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Changting Wang
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Schenectady, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic inspection systems for inspection of target objects
Patent number
9,759,686
Issue date
Sep 12, 2017
General Electric Company
Mandar Diwakar Godbole
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current array probe
Patent number
8,884,614
Issue date
Nov 11, 2014
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Grant
Drive coil, measurement probe comprising the drive coil and methods...
Patent number
8,710,834
Issue date
Apr 29, 2014
General Electric Company
Andrzej Michal May
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Eddy current inspection system and method
Patent number
8,436,608
Issue date
May 7, 2013
General Electric Company
Haiyan Sun
G01 - MEASURING TESTING
Information
Patent Grant
Method for non-destructive testing of composite systems
Patent number
8,378,668
Issue date
Feb 19, 2013
General Electric Company
Waseem Ibrahim Faidi
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
System and method for eddy current inspection of parts with complex...
Patent number
8,269,489
Issue date
Sep 18, 2012
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for integrating eddy current inspection with a co...
Patent number
8,179,132
Issue date
May 15, 2012
General Electric Company
Yanyan Wu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspection of parts with an eddy current probe
Patent number
7,994,780
Issue date
Aug 9, 2011
General Electric Company
Haiyan Sun
G01 - MEASURING TESTING
Information
Patent Grant
Flexible eddy current array probe and methods of assembling the same
Patent number
7,952,348
Issue date
May 31, 2011
General Electric Company
Haiyan Sun
G01 - MEASURING TESTING
Information
Patent Grant
Omnidirectional eddy current array probes and methods of use
Patent number
7,948,233
Issue date
May 24, 2011
General Electric Company
Aparna Chakrapani Sheila-Vadde
G01 - MEASURING TESTING
Information
Patent Grant
Surface flaw detection system to facilitate nondestructive inspecti...
Patent number
7,888,932
Issue date
Feb 15, 2011
General Electric Company
William Stewart McKnight
G01 - MEASURING TESTING
Information
Patent Grant
Multi-frequency image processing for inspecting parts having comple...
Patent number
7,817,845
Issue date
Oct 19, 2010
General Electric Company
Ui Won Suh
G01 - MEASURING TESTING
Information
Patent Grant
Inspection of non-planar parts using multifrequency eddy current wi...
Patent number
7,518,359
Issue date
Apr 14, 2009
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed eddy current pipeline inspection system and method
Patent number
7,402,999
Issue date
Jul 22, 2008
General Electric Company
Yuri Plotnikov
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and system using multifrequency phase analysis
Patent number
7,206,706
Issue date
Apr 17, 2007
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current probe and inspection method
Patent number
7,154,265
Issue date
Dec 26, 2006
General Electric Company
Mottito Togo
G01 - MEASURING TESTING
Information
Patent Grant
Omnidirectional eddy current probe and inspection system
Patent number
7,015,690
Issue date
Mar 21, 2006
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for inspection utilizing pulsed eddy current
Patent number
7,005,851
Issue date
Feb 28, 2006
General Electric Company
Andrew May
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for node electronics unit architecture
Patent number
6,999,291
Issue date
Feb 14, 2006
General Electric Company
Emad Andarawis Andarawis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for optimized centralized critical control arc...
Patent number
6,892,115
Issue date
May 10, 2005
General Electric Company
Ertugrul Berkcan
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC INSPECTION SYSTEMS FOR INSPECTION OF TARGET OBJECTS
Publication number
20140139211
Publication date
May 22, 2014
GENERAL ELECTRIC COMPANY
Mandar Diwakar Godbole
G01 - MEASURING TESTING
Information
Patent Application
EDDY CURRENT ARRAY PROBE
Publication number
20130106409
Publication date
May 2, 2013
GENERAL ELECTRIC COMPANY
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EDDY CURRENT INSPECTION OF CASE-HARDENDED...
Publication number
20120043962
Publication date
Feb 23, 2012
Changting WANG
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC INSPECTION SYSTEMS FOR INSPECTION OF TARGET OBJECTS
Publication number
20110215799
Publication date
Sep 8, 2011
GENERAL ELECTRIC COMPANY
Mandar Diwakar Godbole
G01 - MEASURING TESTING
Information
Patent Application
EDDY CURRENT INSPECTION SYSTEM AND METHOD
Publication number
20110068784
Publication date
Mar 24, 2011
GENERAL ELECTRIC COMPANY
Haiyan Sun
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES
Publication number
20110004452
Publication date
Jan 6, 2011
Sanghamithra Korukonda
G01 - MEASURING TESTING
Information
Patent Application
DRIVE COIL, MEASUREMENT PROBE COMPRISING THE DRIVE COIL AND METHODS...
Publication number
20100321012
Publication date
Dec 23, 2010
GENERAL ELECTRIC COMPANY
Andrzej Michal May
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTI...
Publication number
20100312494
Publication date
Dec 9, 2010
Sanghamithra Korukonda
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INTEGRATING EDDY CURRENT INSPECTION WITH A CO...
Publication number
20100207619
Publication date
Aug 19, 2010
Yanyan Wu
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE SYSTEMS, ARTICLES INCORPORATING THE SYSTEM, METHODS FOR I...
Publication number
20100134098
Publication date
Jun 3, 2010
GENERAL ELECTRIC COMPANY
Waseem Ibrahim Faidi
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES
Publication number
20100127699
Publication date
May 27, 2010
GENERAL ELECTRIC COMPANY
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Omnidirectional Eddy Current Array Probes and Methods of Use
Publication number
20100085045
Publication date
Apr 8, 2010
GENERAL ELECTRIC COMPANY
Aparna Chakrapani Sheila-Vadde
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME
Publication number
20090115411
Publication date
May 7, 2009
Haiyan Sun
G01 - MEASURING TESTING
Information
Patent Application
EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME
Publication number
20090115410
Publication date
May 7, 2009
William Stewart McKnight
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTION OF PARTS
Publication number
20090072822
Publication date
Mar 19, 2009
GENERAL ELECTRIC COMPANY
Haiyan Sun
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHODS FOR INSPECTING INTERNAL CRACKS
Publication number
20080278151
Publication date
Nov 13, 2008
GENERAL ELECTRIC COMPANY
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLE...
Publication number
20080159619
Publication date
Jul 3, 2008
GENERAL ELECTRIC COMPANY
Ui Won SUH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS
Publication number
20070222439
Publication date
Sep 27, 2007
GENERAL ELECTRIC COMPANY
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Pulsed eddy current pipeline inspection system and method
Publication number
20070120559
Publication date
May 31, 2007
Yuri Plotnikov
G01 - MEASURING TESTING
Information
Patent Application
Inspection method and system using multifrequency phase analysis
Publication number
20060217908
Publication date
Sep 28, 2006
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Inspection of non-planar parts using multifrequency eddy current wi...
Publication number
20060202687
Publication date
Sep 14, 2006
GENERAL ELECTRIC COMPANY
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Eddy current array probes with enhanced drive fields
Publication number
20060132123
Publication date
Jun 22, 2006
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Eddy current probe and inspection method
Publication number
20060132124
Publication date
Jun 22, 2006
General Electric Company
Mottito Togo
G01 - MEASURING TESTING
Information
Patent Application
Omnidirectional eddy current probe and inspection system
Publication number
20050264284
Publication date
Dec 1, 2005
General Electric Company
Changting Wang
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for inspection utilizing pulsed eddy current
Publication number
20050068026
Publication date
Mar 31, 2005
Andrew May
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for optimized centralized critical control arc...
Publication number
20040024475
Publication date
Feb 5, 2004
General Electric Company
Ertugrul Berkcan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for node electronics unit architecture
Publication number
20030222509
Publication date
Dec 4, 2003
General Electric Company
Emad Andarawis Andarawis
G06 - COMPUTING CALCULATING COUNTING