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Daniel Kadosh
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Determining die performance by incorporating neighboring die perfor...
Patent number
8,190,391
Issue date
May 29, 2012
GLOBALFOUNDRIES Inc.
Daniel Kadosh
G01 - MEASURING TESTING
Information
Patent Grant
End of line performance prediction
Patent number
7,650,199
Issue date
Jan 19, 2010
Daniel Kadosh
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Automated control thread determination based upon post-process cons...
Patent number
7,315,765
Issue date
Jan 1, 2008
Advanced Micro Devices, Inc.
Alan Grosvenor Ranft
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Method and apparatus for multivariate fault detection and classific...
Patent number
7,248,939
Issue date
Jul 24, 2007
Advanced Micro Devices, Inc.
Kevin Andrew Chamness
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting faults using principal component...
Patent number
7,198,964
Issue date
Apr 3, 2007
Advanced Micro Devices, Inc.
Gregory A. Cherry
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Composite spacer liner for improved transistor performance
Patent number
6,949,436
Issue date
Sep 27, 2005
Advanced Micro Devices, Inc.
James F. Buller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Maintaining LDD series resistance of MOS transistors by retarding d...
Patent number
6,777,281
Issue date
Aug 17, 2004
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Narrow width CMOS devices fabricated on strained lattice semiconduc...
Patent number
6,764,908
Issue date
Jul 20, 2004
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming source/drain regions in a semiconductor device
Patent number
6,720,227
Issue date
Apr 13, 2004
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tilted counter-doped implant to sharpen halo profile
Patent number
6,589,847
Issue date
Jul 8, 2003
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Removable spacer technique
Patent number
6,506,642
Issue date
Jan 14, 2003
Advanced Micro Devices, Inc.
Scott D. Luning
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Asymmetrical N-channel and P-channel devices
Patent number
6,504,218
Issue date
Jan 7, 2003
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Elevated transistor fabrication technique
Patent number
6,420,730
Issue date
Jul 16, 2002
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structure for measuring effective channel length of a transistor
Patent number
6,403,979
Issue date
Jun 11, 2002
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Parallel and series-coupled transistors having gate conductors form...
Patent number
6,383,872
Issue date
May 7, 2002
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High density integrated circuit
Patent number
6,365,943
Issue date
Apr 2, 2002
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra high density series-connected transistors formed on separate...
Patent number
6,358,828
Issue date
Mar 19, 2002
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transistor and a method for forming the transistor with elevated an...
Patent number
6,355,955
Issue date
Mar 12, 2002
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mutual implant region used for applying power/ground to a source of...
Patent number
6,300,661
Issue date
Oct 9, 2001
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming integrated circuit gate conductors from dual lay...
Patent number
6,261,885
Issue date
Jul 17, 2001
Advanced Micro Devices, Inc.
Jon D. Cheek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra high density NOR gate using a stacked transistor arrangement
Patent number
6,259,118
Issue date
Jul 10, 2001
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming a retrograde impurity profile
Patent number
6,245,649
Issue date
Jun 12, 2001
Advanced Micro Devices, Inc.
James F. Buller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor fabrication having multi-level transistors and high d...
Patent number
6,232,637
Issue date
May 15, 2001
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nitrogen liner beneath transistor source/drain regions to retard do...
Patent number
6,225,151
Issue date
May 1, 2001
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Asymmetrical IGFET devices with spacers formed by HDP techniques
Patent number
6,218,251
Issue date
Apr 17, 2001
Advanced Micro Devices, Inc.
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit having transistors that include insulative punch...
Patent number
6,172,402
Issue date
Jan 9, 2001
Advanced Micro Devices
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Source/drain junction areas self aligned between a sidewall spacer...
Patent number
6,172,381
Issue date
Jan 9, 2001
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multilevel transistor formation employing a local substrate formed...
Patent number
6,150,695
Issue date
Nov 21, 2000
Advanced Micro Devices, Inc.
Mark Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for upper level substrate isolation integrated...
Patent number
6,140,163
Issue date
Oct 31, 2000
Advanced Micro Devices, Inc.
Mark I. Gardner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor topography including integrated circuit gate conducto...
Patent number
6,137,145
Issue date
Oct 24, 2000
Advanced Micro Devices, Inc.
Jon D. Cheek
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
USING MULTIVARIATE HEALTH METRICS TO DETERMINE MARKET SEGMENT AND T...
Publication number
20080262769
Publication date
Oct 23, 2008
DANIEL KADOSH
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING DIE PERFORMANCE BY INCORPORATING NEIGHBORING DIE PERFOR...
Publication number
20080244348
Publication date
Oct 2, 2008
Daniel Kadosh
G01 - MEASURING TESTING
Information
Patent Application
Determining Die Health by Expanding Electrical Test Data to Represe...
Publication number
20080172189
Publication date
Jul 17, 2008
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Composite spacer liner for improved transistor performance
Publication number
20040259343
Publication date
Dec 23, 2004
Advanced Micro Devices, Inc.
James F. Buller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for providing first-principles feed-forward ma...
Publication number
20040088068
Publication date
May 6, 2004
Daniel Kadosh
G05 - CONTROLLING REGULATING
Information
Patent Application
TRANSISTOR HAVING A TRANSITION METAL OXIDE GATE DIELECTRIC AND METH...
Publication number
20010020723
Publication date
Sep 13, 2001
MARK I. GARDNER
H01 - BASIC ELECTRIC ELEMENTS