David Anthony Kidd

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Back end of line (BEOL) process corner sensing
- Patent number 11,823,962
- Issue date Nov 21, 2023
- QUALCOMM Incorporated
- Saravanan Marimuthu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tipless transistors, short-tip transistors, and methods and circuit...
- Patent number 11,145,647
- Issue date Oct 12, 2021
- United Semiconductor Japan Co., Ltd.
- David A. Kidd
- G11 - INFORMATION STORAGE
Information Patent Grant
Sequential based ring oscillator
- Patent number 11,139,802
- Issue date Oct 5, 2021
- QUALCOMM Incorporated
- Percy Tehmul Marfatia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Back-end-of-line (BEOL) on-chip sensor
- Patent number 11,011,459
- Issue date May 18, 2021
- QUALCOMM Incorporated
- Samy Shafik Tawfik Zaynoun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tipless transistors, short-tip transistors, and methods and circuit...
- Patent number 10,573,644
- Issue date Feb 25, 2020
- Mie Fujitsu Semiconductor Limited
- David A. Kidd
- G11 - INFORMATION STORAGE
Information Patent Grant
Tipless transistors, short-tip transistors, and methods and circuit...
- Patent number 9,953,974
- Issue date Apr 24, 2018
- Mie Fujitsu Semiconductor Limited
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit device body bias circuits and methods
- Patent number 9,853,019
- Issue date Dec 26, 2017
- Mie Fujitsu Semiconductor Limited
- Lawrence T. Clark
- G05 - CONTROLLING REGULATING
Information Patent Grant
Power-density-based clock cell spacing
- Patent number 9,824,174
- Issue date Nov 21, 2017
- QUALCOMM Incorporated
- Ankita Nayak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-speed flip-flop with robust scan-in path hold time
- Patent number 9,612,281
- Issue date Apr 4, 2017
- QUALCOMM Incorporated
- Yi Lou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Tipless transistors, short-tip transistors, and methods and circuit...
- Patent number 9,583,484
- Issue date Feb 28, 2017
- Mie Fujitsu Semiconductor Limited
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit device body bias circuits and methods
- Patent number 9,548,086
- Issue date Jan 17, 2017
- Mie Fujitsu Semiconductor Limited
- Lawrence T. Clark
- G05 - CONTROLLING REGULATING
Information Patent Grant
SRAM cell layout structure and devices therefrom
- Patent number 9,424,385
- Issue date Aug 23, 2016
- Mie Fujitsu Semiconductor Limited
- George Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tipless transistors, short-tip transistors, and methods and circuit...
- Patent number 9,385,121
- Issue date Jul 5, 2016
- Mie Fujitsu Semiconductor Limited
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Slew based process and bias monitors and related methods
- Patent number 9,319,034
- Issue date Apr 19, 2016
- Mie Fujitsu Semiconductor Limited
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit process and bias monitors and related methods
- Patent number 9,276,561
- Issue date Mar 1, 2016
- Mie Fujitsu Semiconductor Limited
- Lawrence T. Clark
- G05 - CONTROLLING REGULATING
Information Patent Grant
Body bias circuits and methods
- Patent number 9,154,123
- Issue date Oct 6, 2015
- Mie Fujitsu Semiconductor Limited
- Lawrence T. Clark
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit process and bias monitors and related methods
- Patent number 9,112,484
- Issue date Aug 18, 2015
- Mie Fujitsu Semiconductor Limited
- Lawrence T. Clark
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit device body bias circuits and methods
- Patent number 9,112,495
- Issue date Aug 18, 2015
- Mie Fujitsu Semiconductor Limited
- Lawrence T. Clark
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Slew based process and bias monitors and related methods
- Patent number 9,093,997
- Issue date Jul 28, 2015
- Mie Fujitsu Semiconductor Limited
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inrush current control circuit and method for utilizing same
- Patent number 9,013,851
- Issue date Apr 21, 2015
- Broadcom Corporation
- David Anthony Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SRAM performance monitor
- Patent number 8,976,575
- Issue date Mar 10, 2015
- SuVolta, Inc.
- David A. Kidd
- G11 - INFORMATION STORAGE
Information Patent Grant
Tipless transistors, short-tip transistors, and methods and circuit...
- Patent number 8,895,327
- Issue date Nov 25, 2014
- SuVolta, Inc.
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
SRAM cell layout structure and devices therefrom
- Patent number 8,863,064
- Issue date Oct 14, 2014
- SuVolta, Inc.
- George Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Body bias circuits and methods
- Patent number 8,816,754
- Issue date Aug 26, 2014
- SuVolta, Inc.
- Lawrence T. Clark
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Timing path detailer
- Patent number 7,000,206
- Issue date Feb 14, 2006
- Broadcom Corporation
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique to assess timing delay by use of layout quality analyzer...
- Patent number 6,877,147
- Issue date Apr 5, 2005
- Broadcom Corporation
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing path detailer
- Patent number 6,834,379
- Issue date Dec 21, 2004
- Broadcom Corporation
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CELL ARCHITECTURE FOR A SEMICONDUCTOR DEVICE
- Publication number 20230022681
- Publication date Jan 26, 2023
- QUALCOMM Incorporated
- Sidharth RASTOGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACK END OF LINE (BEOL) PROCESS CORNER SENSING
- Publication number 20220270938
- Publication date Aug 25, 2022
- QUALCOMM Incorporated
- Saravanan MARIMUTHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIPLESS TRANSISTORS, SHORT-TIP TRANSISTORS, AND METHODS AND CIRCUIT...
- Publication number 20200152626
- Publication date May 14, 2020
- United Semiconductor Japan Co., Ltd.
- David A. Kidd
- G11 - INFORMATION STORAGE
Information Patent Application
DIGITAL CURRENT MEASUREMENT FOR IN-SITU DEVICE MONITORING
- Publication number 20190107569
- Publication date Apr 11, 2019
- QUALCOMM Incorporated
- David Kidd
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tipless Transistors, Short-Tip Transistors, and Methods and Circuit...
- Publication number 20180226401
- Publication date Aug 9, 2018
- MIE Fujitsu Semiconductor Limited
- David A. Kidd
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tipless Transistors, Short-Tip Transistors, and Methods and Circuit...
- Publication number 20170117273
- Publication date Apr 27, 2017
- MIE Fujitsu Semiconductor Limited
- David A. Kidd
- G11 - INFORMATION STORAGE
Information Patent Application
POWER-DENSITY-BASED CLOCK CELL SPACING
- Publication number 20170076030
- Publication date Mar 16, 2017
- QUALCOMM Incorporated
- Ankita NAYAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated Circuit Device Body Boas Circuits and Methods
- Publication number 20170047100
- Publication date Feb 16, 2017
- MIE Fujitsu Semiconductor Limited
- Lawrence T. Clark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tipless Transistors, Short-Tip Transistors, and Methods and Circuit...
- Publication number 20160284698
- Publication date Sep 29, 2016
- MIE Fujitsu Semiconductor Limited
- David A. Kidd
- G11 - INFORMATION STORAGE
Information Patent Application
HIGH-SPEED FLIP-FLOP WITH ROBUST SCAN-IN PATH HOLD TIME
- Publication number 20160146887
- Publication date May 26, 2016
- QUALCOMM Incorporated
- Yi Lou
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Process and Bias Monitors and Related Methods
- Publication number 20150333738
- Publication date Nov 19, 2015
- MIE Fujitsu Semiconductor Limited
- Lawrence T. Clark
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrated Circuit Device Body Bias Circuits and Methods
- Publication number 20150318026
- Publication date Nov 5, 2015
- MIE Fujitsu Semiconductor Limited
- Lawrence T. Clark
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Slew Based Process and Bias Monitors and Related Methods
- Publication number 20150303905
- Publication date Oct 22, 2015
- MIE Fujitsu Semiconductor Limited
- David A. Kidd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Inrush current control circuit and method for utilizing same
- Publication number 20110205680
- Publication date Aug 25, 2011
- BROADCOM CORPORATION
- David Anthony Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Layout quality analyzer
- Publication number 20050132318
- Publication date Jun 16, 2005
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timing path detailer
- Publication number 20050039152
- Publication date Feb 17, 2005
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timing path detailer
- Publication number 20040088662
- Publication date May 6, 2004
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Layout quality analyzer
- Publication number 20040015805
- Publication date Jan 22, 2004
- David A. Kidd
- G06 - COMPUTING CALCULATING COUNTING

David Anthony Kidd

Person

Patents Grantslast 30 patents

Back end of line (BEOL) process corner sensing

Tipless transistors, short-tip transistors, and methods and circuit...

Sequential based ring oscillator

Back-end-of-line (BEOL) on-chip sensor

Tipless transistors, short-tip transistors, and methods and circuit...

Tipless transistors, short-tip transistors, and methods and circuit...

Integrated circuit device body bias circuits and methods

Power-density-based clock cell spacing

High-speed flip-flop with robust scan-in path hold time

Tipless transistors, short-tip transistors, and methods and circuit...

Integrated circuit device body bias circuits and methods

SRAM cell layout structure and devices therefrom

Tipless transistors, short-tip transistors, and methods and circuit...

Slew based process and bias monitors and related methods

Integrated circuit process and bias monitors and related methods

Body bias circuits and methods

Integrated circuit process and bias monitors and related methods

Integrated circuit device body bias circuits and methods

Slew based process and bias monitors and related methods

Inrush current control circuit and method for utilizing same

SRAM performance monitor

Tipless transistors, short-tip transistors, and methods and circuit...

SRAM cell layout structure and devices therefrom

Body bias circuits and methods

Timing path detailer

Technique to assess timing delay by use of layout quality analyzer...

Timing path detailer

Patents Applicationslast 30 patents

CELL ARCHITECTURE FOR A SEMICONDUCTOR DEVICE

BACK END OF LINE (BEOL) PROCESS CORNER SENSING

TIPLESS TRANSISTORS, SHORT-TIP TRANSISTORS, AND METHODS AND CIRCUIT...

DIGITAL CURRENT MEASUREMENT FOR IN-SITU DEVICE MONITORING

Tipless Transistors, Short-Tip Transistors, and Methods and Circuit...

Tipless Transistors, Short-Tip Transistors, and Methods and Circuit...

POWER-DENSITY-BASED CLOCK CELL SPACING

Integrated Circuit Device Body Boas Circuits and Methods

Tipless Transistors, Short-Tip Transistors, and Methods and Circuit...

HIGH-SPEED FLIP-FLOP WITH ROBUST SCAN-IN PATH HOLD TIME

Integrated Circuit Process and Bias Monitors and Related Methods

Integrated Circuit Device Body Bias Circuits and Methods

Slew Based Process and Bias Monitors and Related Methods

Inrush current control circuit and method for utilizing same

Layout quality analyzer

Timing path detailer

Timing path detailer

Layout quality analyzer