld.
The input unit 101 has pointing devices represented by a mouse, keyboard, joystick, trackball, touch panel, and so on.
As shown in
For example, based on information on the types and order of treating units to/in which substrates are to be transported, the main controller 91 determines treating units and their order to/in which wafers W are transported, and also determines transport paths linking the treating units. Alternatively, based on information identifying treating units put to a test run, the main controller 91 determines transport paths for transporting wafers W only to the treating units identified.
The first controller 93 controls substrate transport by the ID transport mechanism TID. The second controller 94 controls substrate transport by the main transport mechanism T1, and substrate treatment in the resist film coating units RESIST1, antireflection film coating units BARC1, cooling units CP1, heating and cooling units PHP1 and adhesion units AHL1. The third controller 95 controls substrate transport by the main transport mechanism T2, and substrate treatment in the edge exposing unit EEW2, developing units DEV2, heating units HP2 and cooling units CP2. The controls by the fourth and fifth controllers 96 and 97 correspond to those by the second and third controllers 94 and 95, respectively. The sixth controller 98 controls substrate transport by the first transport mechanism TIFA, and substrate treatment in the heating and cooling units PHP2 and PHP4. The seventh controller 99 controls substrate transport by the second transport mechanism TIFB. The first to seventh controllers 93-99 carry out the controls independently of one another.
Each of the main controller 91 and the first to seventh controllers 93-99 is realized by a central processing unit (CPU) which performs various processes, a RAM (Random Access Memory) used as the workspace for operation processes, and a storage medium such as a fixed disk for storing a variety of information including a predetermined processing recipe (processing program).
Next, operation of the substrate treating apparatus in this embodiment will be described separately for the case where wafers W go through the same process of treatment in the substrate treatment lines Lu and Ld, and for the case where wafers W go through different processes of treatment in the substrate treatment lines Lu and Ld. In each example of operation, the transport paths of wafers W are based on information inputted to the input unit 101 by the operator beforehand.
Example of Operation 1—where Wafers W go Through the Same Process of Treatment in the Substrate Treatment Lines Lu and Ld
The control section 90 operates each transport mechanism T based on a treating recipe set beforehand and/or information inputted to the input unit 101. The following description will be made separately for each transport mechanism.
ID Transport Mechanism TID
The ID transport mechanism TID moves to a position opposed to one of the cassettes C, holds with the holding arm 25 a wafer W to be treated and takes the wafer W out of the cassette C. The ID transport mechanism TID swivels the holding arm 25, vertically moves the lift shaft 23, moves to a position opposed to the receiver PASS1, and places the wafer W on the receiver PASS1A (which corresponds to step S1a in
This operation of the ID transport mechanism TID is controlled by the first controller 93. As a result, the wafers W in the cassette C are fed to the story K1, and the wafers W delivered from the story K1 are stored in the cassette C. Similarly, the wafers W in the cassette C are fed to the story K3, and the wafers W delivered from the story K3 are stored in the cassette C.
Main Transport Mechanisms T1, T3
Since operation of the main transport mechanism T3 is substantially the same as operation of the main transport mechanism T1, only the main transport mechanism T1 will be described. The main transport mechanism T1 moves to a position opposed to the receiver PASS1. At this time, the main transport mechanism T1 holds, on one holding arm 57 (e.g. 57b), a wafer W received immediately before from the receiver PASS2B. The main transport mechanism T1 places this wafer W on the receiver PASS1B (step S22), and holds the wafer W present on the receiver PASS1A with the other holding arm 57 (e.g. 57a).
The main transport mechanism T1 accesses one of the cooling units CP1. There is a different wafer W having already received cooling treatment in the cooling unit CP1. The main transport mechanism T1 holds the different wafer W with the unloaded holding arm 57 (holding no wafer W), takes it out of the cooling unit CP1, and loads into the cooling unit CP1 the wafer W having received from the receiver PASS1A. Then, the main transport mechanism T1, holding the cooled wafer W, moves to one of the antireflection film coating units BARC1. The cooling unit CP1 starts cooling treatment of the wafer W loaded therein (step S2: the treatment in step S2 by the cooling unit CP1 corresponds to cooling treatment T1u in
Accessing the antireflection film coating unit BARC1, the main transport mechanism T1 takes a wafer W having antireflection film formed thereon from the antireflection film coating unit BARC1, and places the cooled wafer W on the spin holder 32 of the antireflection film coating unit BARC1. Then, the main transport mechanism T1, holding the wafer W having antireflection film formed thereon, moves to one of the heating and cooling units PHP1. The antireflection film coating unit BARC1 starts antireflection film material coating treatment of the wafer W placed on the spin holder 32 (step S3a—antireflection film material coating treatment T2u).
Specifically, the spin holder 32 spins the wafer W in horizontal posture, the gripper 26 grips one of the nozzles 35, the nozzle moving mechanism 37 moves the gripped nozzle 35 to a position above the wafer W, and the treating solution for antireflection film is supplied from the nozzle 35 to the wafer W. The treating solution supplied spreads all over the wafer W, and is scattered away from the wafer W. The cup 33 collects the scattering treating solution. In this way, the treatment is carried out for forming antireflection film on the wafer W.
Accessing the heating and cooling unit PHP1, the main transport mechanism T1 takes a wafer W having received heat treatment out of the heating and cooling unit PHP1, and loads the wafer W having antireflection film formed thereon into the heating and cooling unit PHP1. Then, the main transport mechanism T1, holding the wafer W taken out of the heating and cooling unit PHP1, moves to one of the cooling units CP1. The heating and cooling unit PHP1 receives a wafer W successively on the two plates 43, to heat the wafer W on one of the plates 43 and then to cool the wafer W on the other plate 43 (step S4a—heating and cooling treatment T3u).
Having moved to the cooling unit CP1, the main transport mechanism T1 takes a wafer W out of the cooling unit CP1, and loads the wafer W held by the transport mechanism T1 into the cooling unit CP1. The cooling unit CP1 cools the wafer W loaded therein (step S5a—cooling treatment T4u).
Then, the main transport mechanism T1 moves to one of the resist film coating units RESIST1. The main transport mechanism T1 takes a wafer W having resist film formed thereon from the resist film coating unit RESIST1, and loads the wafer W held by the main transport mechanism T1 into the resist film coating unit RESIST1. The resist film coating unit RESIST1 coats the resist film material on the wafer W loaded therein while spinning the wafer W (step S6a—resist film material coating treatment T5u).
The main transport mechanism T1 further moves to one of the heating and cooling units PHP1 and one of the cooling units CP1. The main transport mechanism T1 loads the wafer W having resist film formed thereon into the heating and cooling unit PHP1, transfers a wafer W treated in the heating and cooling unit PHP1 to the cooling unit CP1, and receives a wafer W treated in the cooling unit CP1. The heating and cooling unit PHP1 and cooling unit CP1 carry out predetermined treatments of newly loaded wafers W, respectively (step S7a—heating and cooling treatment T6u, and S8a—cooling treatment T7u).
The main transport mechanism T1 moves to the receiver PASS2, places the wafer W it is holding on the receiver PASS2A (step S9a), and receives a wafer W present on the receiver PASS2B (step S21a).
Subsequently, the main transport mechanism T1 accesses the receiver PASS1 again, and repeats the above operation. This operation is controlled by the second controller 94. As a result, all the wafers W transported from the cassette C to the receiver PASS1 are transported through the transport paths described above between the various treating units on the story K1 to receive the predetermined treatments in the treating units successively.
The main transport mechanism T1 transports a wafer W having been transported to the receiver PASS1 to a predetermined treating unit (a cooling unit CP1 in this embodiment), and takes a treated wafer W from this treating unit. Subsequently, the main transport mechanism T1 transports the wafer W taken out to a next treating unit (an antireflection film coating unit BARC1 in this embodiment), and takes a treated wafer W from this treating unit. In this way, the treatment is carried out in parallel for a plurality of wafers W by transferring a treated wafer W from each treating unit to a new treating unit. Starting with a wafer W first placed on the receiver PASS1, the wafers W are successively placed on the receiver PASS2 to be fed to the story K2. Similarly, the wafers W are placed on the receiver PASS1 in the order of placement on the receiver PASS2, to be fed to the ID section 1.
Main Transport Mechanisms T2, T4
Since operation of the main transport mechanism T4 is substantially the same as operation of the main transport mechanism T2, only the main transport mechanism T2 will be described. The main transport mechanism T2 moves to a position opposed to the receiver PASS2. At this time, the main transport mechanism T2 holds a wafer W received from a cooling unit CP2 accessed immediately before. The main transport mechanism T2 places this wafer W on the receiver PASS2B (step S21a), and holds the wafer W present on the receiver PASS2A (step S9a).
The main transport mechanism T2 accesses the edge exposing unit EEW2. The main transport mechanism T2 receives a wafer W having received a predetermined treatment in the edge exposing unit EEW2, and loads the cooled wafer W into the edge exposing unit EEW2. While spinning the wafer W loaded therein, the edge exposing unit EEW2 irradiates peripheral regions of the wafer W with light from the light emitter not shown, thereby exposing the peripheral regions of the wafer W (step S10a—edge exposure T8u).
The main transport mechanism T2, holding the wafer W received from the edge exposing unit EEW2, accesses the receiver PASS5. The main transport mechanism T2 places the wafer W on the receiver PASS5A (step S11a), and holds a wafer W present on the receiver PASS5B (step S16a).
The main transport mechanism T2 moves to one of the cooling units CP2, and replaces a wafer W in the cooling unit CP2 with the wafer W held by the main transport mechanism T2. The main transport mechanism T2 holds the wafer W having received cooling treatment, and accesses one of the developing units DEV2. The cooling unit CP2 starts treatment of the newly loaded wafer W (step S17a—cooling treatment T1u).
The main transport mechanism T2 takes a developed wafer W from the developing unit DEV2, and places the cooled wafer W on the spin holder 77 of the developing unit DEV2. The developing unit DEV2 develops the wafer W placed on the spin holder 77 (step S18a—developing treatment T12u). Specifically, while the spin holder 77 spins the wafer W in horizontal posture, the developer is supplied from one of the slit nozzles 81a to the wafer W, thereby developing the wafer W.
The main transport mechanism T2 holds the developed wafer W, and accesses one of the heating units HP2. The main transport mechanism T2 takes a wafer W out of the heating unit HP2, and loads the wafer W it is holding into the heating unit HP2. Then, the main transport mechanism T2 transports the wafer W taken out of the heating unit HP2 to one of the cooling units CP2, and takes out a wafer W already treated in this cooling unit CP2. The heating unit HP2 and cooling unit CP2 carry out predetermined treatments for the newly loaded wafers W, respectively (step S19a—heating treatment T13u, and S20a—cooling treatment T14u).
Subsequently, the main transport mechanism T2 accesses the receiver PASS2 again, and repeats the above operation. This operation is controlled by the third controller 95. As a result, the wafers W are forwarded to the receiver PASS5B in the order in which they are placed on the receiver PASS2A. Similarly, the wafers W are forwarded to the receiver PASS2B in the order in which they are placed on the receiver PASS5B.
IF Transport Mechanisms TIF—First Transport Mechanism TIFA
The first transport mechanism TIFA accesses the receiver PASS5, and receives the wafer W present on the receiver PASS5A (step S11a). The first transport mechanism TIFA, holding the wafer W received, moves to the receiver PASS-CP, and loads the wafer W on the receiver PASS-CP (step S12).
Next, the first transport mechanism TIFA receives a wafer W from the receiver PASS7 (step S14), and moves to a position opposed to one of the heating and cooling units PHP2. The first transport mechanism TIFA takes a wafer W having received PEB treatment from the heating and cooling unit PHP2, and loads the wafer W received from the receiver PASS7 into the heating and cooling unit PHP2. The heating and cooling unit PHP2 carries out heat treatment for the newly loaded wafer W (step S15a—PEB treatment T10u).
The first transport mechanism TIFA transports the wafer W taken out of the heating and cooling unit PHP2 to the receiver PASS5B (step S16a). Subsequently, the first transport mechanism TIFA transports a wafer W from the receiver PASS6A to the receiver PASS-CP (Step S11b, S12). Next, the first transport mechanism TIFA transports a wafer W from the receiver PASS7 to one of the heating and cooling units PHP4. At this time, the first transport mechanism TIFA takes out a wafer W having received the post-exposure baking treatment (PEB) treatment in the heating and cooling unit PHP4, and places the wafer W on the receiver PASS6B (steps S14, S15b—PEB treatment T10d, and S16b).
Subsequently, the first transport mechanism TIFA accesses the receiver PASS5 again and repeats the above operation. This operation is controlled by the sixth controller 98.
IF Transport Mechanisms TIF—Second Transport Mechanism TIFB
The second transport mechanism TIFB takes a wafer W out of the receiver PASS-CP, and transports it to the exposing machine EXP. The exposing machine EXP exposes the wafer W (Step S13—Exposure T9). Then, the second transport mechanism TIFB receives the exposed wafer W from the exposing machine EXP, and transports it to the receiver PASS7.
Subsequently, the second transport mechanism TIFB accesses the receiver PASS-CP again and repeats the above operation.
Example of Operation 2—where Wafers W go Through Different Processes of Treatment in the Substrate Treatment Lines Lu and Ld
The example of operation 2 will be described next.
The control section 90 operates each transport mechanism T based on a treating recipe set beforehand and/or information inputted to the input unit 101. The following description will be made separately for each transport mechanism. The transport mechanisms and other components that perform similarly to the example of operation 1 will be described briefly as appropriate.
ID Transport Mechanism TID
The operation of ID transport mechanism TID is the same as in the example of operation 1, and therefore its description is omitted.
Main Transport Mechanisms T1, T3
The operation of the main transport mechanism T1 is the same as in the example of operation 1. Thus, the operation of the main transport mechanism T1 will be omitted, and only the main transport mechanism T3 will be described.
The main transport mechanism T3 moves to a position opposed to the receiver PASS3. At this time, the main transport mechanism T3 holds, on one holding arm 57 (e.g. 57b), a wafer W received immediately before from the receiver PASS4B. The main transport mechanism T3 places this wafer W on the receiver PASS3B (step S22b), and holds the wafer W present on the receiver PASS3A with the other holding arm 57 (e.g. 57a) (step S1b).
The main transport mechanism T3 accesses one of the resist film coating units RESIST3. The main transport mechanism T3 takes a wafer W having resist film formed thereon from the resist film coating unit RESIST3, and loads the wafer W held by the main transport mechanism T3 into the resist film coating unit RESIST3. The resist film coating unit RESIST3 coats the resist film material on the wafer W loaded therein while spinning the wafer W (step S6b—resist film material coating treatment T21d).
Subsequently, the main transport mechanism T3 accesses the receiver PASS3 again, and repeats the above operation. This operation is controlled by the fourth controller 96. As a result, all the wafers W transported from the cassette C to the receiver PASS3 are transported through the transport path leading only to the resist film coating unit RESIST3 on the story K3.
Main Transport Mechanisms T2, T4
The operation of the main transport mechanism T2 is the same as in the example of operation 1. Thus, the operation of the main transport mechanism T2 will be omitted. The main transport mechanism T4 carries out no operation to transport wafers W. For example, the fifth controller 97 maintains the main transport mechanism T4 at rest.
IF Transport Mechanisms TIF—First Transport Mechanism TIFA
The first transport mechanism TIFA accesses the receiver PASS5, and receives the wafer W present on the receiver PASS5A (step S11a). The first transport mechanism TIFA, holding the wafer W received, moves to the receiver PASS-CP, and loads the wafer W on the receiver PASS-CP (step S12).
Next, the first transport mechanism TIFA receives a wafer W from the receiver PASS7 (step S14), and moves to a position opposed to one of the heating and cooling units PHP2. The first transport mechanism TIFA takes a wafer W having received post-exposure baking treatment (PEB) treatment from the heating and cooling unit PHP2, and loads the wafer W received from the receiver PASS7 into the heating and cooling unit PHP2. The heating and cooling unit PHP2 carries out heat treatment for the newly loaded wafer W (step S15—PEB treatment T10u). The first transport mechanism TIFA transports the wafer W taken out of the heating and cooling unit PHP2 to the receiver PASS5B (step S16a).
Subsequently, the first transport mechanism TIFA accesses the receiver PASS5 again and repeats the above operation.
IF Transport Mechanisms TIF—Second Transport Mechanism TIFB
The operation of the second transport mechanism TIFB is the same as in the example of operation 1. Thus, the operation of the second transport mechanism TIFB will be omitted.
The above is the example of operation 2. However, the processes in the substrate treatment lines Lu and Ld are not limited to examples of operation 1 and 2. As noted in the foregoing description of the outline of this embodiment, the processes in the substrate treatment lines Lu and Ld can be changed very flexibly. Thus, since the substrate treating apparatus in this embodiment has the control section 90 which changes the processes in the substrate treatment lines Lu and Ld, the substrate treatment lines Lu and Ld can carry out different treatments of wafers W in parallel as described in the example of operation 2. Therefore, by transporting wafers W selectively to the substrate treatment line Lu or Ld, the process of treatment is changeable for each wafer W. Further, as described in the example of operation 1, wafers W can go through the same process of treatment in the substrate treatment lines Lu and Ld. Consequently, this apparatus 10 has an improved substrate throughput.
Specifically, in the example of operation 1, wafers W go through the coating and developing process in all the substrate treatment lines L. This embodiment includes heat treatment besides the resist film material coating treatment and developing treatment. Thus, resist film can be formed on the wafers W conveniently, and the wafers W can be developed conveniently.
In the example of operation 2, while wafers W go through the coating and developing process in the substrate treatment line Lu, a process consisting only of the resist film material coating treatment is carried out in the substrate treatment line Ld. The resist film material coating treatment is a single treatment, which is carried out in the resist film coating units RESIST. Thus, when inspecting and verifying the quality of the resist film material coating treatment, or putting the resist film coating units RESIST to a test run, operation may be carried out as described in the example of operation 2 to inhibit a sharp reduction in the working rate of this apparatus.
The treating section 3 has the treating blocks Ba and Bb arranged in juxtaposition, the substrate treatment line Lu is provided on the same stories K1-K2 of the treating blocks Ba and Bb, and the substrate treatment line Ld also is provided on the same stories K3-K4 of the treating blocks Ba and Bb. The control section 90 controls the main transport mechanisms T1-T4 on the respective stories K1-K4 to change the transport paths of wafers W on the stories K1-K4. Thus, the processes in the substrate treatment lines Lu and Ld can be changed separately and independently. In other words, it is possible to change each of the series of treatments on the same stories K1-K2 of the treating blocks Ba and Bb and the series of treatments on the same stories K3-K4.
The input unit 101 is provided, and the control section 90 carries out controls based on information inputted to the input unit 101. Thus, the operator who operates the input unit 101 can instruct changes in the transport paths conveniently.
The information inputted to the input unit 101 is information on the type and order of treatment given to wafers W in each of the substrate treatment lines Lu and Ld, or information identifying treating units and/or the particulars of treatment put to a test run. Thus, the control section 90 can determine transport paths conveniently.
The treating block Bb and ID section 1 are located adjacent the opposite sides of the treating block Ba, and wafers W treated in the coating units 31 are transported from the treating block Ba to the treating block Bb. Thus, a series of treatments including the treatment for applying the treating solution to the wafers W and the treatment for supplying the developer to the wafers W can be carried out smoothly. Further, by transporting wafers W treated in the coating units 31 from the treating blocks Ba to the ID section 1, only the treatment for applying the treating solution to the wafers W is carried out, and the wafers W can be returned to a cassette C promptly.
Since the IF section 5 is located adjacent the treating block Bb, wafers W can be transported from the treating block Bb to the exposing machine EXP through the IF section 5, and the wafers W exposed in the exposing machine EXP can be developed in the developing units DEV. Further, unexposed wafers W may be developed in the developing units DEV of the treating block Bb, without transporting the wafers W from the treating block Bb to the exposing machine EXP.
Embodiments of the present invention are not limited to the foregoing embodiments, but may be modified as follows:
(1) Although the examples of operation 1 and 2 have been described in the foregoing embodiment, the invention is not limited to these examples.
Reference is made to
In this modification, the ID section 1 (ID transport mechanism TID) transports wafers W taken out of a cassette C to either one of the substrate treatment line Lu and Ld, and returns the wafers W from the substrate treatment line Lu and Ld to the cassette C. With such substrate transport by the ID section 1 (ID transport mechanism TID), wafers W can be treated through the process in either one of the substrate treatment lines Lu and Ld.
Further, in this modification, the ID section 1 (ID transport mechanism TID) transports all the wafers W taken out of a cassette C to the substrate treatment line Lu, transports the wafers W from the substrate treatment line Lu to the substrate treatment line Ld, and returns the wafers W from the substrate treatment line Ld to the cassette C. With such substrate transport by the ID section 1 (ID transport mechanism TID), all the wafers W can be treated through the process in the substrate treatment line Lu, and thereafter through the process in the substrate treatment line Ld. Such an example of operation can conveniently carry out double exposure for forming two or more patterns on the same oxide film on the wafers W.
(2) In the foregoing embodiment, as shown in
(3) In the foregoing embodiment, the separate exposing machine EXP is disposed adjacent this apparatus 10, but this is not limitative. This apparatus 10 may not adjoin the exposing machine EXP.
(4) The foregoing embodiment provides two substrate treatment lines L, but the invention not limited to this. The construction may be modified to include three or more substrate treatment lines L vertically arranged in multiple stages. In this case, it is possible to uniform the processes in the substrate treatment lines L, and to provide two or more types of processes for the substrate treatment lines L. All the substrate treatment lines L may carry out different processes.
(5) In the foregoing embodiment, the substrate treatment lines L are arranged vertically, but the invention is not limited to this. For example, a modification may be made to arrange a plurality of substrate treatment lines L sideways or horizontally. Or a plurality of substrate treatment lines L may be arranged sideways as well as vertically.
(6) In the foregoing embodiment, the treating section 3 has a plurality of treating blocks Ba and Bb arranged in juxtaposition, but the invention is not limited to this. For example, the treating section 3 may be constructed of a single treating block with vertically divided stories. A single treating block providing the substrate treatment line Lu and a single treating block providing the substrate treatment line Ld may be arranged one over the other.
(7) In the foregoing embodiment, the substrate treatment lines L carry out all or part of the coating and developing process, but the invention is not limited to this. The substrate treatment lines L may be modified to perform other treatment such as cleaning of wafers W. Thus, the type, number and the like of treating units are selected or designed as appropriate. Further, the substrate treating apparatus may be constructed to exclude the IF section 5.
This invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof and, accordingly, reference should be made to the appended claims, rather than to the foregoing specification, as indicating the scope of the invention.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2007-340428 | Dec 2007 | JP | national |
| Number | Name | Date | Kind |
|---|---|---|---|
| 4409889 | Burleson | Oct 1983 | A |
| 4985722 | Ushijima et al. | Jan 1991 | A |
| 5028195 | Ishii et al. | Jul 1991 | A |
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| Number | Date | Country | |
|---|---|---|---|
| 20090165712 A1 | Jul 2009 | US |
