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Douglas J. Bonser
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Formation of FinFET gate spacer
Patent number
8,525,234
Issue date
Sep 3, 2013
GLOBALFOUNDRIES Inc.
Douglas Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for fabricating FinFET semiconductor devices using planariz...
Patent number
8,268,727
Issue date
Sep 18, 2012
GLOBALFOUNDRIES, INC.
Frank S. Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Formation of FinFET gate spacer
Patent number
8,174,055
Issue date
May 8, 2012
GLOBALFOUNDRIES Inc.
Douglas Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating a semiconductor device having a semiconducti...
Patent number
7,985,639
Issue date
Jul 26, 2011
GLOBALFOUNDRIES, INC.
Frank Scott Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Use of scanning theme implanters and annealers for selective implan...
Patent number
7,504,326
Issue date
Mar 17, 2009
Advanced Micro Devices, Inc.
George Jonathan Kluth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming a semiconductor arrangement with gate sidewall s...
Patent number
7,279,386
Issue date
Oct 9, 2007
Advanced Micro Devices, Inc.
Mark C. Kelling
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for semiconductor gate line dimension reduction
Patent number
7,268,066
Issue date
Sep 11, 2007
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a semiconductor arrangement with reduced field-to...
Patent number
7,223,698
Issue date
May 29, 2007
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming isolation trench with spacer formation
Patent number
7,144,785
Issue date
Dec 5, 2006
Advanced Micro Devices, Inc.
Srikanteswara Dakshina-Murthy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selective epitaxial growth for tunable channel thickness
Patent number
7,105,399
Issue date
Sep 12, 2006
Advanced Micro Devices, Inc.
Srikanteswara Dakshina-Murthy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of reducing STI divot formation during semiconductor device...
Patent number
7,091,106
Issue date
Aug 15, 2006
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for patterning a feature using a trimmed hardmask
Patent number
6,913,958
Issue date
Jul 5, 2005
Advanced Micro Devices
Marina V. Plat
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for photoresist trim endpoint detection
Patent number
6,900,139
Issue date
May 31, 2005
Advanced Micro Devices, Inc.
Srikanteswara Dakshina-Murthy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
L-shaped spacer incorporating or patterned using amorphous carbon o...
Patent number
6,893,967
Issue date
May 17, 2005
Advanced Micro Devices, Inc.
Marilyn I. Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for forming a semiconductor device and method thereof includ...
Patent number
6,881,616
Issue date
Apr 19, 2005
Advanced Micro Devices, Inc.
Kay Hellig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for semiconductor gate line dimension reduction
Patent number
6,849,530
Issue date
Feb 1, 2005
Advanced Micro Devices
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for patterning narrow gate lines
Patent number
6,812,077
Issue date
Nov 2, 2004
Advanced Micro Devices, Inc.
Darin Chan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for defect reduction and enhanced control over critical dime...
Patent number
6,797,552
Issue date
Sep 28, 2004
Advanced Micro Devices, Inc.
Mark S. Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Modified film stack and patterning strategy for stress compensation...
Patent number
6,773,998
Issue date
Aug 10, 2004
Advanced Micro Devices, Inc.
Philip A. Fisher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reducing gate line deformation and reducing gate line wi...
Patent number
6,764,947
Issue date
Jul 20, 2004
Advanced Micro Devices, Inc.
Darin Chan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reducing pattern deformation and photoresist poisoning i...
Patent number
6,764,949
Issue date
Jul 20, 2004
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating a semiconductor device using amorphous carbo...
Patent number
6,750,127
Issue date
Jun 15, 2004
Advanced Micro Devices, Inc.
Mark S. Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control of two-step gate etch process
Patent number
6,734,088
Issue date
May 11, 2004
Advanced Micro Devices, Inc.
Matthew Purdy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for alignment mark formation for a shallow trench isolation...
Patent number
6,673,635
Issue date
Jan 6, 2004
Advanced Micro Devices, Inc.
Kay Hellig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CVD silicon carbide layer as a BARC and hard mask for gate patterning
Patent number
6,653,735
Issue date
Nov 25, 2003
Advanced Micro Devices, Inc.
Chih Yuh Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dry isotropic removal of inorganic anti-reflective coating after po...
Patent number
6,555,397
Issue date
Apr 29, 2003
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Isotropic resistor protect etch to aid in residue removal
Patent number
6,365,481
Issue date
Apr 2, 2002
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device with improved isolat...
Patent number
6,309,947
Issue date
Oct 30, 2001
Advanced Micro Devices, Inc.
Basab Bandyopadhyay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for control of critical dimension using feedba...
Patent number
6,245,581
Issue date
Jun 12, 2001
Advanced Micro Devices, Inc.
Douglas Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor topography employing a shallow trench isolation struc...
Patent number
6,165,906
Issue date
Dec 26, 2000
Advanced Micro Devices, Inc.
Basab Bandyopadhyay
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
FORMATION OF FINFET GATE SPACER
Publication number
20120168833
Publication date
Jul 5, 2012
GLOBALFOUNDRIES INC.
Douglas Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FORMATION OF FINFET GATE SPACER
Publication number
20110198673
Publication date
Aug 18, 2011
GLOBALFOUNDRIES INC.
Douglas Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE HAVING A SEMICONDUCTI...
Publication number
20110070712
Publication date
Mar 24, 2011
GLOBALFOUNDRIES INC.
Frank Scott JOHNSON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR FABRICATING FINFET SEMICONDUCTOR DEVICES USING ASHABLE...
Publication number
20100267237
Publication date
Oct 21, 2010
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS FOR FABRICATING FINFET SEMICONDUCTOR DEVICES USING PLANARIZ...
Publication number
20100267238
Publication date
Oct 21, 2010
Advanced Micro Devices, Inc.
Frank S. Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Use of Scanning Theme Implanters and Annealers for Selective Implan...
Publication number
20070281450
Publication date
Dec 6, 2007
George Jonathan Kluth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for forming a semiconductor arrangement with gate sidewall s...
Publication number
20060121711
Publication date
Jun 8, 2006
Advanced Micro Devices, Inc.
Mark C. Kelling
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of forming isolation trench with spacer formation
Publication number
20060094205
Publication date
May 4, 2006
Advanced Micro Devices, Inc.
Srikanteswara Dakshina-Murthy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of reducing STI divot formation during semiconductor device...
Publication number
20050196928
Publication date
Sep 8, 2005
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for semiconductor gate line dimension reduction
Publication number
20050020019
Publication date
Jan 27, 2005
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for semiconductor gate line dimension reduction
Publication number
20040043590
Publication date
Mar 4, 2004
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for reducing pattern deformation and photoresist poisoning i...
Publication number
20040023475
Publication date
Feb 5, 2004
Advanced Micro Devices, Inc.
Douglas J. Bonser
H01 - BASIC ELECTRIC ELEMENTS