Top port multi-part surface mount silicon condenser microphone

Abstract
A surface mount package for a micro-electro-mechanical system (MEMS) microphone die is disclosed. The surface mount package features a substrate with metal pads for surface mounting the package to a device's printed circuit board and for making electrical connections between the microphone package and the device's circuit board. The surface mount microphone package has a cover, and the MEMS microphone die is substrate-mounted and acoustically coupled to an acoustic port provided in the surface mount package. The substrate and the cover are joined together to form the MEMS microphone, and the substrate and cover cooperate to form an acoustic chamber for the substrate-mounted MEMS microphone die.
Description
TECHNICAL FIELD

This patent relates generally to a housing for a transducer. More particularly, this patent relates to a silicon condenser microphone including a housing for shielding a transducer.


BACKGROUND OF THE INVENTION

There have been a number of disclosures related to building microphone elements on the surface of a silicon die. Certain of these disclosures have come in connection with the hearing aid field for the purpose of reducing the size of the hearing aid unit. While these disclosures have reduced the size of the hearing aid, they have not disclosed how to protect the transducer from outside interferences. For instance, transducers of this type are fragile and susceptible to physical damage. Furthermore, they must be protected from light and electromagnetic interferences. Moreover, they require an acoustic pressure reference to function properly. For these reasons, the silicon die must be shielded.


Some shielding practices have been used to house these devices. For instance, insulated metal cans or discs have been provided. Additionally, DIPs and small outline integrated circuit (SOIC) packages have been utilized. However, the drawbacks associated with manufacturing these housings, such as lead time, cost, and tooling, make these options undesirable.


SUMMARY OF THE INVENTION

The present invention is directed to a silicon condenser microphone package that allows acoustic energy to contact a transducer disposed within a housing. The housing provides the necessary pressure reference while at the same time protects the transducer from light, electromagnetic interference, and physical damage. In accordance with an embodiment of the invention a silicon condenser microphone includes a transducer and a substrate and a cover forming the housing. The substrate may have an upper surface with a recess formed therein allowing the transducer to be attached to the upper surface and to overlap at least a portion of the recess thus forming a back volume. The cover is placed over the transducer and includes an aperture adapted for allowing sound waves to reach the transducer.


Other features and advantages of the invention will be apparent from the following specification taken in conjunction with the following drawings.





BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a cross-sectional view of a first embodiment of a silicon condenser microphone of the present invention;



FIG. 2 is a cross-sectional view of a second embodiment of a silicon condenser microphone of the present invention;



FIG. 3 is a cross-sectional view of a third embodiment of a silicon condenser microphone of the present invention;



FIG. 4 is a cross-sectional view of the third embodiment of the present invention affixed to an end user circuit board;



FIG. 5 is a cross-sectional view of the third embodiment of the present invention affixed to an end user circuit board in an alternate fashion;



FIG. 6 is a plan view of a substrate to which a silicon condenser microphone is fixed;



FIG. 7 is a longitudinal cross-sectional view of a microphone package of the present invention;



FIG. 8 is a lateral cross-sectional view of a microphone package of the present invention;



FIG. 9 is a longitudinal cross-sectional view of a microphone package of the present invention;



FIG. 10 is a lateral cross-sectional view of a microphone package of the present invention;



FIG. 11 is a cross-sectional view of a top portion for a microphone package of the present invention;



FIG. 12 is a cross-sectional view of a top portion for a microphone package of the present invention;



FIG. 13 is a cross-sectional view of a top portion for a microphone package of the present invention;



FIG. 14a is a cross-sectional view of a laminated bottom portion of a housing for a microphone package of the present invention;



FIG. 14b is a plan view of a layer of the laminated bottom portion of FIG. 14a;



FIG. 14c is a plan view of a layer of the laminated bottom portion of FIG. 14a;



FIG. 14d is a plan view of a layer of the laminated bottom portion of FIG. 14a;



FIG. 15 is a cross-sectional view of a bottom portion for a microphone package of the present invention;



FIG. 16 is a cross-sectional view of a bottom portion for a microphone package of the present invention;



FIG. 17 is a cross-sectional view of a bottom portion for a microphone package of the present invention;



FIG. 18 is a cross-sectional view of a bottom portion for a microphone package of the present invention;



FIG. 19 is a plan view of a side portion for a microphone package of the present invention;



FIG. 20 is a cross-sectional view of a side portion for a microphone package of the present invention;



FIG. 21 is a cross-sectional view of a side portion for a microphone package of the present invention;



FIG. 22 is a cross-sectional view of a side portion for a microphone package of the present invention;



FIG. 23 is a cross-sectional view of a microphone package of the present invention;



FIG. 24 is a cross-sectional view of a microphone package of the present invention;



FIG. 25 is a cross-sectional view of a microphone package of the present invention;



FIG. 26 is a cross-sectional view of a microphone package of the present invention;



FIG. 27 is a cross-sectional view of a microphone package of the present invention with a retaining ring;



FIG. 28 is a cross-sectional view of a microphone package of the present invention with a retaining wing;



FIG. 29 is a cross-sectional view of a microphone package of the present invention with a retaining ring;



FIG. 30 is a plan view of a panel of a plurality of microphone packages; and



FIG. 31 is a plan view of a microphone pair.





DETAILED DESCRIPTION

While the invention is susceptible of embodiments in many different forms, there is shown in the drawings and will herein be described in detail several possible embodiments of the invention with the understanding that the present disclosure is to be considered as an exemplification of the principles of the invention and is not intended to limit the broad aspect of the invention to the embodiments illustrated.


The present invention is directed to microphone packages. The benefits of the microphone packages disclosed herein over microphone packaging utilizing plastic body/lead frames include the ability to process packages in panel form allowing more units to be formed per operation and at much lower cost. The typical lead frame for a similarly functioning package would contain between 40 and 100 devices connected together. The present disclosure would have approximately 14,000 devices connected together (as a panel). Also, the embodiments disclosed herein require minimal “hard-tooling” This allows the process to adjust to custom layout requirements without having to redesign mold, lead frame, and trim/form tooling.


Moreover, many of the described embodiments have a better match of thermal coefficients of expansion with the end user's PCB, typically made of FR-4, since the microphone package is also made primarily of FR-4. These embodiments of the invention may also eliminate the need for wire bonding that is required in plastic body/lead frame packages. The footprint is typically smaller than that would be required for a plastic body/lead frame design since the leads may be formed by plating a through-hole in a circuit board to form the pathway to the solder pad. In a typical plastic body/lead frame design, a (gull wing configuration would be used in which the leads widen the overall foot print.


Now, referring to FIGS. 1-3, three embodiments of a silicon condenser microphone package 10 of the present invention are illustrated. Included within silicon microphone package 10 is a transducer 12, e.g. a silicon condenser microphone as disclosed in U.S. Pat. No. 5,870,482 which is hereby incorporated by reference and an amplifier 16. The package itself includes a substrate 14, a back volume or air cavity 18, which provides a pressure reference for the transducer 12, and a cover 20. The substrate 14 may be formed of FR-4 material allowing processing in circuit board panel form, thus taking advantage of economies of scale in manufacturing. FIG. 6 is a plan view of the substrate 14 showing the back volume 18 surrounded a plurality of terminal pads.


The back volume 18 may be formed by a number of methods, including controlled depth drilling of an upper surface 19 of the substrate 14 to form a recess over which the transducer 12 is mounted (FIG. 1); drilling and routing of several individual sheets of FR-4 and laminating the individual sheets to form the back volume 18, which may or may not have internal support posts (FIG. 2); or drilling completely through the substrate 14 and providing a sealing ring 22 on the bottom of the device that will seal the back volume 18 during surface mounting to a user's “board” 28 (FIGS. 3-5). In this example, the combination of the substrate and the user's board 28 creates the back volume 18. The back volume 18 is covered by the transducer 12 (e.g., a MEMS device) which may be “bumpbonded” and mounted face down. The boundary is sealed such that the back volume 18 is operably “air-tight.”


The cover 20 is attached for protection and processability. The cover 20 contains an aperture 24 which may contain a sintered metal insert 26 to prevent water, particles and/or light from entering the package and damaging the internal components inside; i.e. semiconductor chips. The aperture 24 is adapted for allowing sound waves to reach the transducer 12. The sintered metal insert 26 will also have certain acoustic properties, e.g. acoustic damping or resistance. The sintered metal insert 26 may therefore be selected such that its acoustic properties enhance the functional capability of the transducer 12 and/or the overall performance of the silicon microphone 10.


Referring to FIGS. 4 and 5 the final form of the product is a silicon condenser microphone package 10 which would most likely be attached to an end user's PCB 28 via a solder reflow process. FIG. 5 illustrates a method of enlarging the back volume 18 by including a chamber 32 within the end user's circuit board 28.


Another embodiment of a silicon condenser microphone package 40 of the present invention is illustrated in FIGS. 7-10. In this embodiment, a housing 42 is formed from layers of materials, such as those used in providing circuit boards. Accordingly, the housing 42 generally comprises alternating layers of conductive and non-conductive materials 44, 46. The non-conductive layers 46 are typically FR-4 board. The conductive layers 44 are typically copper. This multi-layer housing construction advantageously permits the inclusion of circuitry, power and ground planes, solder pads, ground pads, capacitance layers and plated through holes pads within the structure of the housing itself. The conductive layers provide EMI shielding while also allowing configuration as capacitors and/or inductors to filter input/output signals and/or the input power supply.


In the embodiment illustrated, the housing 42 includes a top portion 48 and a bottom portion 50 spaced by a side portion 52. The housing 42 further includes an aperture or acoustic port 54 for receiving an acoustic signal and an inner chamber 56 which is adapted for housing a transducer unit 58, typically a silicon die microphone or a ball grid array package (BGA). The top, bottom, and side portions 48, 50, 52 are electrically connected, for example with a conductive adhesive 60. The conductive adhesive may be provided conveniently in the form of suitably configured sheets of dry adhesive disposed between the top, bottom and side portions 48, 50 and 52. The sheet of dry adhesive may be activated by pressure, heat or other suitable means after the portions are brought together during assembly. Each portion may comprise alternating conductive and non-conductive layers of 44, 46.


The chamber 56 may include an inner lining 61. The inner lining 61 is primarily formed by conductive material. It should be understood that the inner lining may include portions of non-conductive material, as the conductive material may not fully cover the non-conductive material. The inner lining 61 protects the transducer 58 against electromagnetic interference and the like, much like a faraday cage. The inner lining 61 may also be provided by suitable electrically coupling together of the various conductive layers within the top, bottom and side portions 48, 50 and 52 of the housing.


In the various embodiments illustrated in FIGS. 7-10 and 23-26, the portions of the housing 42 that include the aperture or acoustic port 54 further include a layer of material that forms an environmental barrier 62 over or within the aperture 54. This environmental barrier 62 is typically a polymeric material formed to a film, such as a polytetrafluoroethylene (PTFE) or a sintered metal. The environmental barrier 62 is supplied for protecting the chamber 56 of the housing 42, and, consequently, the transducer unit 58 within the housing 42, from environmental elements such as sunlight, moisture, oil, dirt, and/or dust. The environmental barrier 62 will also have inherent acoustic properties, e.g. acoustic damping/resistance. Therefore the environmental barrier 62 is chosen such that its acoustic properties cooperate with the transducer unit 58 to enhance the performance of the microphone. This is particularly true in connection with the embodiments illustrated in FIGS. 24 and 25, which may be configured to operate as directional microphones.


The environmental barrier layer 62 is generally sealed between layers of the portion, top 48 or bottom 50 in which the acoustic port 54 is formed. For example, the environmental barrier may be secured between layers of conductive material 44 thereby permitting the layers of conductive material 44 to act as a capacitor (with electrodes defined by the metal) that can be used to filter input and output signals or the input power. The environmental barrier layer 62 may further serve as a dielectric protective layer when in contact with the conductive layers 44 in the event that the conductive layers also contain thin film passive devices such as resistors and capacitors.


In addition to protecting the chamber 56 from environmental elements, the barrier layer 62 allows subsequent wet processing, board washing of the external portions of the housing 42, and electrical connection to ground from the walls via thru hole plating. The environmental barrier layer 62 also allows the order of manufacturing steps in the fabrication of the printed circuit board-based package to be modified. This advantage can be used to accommodate different termination styles. For example, a double sided package can be fabricated having a pair of apertures 54 (see FIG. 25), both including an environmental barrier layer 62. The package would look and act the same whether it is mounted face up or face down, or the package could be mounted to provide directional microphone characteristics. Moreover, the environmental barrier layer 62 may also be selected so that its acoustic properties enhance the directional performance of the microphone.


Referring to FIGS. 7, 8, and 11-13 the transducer unit 58 is generally not mounted to the top portion 48 of the housing. This definition is independent of the final mounting orientation to an end user's circuit board. It is possible for the top portion 48 to be mounted face down depending on the orientation of the transducer 58 as well as the choice for the bottom portion 50. The conductive layers 44 of the top portion 48 may be patterned to form circuitry, ground planes, solder pads, ground pads, capacitors and plated through hole pads. Referring to FIGS. 1-13 there may be additional alternating conductive layers 44, non-conductive layers 46, and environmental protective membranes 62 as the package requires. Alternatively, some layers may be deliberately excluded as well. The first non-conductive layer 46 may be patterned so as to selectively expose certain features on the first conductive layer 44.



FIG. 11 illustrates an alternative top portion 48 for a microphone package. In this embodiment, a connection between the layers can be formed to provide a conduit to ground. The top portion of FIG. 11 includes ground planes and/or pattern circuitry 64 and the environmental barrier 62. The ground planes and or pattern circuitry 64 are connected by pins 65.



FIG. 12 illustrates another embodiment of a top portion 48. In addition to the connection between layers, ground planes/pattern circuitry 64, and the environmental barrier 62, this embodiment includes conductive bumps 66 (e.g. Pb/Sn or Ni/Au) patterned on the bottom side to allow secondary electrical contact to the transducer 58. Here, conductive circuitry would be patterned such that electrical connection between the bumps 66 and a plated through hole termination is made.



FIG. 13 illustrates yet another embodiment of the top portion 48. In this embodiment, the top portion 48 does not include an aperture or acoustic port 54.


Referring to FIGS. 7, 8 and 14-18, the bottom portion 50 is the component of the package to which the transducer 58 is primarily mounted. This definition is independent of the final mounting orientation to the end user's circuit board. It is possible for the bottom portion 50 to be mounted facing upwardly depending on the mounting orientation of the transducer 58 as well as the choice for the top portion 48 construction Like the top portion 48, the conductive layers 44 of the bottom portion 50 may be patterned to form circuitry, ground planes, solder pads, ground pads, capacitors and plated through hole pads. As shown in FIGS. 14-18, there may be additional alternating conductive layers 44, non-conductive layers 46, and environmental protective membranes 62 as the package requires. Alternatively, some layers may be deliberately excluded as well. The first non-conductive layer 46 may be patterned so as to selectively expose certain features on the first conductive layer 44.


Referring to FIGS. 14a through 14d, the bottom portion 50 comprises a laminated, multi-layered board including layers of conductive material 44 deposited on layers of non-conductive material 46. Referring to FIG. 14b, the first layer of conductive material is used to attach wire bonds or flip chip bonds. This layer includes etched portions to define lead pads, bond pads, and ground pads. The pads would have holes drilled through them to allow the formation of plated through-holes.


As shown in FIG. 14c, a dry film 68 of non-conductive material covers the conductive material. This illustration shows the exposed bonding pads as well as an exposed ground pad. The exposed ground pad would come in electrical contact with the conductive epoxy and form the connection to ground of the side portion 52 and the base portion 50.


Referring to FIG. 14d, ground layers can be embedded within the base portion 50. The hatched area represents a typical ground plane 64. The ground planes do not overlap the power or output pads, but will overlap the transducer 58.


Referring to FIG. 15, an embodiment of the bottom portion 50 is illustrated. The bottom portion 50 of this embodiment includes a solder mask layer 68 and alternating layers of conductive and non-conductive material 44, 46. The bottom portion further comprises solder pads 70 for electrical connection to an end user's board.



FIGS. 16 and 17 illustrate embodiments of the bottom portion 50 with enlarged back volumes 18. These embodiments illustrate formation of the back volume 18 using the conductive/non-conductive layering.



FIG. 18 shows yet another embodiment of the bottom portion 50. In this embodiment, the back portion 50 includes the acoustic port 54 and the environmental barrier 62.


Referring to FIGS. 7-10 and 19-22, the side portion 52 is the component of the package that joins the bottom portion 50 and the top portion 48. The side portion 52 may include a single layer of a non-conductive material 46 sandwiched between two layers of conductive material 44. The side portion 52 forms the internal height of the chamber 56 that houses the transducer 58. The side portion 52 is generally formed by one or more layers of circuit board material, each having a routed window 72 (see FIG. 19).


Referring to FIGS. 19-22, the side portion 52 includes inner sidewalls 74. The inner sidewalls 74 are generally plated with a conductive material, typically copper, as shown in FIGS. 20 and 21. The sidewalls 74 are formed by the outer perimeter of the routed window 72 and coated/metallized with a conductive material.


Alternatively, the sidewalls 74 may be formed by may alternating layers of non-conductive material 46 and conductive material 44, each having a routed window 72 (see FIG. 19). In this case, the outer perimeter of the window 72 may not require coverage with a conductive material because the layers of conductive material 44 would provide effective shielding.



FIGS. 23-26 illustrate various embodiments of the microphone package 40. These embodiments utilize top, bottom, and side portions 48, 50, and 52 which are described above. It is contemplated that each of the top, bottom, and side portion 48, 50, 52 embodiments described above can be utilized in any combination without departing from the invention disclosed and described herein.


In FIG. 23, connection to an end user's board is made through the bottom portion 50. The package mounting orientation is bottom portion 50 down. Connection from the transducer 58 to the plated through holes is be made by wire bonding. The transducer back volume 18 is formed by the back hole (mounted down) of the silicon microphone only. Bond pads, wire bonds and traces to the terminals are not shown. A person of ordinary skilled in the art of PCB design will understand that the traces reside on the first conductor layer 44. The wire bonds from the transducer 58 are be connected to exposed pads. The pads are connected to the solder pads via plated through holes and traces on the surface.


In FIG. 24, connection to the end user's board is also made through the bottom portion 50. Again, the package mounting orientation is bottom portion 50. Connection from the transducer 58 to the plated through holes are made by wire bonding. The back volume is formed by a combination of the back hole of the transducer 58 (mounted down) and the bottom portion 50.


In FIG. 25, connection to the end user's board is also made through the bottom portion 50. Again, the package mounting orientation is bottom portion 50. Connection from the transducer 58 to the plated through holes are made by wire bonding. With acoustic ports 54 on both sides of the package, there is no back volume. This method is suitable to a directional microphone.


In FIG. 26, connection to the end user's board is made through the top portion 48 or the bottom portion 53. The package mounting orientation is either top portion 48 down or bottom portion 50 down. Connection from the transducer 58 to the plated through holes is made by flip chipping or wire bonding and trace routing. The back volume 18 is formed by using the air cavity created by laminating the bottom portion 50 and the top portion 48 together. Some portion of the package fabrication is performed after the transducer 58 has been attached. In particular, the through hole formation, plating, and solder pad definition would be done after the transducer 58 is attached. The protective membrane 62 is hydrophobic and prevents corrosive plating chemistry from entering the chamber 56.


Referring to FIGS. 27-29, the portion to which the transducer unit 58 is mounted may include a retaining ring 84. The retaining ring 84 prevents wicking of an epoxy 86 into the transducer 58 and from flowing into the acoustic port or aperture 54. Accordingly, the shape of the retaining ring 84 will typically match the shape of the transducer 58 foot print. The retaining ring 84 comprises a conductive material (e.g., 3 mil. thick copper) imaged on a non-conductive layer material.


Referring to FIG. 27, the retaining ring 84 is imaged onto a nonconductive layer. An epoxy is applied outside the perimeter of the retaining ring 84, and the transducer 58 is added so that it overlaps the epoxy 86 and the retaining ring 84. This reduces epoxy 86 wicking up the sides of the transducer's 58 etched port (in the case of a silicon die microphone).


Alternatively, referring to FIG. 28, the retaining ring 84 can be located so that the transducer 58 does not contact the retaining ring 84. In this embodiment, the retaining ring 84 is slightly smaller than the foot print of the transducer 58 so that the epoxy 86 has a restricted path and is, thus, less likely to wick. In FIG. 29, the retaining ring 84 is fabricated so that it contacts the etched port of the transducer 58. The following tables provide an illustrative example of a typical circuit board processing technique for fabrication of the housing of this embodiment.









TABLE 1







Materials










Material
Type
Component
Note





1
0.5/0.5 oz. DST
Bottom Portion (Conductive




Cu 5 core FR-4
Layers Non-Conductive





Layer 1)



2
0.5/0.5 oz. DST
Bottom Portion (Conductive




Cu 5 core FR-4
Layers 3 and 4;





Non-Conductive Layer 2)



3
106 pre-preg

For Laminating





Material 1 and





Material 2


4
0.5/0.5 oz. DST
Side Portion
Metallized



Cu 40 Core FR-4

Afterward


5
Bare/0.5 oz. Cu 2
Top Portion (Each Piece




core FR-4 (2
Includes 1 Conductive and 1




pieces)
Non-Conductive Layer)



6
Expanded PTFE
Environmental Barrier
















TABLE 2







Processing of Materials (Base Portion Material 1)










Step
Type
Description
Note





1
Dry Film





Conductive Layers




2
Expose
Mask Material 1 (Upper
Forms Ground




Conductive Layer)
Plane on Lower





Conductive Layer


3
Develop




4
Etch Cu

No Etching on





Upper Conductive





Layer


5
Strip Dry Film
















TABLE 3







Processing of Materials (Bottom Portion Material 2)










Step
Type
Description
Note





1
Dry Film





Conductive





Layers




2
Expose
Mask Material 2 (Upper
Forms Ground




Conductive Layer)
Plane on Upper





Conductive Layer


3
Develop




4
Etch Cu

No Etching on Upper





Conductive





Layer


5
Strip Dry Film
















TABLE 4







Processing of Materials 1, 2, and 3 (Form Bottom Portion)










Step
Type
Description
Note













1
Laminate
Materials 1 and 2





Laminated Using





Material 3



2
Drill Thru Holes
Drill Bit = 0.025 in.



3
Direct
Plates Thru Holes




Metallization/Flash





Copper




4
Dry Film (L1 and





L4)




5
Expose
Mask Laminated
Forms Traces and Solder




Materials 1 and 2
Pads




(Upper and Lower





Conductive Layers)



6
Develop




7
Electrolytic Cu
1.0 mil



8
Electrolytic Sn
As Required



9
Strip Dry Film




10
Etch Cu




11
Etch Cu




12
Insert Finishing
NG Option (See
NG Option for Proof



Option Here
Table Below)
of Principle


13
Dry Film (cover
2.5 mil
Minimum Thickness



lay) on Upper

on Upper Conductive



Conductive Layer

Layer



Only




14
Expose
Mask Laminated
This mask defines an




Materials 1 and 2
area on the upper




(upper and lower)
conductive layer that





will receive a dry film





solder mask (cover





lay). The bottom layer





will not have dry film





applied to it. The





plated through holes





will be bridged over by





the coating on the top.


15
Develop




16
Cure

Full Cure


17
Route Panels
Route Bit = As
Forms 4″ × 4″ pieces.




Required
Conforms to finished





dims









Table 5 describes the formation of the side portion 52. This process involves routing a matrix of openings in FR-4 board. However, punching is thought to be the cost effective method for manufacturing. The punching may done by punching through the entire core, or, alternatively, punching several layers of no-flow pre-preg and thin core c-stage which are then laminated to form the wall of proper thickness.


After routing the matrix, the board will have to be electroless or DM plated. Finally, the boards will have to be routed to match the bottom portion. This step can be done first or last. It may make the piece more workable to perform the final routing as a first step.









TABLE 5







Processing of Material 4 (Side Portion)










Step
Type
Description
Note





1
Route/Punch
Route Bit = 0.031 in.
Forms Side Portion



Matrix of





Openings




2
Direct
0.25 mil minimum
Forms Sidewalls



Metallization/

on Side Portion



Flash Cu




3
Route Panels









Table 6 describes the processing of the top portion. The formation of the top portion 48 involves imaging a dry film cover lay or liquid solder mask on the bottom (i.e. conductive layer forming the inner layer. The exposed layer of the top portion 48 will not have a copper coating. It can be processed this way through etching or purchased this way as a one sided laminate.


A matrix of holes is drilled into the lid board. Drilling may occur after the imaging step. If so, then a suitable solder mask must be chosen that can survive the drilling process.









TABLE 6







Processing of Top Portion










Step
Type
Description
Note





1
Dry Film
Conductive Layer



2
Expose
Mask Bare Layer
Form Conduction Ring


3
Develop




4
Cure




5
Drill Matrix of
Drill Bit 0.025 in.
Acoustic Ports



Holes




6
Laminate
PTFE (Environmental
Forms Top Portion




Barrier) Between 2 Pieces





of Material 5
















TABLE 7







Processing of Laminated Materials 1 and 2 with Material 4










Step
Type
Description
Note





1
Screen





Conductive





Adhesive on





Material 4




2
Laminate
Bottom Portion with Side
Forms Bottom




Portion
Portion with Side





Portion (spacer)


3
Add Transducer
Silicon Die Microphone




Assembly
and Integrated Circuit
















TABLE 8







Processing of Laminated Materials 1, 2, and 4 with Material 5










Step
Type
Description
Note





1
Screen





Conductive





Adhesive on





Top Portion




2
Laminate
Bottom Portion and Side
Forms Housing




Portion with Top Portion



3
Dice
















TABLE 9







Finishing Option NG (Nickel/Gold)










Step
Type
Description
Note





1
Immersion Ni





(40-50 μ-in)




2
Immersion Au





(25-30 μ-in)
















TABLE 10







Finishing Option NGT (Nickel/Gold/Tin)








Step
Type





1
Mask L2 (using thick dry film or high tack dicing tape)


2
Immersion Ni (40-50 μ-in)


3
Immersion Au (25-30 μ-in)


4
Remove Mask on L2


5
Mask L1 (using thick dry film or high tack dicing tape)



bridge over cavity created by wall


6
Immersion Sn (100-250 μ-in)


7
Remove Mask on L1
















TABLE 11







Finishing Option ST (Silver/Tin)








Step
Type





1
Mask L2 (using thick dry film or high tack dicing tape)


2
Immersion Ag (40-50 μ-in)


3
Remove Mask on L2


4
Mask L1 (using thick dry film or high tack dicing tape)



bridge over cavity created by wall


5
Immersion Sn (100-250 μ-in)


6
Remove Mask on L1










FIG. 30 is a plan view illustrating a panel 90 for forming a plurality of microphone packages 92. The microphone packages 92 are distributed on the panel 90 in a 14×24 array, or 336 microphone packages total. Fewer or more microphone packages may be disposed on the panel 90, or on smaller or larger panels. As described herein in connection with the various embodiments of the invention, the microphone packages include a number of layers, such as top, bottom and side portions of the housing, environmental barriers, adhesive layers for joining the portions, and the like. To assure alignment of the portions as they are brought together, each portion may be formed to include a plurality of alignment apertures 94. To simultaneously manufacture several hundred or even several thousand microphones, a bottom layer, such as described herein, is provided. A transducer, amplifier and components are secured at appropriate locations on the bottom layer corresponding to each of the microphones to be manufactured. An adhesive layer, such as a sheet of dry adhesive is positioned over the bottom layer, and a sidewall portion layer is positioned over the adhesive layer. An additional dry adhesive layer is positioned, followed by an environmental barrier layer, another dry adhesive layer and the top layer. The dry adhesive layers are activated, such as by the application of heat and/or pressure. The panel is then separated into individual microphone assemblies using known panel cutting and separating techniques.


The microphone, microphone package and method of assembly herein described further allow the manufacture of multiple microphone assembly, such as microphone pairs. In the simplest form, during separation two microphones may be left joined together, such as the microphone pair 96 shown in FIG. 31. Each microphone 98 and 100 of the microphone pair 96 is thus a separate, individually operable microphone in a single package sharing a common sidewall 102. Alternatively, as described herein, conductive traces may be formed in the various layers of either the top or bottom portion thus allowing multiple microphones to be electrically coupled.


While specific embodiments have been illustrated and described, numerous modifications come to mind without significantly departing from the spirit of the invention, and the scope of protection is only limited by the scope of the accompanying Claims.

Claims
  • 1. A micro-electro-mechanical system (MEMS) microphone, the microphone comprising: a rigid rectangle-shaped microphone base adapted for solder reflow surface mounting and having substantially planar top and bottom surfaces, the microphone base comprising: a top core layer comprising a first non-conductive layer with a first conductive layer disposed on the upper surface of the first non-conductive layer, and a second conductive layer disposed on the lower surface of the first non-conductive layer, wherein the first non-conductive layer has a predetermined coefficient of thermal expansion;a bottom core layer comprising a second non-conductive layer with a third conductive layer disposed on the upper surface of the second non-conductive layer, and a fourth conductive layer disposed on the lower surface of the second non-conductive layer, wherein the second non-conductive layer has a predetermined coefficient of thermal expansion;a passive electronic material layer disposed between the second and third conductive layers and in electrical contact with the second and third conductive layers, wherein the second and third conductive layers are patterned into electrodes;a first solder mask that defines a plurality of conductive pads in the first conductive layer;a second solder mask that defines a plurality of flat solder pads in the fourth conductive layer; andone or more electrical paths disposed completely within the microphone base,wherein the paths electrically couple one or more of the plurality of conductive pads in the first conductive layer to one or more of the solder pads in the fourth conductive layer;a MEMS microphone die mounted to the top surface of the microphone base and electrically coupled to at least one of the conductive pads in the first conductive layer; anda single-piece rectangular cover formed from a solid material and having a predetermined shape with a top portion and a substantially vertical and continuous sidewall portion that adjoins the top portion at an angle and that completely surrounds and supports the top portion, the sidewall portion having a predetermined height, an exterior sidewall surface, an interior sidewall surface, and an attachment surface, the single-piece rectangular cover comprising an acoustic port disposed in the top portion of the rectangular cover and passing completely through the rectangular cover, wherein the acoustic port is disposed in a position offset from a centerpoint of the top portion of the rectangular cover, wherein the attachment surface of the sidewall portion of the rectangular cover is aligned with and attached to a peripheral region along each edge of the top surface of the microphone base, andwherein the predetermined height of the sidewall portion of the rectangular cover, the interior sidewall surface of the sidewall portion of the rectangular cover, and an interior surface of the top portion of the rectangular cover, in cooperation with the top surface of the microphone base, define an acoustic chamber for the MEMS microphone die and provide a protective enclosure for the MEMS microphone die to reduce electromagnetic interference.
  • 2. A MEMS microphone according to claim 1, wherein the microphone base further comprises a recess disposed therein, and the MEMS microphone die is positioned over the recess.
  • 3. A MEMS microphone according to claim 1, wherein the microphone base further comprises an internal cavity with an aperture in the top surface of the microphone base, the internal cavity extending longitudinally within the microphone base, and the MEMS microphone die is positioned over the aperture in the top surface of the base layer.
  • 4. A MEMS microphone according to claim 1, wherein the passive electronic material layer is a resistive material, and is electrically coupled to one or more of the plurality of conductive pads in the first conductive layer or one or more of the solder pads in the fourth conductive layer through one or more of the electrodes formed in the second and third conductive layers.
  • 5. A MEMS microphone according to claim 1, wherein the passive electronic material layer is a capacitive dielectric material, and is electrically coupled to one or more of the plurality of conductive pads in the first conductive layer or one or more of the solder pads in the fourth conductive layer through one or more of the electrodes formed in the second and third conductive layers.
  • 6. MEMS microphone according to claim 1, wherein a passive electrical element formed in the passive electronic material layer filters one or more of an input signal, an output signal, or input power.
  • 7. A MEMS microphone according to claim 1, wherein the MEMS microphone die is a pressure-equalizing MEMS microphone die.
  • 8. A MEMS microphone according to claim 1, wherein a diaphragm of the MEMS microphone die defines a front volume and a back volume within the acoustic chamber, and the acoustic port disposed in the rectangular cover is acoustically coupled to the diaphragm.
  • 9. A MEMS microphone according to claim 8, wherein the interface between the attachment surface of the sidewall portion of the rectangular cover and the attachment region of the top surface of the substrate is sealed to maintain acoustic pressure within the front volume.
  • 10. A MEMS microphone according to claim 1, wherein the first and second non-conductive layers comprise one or more layers of FR-4 printed circuit board material.
  • 11. A micro-electro-mechanical system (MEMS) microphone, the microphone comprising: a rigid rectangle-shaped microphone base adapted for solder reflow surface mounting and having substantially planar top and bottom surfaces, the microphone base comprising: a top core layer comprising a first non-conductive layer with a first conductive layer disposed on the upper surface of the first non-conductive layer, and a second conductive layer disposed on the lower surface of the first non-conductive layer, wherein the first non-conductive layer has a predetermined coefficient of thermal expansion;a bottom core layer comprising a second non-conductive layer with a third conductive layer disposed on the upper surface of the second non-conductive layer, and a fourth conductive layer disposed on the lower surface of the second non-conductive layer, wherein the second non-conductive layer has a predetermined coefficient of thermal expansion;a passive electronic material layer disposed between the second and third conductive layers and in electrical contact with the second and third conductive layers, wherein the second and third conductive layers are patterned into electrodes;a first solder mask that defines a plurality of conductive pads in the first conductive layer;a second solder mask that defines a plurality of flat solder pads in the fourth conductive layer;one or more electrical paths disposed completely within the microphone base, wherein the paths electrically couple one or more of the plurality of conductive pads in the first conductive layer to one or more of the solder pads in the fourth conductive layer; andan acoustic port disposed in an interior region of the microphone base layer and passing completely through the microphone base, wherein the acoustic port is disposed in a position offset from a centerpoint of the microphone base, and wherein one of the plurality of flat solder pads in the fourth conductive layer is a metal ring that completely surrounds the acoustic port in the microphone base;a MEMS microphone die mounted to the top surface of the microphone base and electrically coupled to at least one of the conductive pads in the first conductive layer, the MEMS microphone die being disposed directly over the acoustic port in the microphone base; anda single-piece rectangular cover formed from a solid material and having a predetermined shape with a top portion and a substantially vertical and continuous sidewall portion that adjoins the top portion at an angle and that completely surrounds and supports the top portion, the sidewall portion having a predetermined height, an exterior sidewall surface, an interior sidewall surface, and an attachment surface, wherein the attachment surface of the sidewall portion of the rectangular cover is aligned with and attached to a peripheral region along each edge of the top surface of the microphone base, andwherein the predetermined height of the sidewall portion of the rectangular cover, the interior sidewall surface of the sidewall portion of the rectangular cover, and an interior surface of the top portion of the rectangular cover, in cooperation with the top surface of the microphone base, define an acoustic chamber for the MEMS microphone die and provide a protective enclosure for the MEMS microphone die to reduce electromagnetic interference.
  • 12. A MEMS microphone according to claim 11, wherein the passive electronic material layer is a resistive material, and is electrically coupled to one or more of the plurality of conductive pads in the first conductive layer or one or more of the solder pads in the fourth conductive layer through one or more of the electrodes formed in the second and third conductive layers.
  • 13. A MEMS microphone according to claim 11, wherein the passive electronic material layer is a capacitive dielectric material, and is electrically coupled to one or more of the plurality of conductive pads in the first conductive layer or one or more of the solder pads in the fourth conductive layer through one or more of the electrodes formed in the second and third conductive layers.
  • 14. MEMS microphone according to claim 11, wherein a passive electrical element formed in the passive electronic material layer filters one or more of an input signal, an output signal, or input power.
  • 15. A MEMS microphone according to claim 11, wherein the MEMS microphone die is a pressure-equalizing MEMS microphone die.
  • 16. A MEMS microphone according to claim 11, wherein the microphone base further comprises an acoustic material that substantially blocks contaminants from passing through the acoustic port.
  • 17. A MEMS microphone according to claim 16, wherein the acoustic material to block environmental contaminants is a film of polymeric material.
  • 18. A MEMS microphone according to claim 16, wherein the acoustic material to block environmental contaminants is hydrophobic.
  • 19. A MEMS microphone according to claim 11, wherein a diaphragm of the MEMS microphone die defines a front volume and a back volume within the acoustic chamber, and the acoustic port disposed in the microphone base of the substrate is acoustically coupled to the front volume.
  • 20. A MEMS microphone according to claim 19, wherein the interface between the attachment surface of the sidewall portion of the cover and the peripheral region of the top surface of the microphone base is sealed to maintain acoustic pressure within the back volume.
RELATED APPLICATIONS

This application is a continuation of Ser. No. 14/258,870, filed Apr. 22, 2014, which is a continuation of U.S. application Ser. No. 13/732,179 (now U.S. Pat. No. 8,704,360), filed Dec. 31, 2012, which is a continuation of U.S. patent application Ser. No. 13/286,558 (now U.S. Pat. No. 8,358,004), filed Nov. 1, 2011, which is a continuation of U.S. patent application Ser. No. 13/111,537 (now U.S. Pat. No. 8,121,331), filed May 19, 2011, which is a continuation of U.S. patent application Ser. No. 11/741,881 (now U.S. Pat. No. 8,018,049), filed Apr. 30, 2007, which is a divisional of U.S. patent application Ser. No. 10/921,747 (now U.S. Pat. No. 7,434,305), filed Aug. 19, 2004, which is a continuation-in-part of U.S. patent application Ser. No. 09/886,854 (now U.S. Pat. No. 7,166,910), filed Jun. 21, 2001, which claims the benefit of U.S. Provisional Patent Application No. 60/253,543, filed Nov. 28, 2000. U.S. patent application Ser. No. 13/668,035, filed Nov. 2, 2012, U.S. patent application Ser. No. 13/668,103, filed Nov. 2, 2012, U.S. patent application Ser. No. 13/732,120, filed Dec. 31, 2012, U.S. patent application Ser. No. 13/732,205, filed Dec. 31, 2012, U.S. patent application Ser. No. 13/732,232, filed Dec. 31, 2012, and U.S. patent application Ser. No. 13/732,265, filed Dec. 31, 2012, are also continuations of U.S. patent application Ser. No. 13/286,558 (now U.S. Pat. No. 8,358,004). These applications are hereby incorporated by reference herein in their entireties for all purposes.

US Referenced Citations (238)
Number Name Date Kind
3192086 Gyurk Jun 1965 A
3567844 Krcmar Mar 1971 A
3735209 Saddler May 1973 A
3735211 Kapnias May 1973 A
4127840 House Nov 1978 A
4222277 Kurtz et al. Sep 1980 A
4277814 Giachino et al. Jul 1981 A
4314226 Oguro et al. Feb 1982 A
4456796 Nakagawa et al. Jun 1984 A
4533795 Baumhauer et al. Aug 1985 A
4558184 Busch-Vishniac et al. Dec 1985 A
4628740 Ueda et al. Dec 1986 A
4643935 McNeal et al. Feb 1987 A
4691363 Khanna Sep 1987 A
4737742 Takoshima et al. Apr 1988 A
4776019 Miyatake Oct 1988 A
4825335 Wilner Apr 1989 A
4891686 Krausse, III Jan 1990 A
4908805 Sprenkels et al. Mar 1990 A
4910840 Sprenkels et al. Mar 1990 A
4984268 Brown et al. Jan 1991 A
5099396 Barz et al. Mar 1992 A
5101543 Cote et al. Apr 1992 A
5101665 Mizuno Apr 1992 A
5146435 Bernstein Sep 1992 A
5151763 Marek et al. Sep 1992 A
5153379 Guzuk et al. Oct 1992 A
5159537 Okano Oct 1992 A
5178015 Loeppert et al. Jan 1993 A
5202652 Tabuchi et al. Apr 1993 A
5216278 Lin et al. Jun 1993 A
5237235 Cho et al. Aug 1993 A
5241133 Mullen, III et al. Aug 1993 A
5252882 Yatsuda Oct 1993 A
5257547 Boyer Nov 1993 A
5313371 Knecht et al. May 1994 A
5357807 Guckel et al. Oct 1994 A
5394011 Yamamoto et al. Feb 1995 A
5400949 Hirvonen et al. Mar 1995 A
5408731 Berggvist et al. Apr 1995 A
5449909 Kaiser et al. Sep 1995 A
5452268 Bernstein Sep 1995 A
5459368 Onishi et al. Oct 1995 A
5477008 Pasqualoni et al. Dec 1995 A
5490220 Loeppert Feb 1996 A
5506919 Roberts Apr 1996 A
5531787 Lesinski et al. Jul 1996 A
5545912 Ristic et al. Aug 1996 A
5592391 Muyshondt et al. Jan 1997 A
5593926 Fujihira Jan 1997 A
5611129 Yoshimoto et al. Mar 1997 A
5659195 Kaiser et al. Aug 1997 A
5712523 Nakashima et al. Jan 1998 A
5736783 Wein et al. Apr 1998 A
5740261 Loeppert Apr 1998 A
5748758 Measco, Jr. et al. May 1998 A
5761053 King et al. Jun 1998 A
5776798 Quan et al. Jul 1998 A
5783748 Otani Jul 1998 A
5789679 Koshimizu et al. Aug 1998 A
5818145 Fukiharu Oct 1998 A
5831262 Greywall et al. Nov 1998 A
5838551 Chan Nov 1998 A
5852320 Ichihashi Dec 1998 A
5870482 Loeppert et al. Feb 1999 A
5886876 Yamaguchi Mar 1999 A
5889872 Sooriakumar et al. Mar 1999 A
5895229 Carney et al. Apr 1999 A
5898574 Tan et al. Apr 1999 A
5901046 Ohta et al. May 1999 A
5923995 Kao et al. Jul 1999 A
5939784 Glenn Aug 1999 A
5939968 Nguyen et al. Aug 1999 A
5949305 Shimamura Sep 1999 A
5976912 Fukutomi et al. Nov 1999 A
5977626 Wang et al. Nov 1999 A
5981314 Glenn et al. Nov 1999 A
5999821 Kaschke Dec 1999 A
6003381 Kato Dec 1999 A
6012335 Bashir et al. Jan 2000 A
6052464 Harris et al. Apr 2000 A
6066882 Kato May 2000 A
6078245 Fritz et al. Jun 2000 A
6088463 Rombach et al. Jul 2000 A
6093972 Carney et al. Jul 2000 A
6108184 Minervini et al. Aug 2000 A
6117705 Glenn et al. Sep 2000 A
6118881 Quinlan et al. Sep 2000 A
6119920 Guthrie et al. Sep 2000 A
6136419 Fasano et al. Oct 2000 A
6140144 Najafi et al. Oct 2000 A
6147876 Yamaguchi et al. Nov 2000 A
6150748 Fukiharu Nov 2000 A
6157546 Petty et al. Dec 2000 A
6163071 Yamamura Dec 2000 A
6178249 Hietanen et al. Jan 2001 B1
6191928 Rector et al. Feb 2001 B1
6201876 Niemi et al. Mar 2001 B1
6228676 Glenn et al. May 2001 B1
6242802 Miles et al. Jun 2001 B1
6262477 Mahulikar et al. Jul 2001 B1
6282072 Minervini et al. Aug 2001 B1
6282781 Gotoh et al. Sep 2001 B1
6308398 Beavers Oct 2001 B1
6324067 Nishiyama Nov 2001 B1
6324907 Halteren et al. Dec 2001 B1
6339365 Kawase et al. Jan 2002 B1
6352195 Guthrie et al. Mar 2002 B1
6388887 Matsumoto et al. May 2002 B1
6401542 Kato Jun 2002 B1
6403881 Hughes Jun 2002 B1
6404100 Chujo et al. Jun 2002 B1
6428650 Chung Aug 2002 B1
6437412 Higuchi et al. Aug 2002 B1
6439869 Seng et al. Aug 2002 B1
6441503 Webster Aug 2002 B1
6472724 Matsuzawa et al. Oct 2002 B1
6479320 Gooch Nov 2002 B1
6483037 Moore et al. Nov 2002 B1
6521482 Hyoudo et al. Feb 2003 B1
6522762 Mullenborn et al. Feb 2003 B1
6526653 Glenn et al. Mar 2003 B1
6534340 Karpman et al. Mar 2003 B1
6535460 Loeppert Mar 2003 B2
6552469 Pederson Apr 2003 B1
6594369 Une Jul 2003 B1
6621392 Volant et al. Sep 2003 B1
6664709 Irie Dec 2003 B2
6675471 Kimura et al. Jan 2004 B1
6781231 Minervini Aug 2004 B2
6847090 Loeppert Jan 2005 B2
6859542 Johannsen et al. Feb 2005 B2
6876052 Tai Apr 2005 B1
6928718 Carpenter Aug 2005 B2
6936918 Harney et al. Aug 2005 B2
6962829 Glenn et al. Nov 2005 B2
7003127 Sjursen et al. Feb 2006 B1
7080442 Kawamura et al. Jul 2006 B2
7092539 Sheplak et al. Aug 2006 B2
7142682 Mullenborn et al. Nov 2006 B2
7166910 Minervini Jan 2007 B2
7215223 Hattanda et al. May 2007 B2
7221767 Mullenborn et al. May 2007 B2
7242089 Minervini Jul 2007 B2
7280855 Hawker et al. Oct 2007 B2
7297567 Loeppert Nov 2007 B2
7381589 Minervini Jun 2008 B2
7382048 Minervini Jun 2008 B2
7434305 Minervini Oct 2008 B2
7436054 Zhe Oct 2008 B2
7439616 Minervini Oct 2008 B2
7501703 Minervini Mar 2009 B2
7537964 Minervini May 2009 B2
RE40781 Johannsen et al. Jun 2009 E
7633156 Minervini Dec 2009 B2
7927927 Quan et al. Apr 2011 B2
8018049 Minervini Sep 2011 B2
8103025 Mullenborn et al. Jan 2012 B2
8121331 Minervini Feb 2012 B2
8170244 Ryan May 2012 B2
8358004 Minervini Jan 2013 B2
8450817 Minervini May 2013 B2
8457332 Loeppert Jun 2013 B2
8526665 Lutz Sep 2013 B2
8594347 Ryan Nov 2013 B2
8617934 Minervini Dec 2013 B1
8623709 Minervini Jan 2014 B1
8623710 Minervini Jan 2014 B1
8624384 Minervini Jan 2014 B1
8624385 Minervini Jan 2014 B1
8624386 Minervini Jan 2014 B1
8624387 Minervini Jan 2014 B1
8629005 Minervini Jan 2014 B1
8629551 Minervini Jan 2014 B1
8629552 Minervini Jan 2014 B1
8633064 Minervini Jan 2014 B1
8652883 Minervini Feb 2014 B1
8704360 Minervini Apr 2014 B1
8765530 Minervini Jul 2014 B1
8781140 Lautenschlager Jul 2014 B2
8791531 Loeppert Jul 2014 B2
8879767 Wickstrom Nov 2014 B2
8969980 Lee Mar 2015 B2
8987030 Loeppert Mar 2015 B2
8995694 Vos Mar 2015 B2
9006880 Minervini Apr 2015 B1
9023689 Minervini May 2015 B1
9024432 Minervini May 2015 B1
9040360 Minervini May 2015 B1
9051171 Minervini Jun 2015 B1
9061893 Minervini Jun 2015 B1
9067780 Minervini Jun 2015 B1
9078063 Loeppert Jul 2015 B2
9096423 Minervini Aug 2015 B1
9133020 Minervini Sep 2015 B1
9137595 Lee Sep 2015 B2
9139421 Minervini Sep 2015 B1
9139422 Minervini Sep 2015 B1
9148731 Minervini Sep 2015 B1
9150409 Minervini Oct 2015 B1
20020067663 Loeppert et al. Jun 2002 A1
20020102004 Minervini Aug 2002 A1
20030052404 Thomas Mar 2003 A1
20030133588 Pedersen Jul 2003 A1
20040032705 Ma Feb 2004 A1
20040184632 Minervini Sep 2004 A1
20040253760 Zhang Dec 2004 A1
20050018864 Minervini Jan 2005 A1
20050069164 Muthuswamy et al. Mar 2005 A1
20050185812 Minervini Aug 2005 A1
20050218488 Matsuo Oct 2005 A1
20060157841 Minervini Jul 2006 A1
20070189568 Wilk et al. Aug 2007 A1
20070215962 Minervini Sep 2007 A1
20080142475 Loeppert Jun 2008 A1
20080217709 Minervini Sep 2008 A1
20080247585 Leidl et al. Oct 2008 A1
20110096945 Furst et al. Apr 2011 A1
20120039499 Ryan Feb 2012 A1
20130108074 Reining May 2013 A1
20130177192 Abry Jul 2013 A1
20140037115 Vos Feb 2014 A1
20140037120 Lim Feb 2014 A1
20140037124 Lim Feb 2014 A1
20140064546 Szczech Mar 2014 A1
20140133686 Lee May 2014 A1
20140177113 Gueorguiev Jun 2014 A1
20140291783 Talag Oct 2014 A1
20140291784 Conklin Oct 2014 A1
20140294209 Szczech Oct 2014 A1
20140321687 Friel Oct 2014 A1
20150117681 Watson Apr 2015 A1
20150139428 Reining May 2015 A1
20150166335 Loeppert Jun 2015 A1
20150172825 Lim Jun 2015 A1
20150195659 Szczech Jul 2015 A1
20150208165 Volk Jul 2015 A1
20150251898 Vos Sep 2015 A1
Foreign Referenced Citations (33)
Number Date Country
2315417 Feb 2001 CA
10303263 Aug 2004 DE
0 077 615 Apr 1983 EP
0 534 251 Mar 1993 EP
0 682 408 Nov 1995 EP
0 774 888 May 1997 EP
981413 Dec 1999 FI
01169333 Jul 1989 JP
07-099420 Apr 1995 JP
09-107192 Apr 1997 JP
09-306934 Nov 1997 JP
09-318650 Dec 1997 JP
10-062282 Mar 1998 JP
63275926 Nov 1998 JP
2000-165999 Jun 2000 JP
2000-199725 Jul 2000 JP
2000-277970 Oct 2000 JP
2000-316042 Nov 2000 JP
2000-340687 Dec 2000 JP
2001-102469 Apr 2001 JP
2001-308217 Nov 2001 JP
2002-324873 Nov 2002 JP
2002-334951 Nov 2002 JP
2005-235377 Sep 2005 JP
2006-283561 Oct 2006 JP
0042636 Jul 2000 WO
0119133 Mar 2001 WO
0120948 Mar 2001 WO
0141497 Jun 2001 WO
0215636 Feb 2002 WO
0245463 Jun 2002 WO
2006020478 Feb 2006 WO
2006061058 Jun 2006 WO
Non-Patent Literature Citations (96)
Entry
U.S. Appl. No. 60/209,692, filed Jun. 6, 2000, Carpenter.
U.S. Appl. No. 60/450,569, filed Feb. 28, 2003, Minervini.
U.S. Appl. No. 09/886,854, filed Jun. 21, 2001, Minervini.
U.S. Appl. No. 10/921,747, filed Aug. 19, 2004, Minervini.
U.S. Appl. No. 60/253,543, filed Nov. 29, 2000, Minervini.
U.S. Appl. No. 11/741,881, filed Apr. 30, 2007, Minervini.
Khadpe, S., “Worldwide Activities in Flip Chip, BGA and TAB Technologies and Markets”, pp. 290-293, Proceedings 1995 International Flip Chip, Ball Grid Array, TAB and Advanced Packaging Symposium (1995).
Kress, H.J. et al, “Integrated Silicon Pressure Sensor for Automotive Application with Electronic Trimming,” SAE International, International Congress and Exposition, Detroit, Michigan (Feb. 27, 1995-Mar. 2, 1995).
Kristiansen, H. et al., “Fine Pitch Connection of Flexible Circuits to Rigid Substrates Using Non-Conductive Epoxy Adhesive”, IEPS, pp. 759-773 (1991).
Lau, John, “Chip Scale Package Design, Materials, Process, Reliability, and Applications”, McGraw-Hill(1999).
Lau, John, ed., “Ball Grid Array Technology”, McGraw Hill, Inc., USA (1995).
Lloyd, R.H.F., “ASLT: An Extension of Hybrid-Miniaturization Techniques”, IBM J. Res. Develop.,11(4), pp. 86-92 (1967).
Lomeson, .R.B, “High Technology Microcircuit Packaging”, International Electronic Packaging Society Proceedings, pp. 498-503 (1982).
Bever, T. et al., “BICMOS Compatible Silicon Microphone Packaged as Surface Mount Device”, Sensors Expo (1999).
Card, D., How ETA Chose to Make a Megaboard for its Supercomputer, pp. 50-52, Electron. Bus. (1988).
Chung, K., et al., “Z-Axis Conductive Adhesives for Fine Pitch Interconnections”, ISHM Proceedings, pp. 678-689 (1992).
Commission Opinion, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-629 (Aug. 18, 2009).
Complainant Knowles Electronics, LLC's Contingent Petition for Review of Final Initial Determination, Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Sep. 17, 2014.
Complainant Knowles Electronics, LLC's Response to Petition for Review of Respondents Goertek Inc. and Goertek Electronics, Inc., Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Sep. 29, 2014.
Complainant Knowles Electronics, LLC's Statement on the Public Interest Pursuant to 19 C.F.R. § 210.50(a)(4), Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Oct. 2, 2014.
Construing Terms of Asserted Claims of Patents at Issue & Denying Complainants' Motion to Supplement its Proposed Claim Constructions, Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Apr. 15, 2014.
Corrected Conditional Rebuttal Expert Report of Wilmer Bottoms Regarding Validity, Public Version, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 7, 2013).
Davis, E.M., et al., “Solid Logic Technology: Versatile High-Performance Microelectronics”, IBM J. Res. Devel., 8(2), pp. 102-114 (1964).
Expert Report of Prof. Michael G. Pecht, Public Version, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 7, 2013).
Federal Circuit Court of Appeals Opinion, Mems Technology Berhad v. International Trade Commission and Knowles Electronics LLC, Case No. 2010-1018 (Jun. 3, 2011).
Fox, P.E,. et al., “Design of Logic-Circuit Technology for IBM System 370 Models 145 and 155”, IBM J. Res. Devel. 15(2), pp. 384-390 (1971).
Gale, Bruce K., “MEMS Packaging,” Microsystems Principles (Oct. 2001).
Gedney, R.W., “Trends in Packaging Technology”,16th Annual Proceedings of Reliability Physics, pp. 127-129 (1978).
Giasolli, Robert, “MEMS Packaging Introduction” (Nov. 2000).
Gilleo, Ken, “Handbook of Flexible Circuits” (1992).
Grieg, William, “Integrated Circuit Packaging, Assembly and Interconnections” (2007).
Henning, Albert K. et al., “Microfluidic MEMS for Semiconductor Processing,” IEEE Transaction on Components, Packaging, & Mfg. Tech., Part B, pp. 329-37, vol. 21, No. 4 (Nov. 1998).
Initial Determination on Violation of Section 337 and Recommended Determination on Remedy and Bond, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-629 (Jan. 12, 2009).
Initial Determination on Violation of Section 337 and Recommended Determination on Remedy and Bond, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-695 (Nov. 22, 2010).
Initial Determination Terminating Investigation Based on Settlement Agreement, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 12, 2013).
Initial Post-Hearing Brief of Complainant Knowles Electronics, LLC, Public Version, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 7, 2013).
Initial Post-Hearing Brief of Respondents Analog Devices, Inc., Amkor Technology, Inc. & Avnet, Inc., Public Version, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 7, 2013).
Institute of Electrical and Electronics Engineers, IEEE 100 The Authoritative Dictionary of IEEE Standards Terms Seventh Edition (2000).
International Search Report for Application No. PCT/US05/021276 (Oct. 21, 2005).
Joint Stipulation of Dismissal, Knowles Electronics, LLC v. Analog Devices, Inc., United States District Court for the Northern District of Illinois, Civil Action No. 1:11-cv-06804 (Mar. 12, 2013).
Katopis, G.A., “Delta-I Noise Specification for a High Performance Computing ‘Machine’”, Proc. IEEE, pp. 1405-1415 (1985).
“Harper, Charles ed., McGraw Hill, “Electronic Packaging and Interconnection Handbook” (2000)”.
“Pressure Transducer Handbook,” pp. 4-2 to 4-5, 12-1 to 12-5, National Semiconductor Corp., USA (1977).
Alvarez, E. and Amkor Technology, Inc., “CABGA Optional Process Description” (Apr. 1997).
Amkor Technology, Inc., “Control Plan—CABGA” (Apr. 2012).
Arnold, David P. et al., “MEMS-Based Acoustic Array Technology,” 40th AIAA Aerospace Sciences Meeting & Exhibit, Jan. 14-17, 2000, American Institute of Aeronautics and Astronautics, Reston, Virginia.
Arnold, David Patrick, “A MEMS-Based Directional Acoustic Array for Aeoacoustic Measurements,” Masters Thesis, University of Florida (2001).
Balde, J.W., “Status and Prospects of Surface Mount Technology”, Solid State Technol., 29(6), pp. 99-103 (1986).
A. J. Sprenkels, J.A. Voorthuryzen, and P. Bergveld, “A theoretical analysis of the electric airgap field-effect structure for sensors applications,” 1986, US.
A.J. Sprenkels, W. Olthius, and P. Bergveld, “The application of silicon dioxide as an elecret materials”, Proc. 6th Int. Symp. Electrets, ISE 6, pg. 164-169, 1988, UK.
E.H. Pederson et al., “Flip-Chip Hermetic Packaging for MEMS”, Proceedings of Eurosensors XIV, Copenhagen, Denmark, Aug. 27-30, 2000 US.
J.A. Voorthuyzen and P. Bergveld, “Semiconductor-based electret sensor for sound and pressure”, IEEE Trans. Dielect, Elect. Insulation, 1989, p. 267-276.
J.A. Voorthuyzen and P. Bergveld, “The Pressfet: An integrated electret-MOSFET based pressure sensor”, Sens Actuators, 1988, p. 349-360.
Joint Electron Device Engineering Council, “JEDEC Standard, Descriptive Designation System for Semiconductor-Device Packages, JESD30-B, Elec. Indus. Ass'n” Apr. 1995, US.
Kourosh Amiri Jam et al., “Design Methodology of Modular Microsystems”, Mar. 29, 2001, Germany.
M. Schuenemann et al., “A highly flexible design and production framework for modularized microelectromechanical systems”, Oct. 7, 1998, pp. 153-168.
Malshe et al., “Challenges in the Packaging of MEMS”, 1999, p. 41-47, US.
Pecht et al., Plastic-Encapsulated Microelectronics, 1995, p. 460, US.
Prasad, Ray P., “Surface Mount Technology: Principles and Practices” 2nd Edition, 1997, p. 3-50, 129-135, 149-203, 339-597, 747-757, US.
Tummala, Rao R., “Microelectronics Packaging Handbook: Semiconductor Packaging Part II”, 1997, p. 1-42; Ch. 7 p. 11-3 to 11-128; Ch. 8.3 p. 11-136 to 11-185; Ch. 9 p. 11-284 to 11-393; Section 11.5 p. 11-516 to 11-527; Section 11.6 p. 11-528 to 11-533; Ch. 14 p. 11-873 to 11-927; Glossary pp. 11-931 to 11-976, USA.
Tummala, Rao R., “Fundamentals of Microsystems Packaging”, 2001, p. 2-42, 65-68, 81-119, 120-183, 265-294, 297-340, 543-578, 580-610, 659-693, 695-747, ??678-682, 924-944, US, No date.
Masuda, N., IEEE/CHMT Japan IEMT Symposium, pp. 55-58 (1989).
Notice of a Commission Determination Not to Review an Initial Determination Terminating Investigation Based on a Settlement Agreement; Termination of the Investigation, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Apr. 8, 2013).
Notice of Commission Determination to Review in Part an Initial Determination, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-695 (Jan. 21, 2011).
Notice of Investigation, Inv. No. 337-TA-629, in the Matter of “Certain Silicon Microphone Packages and Products Containing the Same”, United States International Trade Commission, issued Jan. 3, 2008.
Notice Regarding Issuance of Public Version of Final Initial Determination and Recommended Determination on Remedy and Bond, Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Oct. 15, 2014.
Notification of Docket Entry, Knowles Electronics, LLC v. Analog Devices, Inc., United States District Court for the Northern District of Illinois, Civil Action No. 1:11-cv-06804 (Mar. 13, 2013).
Opinion and Order, Motion for Partial Summary Judgment, Knowles Electronics, LLC v. Analog Devices, Inc., United States District Court for the Northern District of Illinois, Civil Action No. 1:11-cv-06804 (Mar. 7, 2013).
Opinion and Order, Motion for Reconsideration of the Court's Claim Construction Ruling, Knowles Electronics, LLC v. Analog Devices, Inc., United States District Court for the Northern District of Illinois, Civil Action No. 1:11-cv-06804 (Feb. 19, 2013).
Reply Post-Hearing Brief of Respondents Analog Devices, Inc., Amkor Technology, Inc. & Avnet, Inc., Public Version, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 7, 2013).
Respondents Goertek, Inc.'s, and Goertek Electronics, Inc.'s Petition for Review of Initial and Recommended Determinations, Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Sep. 17, 2014.
Respondents Goertek, Inc.'s, and Goertek Electronics, Inc.'s Response to Complainant Knowles Electronics LLC's Contingent Petition for Review of Final Initial Determination, Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Sep. 29, 2014.
Rosenberger, M.E., “Absolute Pressure Transducer for Turbo Application”, pp. 77-79 (1983).
Rulings on Claim Construction, Knowles Electronics, LLC v. Analog Devices, Inc., United States District Court for the Northern District of Illinois, Civil Action No. 1:11-cv-06804 (May 30, 2012).
Sakuma, K., et al., “Chip on Glass Technology with Standard Aluminized IC Chip”, ISHM, pp. 250-256 (1990).
Scheeper, P.R. et al., “A Review of Silicon Microphones”, Sensor and Actuators Actuators, A 44, pp. 1-11 (1994).
Schwartz, B. et al., “Ceramics and the Micromodule”, RCA Eng., 5(4), p. 56-58 (1960).
Smith, K., An Inexpensive High Frequency High Power VLSI Chip Carrier, IEPS, No date.
Speerschneider, C.F. et al., “Solder Bump Reflow Tape Automated Bonding”, pp. 7-12, Proceedings 2nd ASM International Electronic Materials and Processing Congress (1989).
Summary of Complainant Knowles Electronics, LLC's Response to Petition for Review of Respondents Goertek Inc. and Goertek Electronics, Inc., Inv. No. 337-TA-888, U.S. Int'l Trade Commission, Sep. 29, 2014.
Torkkeli, Altti et al., “Capacitive Silicon Microphone,” Physica Scripta vol. T79, pp. 275-278 (1999).
Premachandran, C.S. et al,, “Si-based Microphone Testing Methodology and Noise Reduction,” Proceedings of SPIE, vol. 4019 (2000).
Torkkeli, Altti et al., “Capacitive microphone with low-stress polysilicon membrane and high-stress polysilicon backplate,” Sensors and Actuators (2000).
JEDEC Standard Terms, Definitions, and Letter Symbols for Microelectronic Devices (2000).
Puttlitz & Totta, “Area Array Interconnection Handbook” (2001).
European Search Report for Application No. 07702957.4 (Jul. 19, 2007).
A. Dehe et al., Silicon Micromachined Microphone Chip at Siemens, 137th Regular Meeting of the Acoustical Society of America, Mar. 16, 1999, US.
Tummala and Rymaszewski, “Microelectronics Packaging Handbook” (1989).
Minges, Merrill, L. “Electronics Materials Handbook, vol. 1 Packaging” (1989).
Pecht, Michael G., “Handbook of Electronic Package Design” (1991).
Petersen, Kurt et al., “Silicon Accelerometer Family; Manufactured for Automotive Applications” (1992).
Dizon, C. and Amkor Technology, Inc., “CABGA Control Plan” (Dec. 1997).
Pecht et al., “Electronic Packaging Materials and their Properties” (1999).
Respondents' Notice of Prior Art, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-888 (Oct. 23, 2013).
Wiley Electrical and Electronics Engineering Dictionary, p. 275, IEEE Press (2004).
Reply Post-Hearing Brief of Complainant Knowles Electronics, LLC, Public Version, In the Matter of Certain Silicon Microphone Packages and Products Containing the Same, ITC Inv. No. 337-TA-825 (Mar. 7, 2013).
Provisional Applications (1)
Number Date Country
60253543 Nov 2000 US
Divisions (1)
Number Date Country
Parent 10921747 Aug 2004 US
Child 11741881 US
Continuations (5)
Number Date Country
Parent 14258870 Apr 2014 US
Child 14836499 US
Parent 13732179 Dec 2012 US
Child 14258870 US
Parent 13286558 Nov 2011 US
Child 13732179 US
Parent 13111537 May 2011 US
Child 13286558 US
Parent 11741881 Apr 2007 US
Child 13111537 US
Continuation in Parts (1)
Number Date Country
Parent 09886854 Jun 2001 US
Child 10921747 US